AU775264B2 - Apparatus for fast detection of X-rays - Google Patents

Apparatus for fast detection of X-rays Download PDF

Info

Publication number
AU775264B2
AU775264B2 AU14033/01A AU1403301A AU775264B2 AU 775264 B2 AU775264 B2 AU 775264B2 AU 14033/01 A AU14033/01 A AU 14033/01A AU 1403301 A AU1403301 A AU 1403301A AU 775264 B2 AU775264 B2 AU 775264B2
Authority
AU
Australia
Prior art keywords
array
ray
rays
inspection system
ray inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
AU14033/01A
Other languages
English (en)
Other versions
AU1403301A (en
Inventor
Andrew James Boyd
John David Burrows
Tony Carter
Geraint Spencer Dermody
Ian David Jupp
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
UK Secretary of State for Defence
Original Assignee
UK Secretary of State for Defence
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by UK Secretary of State for Defence filed Critical UK Secretary of State for Defence
Publication of AU1403301A publication Critical patent/AU1403301A/en
Application granted granted Critical
Publication of AU775264B2 publication Critical patent/AU775264B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AU14033/01A 1999-12-16 2000-11-17 Apparatus for fast detection of X-rays Ceased AU775264B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB9929701 1999-12-16
GB9929701A GB2357414A (en) 1999-12-16 1999-12-16 Fast detection of X-rays using detector arrays and energy discrimination
PCT/GB2000/004361 WO2001044792A2 (en) 1999-12-16 2000-11-17 Apparatus for fast detection of x-rays

Publications (2)

Publication Number Publication Date
AU1403301A AU1403301A (en) 2001-06-25
AU775264B2 true AU775264B2 (en) 2004-07-29

Family

ID=10866407

Family Applications (1)

Application Number Title Priority Date Filing Date
AU14033/01A Ceased AU775264B2 (en) 1999-12-16 2000-11-17 Apparatus for fast detection of X-rays

Country Status (10)

Country Link
EP (1) EP1238265A2 (no)
JP (1) JP2003517602A (no)
CN (1) CN1243972C (no)
AU (1) AU775264B2 (no)
CA (1) CA2394360A1 (no)
GB (1) GB2357414A (no)
HK (1) HK1056394A1 (no)
NO (1) NO20022858L (no)
TW (1) TW507071B (no)
WO (1) WO2001044792A2 (no)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7065175B2 (en) * 2003-03-03 2006-06-20 Varian Medical Systems Technologies, Inc. X-ray diffraction-based scanning system
JP5054518B2 (ja) * 2004-07-08 2012-10-24 パスポート システムズ， インク． 物質の平均原子番号及び質量を求めるための方法及びシステム
KR102171020B1 (ko) * 2013-10-16 2020-10-29 삼성전자주식회사 엑스레이 흡수 필터를 갖는 엑스레이 시스템, 반도체 패키지, 및 트레이
CN106646639A (zh) * 2016-12-02 2017-05-10 北京航星机器制造有限公司 一种可变速射线安检机
EP3553507A1 (en) * 2018-04-13 2019-10-16 Malvern Panalytical B.V. X-ray analysis apparatus
CN115598157A (zh) * 2021-06-25 2023-01-13 中国兵器工业第五九研究所（Cn） 一种基于阵列探测的短波长特征x射线衍射装置和方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5265144A (en) * 1991-01-19 1993-11-23 U.S. Philips Corp. X-ray apparatus
US5394453A (en) * 1992-02-06 1995-02-28 U.S. Philips Corporation Device for measuring the pulse transfer spectrum of elastically scattered X-ray quanta
GB2312507A (en) * 1995-02-08 1997-10-29 Secr Defence X-ray inspection system

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4034602A1 (de) * 1990-06-20 1992-05-07 Philips Patentverwaltung Anordnung zur messung des impulsuebertragsspektrums von roentgenquanten
GB2297835A (en) * 1995-02-08 1996-08-14 Secr Defence Three dimensional detection of contraband using x rays
DE19510168C2 (de) * 1995-03-21 2001-09-13 Heimann Systems Gmbh & Co Verfahren und Vorrichtung zur Bestimmung von kristallinen und polykristallinen Materialien in einem Untersuchungsbereich
GB2318411B (en) * 1996-10-15 1999-03-10 Simage Oy Imaging device for imaging radiation

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5265144A (en) * 1991-01-19 1993-11-23 U.S. Philips Corp. X-ray apparatus
US5394453A (en) * 1992-02-06 1995-02-28 U.S. Philips Corporation Device for measuring the pulse transfer spectrum of elastically scattered X-ray quanta
GB2312507A (en) * 1995-02-08 1997-10-29 Secr Defence X-ray inspection system

Also Published As

Publication number Publication date
CN1434920A (zh) 2003-08-06
NO20022858D0 (no) 2002-06-14
GB9929701D0 (en) 2000-02-09
TW507071B (en) 2002-10-21
HK1056394A1 (en) 2004-02-13
CN1243972C (zh) 2006-03-01
JP2003517602A (ja) 2003-05-27
WO2001044792A3 (en) 2002-03-21
GB2357414A (en) 2001-06-20
EP1238265A2 (en) 2002-09-11
CA2394360A1 (en) 2001-06-21
WO2001044792A2 (en) 2001-06-21
AU1403301A (en) 2001-06-25
NO20022858L (no) 2002-08-15

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