AU2001261345A1 - Method of manufacturing a semiconductor component and semiconductor component thereof - Google Patents

Method of manufacturing a semiconductor component and semiconductor component thereof

Info

Publication number
AU2001261345A1
AU2001261345A1 AU2001261345A AU6134501A AU2001261345A1 AU 2001261345 A1 AU2001261345 A1 AU 2001261345A1 AU 2001261345 A AU2001261345 A AU 2001261345A AU 6134501 A AU6134501 A AU 6134501A AU 2001261345 A1 AU2001261345 A1 AU 2001261345A1
Authority
AU
Australia
Prior art keywords
semiconductor component
manufacturing
semiconductor
component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001261345A
Inventor
Eric S. Johnson
William C. Peatman
Adolfo C. Reyes
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Motorola Solutions Inc
Original Assignee
Motorola Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Motorola Inc filed Critical Motorola Inc
Publication of AU2001261345A1 publication Critical patent/AU2001261345A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007Multistep manufacturing processes
    • H01L29/66075Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66409Unipolar field-effect transistors
    • H01L29/66893Unipolar field-effect transistors with a PN junction gate, i.e. JFET
    • H01L29/66924Unipolar field-effect transistors with a PN junction gate, i.e. JFET with an active layer made of a group 13/15 material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/80Field effect transistors with field effect produced by a PN or other rectifying junction gate, i.e. potential-jump barrier
    • H01L29/802Field effect transistors with field effect produced by a PN or other rectifying junction gate, i.e. potential-jump barrier with heterojunction gate, e.g. transistors with semiconductor layer acting as gate insulating layer, MIS-like transistors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/12Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/20Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only AIIIBV compounds
    • H01L29/2003Nitride compounds
AU2001261345A 2000-06-12 2001-05-10 Method of manufacturing a semiconductor component and semiconductor component thereof Abandoned AU2001261345A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09592349 2000-06-12
US09/592,349 US6821829B1 (en) 2000-06-12 2000-06-12 Method of manufacturing a semiconductor component and semiconductor component thereof
PCT/US2001/015049 WO2001097274A2 (en) 2000-06-12 2001-05-10 Heterostructure field effect transistor and method of manufacturing it

Publications (1)

Publication Number Publication Date
AU2001261345A1 true AU2001261345A1 (en) 2001-12-24

Family

ID=24370293

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001261345A Abandoned AU2001261345A1 (en) 2000-06-12 2001-05-10 Method of manufacturing a semiconductor component and semiconductor component thereof

Country Status (6)

Country Link
US (1) US6821829B1 (en)
JP (1) JP2004503937A (en)
CN (1) CN1205659C (en)
AU (1) AU2001261345A1 (en)
TW (1) TW522477B (en)
WO (1) WO2001097274A2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7504677B2 (en) * 2005-03-28 2009-03-17 Freescale Semiconductor, Inc. Multi-gate enhancement mode RF switch and bias arrangement
US7345545B2 (en) * 2005-03-28 2008-03-18 Freescale Semiconductor, Inc. Enhancement mode transceiver and switched gain amplifier integrated circuit
JP5249521B2 (en) * 2007-03-30 2013-07-31 本田技研工業株式会社 Manufacturing method of semiconductor device

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0695531B2 (en) 1985-04-08 1994-11-24 日本電信電話株式会社 Field effect transistor
DE3682119D1 (en) 1985-06-21 1991-11-28 Honeywell Inc COMPLEMENTARY IC STRUCTURE WITH HIGH SLOPE.
JPS62268165A (en) 1986-05-15 1987-11-20 Nec Corp Field effect transistor
JP2680821B2 (en) * 1987-11-09 1997-11-19 日本電気株式会社 Heterostructure field effect transistor
US5124762A (en) 1990-12-31 1992-06-23 Honeywell Inc. Gaas heterostructure metal-insulator-semiconductor integrated circuit technology
JPH0521468A (en) 1991-07-17 1993-01-29 Sumitomo Electric Ind Ltd Manufacture of field-effect transistor
JPH06267991A (en) 1993-03-12 1994-09-22 Hitachi Ltd Semiconductor device and its manufacture
JPH06283554A (en) * 1993-03-30 1994-10-07 Hitachi Cable Ltd Compound semiconductor epitaxial wafer
JPH0722614A (en) * 1993-07-06 1995-01-24 Hitachi Cable Ltd Compound semiconductor epitaxial wafer
US5455183A (en) 1994-01-03 1995-10-03 Honeywell Inc. Method for fabricating a FET having a dielectrically isolated gate connect
US5479033A (en) 1994-05-27 1995-12-26 Sandia Corporation Complementary junction heterostructure field-effect transistor
US5512518A (en) * 1994-06-06 1996-04-30 Motorola, Inc. Method of manufacture of multilayer dielectric on a III-V substrate
JPH08162479A (en) * 1994-12-08 1996-06-21 Hitachi Ltd Manufacture of field-effect transistor and field-effect transistor
US5514891A (en) 1995-06-02 1996-05-07 Motorola N-type HIGFET and method
US5614739A (en) 1995-06-02 1997-03-25 Motorola HIGFET and method
US5895929A (en) * 1996-04-22 1999-04-20 Motorola, Inc. Low subthreshold leakage current HFET
JP3601649B2 (en) 1996-12-25 2004-12-15 株式会社村田製作所 Field effect transistor
US5937285A (en) * 1997-05-23 1999-08-10 Motorola, Inc. Method of fabricating submicron FETs with low temperature group III-V material
JPH1154527A (en) * 1997-07-30 1999-02-26 Fujitsu Ltd Field effect transistor and its manufacture

Also Published As

Publication number Publication date
TW522477B (en) 2003-03-01
WO2001097274A3 (en) 2002-04-11
CN1436367A (en) 2003-08-13
CN1205659C (en) 2005-06-08
US6821829B1 (en) 2004-11-23
WO2001097274A2 (en) 2001-12-20
JP2004503937A (en) 2004-02-05

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