AU2001251167A1 - Systems for detecting and measuring inclusions - Google Patents
Systems for detecting and measuring inclusionsInfo
- Publication number
- AU2001251167A1 AU2001251167A1 AU2001251167A AU5116701A AU2001251167A1 AU 2001251167 A1 AU2001251167 A1 AU 2001251167A1 AU 2001251167 A AU2001251167 A AU 2001251167A AU 5116701 A AU5116701 A AU 5116701A AU 2001251167 A1 AU2001251167 A1 AU 2001251167A1
- Authority
- AU
- Australia
- Prior art keywords
- liquid
- inclusions
- particles
- gas
- fluid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 239000002245 particle Substances 0.000 claims description 55
- 238000000034 method Methods 0.000 claims description 40
- 238000001514 detection method Methods 0.000 claims description 39
- 229910052751 metal Inorganic materials 0.000 claims description 32
- 239000002184 metal Substances 0.000 claims description 32
- 238000005259 measurement Methods 0.000 claims description 31
- 239000007788 liquid Substances 0.000 claims description 27
- 239000007789 gas Substances 0.000 claims description 21
- 239000012530 fluid Substances 0.000 claims description 19
- 238000009826 distribution Methods 0.000 claims description 17
- 238000000926 separation method Methods 0.000 claims description 16
- 229910052782 aluminium Inorganic materials 0.000 claims description 13
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 13
- 230000003750 conditioning effect Effects 0.000 claims description 11
- 230000003287 optical effect Effects 0.000 claims description 11
- 230000005012 migration Effects 0.000 claims description 8
- 238000013508 migration Methods 0.000 claims description 8
- 239000007787 solid Substances 0.000 claims description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 4
- 238000003384 imaging method Methods 0.000 claims description 4
- 239000011261 inert gas Substances 0.000 claims description 4
- 239000000463 material Substances 0.000 claims description 4
- 230000003647 oxidation Effects 0.000 claims description 4
- 238000007254 oxidation reaction Methods 0.000 claims description 4
- 230000008569 process Effects 0.000 claims description 4
- 239000010453 quartz Substances 0.000 claims description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 2
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 claims description 2
- 229910052786 argon Inorganic materials 0.000 claims description 2
- 239000004020 conductor Substances 0.000 claims description 2
- 229910052802 copper Inorganic materials 0.000 claims description 2
- 239000010949 copper Substances 0.000 claims description 2
- 229910002804 graphite Inorganic materials 0.000 claims description 2
- 239000010439 graphite Substances 0.000 claims description 2
- 239000001307 helium Substances 0.000 claims description 2
- 229910052734 helium Inorganic materials 0.000 claims description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims description 2
- 239000000203 mixture Substances 0.000 claims description 2
- 230000004044 response Effects 0.000 claims description 2
- 229910052711 selenium Inorganic materials 0.000 claims description 2
- 239000011669 selenium Substances 0.000 claims description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 2
- 229910052721 tungsten Inorganic materials 0.000 claims description 2
- 239000010937 tungsten Substances 0.000 claims description 2
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 claims 1
- 239000000460 chlorine Substances 0.000 claims 1
- 229910052801 chlorine Inorganic materials 0.000 claims 1
- 238000003331 infrared imaging Methods 0.000 claims 1
- 239000000155 melt Substances 0.000 description 28
- 229910001338 liquidmetal Inorganic materials 0.000 description 27
- 150000002739 metals Chemical class 0.000 description 12
- 238000012545 processing Methods 0.000 description 12
- 238000007689 inspection Methods 0.000 description 5
- 238000005266 casting Methods 0.000 description 4
- 239000000919 ceramic Substances 0.000 description 4
- 238000004140 cleaning Methods 0.000 description 4
- 230000004907 flux Effects 0.000 description 4
- 239000010410 layer Substances 0.000 description 4
- 239000002344 surface layer Substances 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 230000001143 conditioned effect Effects 0.000 description 3
- 239000000356 contaminant Substances 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- CWYNVVGOOAEACU-UHFFFAOYSA-N Fe2+ Chemical compound [Fe+2] CWYNVVGOOAEACU-UHFFFAOYSA-N 0.000 description 2
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 2
- 241001424392 Lucia limbaria Species 0.000 description 2
- 241001275902 Parabramis pekinensis Species 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000004512 die casting Methods 0.000 description 2
- 229910052733 gallium Inorganic materials 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 230000010355 oscillation Effects 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 229910052596 spinel Inorganic materials 0.000 description 2
- 230000000007 visual effect Effects 0.000 description 2
- KZBUYRJDOAKODT-UHFFFAOYSA-N Chlorine Chemical compound ClCl KZBUYRJDOAKODT-UHFFFAOYSA-N 0.000 description 1
- 229910000881 Cu alloy Inorganic materials 0.000 description 1
- 229910001111 Fine metal Inorganic materials 0.000 description 1
- 229910026161 MgAl2O4 Inorganic materials 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- SBYXRAKIOMOBFF-UHFFFAOYSA-N copper tungsten Chemical compound [Cu].[W] SBYXRAKIOMOBFF-UHFFFAOYSA-N 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 229910052593 corundum Inorganic materials 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000007872 degassing Methods 0.000 description 1
- 230000001627 detrimental effect Effects 0.000 description 1
- 238000005553 drilling Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 125000004435 hydrogen atom Chemical class [H]* 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 239000011344 liquid material Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 150000001247 metal acetylides Chemical class 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000002028 premature Effects 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
- 239000011819 refractory material Substances 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 239000012056 semi-solid material Substances 0.000 description 1
- 239000011029 spinel Substances 0.000 description 1
- 229910052566 spinel group Inorganic materials 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 229910001845 yogo sapphire Inorganic materials 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C21—METALLURGY OF IRON
- C21C—PROCESSING OF PIG-IRON, e.g. REFINING, MANUFACTURE OF WROUGHT-IRON OR STEEL; TREATMENT IN MOLTEN STATE OF FERROUS ALLOYS
- C21C5/00—Manufacture of carbon-steel, e.g. plain mild steel, medium carbon steel or cast steel or stainless steel
- C21C5/28—Manufacture of steel in the converter
- C21C5/42—Constructional features of converters
- C21C5/46—Details or accessories
- C21C5/4673—Measuring and sampling devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B03—SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES OR JIGS; MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROM SOLID MATERIALS OR FLUIDS; SEPARATION BY HIGH-VOLTAGE ELECTRIC FIELDS
- B03C—MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROM SOLID MATERIALS OR FLUIDS; SEPARATION BY HIGH-VOLTAGE ELECTRIC FIELDS
- B03C1/00—Magnetic separation
- B03C1/32—Magnetic separation acting on the medium containing the substance being separated, e.g. magneto-gravimetric-, magnetohydrostatic-, or magnetohydrodynamic separation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/20—Metals
- G01N33/205—Metals in liquid state, e.g. molten metals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/06—Investigating concentration of particle suspensions
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- Immunology (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Food Science & Technology (AREA)
- Manufacturing & Machinery (AREA)
- Medicinal Chemistry (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Fluid Mechanics (AREA)
- Investigating And Analyzing Materials By Characteristic Methods (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Dispersion Chemistry (AREA)
- Sampling And Sample Adjustment (AREA)
- Manufacture And Refinement Of Metals (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| USPCT/US00/08668 | 2000-03-31 | ||
| WOUS00/08668 | 2000-03-31 | ||
| US70097500A | 2000-11-21 | 2000-11-21 | |
| US09700975 | 2000-11-21 | ||
| PCT/US2001/010371 WO2001075183A2 (en) | 2000-03-31 | 2001-03-30 | System for detecting inclusions in molten metals |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| AU2001251167A1 true AU2001251167A1 (en) | 2001-10-15 |
Family
ID=26680179
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU2001251167A Abandoned AU2001251167A1 (en) | 2000-03-31 | 2001-03-30 | Systems for detecting and measuring inclusions |
Country Status (10)
| Country | Link |
|---|---|
| EP (1) | EP1268866A2 (ja) |
| JP (1) | JP2003535316A (ja) |
| KR (1) | KR20020095199A (ja) |
| CN (1) | CN1427898A (ja) |
| AU (1) | AU2001251167A1 (ja) |
| BR (1) | BR0107533A (ja) |
| CA (1) | CA2404560A1 (ja) |
| MX (1) | MXPA02009593A (ja) |
| NO (1) | NO20024613L (ja) |
| RU (1) | RU2002128920A (ja) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8505397B2 (en) * | 2010-09-30 | 2013-08-13 | GM Global Technology Operations LLC | Methods of characterizing aluminum oxides |
| EP2906927B1 (en) * | 2012-10-15 | 2021-08-04 | ABB Inc. | Liquid metal cleanliness analyzer |
| CN103123329B (zh) * | 2012-12-31 | 2015-07-29 | 上海大学 | 金属中非金属夹杂物的快速检测方法及快速检测装置 |
| CN103245711B (zh) * | 2013-04-18 | 2016-10-05 | 沈阳理工大学 | 基于神经网络的铝液非金属夹杂物在线软测量装置及方法 |
| FI125886B (fi) * | 2014-01-29 | 2016-03-31 | Ilkka Jaakkola | Järjestelmä sähköä johtavien partikkeleiden eliminoimiseksi |
| CN104007170B (zh) * | 2014-05-19 | 2016-10-05 | 中国科学院大学 | 基于电磁原理的通过状态转化测量金属液纯净度的方法 |
| CN105108093B (zh) * | 2015-09-02 | 2017-03-08 | 青岛理工大学 | 搅拌磁场作用下连铸结晶器内非金属夹杂物运动规律的物理模拟方法 |
| CN105499142B (zh) * | 2016-01-27 | 2017-06-20 | 东北大学 | 一种复合磁场螺旋溜槽金属熔珠分离系统及方法 |
| US9651469B1 (en) * | 2016-01-27 | 2017-05-16 | General Electric Company | Electrostatic particle sensor |
| CN106018448B (zh) * | 2016-05-16 | 2019-01-08 | 横店集团东磁股份有限公司 | 一种LaFeSi基磁制冷材料中杂相含量评估方法 |
| CN106017993B (zh) * | 2016-05-17 | 2019-11-26 | 沈阳理工大学 | 金属熔体取样设备 |
| CN107119192B (zh) * | 2017-04-17 | 2019-02-22 | 上海大学 | 电磁涡旋驱动力净化金属液的方法及装置 |
| CN108043586A (zh) * | 2017-12-21 | 2018-05-18 | 西安欧中材料科技有限公司 | 一种检测金属粉末中非金属夹杂含量的方法 |
| KR102309284B1 (ko) * | 2018-08-03 | 2021-10-06 | 주식회사 엘지에너지솔루션 | 고분자 솔루션의 미용해물 측정법 |
| CN110068483A (zh) * | 2019-05-27 | 2019-07-30 | 邯郸百世创联电子科技有限公司 | 一种环境监测用城市地下污水检测取样装置 |
| CN110412489B (zh) * | 2019-07-29 | 2020-08-14 | 大连理工大学 | 一种永磁耦合器内部复合磁场估算方法 |
-
2001
- 2001-03-30 BR BR0107533-0A patent/BR0107533A/pt not_active IP Right Cessation
- 2001-03-30 JP JP2001573055A patent/JP2003535316A/ja active Pending
- 2001-03-30 MX MXPA02009593A patent/MXPA02009593A/es unknown
- 2001-03-30 EP EP01924518A patent/EP1268866A2/en not_active Withdrawn
- 2001-03-30 CA CA002404560A patent/CA2404560A1/en not_active Abandoned
- 2001-03-30 KR KR1020027012866A patent/KR20020095199A/ko not_active Application Discontinuation
- 2001-03-30 CN CN01808824A patent/CN1427898A/zh active Pending
- 2001-03-30 RU RU2002128920/02A patent/RU2002128920A/ru not_active Application Discontinuation
- 2001-03-30 AU AU2001251167A patent/AU2001251167A1/en not_active Abandoned
-
2002
- 2002-09-26 NO NO20024613A patent/NO20024613L/no not_active Application Discontinuation
Also Published As
| Publication number | Publication date |
|---|---|
| CA2404560A1 (en) | 2001-10-11 |
| CN1427898A (zh) | 2003-07-02 |
| NO20024613L (no) | 2002-11-27 |
| NO20024613D0 (no) | 2002-09-26 |
| JP2003535316A (ja) | 2003-11-25 |
| EP1268866A2 (en) | 2003-01-02 |
| BR0107533A (pt) | 2003-06-10 |
| RU2002128920A (ru) | 2004-04-20 |
| MXPA02009593A (es) | 2004-05-14 |
| KR20020095199A (ko) | 2002-12-20 |
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