AU2001283054A1 - Electrical test probe flexible spring tip - Google Patents

Electrical test probe flexible spring tip

Info

Publication number
AU2001283054A1
AU2001283054A1 AU2001283054A AU8305401A AU2001283054A1 AU 2001283054 A1 AU2001283054 A1 AU 2001283054A1 AU 2001283054 A AU2001283054 A AU 2001283054A AU 8305401 A AU8305401 A AU 8305401A AU 2001283054 A1 AU2001283054 A1 AU 2001283054A1
Authority
AU
Australia
Prior art keywords
test probe
electrical test
flexible spring
spring tip
probe flexible
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001283054A
Inventor
Julie A. Campbell
Lawrence W. Jacobs
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lecroy Corp
Original Assignee
Lecroy Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lecroy Corp filed Critical Lecroy Corp
Publication of AU2001283054A1 publication Critical patent/AU2001283054A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments
AU2001283054A 2000-07-31 2001-07-30 Electrical test probe flexible spring tip Abandoned AU2001283054A1 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US22171600P 2000-07-31 2000-07-31
US60221716 2000-07-31
US89506001A 2001-06-29 2001-06-29
US09895060 2001-06-29
PCT/US2001/024017 WO2002010675A1 (en) 2000-07-31 2001-07-30 Electrical test probe flexible spring tip

Publications (1)

Publication Number Publication Date
AU2001283054A1 true AU2001283054A1 (en) 2002-02-13

Family

ID=26916064

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001283054A Abandoned AU2001283054A1 (en) 2000-07-31 2001-07-30 Electrical test probe flexible spring tip

Country Status (3)

Country Link
US (1) US6863576B2 (en)
AU (1) AU2001283054A1 (en)
WO (1) WO2002010675A1 (en)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2848347B1 (en) * 2002-12-06 2005-01-07 Marechal Sepm ELASTIC RECALL ELECTRICAL CONTACT AND ELECTRICAL CONNECTING ELEMENT PROVIDED WITH AT LEAST ONE SUCH CONTACT
US7221179B1 (en) * 2003-12-18 2007-05-22 Lecroy Corporation Bendable conductive connector
US20050184747A1 (en) * 2004-02-19 2005-08-25 Sanders David L. Spring plunger probe
US6998859B1 (en) 2004-08-25 2006-02-14 Hitachi Global Storage Technologies Netherlands B.V. Test probe with side arm
US7176703B2 (en) * 2004-08-31 2007-02-13 Hitachi Global Storage Technologies Netherlands B.V. Test probe with thermally activated grip and release
US7307437B1 (en) 2005-03-24 2007-12-11 Hewlett-Packard Development Company, L.P. Arrangement with conductive pad embedment
FR2886361B1 (en) 2005-05-31 2007-07-20 Snr Roulements Sa SEALING DEVICE FOR BEARING BEARING COMPRISING A MEANS OF IDENTIFICATION
US9404940B1 (en) 2006-01-06 2016-08-02 Teledyne Lecroy, Inc. Compensating probing tip optimized adapters for use with specific electrical test probes
US9140724B1 (en) 2006-01-06 2015-09-22 Lecroy Corporation Compensating resistance probing tip optimized adapters for use with specific electrical test probes
US7671613B1 (en) 2006-01-06 2010-03-02 Lecroy Corporation Probing blade conductive connector for use with an electrical test probe
US7567213B2 (en) * 2006-05-02 2009-07-28 Accton Technology Corporation Array structure for the application to wireless switch of WLAN and WMAN
US7268295B1 (en) 2006-05-02 2007-09-11 Johnson Richard A Puller/connector for electrical raceways
US7378832B2 (en) * 2006-08-22 2008-05-27 Lecroy Corporation Probing high-frequency signals
US7659790B2 (en) * 2006-08-22 2010-02-09 Lecroy Corporation High speed signal transmission line having reduced thickness regions
WO2008023636A1 (en) * 2006-08-24 2008-02-28 Murata Manufacturing Co., Ltd. Wireless ic device inspecting system and wireless ic device manufacturing method using the same
US20080309349A1 (en) * 2007-06-15 2008-12-18 Computer Access Technology Corporation Flexible interposer system
US20100073021A1 (en) * 2008-09-23 2010-03-25 Nichepac Technology Inc. Electrical contact probe
JP4828617B2 (en) * 2009-04-20 2011-11-30 ソニー エリクソン モバイル コミュニケーションズ， エービー Spring connector and terminal device
US20110112527A1 (en) * 2009-11-06 2011-05-12 Angiodynamics, Inc. Flexible medical ablation device and method of use
US8506307B2 (en) 2010-12-02 2013-08-13 Interconnect Devices, Inc. Electrical connector with embedded shell layer
WO2012176289A1 (en) * 2011-06-22 2012-12-27 株式会社メイコー Spiral probe and manufacturing method for same
AU2012290158B2 (en) * 2011-08-03 2016-07-07 Alcon Inc. Articulating ophthalmic surgical probe
US10119992B2 (en) 2015-04-01 2018-11-06 Tektronix, Inc. High impedance compliant probe tip
US9810715B2 (en) 2014-12-31 2017-11-07 Tektronix, Inc. High impedance compliant probe tip
TWI615615B (en) * 2016-07-13 2018-02-21 中華精測科技股份有限公司 Probe structure
DE102018123994B4 (en) * 2018-09-28 2022-05-25 Knorr-Bremse Systeme für Nutzfahrzeuge GmbH Contacting device for spring-loaded contacting of a circuit board with a contact element for a magnetic coil or a sensor for a vehicle system, vehicle system with a contacting device and method for producing a contacting device
CN114487518A (en) * 2021-12-13 2022-05-13 渭南高新区木王科技有限公司 Double-end double-acting probe capable of independently adjusting spring resistance

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3072877A (en) 1961-05-05 1963-01-08 George O Landwehr Connection device
US3676776A (en) * 1970-01-19 1972-07-11 Siemens Ag Testing probe construction
US3885848A (en) * 1974-06-03 1975-05-27 Corning Glass Works Electrical connection and method of making same
US4740746A (en) * 1984-11-13 1988-04-26 Tektronix, Inc. Controlled impedance microcircuit probe
EP0256541A3 (en) * 1986-08-19 1990-03-14 Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung Contacting device
US4978312A (en) 1988-05-23 1990-12-18 S & G Tool Aid Corp. Tip attachment for circuit probe tester
JPH0412483A (en) * 1990-04-27 1992-01-17 Kel Corp Ic socket
US5982187A (en) * 1993-07-01 1999-11-09 Alphatest Corporation Resilient connector having a tubular spring
US5967856A (en) * 1995-12-20 1999-10-19 Berg Technology, Inc. Connector with spring contact member and shorting means
US5997360A (en) * 1997-10-14 1999-12-07 Gen-Kuong; Fernando Francisco Aircraft equipment configuration identification interface
US6083059A (en) * 1999-05-28 2000-07-04 Ant Precision Industry Co., Ltd. Structure of a terminal
US6464511B1 (en) * 1999-11-17 2002-10-15 Advantest Corporation IC socket and IC tester
TW549662U (en) * 2001-06-08 2003-08-21 Hon Hai Prec Ind Co Ltd Electrical connector

Also Published As

Publication number Publication date
US6863576B2 (en) 2005-03-08
US20020052155A1 (en) 2002-05-02
WO2002010675A1 (en) 2002-02-07

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