NO20022858L - Anordning for rask påvisning av röntgenstråler - Google Patents

Anordning for rask påvisning av röntgenstråler

Info

Publication number
NO20022858L
NO20022858L NO20022858A NO20022858A NO20022858L NO 20022858 L NO20022858 L NO 20022858L NO 20022858 A NO20022858 A NO 20022858A NO 20022858 A NO20022858 A NO 20022858A NO 20022858 L NO20022858 L NO 20022858L
Authority
NO
Norway
Prior art keywords
rays
rapid detection
rapid
detection
Prior art date
Application number
NO20022858A
Other languages
English (en)
Other versions
NO20022858D0 (no
Inventor
Tony Carter
Ian David Jupp
Geraint Spencer Dermody
Andrew James Boyd
John David Burrows
Original Assignee
Dstl Sec Dep For Defence In He
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dstl Sec Dep For Defence In He filed Critical Dstl Sec Dep For Defence In He
Publication of NO20022858D0 publication Critical patent/NO20022858D0/no
Publication of NO20022858L publication Critical patent/NO20022858L/no

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
NO20022858A 1999-12-16 2002-06-14 Anordning for rask påvisning av röntgenstråler NO20022858L (no)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB9929701A GB2357414A (en) 1999-12-16 1999-12-16 Fast detection of X-rays using detector arrays and energy discrimination
PCT/GB2000/004361 WO2001044792A2 (en) 1999-12-16 2000-11-17 Apparatus for fast detection of x-rays

Publications (2)

Publication Number Publication Date
NO20022858D0 NO20022858D0 (no) 2002-06-14
NO20022858L true NO20022858L (no) 2002-08-15

Family

ID=10866407

Family Applications (1)

Application Number Title Priority Date Filing Date
NO20022858A NO20022858L (no) 1999-12-16 2002-06-14 Anordning for rask påvisning av röntgenstråler

Country Status (10)

Country Link
EP (1) EP1238265A2 (no)
JP (1) JP2003517602A (no)
CN (1) CN1243972C (no)
AU (1) AU775264B2 (no)
CA (1) CA2394360A1 (no)
GB (1) GB2357414A (no)
HK (1) HK1056394A1 (no)
NO (1) NO20022858L (no)
TW (1) TW507071B (no)
WO (1) WO2001044792A2 (no)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7065175B2 (en) * 2003-03-03 2006-06-20 Varian Medical Systems Technologies, Inc. X-ray diffraction-based scanning system
EP1766380B1 (en) * 2004-07-08 2020-06-10 Passport Systems, Inc. Methods and systems for determining the average atomic number and mass of materials
KR102171020B1 (ko) * 2013-10-16 2020-10-29 삼성전자주식회사 엑스레이 흡수 필터를 갖는 엑스레이 시스템, 반도체 패키지, 및 트레이
CN106646639A (zh) * 2016-12-02 2017-05-10 北京航星机器制造有限公司 一种可变速射线安检机
EP3553507A1 (en) * 2018-04-13 2019-10-16 Malvern Panalytical B.V. X-ray analysis apparatus
CN115598157A (zh) * 2021-06-25 2023-01-13 中国兵器工业第五九研究所（Cn） 一种基于阵列探测的短波长特征x射线衍射装置和方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4034602A1 (de) * 1990-06-20 1992-05-07 Philips Patentverwaltung Anordnung zur messung des impulsuebertragsspektrums von roentgenquanten
DE4101544A1 (de) * 1991-01-19 1992-07-23 Philips Patentverwaltung Roentgengeraet
EP0556887B1 (de) * 1992-02-06 1998-07-08 Philips Patentverwaltung GmbH Anordnung zum Messen des Impulsübertragsspektrums von elastisch gestreuten Röntgenquanten
GB2297835A (en) * 1995-02-08 1996-08-14 Secr Defence Three dimensional detection of contraband using x rays
GB2312507B (en) * 1995-02-08 1999-08-25 Secr Defence X-Ray Inspection System
DE19510168C2 (de) * 1995-03-21 2001-09-13 Heimann Systems Gmbh & Co Verfahren und Vorrichtung zur Bestimmung von kristallinen und polykristallinen Materialien in einem Untersuchungsbereich
GB2318411B (en) * 1996-10-15 1999-03-10 Simage Oy Imaging device for imaging radiation

Also Published As

Publication number Publication date
GB2357414A (en) 2001-06-20
AU1403301A (en) 2001-06-25
WO2001044792A2 (en) 2001-06-21
WO2001044792A3 (en) 2002-03-21
CN1434920A (zh) 2003-08-06
AU775264B2 (en) 2004-07-29
CA2394360A1 (en) 2001-06-21
CN1243972C (zh) 2006-03-01
GB9929701D0 (en) 2000-02-09
TW507071B (en) 2002-10-21
JP2003517602A (ja) 2003-05-27
HK1056394A1 (en) 2004-02-13
EP1238265A2 (en) 2002-09-11
NO20022858D0 (no) 2002-06-14

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Legal Events

Date Code Title Description
FC2A Withdrawal, rejection or dismissal of laid open patent application