BR102013002577B1 - Aparelho e método para calibragem de sistema de projeção a laser - Google Patents

Aparelho e método para calibragem de sistema de projeção a laser Download PDF

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Publication number
BR102013002577B1
BR102013002577B1 BR102013002577-1A BR102013002577A BR102013002577B1 BR 102013002577 B1 BR102013002577 B1 BR 102013002577B1 BR 102013002577 A BR102013002577 A BR 102013002577A BR 102013002577 B1 BR102013002577 B1 BR 102013002577B1
Authority
BR
Brazil
Prior art keywords
dimensional
structural
assembly
laser
moving
Prior art date
Application number
BR102013002577-1A
Other languages
English (en)
Portuguese (pt)
Other versions
BR102013002577A2 (pt
Inventor
Curtis M. Ashford
Brian A. Bollinger
Original Assignee
The Boeing Company
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by The Boeing Company filed Critical The Boeing Company
Publication of BR102013002577A2 publication Critical patent/BR102013002577A2/pt
Publication of BR102013002577B1 publication Critical patent/BR102013002577B1/pt

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/14Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2504Calibration devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C25/00Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass
    • G01C25/005Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass initial alignment, calibration or starting-up of inertial devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/002Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7088Alignment mark detection, e.g. TTR, TTL, off-axis detection, array detector, video detection

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Manufacturing & Machinery (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
  • Transforming Electric Information Into Light Information (AREA)
BR102013002577-1A 2012-02-03 2013-02-01 Aparelho e método para calibragem de sistema de projeção a laser BR102013002577B1 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/366,260 US8780361B2 (en) 2012-02-03 2012-02-03 Apparatus and method for calibrating laser projection system
US13/366,260 2012-02-03

Publications (2)

Publication Number Publication Date
BR102013002577A2 BR102013002577A2 (pt) 2014-09-09
BR102013002577B1 true BR102013002577B1 (pt) 2021-10-26

Family

ID=47721978

Family Applications (1)

Application Number Title Priority Date Filing Date
BR102013002577-1A BR102013002577B1 (pt) 2012-02-03 2013-02-01 Aparelho e método para calibragem de sistema de projeção a laser

Country Status (6)

Country Link
US (1) US8780361B2 (https=)
EP (1) EP2623930B1 (https=)
JP (1) JP5878136B2 (https=)
CN (1) CN103245289B (https=)
BR (1) BR102013002577B1 (https=)
CA (1) CA2795983C (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013070296A2 (en) * 2011-08-19 2013-05-16 Aerovironment, Inc. Aircraft system for reduced observer visibility
US9091530B1 (en) 2014-06-10 2015-07-28 The Boeing Company Calibration system and method for a three-dimensional measurement system
US10179710B2 (en) 2016-03-03 2019-01-15 Gpcp Ip Holdings Llc Automated loading system alignment assembly
US10239178B2 (en) * 2016-10-17 2019-03-26 Virtek Vision International, ULC Laser projector with dynamically adaptable focus
WO2019206633A1 (en) * 2018-04-23 2019-10-31 Robert Bosch Gmbh Portable vehicle sensor calibration apparatus having a suction mechanism
CN114132452B (zh) * 2021-12-23 2023-04-18 武昌船舶重工集团有限公司 一种用于船体轴承的同轴定位方法
CN114624899B (zh) * 2022-03-10 2023-09-29 歌尔光学科技有限公司 光学系统校准方法、光学系统校准装置以及存储介质

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03189504A (ja) * 1989-12-20 1991-08-19 Nissan Motor Co Ltd 光学式三次元測定装置
GB9401692D0 (en) 1994-01-28 1994-03-23 Renishaw Plc Performing measurement or calibration on positioning machines
JP2004271292A (ja) * 2003-03-07 2004-09-30 Meidensha Corp 校正器及びステレオカメラ位置姿勢校正装置
EP1719580B1 (en) * 2003-09-10 2012-06-27 Nikon Metrology NV Laser projection system
US7463368B2 (en) * 2003-09-10 2008-12-09 Metris Canada Inc Laser projection system, intelligent data correction system and method
US7489411B2 (en) 2005-07-27 2009-02-10 The Boeing Company Apparatus and methods for calibrating a laser projection device
CN100429476C (zh) * 2006-12-20 2008-10-29 北京航空航天大学 一种双传感器激光视觉三维测量系统校准方法
US7965396B2 (en) * 2008-03-14 2011-06-21 The Boeing Company Enhanced laser projector calibration wall

Also Published As

Publication number Publication date
EP2623930B1 (en) 2019-09-11
CA2795983A1 (en) 2013-08-03
CN103245289B (zh) 2016-08-03
JP2013160762A (ja) 2013-08-19
CA2795983C (en) 2015-02-24
US20130201491A1 (en) 2013-08-08
JP5878136B2 (ja) 2016-03-08
EP2623930A2 (en) 2013-08-07
US8780361B2 (en) 2014-07-15
BR102013002577A2 (pt) 2014-09-09
CN103245289A (zh) 2013-08-14
EP2623930A3 (en) 2014-03-12

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Legal Events

Date Code Title Description
B03A Publication of a patent application or of a certificate of addition of invention [chapter 3.1 patent gazette]
B06F Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette]
B06U Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette]
B09A Decision: intention to grant [chapter 9.1 patent gazette]
B16A Patent or certificate of addition of invention granted [chapter 16.1 patent gazette]

Free format text: PRAZO DE VALIDADE: 20 (VINTE) ANOS CONTADOS A PARTIR DE 01/02/2013, OBSERVADAS AS CONDICOES LEGAIS.