DE10081321D2 - Device geometry-independent device for testing electronic components with sliding contact means - Google Patents

Device geometry-independent device for testing electronic components with sliding contact means

Info

Publication number
DE10081321D2
DE10081321D2 DE10081321T DE10081321T DE10081321D2 DE 10081321 D2 DE10081321 D2 DE 10081321D2 DE 10081321 T DE10081321 T DE 10081321T DE 10081321 T DE10081321 T DE 10081321T DE 10081321 D2 DE10081321 D2 DE 10081321D2
Authority
DE
Germany
Prior art keywords
electronic components
sliding contact
contact means
testing electronic
geometry
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE10081321T
Other languages
German (de)
Inventor
Hans-Georg Meissner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DUAL M TECH AG
Original Assignee
DUAL M TECH AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by DUAL M TECH AG filed Critical DUAL M TECH AG
Priority to DE10081321T priority Critical patent/DE10081321D2/en
Application granted granted Critical
Publication of DE10081321D2 publication Critical patent/DE10081321D2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2886Features relating to contacting the IC under test, e.g. probe heads; chucks
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
DE10081321T 1999-05-16 2000-05-16 Device geometry-independent device for testing electronic components with sliding contact means Ceased DE10081321D2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE10081321T DE10081321D2 (en) 1999-05-16 2000-05-16 Device geometry-independent device for testing electronic components with sliding contact means

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE29908399U DE29908399U1 (en) 1999-05-16 1999-05-16 Device geometry-independent device for testing electronic components with sliding contact means
DE10081321T DE10081321D2 (en) 1999-05-16 2000-05-16 Device geometry-independent device for testing electronic components with sliding contact means
PCT/DE2000/001522 WO2000070355A1 (en) 1999-05-16 2000-05-16 Component geometry-independent device for testing electronic components with movable contact means

Publications (1)

Publication Number Publication Date
DE10081321D2 true DE10081321D2 (en) 2001-08-09

Family

ID=8073440

Family Applications (2)

Application Number Title Priority Date Filing Date
DE29908399U Expired - Lifetime DE29908399U1 (en) 1999-05-16 1999-05-16 Device geometry-independent device for testing electronic components with sliding contact means
DE10081321T Ceased DE10081321D2 (en) 1999-05-16 2000-05-16 Device geometry-independent device for testing electronic components with sliding contact means

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE29908399U Expired - Lifetime DE29908399U1 (en) 1999-05-16 1999-05-16 Device geometry-independent device for testing electronic components with sliding contact means

Country Status (3)

Country Link
AU (1) AU5961500A (en)
DE (2) DE29908399U1 (en)
WO (1) WO2000070355A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE20214629U1 (en) * 2002-09-20 2002-11-21 esmo AG, 83022 Rosenheim Sliding mounting plate
CN106405412B (en) * 2016-11-28 2023-09-19 温州大学 Circuit breaker characteristic test loading table

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3253069B2 (en) * 1990-07-25 2002-02-04 キヤノン株式会社 Inspection method of part to be measured using electrical connection member
US5189363A (en) * 1990-09-14 1993-02-23 Ibm Corporation Integrated circuit testing system having a cantilevered contact lead probe pattern mounted on a flexible tape for interconnecting an integrated circuit to a tester
US5543724A (en) * 1994-10-03 1996-08-06 Motorola, Inc. Method and apparatus for locating conductive features and testing semiconductor devices

Also Published As

Publication number Publication date
AU5961500A (en) 2000-12-05
DE29908399U1 (en) 1999-07-15
WO2000070355A1 (en) 2000-11-23

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Legal Events

Date Code Title Description
8131 Rejection