AU8562991A - Surface inspection device - Google Patents

Surface inspection device

Info

Publication number
AU8562991A
AU8562991A AU85629/91A AU8562991A AU8562991A AU 8562991 A AU8562991 A AU 8562991A AU 85629/91 A AU85629/91 A AU 85629/91A AU 8562991 A AU8562991 A AU 8562991A AU 8562991 A AU8562991 A AU 8562991A
Authority
AU
Australia
Prior art keywords
inspection device
surface inspection
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU85629/91A
Inventor
Yoshida Hajime
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hajime Industries Ltd
Original Assignee
Hajime Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hajime Industries Ltd filed Critical Hajime Industries Ltd
Publication of AU8562991A publication Critical patent/AU8562991A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8877—Proximity analysis, local statistics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30136—Metal

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Quality & Reliability (AREA)
  • General Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Mobile Radio Communication Systems (AREA)
AU85629/91A 1990-10-09 1991-10-07 Surface inspection device Abandoned AU8562991A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2271714A JPH06103276B2 (en) 1990-10-09 1990-10-09 Surface inspection device
JP2-271714 1990-10-09

Publications (1)

Publication Number Publication Date
AU8562991A true AU8562991A (en) 1992-04-16

Family

ID=17503821

Family Applications (1)

Application Number Title Priority Date Filing Date
AU85629/91A Abandoned AU8562991A (en) 1990-10-09 1991-10-07 Surface inspection device

Country Status (6)

Country Link
JP (1) JPH06103276B2 (en)
AU (1) AU8562991A (en)
CA (1) CA2052905A1 (en)
DE (1) DE4133315A1 (en)
FR (1) FR2667686A1 (en)
GB (1) GB2248935A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997029368A1 (en) * 1996-02-09 1997-08-14 Unisearch Limited Visual inspection system for leather hide

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4415004A1 (en) * 1993-04-30 1994-11-03 Univ Schiller Jena Arrangement and method for characterising surfaces and for characterising and classifying surface defects and near-surface defects as well as inhomogeneities in the volume of transparent media
DE4322870C1 (en) * 1993-07-09 1994-09-29 Tuchenhagen Otto Gmbh Method and arrangement for assessing the success of cleaning procedures on contaminated surfaces
GB2349214B (en) * 1996-07-18 2000-12-20 Speedfam Ipec Corp Methods and apparatus for the in-process detection of workpieces
FI110343B (en) 1999-02-25 2002-12-31 Honeywell Oy Monitoring system for a paper machine's breakage
JP2011196730A (en) * 2010-03-18 2011-10-06 Fujikura Ltd Wire surface flaw detection device and wire surface flaw detection method
CN101984346A (en) * 2010-10-19 2011-03-09 浙江大学 Method of detecting fruit surface defect based on low pass filter
CN108337448B (en) * 2018-04-12 2020-09-25 Oppo广东移动通信有限公司 High dynamic range image acquisition method and device, terminal equipment and storage medium

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2937245A1 (en) * 1978-09-18 1980-03-27 Eastman Kodak Co DEVICE FOR TESTING LONG-EXTENDED MATERIAL
DE3028942A1 (en) * 1980-07-30 1982-02-18 Krones Ag Hermann Kronseder Maschinenfabrik, 8402 Neutraubling METHOD AND INSPECTION DEVICE FOR INSPECTING AN OBJECT, IN PARTICULAR A BOTTLE
US4519041A (en) * 1982-05-03 1985-05-21 Honeywell Inc. Real time automated inspection
JPS60159637A (en) * 1984-01-31 1985-08-21 Kirin Brewery Co Ltd Method and device for defect detection
JPS62279931A (en) * 1986-05-29 1987-12-04 レンゴ−株式会社 Defective detector for single-sided corrugated board
DE3620146A1 (en) * 1986-06-14 1987-12-17 Zeiss Carl Fa METHOD FOR TESTING COMPONENTS MADE OF TRANSPARENT MATERIAL FOR SURFACE DEFECTS AND INCLUDES
JPH01239439A (en) * 1988-03-18 1989-09-25 Fuji Photo Film Co Ltd Surface inspecting device
DE3819183A1 (en) * 1988-06-06 1989-12-07 Sick Optik Elektronik Erwin Method for fault-detection in the case of running material webs

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997029368A1 (en) * 1996-02-09 1997-08-14 Unisearch Limited Visual inspection system for leather hide
US6157730A (en) * 1996-02-09 2000-12-05 Roever; Detlef E. Visual inspection system for leather hide

Also Published As

Publication number Publication date
JPH06103276B2 (en) 1994-12-14
JPH04147045A (en) 1992-05-20
CA2052905A1 (en) 1992-04-10
GB2248935A (en) 1992-04-22
FR2667686A1 (en) 1992-04-10
DE4133315A1 (en) 1992-04-16
GB9120957D0 (en) 1991-11-13

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