AU5961500A - Component geometry-independent device for testing electronic components with movable contact means - Google Patents

Component geometry-independent device for testing electronic components with movable contact means

Info

Publication number
AU5961500A
AU5961500A AU59615/00A AU5961500A AU5961500A AU 5961500 A AU5961500 A AU 5961500A AU 59615/00 A AU59615/00 A AU 59615/00A AU 5961500 A AU5961500 A AU 5961500A AU 5961500 A AU5961500 A AU 5961500A
Authority
AU
Australia
Prior art keywords
electronic components
movable contact
contact means
independent device
testing electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU59615/00A
Inventor
Hans-Georg Meissner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DUAL-M-TECH AG
Original Assignee
DUAL M TECH AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by DUAL M TECH AG filed Critical DUAL M TECH AG
Publication of AU5961500A publication Critical patent/AU5961500A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
AU59615/00A 1999-05-16 2000-05-16 Component geometry-independent device for testing electronic components with movable contact means Abandoned AU5961500A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE29908399 1999-05-16
DE29908399U DE29908399U1 (en) 1999-05-16 1999-05-16 Device geometry-independent device for testing electronic components with sliding contact means
PCT/DE2000/001522 WO2000070355A1 (en) 1999-05-16 2000-05-16 Component geometry-independent device for testing electronic components with movable contact means

Publications (1)

Publication Number Publication Date
AU5961500A true AU5961500A (en) 2000-12-05

Family

ID=8073440

Family Applications (1)

Application Number Title Priority Date Filing Date
AU59615/00A Abandoned AU5961500A (en) 1999-05-16 2000-05-16 Component geometry-independent device for testing electronic components with movable contact means

Country Status (3)

Country Link
AU (1) AU5961500A (en)
DE (2) DE29908399U1 (en)
WO (1) WO2000070355A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE20214629U1 (en) * 2002-09-20 2002-11-21 Esmo Ag Sliding mounting plate
CN106405412B (en) * 2016-11-28 2023-09-19 温州大学 Circuit breaker characteristic test loading table

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3253069B2 (en) * 1990-07-25 2002-02-04 キヤノン株式会社 Inspection method of part to be measured using electrical connection member
US5189363A (en) * 1990-09-14 1993-02-23 Ibm Corporation Integrated circuit testing system having a cantilevered contact lead probe pattern mounted on a flexible tape for interconnecting an integrated circuit to a tester
US5543724A (en) * 1994-10-03 1996-08-06 Motorola, Inc. Method and apparatus for locating conductive features and testing semiconductor devices

Also Published As

Publication number Publication date
WO2000070355A1 (en) 2000-11-23
DE29908399U1 (en) 1999-07-15
DE10081321D2 (en) 2001-08-09

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase