WO2001044792A3 - Apparatus for fast detection of x-rays - Google Patents

Apparatus for fast detection of x-rays Download PDF

Info

Publication number
WO2001044792A3
WO2001044792A3 PCT/GB2000/004361 GB0004361W WO0144792A3 WO 2001044792 A3 WO2001044792 A3 WO 2001044792A3 GB 0004361 W GB0004361 W GB 0004361W WO 0144792 A3 WO0144792 A3 WO 0144792A3
Authority
WO
WIPO (PCT)
Prior art keywords
monochromatic
diffraction
ray
polychromatic
quasi
Prior art date
Application number
PCT/GB2000/004361
Other languages
French (fr)
Other versions
WO2001044792A2 (en
Inventor
Tony Carter
Ian David Jupp
Geraint Spencer Dermody
Andrew James Boyd
John David Burrows
Original Assignee
Secr Defence
Tony Carter
Ian David Jupp
Geraint Spencer Dermody
Andrew James Boyd
John David Burrows
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Secr Defence, Tony Carter, Ian David Jupp, Geraint Spencer Dermody, Andrew James Boyd, John David Burrows filed Critical Secr Defence
Priority to CA002394360A priority Critical patent/CA2394360A1/en
Priority to AU14033/01A priority patent/AU775264B2/en
Priority to EP00976149A priority patent/EP1238265A2/en
Priority to JP2001545831A priority patent/JP2003517602A/en
Publication of WO2001044792A2 publication Critical patent/WO2001044792A2/en
Publication of WO2001044792A3 publication Critical patent/WO2001044792A3/en
Priority to NO20022858A priority patent/NO20022858L/en
Priority to HK03108627A priority patent/HK1056394A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

This invention relates to the field of X-ray inspection systems and more particularly to those that use X-ray diffraction to analyse an object under inspection. Essential to prior art diffraction systems employing angular dispersion is the provision of a monochromatic incident X-ray beam. Conventionally, this is provided by filtering out the desired spectral peak from a polychromatic or quasi-monochromatic X-ray beam by means of the balanced filter technique. There are disadvantages to this technique in that it requires two diffraction images to be subtracted form one another in order to get the desired spectral peak. This results in beam attenuation and data of poor statistical quality. The invention proposes the use of an array of semiconductor detector elements and associated electronics which are capable of extracting an essentially monochromatic diffraction pattern from scattered polychromatic or quasi-monochromatic X-rays.
PCT/GB2000/004361 1999-12-16 2000-11-17 Apparatus for fast detection of x-rays WO2001044792A2 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
CA002394360A CA2394360A1 (en) 1999-12-16 2000-11-17 Apparatus for fast detection of x-rays
AU14033/01A AU775264B2 (en) 1999-12-16 2000-11-17 Apparatus for fast detection of X-rays
EP00976149A EP1238265A2 (en) 1999-12-16 2000-11-17 Apparatus for fast detection of x-rays
JP2001545831A JP2003517602A (en) 1999-12-16 2000-11-17 Apparatus for high-speed detection of X-rays
NO20022858A NO20022858L (en) 1999-12-16 2002-06-14 Device for rapid detection of X-rays
HK03108627A HK1056394A1 (en) 1999-12-16 2003-11-26 Apparatus for fast detection of x-rays

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB9929701A GB2357414A (en) 1999-12-16 1999-12-16 Fast detection of X-rays using detector arrays and energy discrimination
GB9929701.2 1999-12-16

Publications (2)

Publication Number Publication Date
WO2001044792A2 WO2001044792A2 (en) 2001-06-21
WO2001044792A3 true WO2001044792A3 (en) 2002-03-21

Family

ID=10866407

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/GB2000/004361 WO2001044792A2 (en) 1999-12-16 2000-11-17 Apparatus for fast detection of x-rays

Country Status (10)

Country Link
EP (1) EP1238265A2 (en)
JP (1) JP2003517602A (en)
CN (1) CN1243972C (en)
AU (1) AU775264B2 (en)
CA (1) CA2394360A1 (en)
GB (1) GB2357414A (en)
HK (1) HK1056394A1 (en)
NO (1) NO20022858L (en)
TW (1) TW507071B (en)
WO (1) WO2001044792A2 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7065175B2 (en) * 2003-03-03 2006-06-20 Varian Medical Systems Technologies, Inc. X-ray diffraction-based scanning system
US7286638B2 (en) * 2004-07-08 2007-10-23 Passport Systems, Inc. Methods and systems for determining the average atomic number and mass of materials
KR102171020B1 (en) 2013-10-16 2020-10-29 삼성전자주식회사 X-ray system, semiconductor package, and tray having X-ray absorption filter
CN106646639A (en) * 2016-12-02 2017-05-10 北京航星机器制造有限公司 Variable speed ray security inspection machine
EP3553507A1 (en) * 2018-04-13 2019-10-16 Malvern Panalytical B.V. X-ray analysis apparatus
CN115598157A (en) * 2021-06-25 2023-01-13 中国兵器工业第五九研究所（Cn） Short-wavelength characteristic X-ray diffraction device and method based on array detection

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5265144A (en) * 1991-01-19 1993-11-23 U.S. Philips Corp. X-ray apparatus
WO1998016853A1 (en) * 1996-10-15 1998-04-23 Simage Oy Imaging device for imaging radiation
US5787145A (en) * 1995-03-21 1998-07-28 Heimann Systems Gmbh Method and arrangement for identifying crystalline and polycrystalline materials

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4034602A1 (en) * 1990-06-20 1992-05-07 Philips Patentverwaltung ARRANGEMENT FOR MEASURING THE IMPULSE TRANSMISSION SPECTRUM OF ROENTGEN QUANTS
EP0556887B1 (en) * 1992-02-06 1998-07-08 Philips Patentverwaltung GmbH Device for the measurement of the pulse transfer spectrum of X-ray quantor
GB2312507B (en) * 1995-02-08 1999-08-25 Secr Defence X-Ray Inspection System
GB2297835A (en) * 1995-02-08 1996-08-14 Secr Defence Three dimensional detection of contraband using x rays

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5265144A (en) * 1991-01-19 1993-11-23 U.S. Philips Corp. X-ray apparatus
US5787145A (en) * 1995-03-21 1998-07-28 Heimann Systems Gmbh Method and arrangement for identifying crystalline and polycrystalline materials
WO1998016853A1 (en) * 1996-10-15 1998-04-23 Simage Oy Imaging device for imaging radiation

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
MALDEN C H ET AL: "A CdZnTe array for the detection of explosives in baggage by energy-dispersive X-ray diffraction signatures at multiple scatter angles", NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, SECTION - A: ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT, NORTH-HOLLAND PUBLISHING COMPANY. AMSTERDAM, NL, VOL. 449, NR. 1-2, PAGE(S) 408-415, ISSN: 0168-9002, XP004208093 *

Also Published As

Publication number Publication date
WO2001044792A2 (en) 2001-06-21
GB2357414A (en) 2001-06-20
CN1434920A (en) 2003-08-06
AU1403301A (en) 2001-06-25
AU775264B2 (en) 2004-07-29
GB9929701D0 (en) 2000-02-09
NO20022858D0 (en) 2002-06-14
HK1056394A1 (en) 2004-02-13
JP2003517602A (en) 2003-05-27
EP1238265A2 (en) 2002-09-11
NO20022858L (en) 2002-08-15
CA2394360A1 (en) 2001-06-21
TW507071B (en) 2002-10-21
CN1243972C (en) 2006-03-01

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