AU5149700A - Method and apparatus for testing of sheet material - Google Patents

Method and apparatus for testing of sheet material

Info

Publication number
AU5149700A
AU5149700A AU51497/00A AU5149700A AU5149700A AU 5149700 A AU5149700 A AU 5149700A AU 51497/00 A AU51497/00 A AU 51497/00A AU 5149700 A AU5149700 A AU 5149700A AU 5149700 A AU5149700 A AU 5149700A
Authority
AU
Australia
Prior art keywords
testing
sheet material
sheet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU51497/00A
Other languages
English (en)
Inventor
Austin R. Blew
Alexander Eidukonis
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lehighton Electronics Inc
Original Assignee
Lehighton Electronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lehighton Electronics Inc filed Critical Lehighton Electronics Inc
Publication of AU5149700A publication Critical patent/AU5149700A/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/14—Vertical carrier comprising wall type elements whereby the substrates are horizontally supported, e.g. comprising sidewalls
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
    • H10P72/0604—Process monitoring, e.g. flow or thickness monitoring
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
    • H10P72/0606—Position monitoring, e.g. misposition detection or presence detection
    • H10P72/0608—Position monitoring, e.g. misposition detection or presence detection of substrates stored in a container, a magazine, a carrier, a boat or the like
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/19—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
    • H10P72/1908—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers specially adapted for containing substrates other than wafers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/34—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H10P72/3411—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers

Landscapes

  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
AU51497/00A 1999-05-21 2000-05-19 Method and apparatus for testing of sheet material Abandoned AU5149700A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/316,677 US6202482B1 (en) 1998-03-23 1999-05-21 Method and apparatus for testing of sheet material
US09316677 1999-05-21
PCT/US2000/013926 WO2000072361A2 (en) 1999-05-21 2000-05-19 Apparatus and method for testing of sheet material

Publications (1)

Publication Number Publication Date
AU5149700A true AU5149700A (en) 2000-12-12

Family

ID=23230155

Family Applications (1)

Application Number Title Priority Date Filing Date
AU51497/00A Abandoned AU5149700A (en) 1999-05-21 2000-05-19 Method and apparatus for testing of sheet material

Country Status (6)

Country Link
US (4) US6202482B1 (https=)
EP (1) EP1194764A2 (https=)
JP (1) JP4931280B2 (https=)
KR (1) KR100718029B1 (https=)
AU (1) AU5149700A (https=)
WO (1) WO2000072361A2 (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6631935B1 (en) * 2000-08-04 2003-10-14 Tru-Si Technologies, Inc. Detection and handling of semiconductor wafer and wafer-like objects
US6935830B2 (en) * 2001-07-13 2005-08-30 Tru-Si Technologies, Inc. Alignment of semiconductor wafers and other articles
US6615113B2 (en) * 2001-07-13 2003-09-02 Tru-Si Technologies, Inc. Articles holders with sensors detecting a type of article held by the holder
US6638004B2 (en) 2001-07-13 2003-10-28 Tru-Si Technologies, Inc. Article holders and article positioning methods
US8207748B2 (en) * 2004-08-11 2012-06-26 Lehighton Electronics, Inc. Device and handling system for measurement of mobility and sheet charge density
KR101319293B1 (ko) 2005-11-14 2013-10-29 리하이톤 일렉트로닉스, 인크. 시트 컨덕턴스 및 시트 저항 측정 시스템
TW201044487A (en) * 2009-03-30 2010-12-16 Automation Tooling Syst Systems and methods for handling wafers
US20150316387A1 (en) 2014-04-30 2015-11-05 Toyota Motor Engineering & Manufacturing North America, Inc. Detailed map format for autonomous driving
US20150316386A1 (en) 2014-04-30 2015-11-05 Toyota Motor Engineering & Manufacturing North America, Inc. Detailed map format for autonomous driving
US10867824B2 (en) 2018-05-29 2020-12-15 Taiwan Semiconductor Manufacturing Co., Ltd. Substrate detecting system in a substrate storage container

Family Cites Families (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL169693C (nl) 1974-10-09 1982-08-16 Nederlanden Staat Detectie-inrichting.
US4618938A (en) 1984-02-22 1986-10-21 Kla Instruments Corporation Method and apparatus for automatic wafer inspection
US4636634A (en) 1984-08-28 1987-01-13 Veeco Integrated Automation, Inc. Apparatus with intelligent bins indicating the presence and identity of stored coded articles
JPH0620922B2 (ja) * 1984-10-19 1994-03-23 株式会社東芝 被検物の搬送装置
US4856904A (en) 1985-01-21 1989-08-15 Nikon Corporation Wafer inspecting apparatus
US4818169A (en) 1985-05-17 1989-04-04 Schram Richard R Automated wafer inspection system
US4893322A (en) * 1985-11-15 1990-01-09 Medrad, Inc. Film changer
EP0256502A3 (en) * 1986-08-15 1989-09-27 Kabushiki Kaisha Toshiba Image forming apparatus with positioning-mark forming function
US4786042A (en) * 1987-04-01 1988-11-22 Xerox Corporation Adjustable size sensing sheet cassette
US4914452A (en) * 1987-05-08 1990-04-03 Ricoh Company, Ltd. Ink sheet/recording paper cassette
JPS6443458A (en) * 1987-08-11 1989-02-15 Nitto Denko Corp Stick cutter for tacky tape with respect to thin board
US5044752A (en) 1989-06-30 1991-09-03 General Signal Corporation Apparatus and process for positioning wafers in receiving devices
US5111963A (en) * 1991-05-24 1992-05-12 Frederick J. Stingel Container storage and dispensing apparatus
US5233195A (en) * 1992-02-25 1993-08-03 Abb Process Automation, Inc. Methods and apparatus for measuring characteristics of moving webs
KR940006241A (ko) 1992-06-05 1994-03-23 이노우에 아키라 기판이재장치 및 이재방법
JP3131750B2 (ja) 1992-10-20 2001-02-05 東京エレクトロン株式会社 被処理体検出装置及び方法
US5479108A (en) 1992-11-25 1995-12-26 David Cheng Method and apparatus for handling wafers
KR100291110B1 (ko) * 1993-06-19 2001-06-01 히가시 데쓰로 프로우브장치 및 그것을 사용한 피검사체의 검사방법
US5488292A (en) 1993-10-04 1996-01-30 Tokyo Seimitsu Co., Ltd. Wafer inspecting system
US5466945A (en) 1994-03-23 1995-11-14 Eaton Corporation Apparatus for detecting proper positioning of objects in a holder
JPH08250558A (ja) * 1995-03-10 1996-09-27 Tokyo Seimitsu Co Ltd ウェーハプローバ
US5609333A (en) 1995-10-05 1997-03-11 Xerox Corporation Sheet stack height control system
KR100193807B1 (ko) * 1995-10-20 1999-06-15 윤종용 용지감지에 따른 전사전압 자동변경장치 및 그 방법
JPH09306970A (ja) * 1996-05-10 1997-11-28 Komatsu Ltd ウエハカセット設置装置及びウエハ検査装置
US5738014A (en) * 1996-07-31 1998-04-14 Agfa Division, Bayer Corporation Method and apparatus for making lithographic printing plates in an automated computer to plate imaging system
US5961226A (en) * 1996-08-16 1999-10-05 Ricoh Company, Ltd. Printing apparatus
US5905302A (en) * 1996-11-18 1999-05-18 Applied Materials, Inc. Loadlock cassette with wafer support rails
US6421139B1 (en) * 1997-02-28 2002-07-16 Canon Kabushiki Kaisha Image forming apparatus for forming image on free-size sheet having arbitrary size
JPH10261676A (ja) * 1997-03-17 1998-09-29 Sharp Corp 半導体のウエハテスト方法
DE19728478C2 (de) * 1997-07-03 2003-08-21 Brooks Pri Automation Germany Verfahren zur optoelektronischen Erkennung von scheibenförmigen Objekten unter Nutzung derer Stirnseiten
JPH1138083A (ja) * 1997-07-14 1999-02-12 Advantest Corp Ｉｃテストハンドラ
JPH11121577A (ja) * 1997-10-08 1999-04-30 Mecs Corp 半導体ウェハの検査システム
DE19758396A1 (de) * 1997-12-23 1999-07-01 Arnold & Richter Kg Laufbildkamera-Kassetten-System
EP1066649A1 (en) * 1998-03-23 2001-01-10 Lehighton Electronics Inc. Method and apparatus for testing of sheet material
DE19814046C1 (de) * 1998-03-30 1999-11-18 Jenoptik Jena Gmbh Anordnung zur Detektion von scheibenförmigen Objekten in einer Kassette
US6280103B1 (en) * 1999-09-22 2001-08-28 Concord Camera Corp. APS camera for ensuring the cassett indicator is in the parked position

Also Published As

Publication number Publication date
JP2003500854A (ja) 2003-01-07
KR20020039267A (ko) 2002-05-25
JP4931280B2 (ja) 2012-05-16
EP1194764A2 (en) 2002-04-10
US20030000301A1 (en) 2003-01-02
US20010025528A1 (en) 2001-10-04
US6711948B2 (en) 2004-03-30
US6443002B2 (en) 2002-09-03
US6202482B1 (en) 2001-03-20
US20030000302A1 (en) 2003-01-02
KR100718029B1 (ko) 2007-05-16
WO2000072361A9 (en) 2002-08-29
WO2000072361A3 (en) 2001-11-15
WO2000072361A2 (en) 2000-11-30

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase