ATE89662T1 - Apparat und verfahren zur elektronischen analyse von proben. - Google Patents

Apparat und verfahren zur elektronischen analyse von proben.

Info

Publication number
ATE89662T1
ATE89662T1 AT88120375T AT88120375T ATE89662T1 AT E89662 T1 ATE89662 T1 AT E89662T1 AT 88120375 T AT88120375 T AT 88120375T AT 88120375 T AT88120375 T AT 88120375T AT E89662 T1 ATE89662 T1 AT E89662T1
Authority
AT
Austria
Prior art keywords
pattern
recorded
interference
polarizer
interfere
Prior art date
Application number
AT88120375T
Other languages
English (en)
Inventor
Yau Y Hung
Original Assignee
Yau Y Hung
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yau Y Hung filed Critical Yau Y Hung
Application granted granted Critical
Publication of ATE89662T1 publication Critical patent/ATE89662T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/168—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by means of polarisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
    • G01L1/241—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet by photoelastic stress analysis

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
AT88120375T 1987-12-07 1988-12-06 Apparat und verfahren zur elektronischen analyse von proben. ATE89662T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US07/129,709 US4887899A (en) 1987-12-07 1987-12-07 Apparatus and method for electronic analysis of test objects
CA000585151A CA1321894C (en) 1987-12-07 1988-12-06 Apparatus and method for electronic analysis of test objects
EP88120375A EP0319923B1 (de) 1987-12-07 1988-12-06 Apparat und Verfahren zur elektronischen Analyse von Proben

Publications (1)

Publication Number Publication Date
ATE89662T1 true ATE89662T1 (de) 1993-06-15

Family

ID=25672280

Family Applications (1)

Application Number Title Priority Date Filing Date
AT88120375T ATE89662T1 (de) 1987-12-07 1988-12-06 Apparat und verfahren zur elektronischen analyse von proben.

Country Status (6)

Country Link
US (1) US4887899A (de)
EP (1) EP0319923B1 (de)
JP (1) JPH0769153B2 (de)
AT (1) ATE89662T1 (de)
CA (1) CA1321894C (de)
DE (1) DE3881173T2 (de)

Families Citing this family (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5094528A (en) * 1990-05-25 1992-03-10 Laser Technology, Inc. Apparatus and method for performing electronic shearography
US5082366A (en) * 1990-08-30 1992-01-21 Laser Technology, Inc. Apparatus and method for detecting leaks in packages
US5091776A (en) * 1990-11-08 1992-02-25 Laser Technology, Inc. Apparatus and method for enhancing the quality of a video signal produced by electronic shearography
DE4036120C2 (de) * 1990-11-13 1994-06-23 Steinbichler Hans Verfahren zur Bestimmung der Wegänderung von Strahlen, insbesondere von Lichtstrahlen, und Vorrichtung zur Durchführung des Verfahrens
US5146289A (en) * 1990-12-21 1992-09-08 Laser Technology, Inc. Nondestructive testing using air-coupled acoustic excitation
DE4129168C2 (de) * 1991-09-03 1996-03-21 Michel Honlet Vorrichtung zur Messung von Verformungen eines Objekts nach dem Prinzip der Speckle-Scher-Interferometrie
US5175601A (en) * 1991-10-15 1992-12-29 Electro-Optical Information Systems High-speed 3-D surface measurement surface inspection and reverse-CAD system
US5257088A (en) * 1992-03-27 1993-10-26 Laser Technology, Inc. Apparatus and method for nondestructive inspection of a vehicle
US5257089A (en) * 1992-06-15 1993-10-26 United Technologies Corporation Optical head for shearography
US5319445A (en) * 1992-09-08 1994-06-07 Fitts John M Hidden change distribution grating and use in 3D moire measurement sensors and CMM applications
DE4231578C2 (de) * 1992-09-21 1995-06-29 Nova C O R D Ag Verfahren zur Ermittlung von Verformungen an einem Prüfobjekt mit diffus streuender Oberfläche, insbesondere an Reifen, sowie Vorrichtung zur Durchführung des Verfahrens
US5414512A (en) * 1993-03-10 1995-05-09 Grant Engineering, Inc. Method and apparatus for viewing a shearographic image
US5341204A (en) * 1993-06-29 1994-08-23 Grant Engineering, Inc. Shearing optical element for interferometric analysis system
US5786533A (en) * 1996-04-17 1998-07-28 Michelin North America, Inc. Method for analyzing a separation in a deformable structure
US6043870A (en) * 1996-07-01 2000-03-28 Cybernet Systems Corporation Compact fiber optic electronic laser speckle pattern interferometer
US6040900A (en) * 1996-07-01 2000-03-21 Cybernet Systems Corporation Compact fiber-optic electronic laser speckle pattern shearography
US6128082A (en) * 1998-09-18 2000-10-03 Board Of Trustees Operating Michigan State University Technique and apparatus for performing electronic speckle pattern interferometry
US6188482B1 (en) 1998-09-18 2001-02-13 Board Of Trustees Operating Michigan State University Apparatus for electronic speckle pattern interferometry
DE19856400B4 (de) * 1998-12-07 2009-04-09 Steinbichler Optotechnik Gmbh Verfahren und Vorrichtung zur direkten Phasenmessung von Strahlung
US6720547B1 (en) * 1999-03-18 2004-04-13 Lucid, Inc. System and method for enhancing confocal reflectance images of tissue specimens
US6791695B2 (en) 1999-06-16 2004-09-14 Bandag Licensing Corporation Shearographic imaging machine with archive memory for animation data and air handling system
US6219143B1 (en) * 1999-06-16 2001-04-17 Bandag, Incorporated Method and apparatus for analyzing shearogram images by animation
US6606160B1 (en) 1999-11-12 2003-08-12 Yau Y. Hung Nondestructive testing of diffusely reflective objects
JP3479685B2 (ja) * 2000-10-24 2003-12-15 新潟大学長 異方性解析方法及び異方性解析装置
US6674532B2 (en) * 2001-11-02 2004-01-06 Vandelden Jay S. Interferometric polarization interrogating filter assembly and method
JP4515261B2 (ja) * 2002-08-29 2010-07-28 ノーコム システムズ インク． シール品の漏洩を検知するシステム及びプロセス
US6934018B2 (en) * 2003-09-10 2005-08-23 Shearographics, Llc Tire inspection apparatus and method
US7436504B2 (en) * 2003-09-10 2008-10-14 Shear Graphics, Llc Non-destructive testing and imaging
US7187437B2 (en) 2003-09-10 2007-03-06 Shearographics, Llc Plurality of light sources for inspection apparatus and method
WO2005103607A1 (en) * 2004-04-22 2005-11-03 Showa Denko K.K. Pressure resistance inspecting method and pressure resistance inspecting apparatus for heat exchangers
US20060216257A1 (en) * 2005-03-24 2006-09-28 L'oreal Makeup and/or care kit providing volumizing effect
US20090174554A1 (en) 2005-05-11 2009-07-09 Eric Bergeron Method and system for screening luggage items, cargo containers or persons
US7991242B2 (en) 2005-05-11 2011-08-02 Optosecurity Inc. Apparatus, method and system for screening receptacles and persons, having image distortion correction functionality
US7532330B2 (en) * 2005-08-16 2009-05-12 Zygo Corporation Angle interferometers
US7899232B2 (en) 2006-05-11 2011-03-01 Optosecurity Inc. Method and apparatus for providing threat image projection (TIP) in a luggage screening system, and luggage screening system implementing same
WO2008010790A1 (en) * 2006-07-18 2008-01-24 Celloptic, Inc. System, apparatus and method for extracting three-dimensional information of an object from received electromagnetic radiation
US8494210B2 (en) 2007-03-30 2013-07-23 Optosecurity Inc. User interface for use in security screening providing image enhancement capabilities and apparatus for implementing same
DE102008038297A1 (de) * 2008-08-18 2010-02-25 Eads Deutschland Gmbh System und Verfahren zum Prüfen von Bauteilen
US20110106459A1 (en) * 2009-10-29 2011-05-05 Northrop Grumman Corporation In-situ optical crack measurement using a dot pattern
US9111331B2 (en) 2011-09-07 2015-08-18 Rapiscan Systems, Inc. X-ray inspection system that integrates manifest data with imaging/detection processing
EP3420563A4 (de) 2016-02-22 2020-03-11 Rapiscan Systems, Inc. Systeme und verfahren zum erkennen von bedrohungen und schmuggelware in ladungen

Family Cites Families (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3218916A (en) * 1962-08-23 1965-11-23 James B Saunders Wave front shearing interferometer
US3487227A (en) * 1966-12-22 1969-12-30 Cornell Aeronautical Labor Inc Three-aperture optical interferometer
US3373652A (en) * 1967-06-29 1968-03-19 Scott Engineering Sciences Cor Educational polariscope apparatus for determining and observing stress in photoelastic materials
US3532431A (en) * 1968-02-05 1970-10-06 Ibm Shearing interferometry by means of holography
US3626753A (en) * 1970-03-05 1971-12-14 Trw Inc Acousto-holographic method and apparatus for internally imaging and interferometrically analyzing objects
US3849003A (en) * 1970-03-25 1974-11-19 Philips Corp Interferometer apparatus for measuring the roughness of a surface
FR2097473A5 (de) * 1970-07-08 1972-03-03 Bazelaire Eric De
GB1392448A (en) * 1971-06-22 1975-04-30 Nat Res Dev Optical indpection
US3767308A (en) * 1972-01-12 1973-10-23 Gen Electric Method and apparatus for sensing surface displacement orthogonal to the line of sight
US3829219A (en) * 1973-03-30 1974-08-13 Itek Corp Shearing interferometer
US3828126A (en) * 1973-04-13 1974-08-06 American Express Invest Real time interferometry
US3911729A (en) * 1973-07-16 1975-10-14 Holosonics Inc Shear wave acoustical holography
JPS5265460A (en) * 1975-11-26 1977-05-30 Agency Of Ind Science & Technol Sharing interference method using hologram as interference meter
US4139302A (en) * 1977-02-17 1979-02-13 Dr. Ralph M. Grant Engineering Consultants, Inc. Method and apparatus for interferometric deformation analysis
US4125314A (en) * 1977-05-05 1978-11-14 Dr. Ralph M. Grant Engineering Consultants, Inc. Beam ratio control for holography
JPS5483854A (en) * 1977-12-16 1979-07-04 Canon Inc Measuring device
US4425039A (en) * 1982-05-07 1984-01-10 Industrial Holographics, Inc. Apparatus for the practice of double exposure interferometric non-destructive testing
US4682892A (en) * 1982-08-13 1987-07-28 The Goodyear Tire & Rubber Company Method and apparatus for speckle-shearing interferometric deformation analysis
US4620223A (en) * 1982-09-03 1986-10-28 Industrial Holographics, Inc. Interferometric deformation analysis system
JPS5953524A (ja) * 1982-09-22 1984-03-28 Sumitomo Bakelite Co Ltd 合成樹脂用難燃剤
US4702594A (en) * 1982-11-15 1987-10-27 Industrial Holographics, Inc. Double exposure interferometric analysis of structures and employing ambient pressure stressing
US4541280A (en) * 1982-12-28 1985-09-17 Canadian Patents & Development Ltd. Efficient laser generation of surface acoustic waves
US4523469A (en) * 1983-01-19 1985-06-18 The United States Of America As Represented By The Secretary Of The Navy Laser generation of ultrasonic waveform reconstructions
JPS60231401A (ja) * 1983-12-15 1985-11-18 Mitsubishi Heavy Ind Ltd Ｃａ−Νａ−Ａ，Νａ−Ｘ−ΝａＣｌを使つたΝ↓２吸着塔による酸素製造方法
US4643576A (en) * 1984-04-19 1987-02-17 Ricoh Company Ltd. Fringe scanning shearing interferometer
US4650302A (en) * 1985-01-15 1987-03-17 Grant Ralph M Interferometric eye test method and apparatus
FR2581190B1 (fr) * 1985-04-25 1987-06-19 Elf France Detecteur interferometrique de gaz
US4633715A (en) * 1985-05-08 1987-01-06 Canadian Patents And Development Limited - Societe Canadienne Des Brevets Et D'exploitation Limitee Laser heterodyne interferometric method and system for measuring ultrasonic displacements
US4690552A (en) * 1985-08-19 1987-09-01 Industrial Holographics, Inc. Optical method and apparatus for strain analysis
DE3531904A1 (de) * 1985-09-05 1986-03-27 Studio S - Gesellschaft für Elektronik, Datenverarbeitung und Optik mbH, 1000 Berlin Lateral-shearing-interferometer zur phasendifferenzmessung von zwei wellenflaechen konstanter phase

Also Published As

Publication number Publication date
US4887899A (en) 1989-12-19
CA1321894C (en) 1993-09-07
DE3881173T2 (de) 1993-12-16
EP0319923B1 (de) 1993-05-19
JPH0769153B2 (ja) 1995-07-26
JPH01202606A (ja) 1989-08-15
EP0319923A2 (de) 1989-06-14
EP0319923A3 (en) 1990-09-12
DE3881173D1 (de) 1993-06-24

Similar Documents

Publication Publication Date Title
DE3881173D1 (de) Apparat und verfahren zur elektronischen analyse von proben.
US4573198A (en) Optical image processing/pattern recognition system
GB2279737A (en) Photoelastic stress analysis
US5011280A (en) Method of measuring displacement between points on a test object
JPH0670798B2 (ja) 光学的パターン認識方法
US5406375A (en) Angular distortion measurements by moire fringe patterns
Purwosumarto et al. Robustness of joint transform correlator versus Vander Lugt correlator
Hung et al. Real-time shearography for measuring time-dependent displacement derivatives
EP0370752A2 (de) Verfahren und Vorrichtung für die optische Erhöhung von besonderen Merkmalen in einem Eingangsbild
Ludman et al. Real-time color-pattern recognition
JPH03175303A (ja) スペックル利用測定装置
Gorecki et al. Speckle displacement analysis by phase correlation using a SLM-based processor
SE9102892D0 (sv) Anordning foer maetning av bildkvalitet mede optisk moensterigenkaenning
ATE255751T1 (de) Verfahren und vorrichtung zur erkennung der räumlichen konfiguration von münzen
Chang et al. Moire image overlapping method for PCB inspection designator
Dymny et al. Optoelectronic/image processing module for enhanced fringe pattern acquisition and analysis
Taniguchi et al. Detection of road signs by using a multiple correlator and partial invariant filters
Gorecki Phase correlation method for speckle in-plane motion analysis using digitally addressed SLM
Gorecki Rough surface classification by optical generation of irradiance moments computed from the Hartley transform
KR910010179A (ko) 가는선의 미세결함 검출장치
JPH01138476A (ja) 半導体素子の不良解析装置
SU1388819A1 (ru) Способ определени наличи вершины взаимодействи зар женных частиц и ее координат в объеме трекового детектора
Moslehy et al. Effect of partial laser beam coverage on point-wise filtering of specklegrams
JPH06160792A (ja) 画像処理によるアライメント方法
JP2986491B2 (ja) 光学的自動追尾装置

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties