AU2001283023A1 - A tunneling sensor or switch and a method of making same - Google Patents
A tunneling sensor or switch and a method of making sameInfo
- Publication number
- AU2001283023A1 AU2001283023A1 AU2001283023A AU8302301A AU2001283023A1 AU 2001283023 A1 AU2001283023 A1 AU 2001283023A1 AU 2001283023 A AU2001283023 A AU 2001283023A AU 8302301 A AU8302301 A AU 8302301A AU 2001283023 A1 AU2001283023 A1 AU 2001283023A1
- Authority
- AU
- Australia
- Prior art keywords
- switch
- making same
- tunneling sensor
- tunneling
- sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H1/00—Contacts
- H01H1/0036—Switches making use of microelectromechanical systems [MEMS]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H59/00—Electrostatic relays; Electro-adhesion relays
- H01H59/0009—Electrostatic relays; Electro-adhesion relays making use of micromechanics
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Pressure Sensors (AREA)
- Micromachines (AREA)
- Measuring Fluid Pressure (AREA)
- Gyroscopes (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/629,680 | 2000-08-01 | ||
US09/629,680 US6563184B1 (en) | 2000-08-01 | 2000-08-01 | Single crystal tunneling sensor or switch with silicon beam structure and a method of making same |
PCT/US2001/023802 WO2002011189A2 (en) | 2000-08-01 | 2001-07-27 | A tunneling sensor or switch and a method of making same |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2001283023A1 true AU2001283023A1 (en) | 2002-02-13 |
Family
ID=24524036
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2001283023A Abandoned AU2001283023A1 (en) | 2000-08-01 | 2001-07-27 | A tunneling sensor or switch and a method of making same |
Country Status (6)
Country | Link |
---|---|
US (2) | US6563184B1 (en) |
EP (1) | EP1352414A2 (en) |
JP (1) | JP2004520177A (en) |
AU (1) | AU2001283023A1 (en) |
TW (1) | TW522440B (en) |
WO (1) | WO2002011189A2 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6555404B1 (en) | 2000-08-01 | 2003-04-29 | Hrl Laboratories, Llc | Method of manufacturing a dual wafer tunneling gyroscope |
US6674141B1 (en) * | 2000-08-01 | 2004-01-06 | Hrl Laboratories, Llc | Single crystal, tunneling and capacitive, three-axes sensor using eutectic bonding and a method of making same |
US6580138B1 (en) | 2000-08-01 | 2003-06-17 | Hrl Laboratories, Llc | Single crystal, dual wafer, tunneling sensor or switch with silicon on insulator substrate and a method of making same |
US7352266B2 (en) * | 2004-02-20 | 2008-04-01 | Wireless Mems, Inc. | Head electrode region for a reliable metal-to-metal contact micro-relay MEMS switch |
US8957355B1 (en) * | 2012-01-26 | 2015-02-17 | The Boeing Company | Inertial measurement unit apparatus for use with guidance systems |
US10145739B2 (en) | 2014-04-03 | 2018-12-04 | Oto Photonics Inc. | Waveguide sheet, fabrication method thereof and spectrometer using the same |
US10850976B2 (en) * | 2018-09-21 | 2020-12-01 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method of making ohmic contact on low doped bulk silicon for optical alignment |
Family Cites Families (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5265470A (en) | 1987-11-09 | 1993-11-30 | California Institute Of Technology | Tunnel effect measuring systems and particle detectors |
US5210714A (en) | 1988-10-14 | 1993-05-11 | International Business Machines Corporation | Distance-controlled tunneling transducer and direct access storage unit employing the transducer |
US5015850A (en) | 1989-06-20 | 1991-05-14 | The Board Of Trustees Of The Leland Stanford Junior University | Microfabricated microscope assembly |
ES2056580T3 (en) | 1990-05-18 | 1994-10-01 | British Aerospace | INERTIAL SENSORS. |
JP3069923B2 (en) | 1991-06-17 | 2000-07-24 | キヤノン株式会社 | Cantilever probe, atomic force microscope, information recording / reproducing device |
US5313835A (en) | 1991-12-19 | 1994-05-24 | Motorola, Inc. | Integrated monolithic gyroscopes/accelerometers with logic circuits |
DE4305033A1 (en) | 1992-02-21 | 1993-10-28 | Siemens Ag | Micro-mechanical relay with hybrid drive - has electrostatic drive combined with piezoelectric drive for high force operation and optimum response |
JP3152005B2 (en) * | 1993-03-17 | 2001-04-03 | 株式会社村田製作所 | Manufacturing method of semiconductor acceleration sensor |
EP0619495B1 (en) | 1993-04-05 | 1997-05-21 | Siemens Aktiengesellschaft | Process for manufacturing tunnel effect sensors |
US5354985A (en) | 1993-06-03 | 1994-10-11 | Stanford University | Near field scanning optical and force microscope including cantilever and optical waveguide |
US5475318A (en) | 1993-10-29 | 1995-12-12 | Robert B. Marcus | Microprobe |
US5729074A (en) * | 1994-03-24 | 1998-03-17 | Sumitomo Electric Industries, Ltd. | Micro mechanical component and production process thereof |
US6075585A (en) | 1994-04-12 | 2000-06-13 | The Board Of Trustees Of The Leland Stanford, Jr. University | Vibrating probe for a scanning probe microscope |
US5666190A (en) | 1994-04-12 | 1997-09-09 | The Board Of Trustees Of The Leland Stanford, Jr. University | Method of performing lithography using cantilever array |
US5596194A (en) | 1994-08-19 | 1997-01-21 | Hughes Aircraft Company | Single-wafer tunneling sensor and low-cost IC manufacturing method |
US5646348A (en) | 1994-08-29 | 1997-07-08 | The Charles Stark Draper Laboratory, Inc. | Micromechanical sensor with a guard band electrode and fabrication technique therefor |
JP3182301B2 (en) | 1994-11-07 | 2001-07-03 | キヤノン株式会社 | Microstructure and method for forming the same |
US5883387A (en) | 1994-11-15 | 1999-03-16 | Olympus Optical Co., Ltd. | SPM cantilever and a method for manufacturing the same |
JP2897671B2 (en) | 1995-01-25 | 1999-05-31 | 日本電気株式会社 | Field emission cold cathode |
US5659195A (en) | 1995-06-08 | 1997-08-19 | The Regents Of The University Of California | CMOS integrated microsensor with a precision measurement circuit |
GB9524241D0 (en) | 1995-11-28 | 1996-01-31 | Smiths Industries Plc | Rate sensors |
US5992233A (en) | 1996-05-31 | 1999-11-30 | The Regents Of The University Of California | Micromachined Z-axis vibratory rate gyroscope |
US5894090A (en) | 1996-05-31 | 1999-04-13 | California Institute Of Technology | Silicon bulk micromachined, symmetric, degenerate vibratorygyroscope, accelerometer and sensor and method for using the same |
US5747804A (en) | 1996-09-13 | 1998-05-05 | Raytheon Company | Method and apparatus for sensing infrared radiation utilizing a micro-electro-mechanical sensor |
JPH10178183A (en) * | 1996-12-17 | 1998-06-30 | Mitsubishi Materials Corp | Semiconductor inertial sensor and manufacture thereof |
JP3639684B2 (en) | 1997-01-13 | 2005-04-20 | キヤノン株式会社 | Evanescent wave detection microprobe and method for manufacturing the same, probe including the microprobe and method for manufacturing the same, evanescent wave detection device including the microprobe, near-field scanning optical microscope, and information reproducing device |
JP3493974B2 (en) * | 1997-10-01 | 2004-02-03 | オムロン株式会社 | Electrostatic micro relay |
US5929497A (en) | 1998-06-11 | 1999-07-27 | Delco Electronics Corporation | Batch processed multi-lead vacuum packaging for integrated sensors and circuits |
US6078103A (en) * | 1998-10-29 | 2000-06-20 | Mcdonnell Douglas Corporation | Dimpled contacts for metal-to-semiconductor connections, and methods for fabricating same |
US6126311A (en) * | 1998-11-02 | 2000-10-03 | Claud S. Gordon Company | Dew point sensor using mems |
US6091125A (en) | 1998-12-02 | 2000-07-18 | Northeastern University | Micromechanical electronic device |
US6229190B1 (en) | 1998-12-18 | 2001-05-08 | Maxim Integrated Products, Inc. | Compensated semiconductor pressure sensor |
US6174820B1 (en) | 1999-02-16 | 2001-01-16 | Sandia Corporation | Use of silicon oxynitride as a sacrificial material for microelectromechanical devices |
US6337027B1 (en) | 1999-09-30 | 2002-01-08 | Rockwell Science Center, Llc | Microelectromechanical device manufacturing process |
US6630367B1 (en) * | 2000-08-01 | 2003-10-07 | Hrl Laboratories, Llc | Single crystal dual wafer, tunneling sensor and a method of making same |
US6580138B1 (en) * | 2000-08-01 | 2003-06-17 | Hrl Laboratories, Llc | Single crystal, dual wafer, tunneling sensor or switch with silicon on insulator substrate and a method of making same |
US6555404B1 (en) * | 2000-08-01 | 2003-04-29 | Hrl Laboratories, Llc | Method of manufacturing a dual wafer tunneling gyroscope |
-
2000
- 2000-08-01 US US09/629,680 patent/US6563184B1/en not_active Expired - Fee Related
-
2001
- 2001-07-04 TW TW090116337A patent/TW522440B/en not_active IP Right Cessation
- 2001-07-27 WO PCT/US2001/023802 patent/WO2002011189A2/en not_active Application Discontinuation
- 2001-07-27 AU AU2001283023A patent/AU2001283023A1/en not_active Abandoned
- 2001-07-27 JP JP2002516817A patent/JP2004520177A/en active Pending
- 2001-07-27 EP EP01961782A patent/EP1352414A2/en not_active Withdrawn
-
2003
- 2003-02-18 US US10/370,124 patent/US6951768B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
TW522440B (en) | 2003-03-01 |
EP1352414A2 (en) | 2003-10-15 |
US20030151104A1 (en) | 2003-08-14 |
WO2002011189A2 (en) | 2002-02-07 |
US6951768B2 (en) | 2005-10-04 |
US6563184B1 (en) | 2003-05-13 |
JP2004520177A (en) | 2004-07-08 |
WO2002011189A3 (en) | 2003-08-14 |
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