DE29908399U1 - Device geometry-independent device for testing electronic components with sliding contact means - Google Patents

Device geometry-independent device for testing electronic components with sliding contact means

Info

Publication number
DE29908399U1
DE29908399U1 DE29908399U DE29908399U DE29908399U1 DE 29908399 U1 DE29908399 U1 DE 29908399U1 DE 29908399 U DE29908399 U DE 29908399U DE 29908399 U DE29908399 U DE 29908399U DE 29908399 U1 DE29908399 U1 DE 29908399U1
Authority
DE
Germany
Prior art keywords
electronic components
sliding contact
contact means
testing electronic
geometry
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE29908399U
Other languages
German (de)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sysko GmbH
Original Assignee
MEISNER
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MEISNER filed Critical MEISNER
Priority to DE29908399U priority Critical patent/DE29908399U1/en
Publication of DE29908399U1 publication Critical patent/DE29908399U1/en
Priority to DE10081321T priority patent/DE10081321D2/en
Priority to PCT/DE2000/001522 priority patent/WO2000070355A1/en
Priority to AU59615/00A priority patent/AU5961500A/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
DE29908399U 1999-05-16 1999-05-16 Device geometry-independent device for testing electronic components with sliding contact means Expired - Lifetime DE29908399U1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
DE29908399U DE29908399U1 (en) 1999-05-16 1999-05-16 Device geometry-independent device for testing electronic components with sliding contact means
DE10081321T DE10081321D2 (en) 1999-05-16 2000-05-16 Device geometry-independent device for testing electronic components with sliding contact means
PCT/DE2000/001522 WO2000070355A1 (en) 1999-05-16 2000-05-16 Component geometry-independent device for testing electronic components with movable contact means
AU59615/00A AU5961500A (en) 1999-05-16 2000-05-16 Component geometry-independent device for testing electronic components with movable contact means

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE29908399U DE29908399U1 (en) 1999-05-16 1999-05-16 Device geometry-independent device for testing electronic components with sliding contact means

Publications (1)

Publication Number Publication Date
DE29908399U1 true DE29908399U1 (en) 1999-07-15

Family

ID=8073440

Family Applications (2)

Application Number Title Priority Date Filing Date
DE29908399U Expired - Lifetime DE29908399U1 (en) 1999-05-16 1999-05-16 Device geometry-independent device for testing electronic components with sliding contact means
DE10081321T Ceased DE10081321D2 (en) 1999-05-16 2000-05-16 Device geometry-independent device for testing electronic components with sliding contact means

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE10081321T Ceased DE10081321D2 (en) 1999-05-16 2000-05-16 Device geometry-independent device for testing electronic components with sliding contact means

Country Status (3)

Country Link
AU (1) AU5961500A (en)
DE (2) DE29908399U1 (en)
WO (1) WO2000070355A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE20214629U1 (en) 2002-09-20 2002-11-21 Esmo Ag Sliding mounting plate
CN106405412B (en) * 2016-11-28 2023-09-19 温州大学 Circuit breaker characteristic test loading table

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3253069B2 (en) * 1990-07-25 2002-02-04 キヤノン株式会社 Inspection method of part to be measured using electrical connection member
US5189363A (en) * 1990-09-14 1993-02-23 Ibm Corporation Integrated circuit testing system having a cantilevered contact lead probe pattern mounted on a flexible tape for interconnecting an integrated circuit to a tester
US5543724A (en) * 1994-10-03 1996-08-06 Motorola, Inc. Method and apparatus for locating conductive features and testing semiconductor devices

Also Published As

Publication number Publication date
WO2000070355A1 (en) 2000-11-23
DE10081321D2 (en) 2001-08-09
AU5961500A (en) 2000-12-05

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Legal Events

Date Code Title Description
R207 Utility model specification

Effective date: 19990826

R081 Change of applicant/patentee

Owner name: SYSKO GMBH, DE

Free format text: FORMER OWNER: MEISSNER, HANS-GEORG, DR., 83233 BERNAU, DE

Effective date: 20000608

R150 Term of protection extended to 6 years

Effective date: 20020725

R151 Term of protection extended to 8 years

Effective date: 20050712

R081 Change of applicant/patentee

Owner name: SYSKO GMBH, DE

Free format text: FORMER OWNER: DUAL-M-TECH AG, 83209 PRIEN, DE

Effective date: 20061002

R152 Term of protection extended to 10 years

Effective date: 20070725

R071 Expiry of right