AU2001292780A1 - A non-intrusive method and apparatus for characterizing particles based on scattering of elliptically polarized radiation - Google Patents

A non-intrusive method and apparatus for characterizing particles based on scattering of elliptically polarized radiation

Info

Publication number
AU2001292780A1
AU2001292780A1 AU2001292780A AU9278001A AU2001292780A1 AU 2001292780 A1 AU2001292780 A1 AU 2001292780A1 AU 2001292780 A AU2001292780 A AU 2001292780A AU 9278001 A AU9278001 A AU 9278001A AU 2001292780 A1 AU2001292780 A1 AU 2001292780A1
Authority
AU
Australia
Prior art keywords
scattering
elliptically polarized
particles based
polarized radiation
characterizing particles
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001292780A
Other languages
English (en)
Inventor
Sivakumar Manickavasagam
M. Pinar Menguc
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of AU2001292780A1 publication Critical patent/AU2001292780A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AU2001292780A 2000-09-20 2001-09-19 A non-intrusive method and apparatus for characterizing particles based on scattering of elliptically polarized radiation Abandoned AU2001292780A1 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US23386400P 2000-09-20 2000-09-20
US23406100P 2000-09-20 2000-09-20
US60/233,864 2000-09-20
US60/234,061 2000-09-20
PCT/US2001/029240 WO2002025247A2 (fr) 2000-09-20 2001-09-19 Procede et appareil non intrusifs permettant de caracteriser des particules par diffusion d'elements matriciels au moyen d'une radiation polarisee elliptiquement

Publications (1)

Publication Number Publication Date
AU2001292780A1 true AU2001292780A1 (en) 2002-04-02

Family

ID=26927309

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001292780A Abandoned AU2001292780A1 (en) 2000-09-20 2001-09-19 A non-intrusive method and apparatus for characterizing particles based on scattering of elliptically polarized radiation

Country Status (3)

Country Link
US (1) US6721051B2 (fr)
AU (1) AU2001292780A1 (fr)
WO (1) WO2002025247A2 (fr)

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JP2005517263A (ja) * 2002-02-07 2005-06-09 サムスン　エレクトロニクス　カンパニー　リミテッド モード表示情報が記録された情報保存媒体、その再生装置および再生方法
US7106327B2 (en) * 2002-11-26 2006-09-12 The Trustees Of Columbia University In The City Of New York Systems and methods for modeling the impact of a medium on the appearances of encompassed light sources
WO2005008195A2 (fr) * 2003-07-16 2005-01-27 Mcgill University Quantification de proprietes optiques dans des milieux de dispersion fondee sur l'analyse fractale de mesures de la repartition de photons
WO2005114143A1 (fr) * 2004-05-12 2005-12-01 Pioneer Hi-Bred International, Inc. Analyseur nir non destructif d'un ou de plusieurs germes, et procede correspondant
US7274457B2 (en) 2004-05-12 2007-09-25 Pioneer Hi-Bred International, Inc. Non-destructive derivation of weight of single seed or several seeds
US7274456B2 (en) 2004-05-12 2007-09-25 Pioneer Hi-Bred International, Inc. Non-destructive single seed or several seeds NIR analyzer and method
US7630075B2 (en) * 2004-09-27 2009-12-08 Honeywell International Inc. Circular polarization illumination based analyzer system
JP3909363B2 (ja) * 2005-03-28 2007-04-25 オムロン株式会社 分光偏光計測方法
DE102005025183A1 (de) * 2005-06-01 2006-12-07 Sick Engineering Gmbh Partikelkonzentrations-Messvorrichtung und Justageverfahren hierfür
DE102005025181A1 (de) * 2005-06-01 2006-12-07 Sick Engineering Gmbh Partikelkonzentrations-Messvorrichtung und Messverfahren
WO2007120181A2 (fr) * 2005-10-03 2007-10-25 Henry M. Jackson Foundation For The Advancement Of Military Medicine, Inc. Procédé et appareil permettant de mesurer des paramètres de la matrice de mueller relatifs à la diffusion d'une lumière polarisée
WO2007111159A1 (fr) * 2006-03-20 2007-10-04 National University Corporation Tokyo University Of Agriculture And Technology Dispositif, procede et unite de mesure de caracteristique optique
US7495763B2 (en) * 2006-03-23 2009-02-24 Hach Company Dual function measurement system
JP4944859B2 (ja) * 2008-09-26 2012-06-06 株式会社堀場製作所 粒子物性測定装置
JP5002564B2 (ja) * 2008-09-26 2012-08-15 株式会社堀場製作所 粒子物性測定装置
JP5514490B2 (ja) * 2008-09-26 2014-06-04 株式会社堀場製作所 粒子物性測定装置
CN102159934A (zh) * 2008-09-26 2011-08-17 株式会社堀场制作所 颗粒物性测量装置
JP5086958B2 (ja) * 2008-09-26 2012-11-28 株式会社堀場製作所 粒子物性測定装置
IT1394971B1 (it) * 2009-07-31 2012-08-07 Gen Impianti S R L Metodo e apparecchiatura per determinare dimensioni e composizione di un particolato in un flusso di fumi
KR20140128741A (ko) * 2013-04-29 2014-11-06 삼성디스플레이 주식회사 결정화 얼룩 검출 장치
DE102013217157A1 (de) * 2013-08-28 2015-03-05 Siemens Healthcare Diagnostics Products Gmbh Analyseverfahren zur Ermittlung der Typen und Konzentrationen biologischer Partikel
WO2015106118A1 (fr) 2014-01-09 2015-07-16 Sonitec Llc Systèmes et méthodes utilisant des ultrasons pour un traitement
US9823183B2 (en) * 2015-09-15 2017-11-21 Ut-Battelle, Llc Extending the range of turbidity measurement using polarimetry
CN107300514B (zh) * 2017-06-13 2019-07-09 南京航空航天大学 利用单频调制激光辐照技术测量球形颗粒分形聚集特征参数的方法
CN107271336B (zh) * 2017-06-13 2019-07-09 南京航空航天大学 基于连续激光多角度散射测量的球形颗粒分形聚集特征参数的反演方法
GB201820796D0 (en) * 2018-12-20 2019-02-06 Dublin Institute Of Tech Imaging of biological tissue
FR3100333B1 (fr) * 2019-09-03 2021-09-17 Cordouan Tech Sas Dispositif et procédé de détermination de paramètres caractéristiques des dimensions de nanoparticules
JPWO2022168555A1 (fr) * 2021-02-02 2022-08-11

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US5037202A (en) 1990-07-02 1991-08-06 International Business Machines Corporation Measurement of size and refractive index of particles using the complex forward-scattered electromagnetic field
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US5657126A (en) 1992-12-21 1997-08-12 The Board Of Regents Of The University Of Nebraska Ellipsometer
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US6011626A (en) * 1997-03-20 2000-01-04 The Regents Of The University Of California Characterization of highly scattering media by measurement of diffusely backscattered polarized light
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IT1306911B1 (it) * 1998-06-30 2001-10-11 Stmicroelettronica Srl Metodo per misurare lo spessore di uno strato di silicio danneggiatoda attacchi con plasma

Also Published As

Publication number Publication date
WO2002025247A3 (fr) 2002-08-01
US20020057433A1 (en) 2002-05-16
WO2002025247A2 (fr) 2002-03-28
US6721051B2 (en) 2004-04-13

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