AU2001274206A1 - Improvements in and relating to microscopy - Google Patents

Improvements in and relating to microscopy

Info

Publication number
AU2001274206A1
AU2001274206A1 AU2001274206A AU7420601A AU2001274206A1 AU 2001274206 A1 AU2001274206 A1 AU 2001274206A1 AU 2001274206 A AU2001274206 A AU 2001274206A AU 7420601 A AU7420601 A AU 7420601A AU 2001274206 A1 AU2001274206 A1 AU 2001274206A1
Authority
AU
Australia
Prior art keywords
radiation
surface waves
analyzing
microscopy
relating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001274206A
Other languages
English (en)
Inventor
Chung Wah See
Michael Geoffrey Somekh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Nottingham
Original Assignee
University of Nottingham
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Nottingham filed Critical University of Nottingham
Publication of AU2001274206A1 publication Critical patent/AU2001274206A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/648—Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Materials For Medical Uses (AREA)
  • Glass Compositions (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Physical Vapour Deposition (AREA)
AU2001274206A 2000-05-30 2001-05-30 Improvements in and relating to microscopy Abandoned AU2001274206A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB0013139 2000-05-30
GBGB0013139.1A GB0013139D0 (en) 2000-05-30 2000-05-30 Improvements in and relating to microscopy
PCT/GB2001/002399 WO2001092858A1 (fr) 2000-05-30 2001-05-30 Ameliorations relatives a la microscopie

Publications (1)

Publication Number Publication Date
AU2001274206A1 true AU2001274206A1 (en) 2001-12-11

Family

ID=9892647

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001274206A Abandoned AU2001274206A1 (en) 2000-05-30 2001-05-30 Improvements in and relating to microscopy

Country Status (7)

Country Link
US (1) US7142308B2 (fr)
EP (1) EP1287337B1 (fr)
AT (1) ATE390627T1 (fr)
AU (1) AU2001274206A1 (fr)
DE (1) DE60133383T2 (fr)
GB (1) GB0013139D0 (fr)
WO (1) WO2001092858A1 (fr)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7365858B2 (en) * 2001-12-18 2008-04-29 Massachusetts Institute Of Technology Systems and methods for phase measurements
US7557929B2 (en) 2001-12-18 2009-07-07 Massachusetts Institute Of Technology Systems and methods for phase measurements
US7872804B2 (en) 2002-08-20 2011-01-18 Illumina, Inc. Encoded particle having a grating with variations in the refractive index
US7619819B2 (en) 2002-08-20 2009-11-17 Illumina, Inc. Method and apparatus for drug product tracking using encoded optical identification elements
US7923260B2 (en) 2002-08-20 2011-04-12 Illumina, Inc. Method of reading encoded particles
US7164533B2 (en) 2003-01-22 2007-01-16 Cyvera Corporation Hybrid random bead/chip based microarray
US7900836B2 (en) 2002-08-20 2011-03-08 Illumina, Inc. Optical reader system for substrates having an optically readable code
US7508608B2 (en) 2004-11-17 2009-03-24 Illumina, Inc. Lithographically fabricated holographic optical identification element
US7901630B2 (en) 2002-08-20 2011-03-08 Illumina, Inc. Diffraction grating-based encoded microparticle assay stick
US7092160B2 (en) 2002-09-12 2006-08-15 Illumina, Inc. Method of manufacturing of diffraction grating-based optical identification element
US20100255603A9 (en) * 2002-09-12 2010-10-07 Putnam Martin A Method and apparatus for aligning microbeads in order to interrogate the same
US7433123B2 (en) * 2004-02-19 2008-10-07 Illumina, Inc. Optical identification element having non-waveguide photosensitive substrate with diffraction grating therein
CA2587674A1 (fr) 2004-11-16 2006-05-26 Illumina, Inc. Procedes de diffusion optique de fourier permettant d'encoder des microbilles et procede et appareil correspondants
US7602952B2 (en) * 2004-11-16 2009-10-13 Illumina, Inc. Scanner having spatial light modulator
US7333205B2 (en) * 2005-03-31 2008-02-19 U Chicago Argonne Llc Broadband surface plasmon jets: direct observation of plasmon propagation for application to sensors and optical communications in microscale and nanoscale circuitry
US7830575B2 (en) 2006-04-10 2010-11-09 Illumina, Inc. Optical scanner with improved scan time
US8736847B2 (en) 2010-07-24 2014-05-27 Focused Innovation, Inc. Method and apparatus for imaging
US8265375B2 (en) 2006-06-16 2012-09-11 Shirley Lyle G Method and apparatus for remote sensing of objects utilizing radiation speckle
FR2924805B1 (fr) * 2007-12-11 2011-05-06 Ecole Norm Superieure Lyon Microscope a plasmon de surface a haute resolution avec interferometre heterodyne en polarisation radiale.
EP2101168A1 (fr) * 2008-03-12 2009-09-16 Ecole Normale Superieure De Lyon Microscopie non linéaire amplifiée par résonance de plasmon de surface
US8810800B2 (en) * 2008-03-22 2014-08-19 Lyle G. Shirley Dimensional probe and methods of use
US8662962B2 (en) * 2008-06-30 2014-03-04 3M Innovative Properties Company Sandpaper with non-slip coating layer and method of using
FR2942049B1 (fr) * 2009-02-12 2011-04-01 Ecole Norm Superieure Lyon Microscope de plasmon de surface a haute resolution comportant un interferometre heterodyne fibre
US8749882B2 (en) * 2009-03-26 2014-06-10 University Of Vermont And State Agriculture College Low numerical aperture exclusion imaging
KR101245544B1 (ko) * 2010-11-29 2013-03-21 한국전기연구원 표면 플라즈몬 현상에 의한 광간섭 변화 특성을 이용한 바이오 센싱 장치
CN103842799B (zh) * 2011-09-30 2017-09-08 通用电气公司 用于样本阵列的自参考检测与成像的系统和方法
GB201216645D0 (en) 2012-09-18 2012-10-31 Univ Nottingham Surface plasmon microscopy
JP6188521B2 (ja) * 2013-10-02 2017-08-30 株式会社日立エルジーデータストレージ 光計測装置
EP3239689B1 (fr) * 2016-04-26 2021-10-06 Atten2 Advanced Monitoring Technologies S.L. Système de surveillance de liquide
WO2018089839A1 (fr) 2016-11-10 2018-05-17 The Trustees Of Columbia University In The City Of New York Procédés d'imagerie rapide de grands échantillons à haute résolution

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3909144A1 (de) 1989-03-21 1990-09-27 Basf Ag Verfahren zur bestimmung von brechungsindex und schichtdicke duenner schichten
DE3914631A1 (de) 1989-05-03 1990-11-08 Basf Ag Verfahren zur untersuchung der physikalischen eigenschaften duenner schichten
DE4310025A1 (de) * 1993-03-27 1994-09-29 Boehringer Mannheim Gmbh Vorrichtung zur lateral aufgelösten Untersuchung einer lateral heterogenen ultradünnen Objektschicht
JP2000055805A (ja) * 1998-06-01 2000-02-25 Toto Ltd センサ装置
US6594011B1 (en) * 2000-07-11 2003-07-15 Maven Technologies, Llc Imaging apparatus and method

Also Published As

Publication number Publication date
DE60133383T2 (de) 2009-04-02
US7142308B2 (en) 2006-11-28
ATE390627T1 (de) 2008-04-15
GB0013139D0 (en) 2000-07-19
EP1287337B1 (fr) 2008-03-26
WO2001092858A1 (fr) 2001-12-06
DE60133383D1 (de) 2008-05-08
EP1287337A1 (fr) 2003-03-05
US20040100636A1 (en) 2004-05-27

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