AU2001261793A1 - Method and apparatus for determining the pass through flux of magnetic materials - Google Patents

Method and apparatus for determining the pass through flux of magnetic materials

Info

Publication number
AU2001261793A1
AU2001261793A1 AU2001261793A AU6179301A AU2001261793A1 AU 2001261793 A1 AU2001261793 A1 AU 2001261793A1 AU 2001261793 A AU2001261793 A AU 2001261793A AU 6179301 A AU6179301 A AU 6179301A AU 2001261793 A1 AU2001261793 A1 AU 2001261793A1
Authority
AU
Australia
Prior art keywords
flux
determining
pass
magnetic materials
magnetic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001261793A
Inventor
Wei Guo
Stephen P. Turner
Yun Xu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Honeywell International Inc
Original Assignee
Honeywell International Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell International Inc filed Critical Honeywell International Inc
Publication of AU2001261793A1 publication Critical patent/AU2001261793A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/10—Plotting field distribution ; Measuring field distribution

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Physical Vapour Deposition (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
AU2001261793A 2000-06-01 2001-05-21 Method and apparatus for determining the pass through flux of magnetic materials Abandoned AU2001261793A1 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US20886400P 2000-06-01 2000-06-01
US60208864 2000-06-01
US09631856 2000-08-03
US09/631,856 US6454911B1 (en) 2000-06-01 2000-08-03 Method and apparatus for determining the pass through flux of magnetic materials
PCT/US2001/016410 WO2001092906A2 (en) 2000-06-01 2001-05-21 Method and apparatus for determining the pass through flux of magnetic materials

Publications (1)

Publication Number Publication Date
AU2001261793A1 true AU2001261793A1 (en) 2001-12-11

Family

ID=26903567

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001261793A Abandoned AU2001261793A1 (en) 2000-06-01 2001-05-21 Method and apparatus for determining the pass through flux of magnetic materials

Country Status (4)

Country Link
US (2) US6454911B1 (en)
AU (1) AU2001261793A1 (en)
TW (1) TWI221930B (en)
WO (1) WO2001092906A2 (en)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6454911B1 (en) * 2000-06-01 2002-09-24 Honeywell International Inc. Method and apparatus for determining the pass through flux of magnetic materials
US7041204B1 (en) 2000-10-27 2006-05-09 Honeywell International Inc. Physical vapor deposition components and methods of formation
US20040129559A1 (en) * 2002-04-12 2004-07-08 Misner Josh W. Diffusion bonded assemblies and fabrication methods
US20080116887A1 (en) * 2006-11-20 2008-05-22 Heraeus, Inc. Method and apparatus for automation of PTF measurement in sputter targets
US20080150523A1 (en) * 2006-12-20 2008-06-26 Heraeus Incorporated Apparatus for a magnetic field detector holding assembly for a PTF measurement stand
WO2009155394A2 (en) * 2008-06-18 2009-12-23 Angstrom Sciences, Inc. Magnetron with electromagnets and permanent magnets
EP2401625B1 (en) 2009-02-26 2014-01-22 Regents of the University of Minnesota High magnetic moment particle detection
GB2515817A (en) * 2013-07-05 2015-01-07 Hirst Magnetic Instr Ltd The measurement of magnetic fields in localised regions of space
US10712405B2 (en) * 2015-06-30 2020-07-14 A. Todd McMullen External air core flux measurement system for a production magnetizing system
CN108496300B (en) * 2016-02-22 2022-05-27 深圳市大疆灵眸科技有限公司 Motor position sensing
WO2017199063A1 (en) 2016-05-17 2017-11-23 Kongsberg Inc. System, method and object for high accuracy magnetic position sensing
US11486776B2 (en) 2016-12-12 2022-11-01 Kongsberg Inc. Dual-band magnetoelastic torque sensor
US10983019B2 (en) 2019-01-10 2021-04-20 Ka Group Ag Magnetoelastic type torque sensor with temperature dependent error compensation
US20230114412A1 (en) 2020-02-11 2023-04-13 Brp Megatech Industries Inc. Magnetoelastic Torque Sensor With Local Measurement Of Ambient Magnetic Field

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4481470A (en) 1981-07-29 1984-11-06 The United States Of America As Represented By The United States Department Of Energy Method for determining the hardness of strain hardening articles of tungsten-nickel-iron alloy
JPS59108970A (en) * 1982-12-13 1984-06-23 Nippon Steel Corp Measuring of magnetic property of steel material
US5282947A (en) 1992-08-13 1994-02-01 Vlsi Technology, Inc. Magnet assembly for enhanced sputter target erosion
JPH08253859A (en) * 1995-03-16 1996-10-01 Sumitomo Metal Mining Co Ltd Sputtering device
US5658442A (en) 1996-03-07 1997-08-19 Applied Materials, Inc. Target and dark space shield for a physical vapor deposition system
JP2001521618A (en) 1997-04-01 2001-11-06 レッドクリフ・マグトロニクス・リミテッド Apparatus and method for measuring magnetic field distribution of magnetic sample
CA2203601C (en) 1997-04-24 2004-03-16 James R. Booker Apparatus and method of detecting loss of cross-sectional area of magnetic metallic strength members used in conductors such as aluminum conductor steel reinforced ("acsr") conductors
US6391172B2 (en) 1997-08-26 2002-05-21 The Alta Group, Inc. High purity cobalt sputter target and process of manufacturing the same
DE59912726D1 (en) * 1998-03-30 2005-12-08 Sentron Ag Zug magnetic field sensor
US6086725A (en) 1998-04-02 2000-07-11 Applied Materials, Inc. Target for use in magnetron sputtering of nickel for forming metallization films having consistent uniformity through life
US6071389A (en) 1998-08-21 2000-06-06 Tosoh Smd, Inc. Diffusion bonded sputter target assembly and method of making
IE20000425A1 (en) 1999-08-19 2001-03-07 Praxair Technology Inc Low permeability non-planar ferromagnetic sputter targets
US6258217B1 (en) * 1999-09-29 2001-07-10 Plasma-Therm, Inc. Rotating magnet array and sputter source
US6299740B1 (en) * 2000-01-19 2001-10-09 Veeco Instrument, Inc. Sputtering assembly and target therefor
US6454911B1 (en) * 2000-06-01 2002-09-24 Honeywell International Inc. Method and apparatus for determining the pass through flux of magnetic materials

Also Published As

Publication number Publication date
US6454911B1 (en) 2002-09-24
US20030006132A1 (en) 2003-01-09
US6821552B2 (en) 2004-11-23
WO2001092906A2 (en) 2001-12-06
TWI221930B (en) 2004-10-11
WO2001092906A3 (en) 2002-03-14

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