AU2001261175A1 - Simplified method to produce nanoporous silicon-based films - Google Patents
Simplified method to produce nanoporous silicon-based filmsInfo
- Publication number
- AU2001261175A1 AU2001261175A1 AU2001261175A AU6117501A AU2001261175A1 AU 2001261175 A1 AU2001261175 A1 AU 2001261175A1 AU 2001261175 A AU2001261175 A AU 2001261175A AU 6117501 A AU6117501 A AU 6117501A AU 2001261175 A1 AU2001261175 A1 AU 2001261175A1
- Authority
- AU
- Australia
- Prior art keywords
- simplified method
- based films
- nanoporous silicon
- produce nanoporous
- produce
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title 1
- 229910052710 silicon Inorganic materials 0.000 title 1
- 239000010703 silicon Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02126—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02203—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being porous
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02205—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition
- H01L21/02208—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si
- H01L21/02214—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound comprising silicon and oxygen
- H01L21/02216—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound comprising silicon and oxygen the compound being a molecule comprising at least one silicon-oxygen bond and the compound having hydrogen or an organic group attached to the silicon or oxygen, e.g. a siloxane
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/314—Inorganic layers
- H01L21/316—Inorganic layers composed of oxides or glassy oxides or oxide based glass
- H01L21/31695—Deposition of porous oxides or porous glassy oxides or oxide based porous glass
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/96—Porous semiconductor
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Formation Of Insulating Films (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/566,287 US6495479B1 (en) | 2000-05-05 | 2000-05-05 | Simplified method to produce nanoporous silicon-based films |
US09566287 | 2000-05-05 | ||
PCT/US2001/014385 WO2001086709A2 (fr) | 2000-05-05 | 2001-05-04 | Procede simplifie de production de pellicules nanoporeuses a base de silicium |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2001261175A1 true AU2001261175A1 (en) | 2001-11-20 |
Family
ID=24262260
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2001261175A Abandoned AU2001261175A1 (en) | 2000-05-05 | 2001-05-04 | Simplified method to produce nanoporous silicon-based films |
Country Status (5)
Country | Link |
---|---|
US (2) | US6495479B1 (fr) |
EP (1) | EP1327260A2 (fr) |
AU (1) | AU2001261175A1 (fr) |
TW (1) | TW514653B (fr) |
WO (1) | WO2001086709A2 (fr) |
Families Citing this family (69)
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EP1323189A2 (fr) * | 2000-09-13 | 2003-07-02 | Shipley Company LLC | Fabrication de dispositifs electroniques |
US6685983B2 (en) * | 2001-03-14 | 2004-02-03 | International Business Machines Corporation | Defect-free dielectric coatings and preparation thereof using polymeric nitrogenous porogens |
US20030054115A1 (en) * | 2001-09-14 | 2003-03-20 | Ralph Albano | Ultraviolet curing process for porous low-K materials |
US7423166B2 (en) | 2001-12-13 | 2008-09-09 | Advanced Technology Materials, Inc. | Stabilized cyclosiloxanes for use as CVD precursors for low-dielectric constant thin films |
US7108771B2 (en) * | 2001-12-13 | 2006-09-19 | Advanced Technology Materials, Inc. | Method for removal of impurities in cyclic siloxanes useful as precursors for low dielectric constant thin films |
US7456488B2 (en) * | 2002-11-21 | 2008-11-25 | Advanced Technology Materials, Inc. | Porogen material |
WO2003088344A1 (fr) * | 2002-04-10 | 2003-10-23 | Honeywell International, Inc. | Dielectrique en silice poreuse, a faible teneur en metal, pour applications sur des circuits integres |
AU2002309806A1 (en) * | 2002-04-10 | 2003-10-27 | Honeywell International, Inc. | New porogens for porous silica dielectric for integral circuit applications |
US7122880B2 (en) * | 2002-05-30 | 2006-10-17 | Air Products And Chemicals, Inc. | Compositions for preparing low dielectric materials |
US7112615B2 (en) * | 2002-07-22 | 2006-09-26 | Massachusetts Institute Of Technology | Porous material formation by chemical vapor deposition onto colloidal crystal templates |
US7153754B2 (en) * | 2002-08-29 | 2006-12-26 | Micron Technology, Inc. | Methods for forming porous insulators from “void” creating materials and structures and semiconductor devices including same |
JP2006500769A (ja) * | 2002-09-20 | 2006-01-05 | ハネウェル・インターナショナル・インコーポレーテッド | 低k材料用の中間層接着促進剤 |
US20040137243A1 (en) * | 2002-10-21 | 2004-07-15 | Massachusetts Institute Of Technology | Chemical vapor deposition of organosilicate thin films |
US7098149B2 (en) * | 2003-03-04 | 2006-08-29 | Air Products And Chemicals, Inc. | Mechanical enhancement of dense and porous organosilicate materials by UV exposure |
TWI240959B (en) | 2003-03-04 | 2005-10-01 | Air Prod & Chem | Mechanical enhancement of dense and porous organosilicate materials by UV exposure |
JP2004269693A (ja) * | 2003-03-10 | 2004-09-30 | Shin Etsu Chem Co Ltd | 多孔質膜形成用組成物及びその製造方法、多孔質膜の製造方法、多孔質膜、層間絶縁膜、及び半導体装置 |
US20050260420A1 (en) * | 2003-04-01 | 2005-11-24 | Collins Martha J | Low dielectric materials and methods for making same |
WO2004099296A1 (fr) * | 2003-05-05 | 2004-11-18 | Dsm Ip Assets B.V. | Materiaux nanoporeux appropries a une utilisation dans les semiconducteurs |
KR100554157B1 (ko) * | 2003-08-21 | 2006-02-22 | 학교법인 포항공과대학교 | 저유전 특성의 유기 실리케이트 고분자 복합체 |
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US7405147B2 (en) * | 2004-01-30 | 2008-07-29 | International Business Machines Corporation | Device and methodology for reducing effective dielectric constant in semiconductor devices |
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US7229934B2 (en) * | 2004-10-18 | 2007-06-12 | International Business Machines Corporation | Porous organosilicates with improved mechanical properties |
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US7790630B2 (en) * | 2005-04-12 | 2010-09-07 | Intel Corporation | Silicon-doped carbon dielectrics |
WO2007143025A2 (fr) * | 2006-05-31 | 2007-12-13 | Roskilde Semiconductor Llc | Solides inorganiques poreux pour utilisation comme matÉriaux À faible constante diÉlectrique |
US7883742B2 (en) * | 2006-05-31 | 2011-02-08 | Roskilde Semiconductor Llc | Porous materials derived from polymer composites |
US7919188B2 (en) * | 2006-05-31 | 2011-04-05 | Roskilde Semiconductor Llc | Linked periodic networks of alternating carbon and inorganic clusters for use as low dielectric constant materials |
JP5026008B2 (ja) * | 2006-07-14 | 2012-09-12 | 東京応化工業株式会社 | 膜形成組成物 |
US20080026541A1 (en) * | 2006-07-26 | 2008-01-31 | International Business Machines Corporation | Air-gap interconnect structures with selective cap |
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US7776395B2 (en) * | 2006-11-14 | 2010-08-17 | Applied Materials, Inc. | Method of depositing catalyst assisted silicates of high-k materials |
FR2908406B1 (fr) * | 2006-11-14 | 2012-08-24 | Saint Gobain | Couche poreuse, son procede de fabrication et ses applications. |
US20080173541A1 (en) * | 2007-01-22 | 2008-07-24 | Eal Lee | Target designs and related methods for reduced eddy currents, increased resistance and resistivity, and enhanced cooling |
US8702919B2 (en) | 2007-08-13 | 2014-04-22 | Honeywell International Inc. | Target designs and related methods for coupled target assemblies, methods of production and uses thereof |
US7745352B2 (en) * | 2007-08-27 | 2010-06-29 | Applied Materials, Inc. | Curing methods for silicon dioxide thin films deposited from alkoxysilane precursor with harp II process |
WO2009085098A1 (fr) * | 2007-12-19 | 2009-07-09 | Lam Research Corporation | Régénération en phase vapeur et étanchéification des pores de matériaux diélectriques à faible k |
US8357435B2 (en) * | 2008-05-09 | 2013-01-22 | Applied Materials, Inc. | Flowable dielectric equipment and processes |
US20100081293A1 (en) * | 2008-10-01 | 2010-04-01 | Applied Materials, Inc. | Methods for forming silicon nitride based film or silicon carbon based film |
US8557877B2 (en) * | 2009-06-10 | 2013-10-15 | Honeywell International Inc. | Anti-reflective coatings for optically transparent substrates |
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US10283321B2 (en) | 2011-01-18 | 2019-05-07 | Applied Materials, Inc. | Semiconductor processing system and methods using capacitively coupled plasma |
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US8716154B2 (en) | 2011-03-04 | 2014-05-06 | Applied Materials, Inc. | Reduced pattern loading using silicon oxide multi-layers |
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US8864898B2 (en) | 2011-05-31 | 2014-10-21 | Honeywell International Inc. | Coating formulations for optical elements |
US8466073B2 (en) | 2011-06-03 | 2013-06-18 | Applied Materials, Inc. | Capping layer for reduced outgassing |
US9404178B2 (en) | 2011-07-15 | 2016-08-02 | Applied Materials, Inc. | Surface treatment and deposition for reduced outgassing |
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US9412581B2 (en) | 2014-07-16 | 2016-08-09 | Applied Materials, Inc. | Low-K dielectric gapfill by flowable deposition |
US10822807B2 (en) | 2019-02-18 | 2020-11-03 | Royal Building Products (Usa) Inc. | Assembly for improved insulation |
WO2021050659A1 (fr) * | 2019-09-13 | 2021-03-18 | Versum Materials Us, Llc | Monoalcoxysilanes et films d'organosilicium denses fabriqués à partir de ceux-ci |
WO2023287455A1 (fr) | 2021-07-16 | 2023-01-19 | Microchip Technology Incorporated | Techniques de régulation de la pression de vapeur de matériaux sujets dans des cellules de vapeur et procédés associés |
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EP0775669B1 (fr) | 1995-11-16 | 2001-05-02 | Texas Instruments Incorporated | Précurseurs pour aérogels nanoporeuse à base de solvent peu volatile |
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US6503850B1 (en) | 1997-04-17 | 2003-01-07 | Alliedsignal Inc. | Process for producing nanoporous dielectric films at high pH |
US6271278B1 (en) * | 1997-05-13 | 2001-08-07 | Purdue Research Foundation | Hydrogel composites and superporous hydrogel composites having fast swelling, high mechanical strength, and superabsorbent properties |
KR19980087552A (ko) | 1997-05-28 | 1998-12-05 | 윌리엄 버. 켐플러 | 집적 회로 유전체 및 그 방법 |
US5883219A (en) | 1997-05-29 | 1999-03-16 | International Business Machines Corporation | Integrated circuit device and process for its manufacture |
RU2195050C2 (ru) * | 1998-06-05 | 2002-12-20 | Джорджиэ Тек Рисеч Копэрейшн | Способ получения пористой изоляционной композиции (варианты), композиция, используемая для получения пористого изоляционного материала (варианты), и полупроводниковое устройство |
US6054206A (en) * | 1998-06-22 | 2000-04-25 | Novellus Systems, Inc. | Chemical vapor deposition of low density silicon dioxide films |
US6093636A (en) * | 1998-07-08 | 2000-07-25 | International Business Machines Corporation | Process for manufacture of integrated circuit device using a matrix comprising porous high temperature thermosets |
US6037275A (en) * | 1998-08-27 | 2000-03-14 | Alliedsignal Inc. | Nanoporous silica via combined stream deposition |
US6410149B1 (en) | 1998-08-27 | 2002-06-25 | Alliedsignal Inc. | Silane-based nanoporous silica thin films and precursors for making same |
US6171945B1 (en) * | 1998-10-22 | 2001-01-09 | Applied Materials, Inc. | CVD nanoporous silica low dielectric constant films |
US6469390B2 (en) * | 1999-01-26 | 2002-10-22 | Agere Systems Guardian Corp. | Device comprising thermally stable, low dielectric constant material |
US6318124B1 (en) * | 1999-08-23 | 2001-11-20 | Alliedsignal Inc. | Nanoporous silica treated with siloxane polymers for ULSI applications |
US6420441B1 (en) * | 1999-10-01 | 2002-07-16 | Shipley Company, L.L.C. | Porous materials |
US6107357A (en) * | 1999-11-16 | 2000-08-22 | International Business Machines Corporatrion | Dielectric compositions and method for their manufacture |
US6287979B1 (en) * | 2000-04-17 | 2001-09-11 | Chartered Semiconductor Manufacturing Ltd. | Method for forming an air gap as low dielectric constant material using buckminsterfullerene as a porogen in an air bridge or a sacrificial layer |
-
2000
- 2000-05-05 US US09/566,287 patent/US6495479B1/en not_active Expired - Fee Related
-
2001
- 2001-05-04 AU AU2001261175A patent/AU2001261175A1/en not_active Abandoned
- 2001-05-04 WO PCT/US2001/014385 patent/WO2001086709A2/fr active Application Filing
- 2001-05-04 EP EP01935047A patent/EP1327260A2/fr not_active Withdrawn
- 2001-07-31 TW TW090110760A patent/TW514653B/zh not_active IP Right Cessation
-
2002
- 2002-08-09 US US10/215,531 patent/US20030077918A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
US20030077918A1 (en) | 2003-04-24 |
WO2001086709A3 (fr) | 2002-05-30 |
US6495479B1 (en) | 2002-12-17 |
TW514653B (en) | 2002-12-21 |
EP1327260A2 (fr) | 2003-07-16 |
WO2001086709A2 (fr) | 2001-11-15 |
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