CN114487518A - Double-end double-acting probe capable of independently adjusting spring resistance - Google Patents
Double-end double-acting probe capable of independently adjusting spring resistance Download PDFInfo
- Publication number
- CN114487518A CN114487518A CN202111523222.8A CN202111523222A CN114487518A CN 114487518 A CN114487518 A CN 114487518A CN 202111523222 A CN202111523222 A CN 202111523222A CN 114487518 A CN114487518 A CN 114487518A
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- Prior art keywords
- double
- spring
- needle
- guide block
- blind hole
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07392—Multiple probes manipulating each probe element or tip individually
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
Abstract
The invention discloses a double-head double-acting probe capable of independently adjusting spring resistance, which comprises a needle tube, wherein a first blind hole and a second blind hole are respectively formed in two ends of the needle tube, a first spring is arranged in the first blind hole, one end of the first spring is connected with a first needle head, a first guide block is sleeved outside the first needle head, and the first guide block is fixedly connected in the needle tube; the needle tube is characterized in that a second spring is arranged in the second blind hole, one end of the second spring is connected with a second needle head, a second guide block is sleeved outside the second needle head, and the second guide block is fixedly connected in the needle tube. The double-end double-acting probe capable of independently adjusting the spring resistance solves the problem that the local plating layer is difficult to carry out in the process of plating layer processing of a test probe. This double-end double acting probe that can independently adjust spring resistance has solved current double-end probe when using, and the spring resistance size that has two syringe needles received is unanimous all the time, can not carry out the problem of adjusting.
Description
Technical Field
The invention belongs to the technical field of semiconductor detection equipment, and particularly relates to a double-head double-acting probe capable of independently adjusting spring resistance.
Background
The test probe is also called as a semiconductor probe and generally comprises a needle tube, a spring and a needle head, wherein the spring is placed in the needle tube, and the needle head is connected with the spring and extends out of one end of the needle tube, so that the structure is simpler. According to the number of the needle heads, the probe can be divided into a double-head probe and a single-head probe. Wherein: one end of the single-head probe is connected with one end of the spring and extends out of one end of the needle tube, the other end of the needle tube is not provided with an opening, and the other end of the spring is pressed against the bottom of the other end of the controversial end; the two ends of the needle tube of the double-ended probe are both opened, the two ends of the spring are respectively provided with a needle head, and the two needle heads respectively extend out of the two ends of the needle tube.
When the existing double-head probe is used, one spring provides spring resistance, and the spring resistance borne by two needle heads is consistent in size, so that the double-head probe cannot be applied to occasions with different special double-head force application.
Disclosure of Invention
The invention aims to provide a double-head double-acting probe capable of independently adjusting spring resistance, which solves the problem that when the existing double-head probe is used, the spring resistance of two needle heads is always consistent and cannot be adjusted.
In order to achieve the purpose, the invention adopts the technical scheme that: a double-head double-acting probe capable of independently adjusting spring resistance comprises a needle tube, wherein a first blind hole and a second blind hole are respectively formed in two ends of the needle tube, a first spring is arranged in the first blind hole, one end of the first spring is connected with a first needle head, a first guide block is sleeved outside the first needle head, and the first guide block is fixedly connected in the needle tube; the needle tube is characterized in that a second spring is arranged in the second blind hole, one end of the second spring is connected with a second needle head, a second guide block is sleeved outside the second needle head, and the second guide block is fixedly connected in the needle tube.
As a preferable aspect of the present invention, the first guide block and the second guide block are respectively connected to the needle tube by riveting points.
As a preferable aspect of the present invention, the first spring and the second spring are both compression springs.
As a preferable technical scheme, the needle tube is externally provided with a supporting sleeve, and the supporting sleeve is positioned outside the non-first blind hole and the non-second blind hole of the needle tube.
As a preferable aspect of the present invention, the first spring and the second spring have different elastic forces.
The invention has the beneficial effects that: (1) the double-head double-acting probe capable of independently adjusting the spring resistance can be used for testing the same spring resistance at two ends and testing different spring resistances, and has strong applicability; (2) according to the double-head double-acting probe capable of independently adjusting the spring resistance, the two needle heads are respectively driven by the elastic force of the independent spring, and when one needle head is damaged, the single-head probe can be used; (3) the double-head double-acting probe capable of independently adjusting the spring resistance has the advantages of simple structure, convenience in operation, lower manufacturing cost and better market popularization and application prospect.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention and not to limit the invention. In the drawings:
FIG. 1 is a schematic diagram of a double-ended double-action probe of the present invention with independently adjustable spring resistance.
In the figure: 1. the needle comprises a supporting sleeve, 2 parts of a needle tube, 3 parts of a first blind hole, 4 parts of a first needle head, 5 parts of a first guide block, 6 parts of a first spring, 7 parts of a second guide block, 8 parts of a second needle head, 9 parts of a second blind hole and 10 parts of a second spring.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the accompanying drawings are illustrative only for the purpose of explaining the present invention, and are not to be construed as limiting the present invention.
In the description of the present invention, if there are first and second descriptions for distinguishing technical features, they are not interpreted as indicating or implying relative importance or implicitly indicating the number of indicated technical features or implicitly indicating the precedence of the indicated technical features.
In the description of the present invention, unless otherwise explicitly limited, terms such as arrangement, installation, connection and the like should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above terms in the present invention in combination with the specific contents of the technical solutions.
As shown in fig. 1, the double-ended double-acting probe capable of independently adjusting spring resistance of the invention comprises a needle tube 2, wherein a first blind hole 3 and a second blind hole 9 are respectively arranged at two ends of the needle tube 2, a first spring 6 is arranged in the first blind hole 3, one end of the first spring 6 is connected with a first needle 4, a first guide block 5 is sleeved outside the first needle 4, and the first guide block 5 is fixedly connected in the needle tube 2; a second spring 10 is arranged in the second blind hole 9, one end of the second spring 10 is connected with a second needle 8, a second guide block 7 is sleeved outside the second needle 8, and the second guide block 7 is fixedly connected in the needle tube 2.
When in use, the needle tube 2 is fixed by applying force to the non-first blind hole 3 and the second blind hole 9 outside the needle tube 2, and then the first needle 4 and the second needle 8 are respectively contacted with different test objects, and the contact requirements with different test objects can be reached through the force application of different degrees, thereby realizing the requirement that the first needle 4 and the second needle 8 are respectively adapted to different spring resistances.
As shown in figure 1, in the double-ended double-acting probe of the invention, the spring resistance can be independently adjusted, and the first guide block 5 and the second guide block 7 are respectively connected with the needle tube 2 through riveting points.
Because the size of the test probe is smaller, the test probe is generally 3-5mm in outer diameter, and a riveting point processing mode is used for dotting outside the needle tube 2, so that a plurality of riveting points are generated between the needle tube 2 and the first guide block 5 and the second guide block 7, and quick and stable assembly can be realized.
In a double-ended double-action probe of the invention, in which the spring resistance can be adjusted independently, as shown in figure 1, the first spring 6 and the second spring 10 are both compression springs.
The first spring 6 and the second spring 10 may also be extension springs, but the compression springs are better able to force the first needle 4 and the second needle 4 by means of elastic forces than compression springs.
As shown in figure 1, in the double-head double-acting probe capable of independently adjusting the spring resistance of the invention, a supporting sleeve 1 is arranged outside a needle tube 2, and the supporting sleeve 1 is positioned outside a non-first blind hole 3 and a second blind hole 9 of the needle tube 2.
The supporting sleeve 1 is convenient for judging the positions of the non-first blind hole 3 and the non-second blind hole 9 of the needle tube 2, and applies force at the positions, and the strength at the positions is relatively high, so that the needle tube 2 is not easy to damage.
As shown in fig. 1, in a double-ended double-action probe of the present invention in which the spring resistances can be independently adjusted, the elastic forces of the first spring 6 and the second spring 10 are different.
Of course, the elasticity of the first spring 6 and the second spring 10 can be the same, which is convenient for testing different requirements of elasticity and resistance of different objects.
Therefore, compared with the prior art, the double-head double-acting probe capable of independently adjusting the spring resistance can be used for testing the same spring resistance at two ends and testing different spring resistances, and has strong applicability. In addition, according to the double-head double-acting probe capable of independently adjusting the spring resistance, the two probe heads are respectively driven by the independent springs in an elastic mode, and when one probe head is damaged, the probe can be used with a single probe head. In addition, the double-head double-acting probe capable of independently adjusting the spring resistance has the advantages of simple structure, convenience in operation, lower manufacturing cost and better market popularization and application prospect.
While the foregoing description shows and describes several preferred embodiments of the invention, it is to be understood, as noted above, that the invention is not limited to the forms disclosed herein, but is not to be construed as excluding other embodiments and is capable of use in various other combinations, modifications, and environments and is capable of changes within the scope of the inventive concept as expressed herein, commensurate with the above teachings, or the skill or knowledge of the relevant art. And that modifications and variations may be effected by those skilled in the art without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (5)
1. The double-head double-acting probe capable of independently adjusting the spring resistance is characterized by comprising a needle tube (2), wherein a first blind hole (3) and a second blind hole (9) are respectively formed in two ends of the needle tube (2), a first spring (6) is arranged in the first blind hole (3), one end of the first spring (6) is connected with a first needle head (4), a first guide block (5) is sleeved outside the first needle head (4), and the first guide block (5) is fixedly connected in the needle tube (2); be provided with second spring (10) in second blind hole (9), the one end of second spring (10) is connected with second syringe needle (8), the outside cover of second syringe needle (8) is equipped with second guide block (7), second guide block (7) fixed connection is in needle tubing (2).
2. Double-ended double-action probe with independently adjustable spring resistance according to claim 1, characterized in that the first guide block (5) and the second guide block (7) are each riveted to the needle cannula (2).
3. Double-ended double-action probe with independently adjustable spring resistance according to claim 2, characterized in that the first spring (6) and the second spring (10) are both compression springs.
4. Double-ended double-action probe with independent adjustment of the spring resistance according to claim 3, characterized in that the needle cannula (2) is externally provided with a holding sleeve (1), said holding sleeve (1) being located outside the non-first (3), second (9) blind holes of the needle cannula (2).
5. Double-ended double-action probe with independently adjustable spring resistance according to claim 4, characterized in that the spring force of the first spring (6) and the second spring (10) are not identical.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111523222.8A CN114487518A (en) | 2021-12-13 | 2021-12-13 | Double-end double-acting probe capable of independently adjusting spring resistance |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111523222.8A CN114487518A (en) | 2021-12-13 | 2021-12-13 | Double-end double-acting probe capable of independently adjusting spring resistance |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114487518A true CN114487518A (en) | 2022-05-13 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111523222.8A Pending CN114487518A (en) | 2021-12-13 | 2021-12-13 | Double-end double-acting probe capable of independently adjusting spring resistance |
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| CN (1) | CN114487518A (en) |
Citations (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4200351A (en) * | 1978-06-12 | 1980-04-29 | Everett/Charles, Inc. | Straight through electrical spring probe |
| US6326799B1 (en) * | 2000-02-29 | 2001-12-04 | Charles A. Schein | Wireless test fixture for testing printed circuit boards |
| US20020052155A1 (en) * | 2000-07-31 | 2002-05-02 | Campbell Julie A. | Electrical test probe flexible spring tip |
| US20030137316A1 (en) * | 2000-06-16 | 2003-07-24 | Toshio Kazama | Microcontactor probe and electric probe unit |
| CN2660540Y (en) * | 2003-11-07 | 2004-12-01 | 王云阶 | Conducting structure of probe assembly and wire in electronic and detecting implement |
| CN201075114Y (en) * | 2007-07-13 | 2008-06-18 | 苏州光韵达光电科技有限公司 | IC testing control tool |
| JP3154264U (en) * | 2009-07-02 | 2009-10-15 | 菱北電子株式会社 | Probe unit for probe pin and board inspection |
| WO2010027075A1 (en) * | 2008-09-05 | 2010-03-11 | 日本発條株式会社 | Wiring board and probe card |
| CN101846695A (en) * | 2009-03-24 | 2010-09-29 | 京元电子股份有限公司 | Test probe and probe base |
| CN101907642A (en) * | 2009-06-02 | 2010-12-08 | 日本电产理德株式会社 | Inspection fixture and inspection probe |
| CN103226155A (en) * | 2012-01-26 | 2013-07-31 | 日本电产理德株式会社 | Probe and fixture |
| CN104515880A (en) * | 2013-10-08 | 2015-04-15 | 日本电产理德股份有限公司 | Inspecting jig, electrode portion, probe and manufacturing method of inspecting jig |
| US20200300892A1 (en) * | 2017-10-19 | 2020-09-24 | Kabushiki Kaisha Nihon Micronics | Electric connection device |
| CN213210236U (en) * | 2020-05-19 | 2021-05-14 | 渭南高新区木王科技有限公司 | Sleeve type anti-deformation test probe |
-
2021
- 2021-12-13 CN CN202111523222.8A patent/CN114487518A/en active Pending
Patent Citations (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4200351A (en) * | 1978-06-12 | 1980-04-29 | Everett/Charles, Inc. | Straight through electrical spring probe |
| US6326799B1 (en) * | 2000-02-29 | 2001-12-04 | Charles A. Schein | Wireless test fixture for testing printed circuit boards |
| US20030137316A1 (en) * | 2000-06-16 | 2003-07-24 | Toshio Kazama | Microcontactor probe and electric probe unit |
| US20020052155A1 (en) * | 2000-07-31 | 2002-05-02 | Campbell Julie A. | Electrical test probe flexible spring tip |
| CN2660540Y (en) * | 2003-11-07 | 2004-12-01 | 王云阶 | Conducting structure of probe assembly and wire in electronic and detecting implement |
| CN201075114Y (en) * | 2007-07-13 | 2008-06-18 | 苏州光韵达光电科技有限公司 | IC testing control tool |
| WO2010027075A1 (en) * | 2008-09-05 | 2010-03-11 | 日本発條株式会社 | Wiring board and probe card |
| CN101846695A (en) * | 2009-03-24 | 2010-09-29 | 京元电子股份有限公司 | Test probe and probe base |
| CN101907642A (en) * | 2009-06-02 | 2010-12-08 | 日本电产理德株式会社 | Inspection fixture and inspection probe |
| JP3154264U (en) * | 2009-07-02 | 2009-10-15 | 菱北電子株式会社 | Probe unit for probe pin and board inspection |
| CN103226155A (en) * | 2012-01-26 | 2013-07-31 | 日本电产理德株式会社 | Probe and fixture |
| CN104515880A (en) * | 2013-10-08 | 2015-04-15 | 日本电产理德股份有限公司 | Inspecting jig, electrode portion, probe and manufacturing method of inspecting jig |
| US20200300892A1 (en) * | 2017-10-19 | 2020-09-24 | Kabushiki Kaisha Nihon Micronics | Electric connection device |
| CN213210236U (en) * | 2020-05-19 | 2021-05-14 | 渭南高新区木王科技有限公司 | Sleeve type anti-deformation test probe |
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Address after: 714000 No. 18, chongye Second Road, high tech Industrial Development Zone, Weinan City, Shaanxi Province Applicant after: Weinan Muwang Intelligent Technology Co.,Ltd. Address before: 714000 northwest corner of Dongfeng Street and Shiquan Road, high tech Industrial Development Zone, Weinan City, Shaanxi Province Applicant before: WEINAN HI-TECH ZONE WOOD KING TECHNOLOGY Co.,Ltd. |