ATE534077T1 - Aktivierung von sondermodi bei einer digitalen vorrichtung - Google Patents
Aktivierung von sondermodi bei einer digitalen vorrichtungInfo
- Publication number
- ATE534077T1 ATE534077T1 AT06735222T AT06735222T ATE534077T1 AT E534077 T1 ATE534077 T1 AT E534077T1 AT 06735222 T AT06735222 T AT 06735222T AT 06735222 T AT06735222 T AT 06735222T AT E534077 T1 ATE534077 T1 AT E534077T1
- Authority
- AT
- Austria
- Prior art keywords
- mode
- key match
- test
- programming
- data stream
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/003—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation in serial memories
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/46—Test trigger logic
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Information Transfer Systems (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US65595505P | 2005-02-24 | 2005-02-24 | |
| PCT/US2006/005462 WO2006091468A2 (en) | 2005-02-24 | 2006-02-16 | Enabling special modes within a digital device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE534077T1 true ATE534077T1 (de) | 2011-12-15 |
Family
ID=36927908
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT06735222T ATE534077T1 (de) | 2005-02-24 | 2006-02-16 | Aktivierung von sondermodi bei einer digitalen vorrichtung |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7603601B2 (de) |
| EP (1) | EP1851635B1 (de) |
| KR (1) | KR101087225B1 (de) |
| CN (1) | CN101128803B (de) |
| AT (1) | ATE534077T1 (de) |
| WO (1) | WO2006091468A2 (de) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102016104946A1 (de) * | 2016-03-17 | 2017-09-21 | Osram Opto Semiconductors Gmbh | Optoelektronisches Bauelement und Verfahren zum Betreiben eines optoelektronischen Bauelements |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5072137A (en) * | 1990-08-17 | 1991-12-10 | Sgs-Thomson Microelectronics, Inc. | Semiconductor memory with a clocked access code for test mode entry |
| GB9622686D0 (en) * | 1996-10-31 | 1997-01-08 | Sgs Thomson Microelectronics | A test port controller and a method of effecting communication using the same |
| TW306627U (en) * | 1996-12-12 | 1997-05-21 | Holtek Semiconductor Inc | Differentiation device of test mode |
| US6005814A (en) * | 1998-04-03 | 1999-12-21 | Cypress Semiconductor Corporation | Test mode entrance through clocked addresses |
| JP2000251497A (ja) * | 1999-03-03 | 2000-09-14 | Toshiba Corp | 半導体メモリ |
| EP1089083A1 (de) * | 1999-09-03 | 2001-04-04 | Sony Corporation | Halbleiterschaltung mit Abtastpfadschaltungen |
| DE60021705T2 (de) * | 1999-11-29 | 2006-06-01 | Koninklijke Philips Electronics N.V. | Verfahren und integrierte schaltung gestaltet zur beschickung eines prüfmusters auf einen einzelnen gemeinsamen anschlussstift |
| JP2002093197A (ja) * | 2000-09-07 | 2002-03-29 | Toshiba Microelectronics Corp | 半導体集積回路のテスト回路 |
| FR2822971A1 (fr) * | 2001-04-03 | 2002-10-04 | St Microelectronics Sa | Systeme et procede de controle d'acces a des donnees protegees stockees dans une memoire |
| JP2002358800A (ja) * | 2001-05-28 | 2002-12-13 | Mitsubishi Electric Corp | 半導体装置 |
| US6888765B1 (en) * | 2002-02-04 | 2005-05-03 | National Semiconductor Corporation | Integrated circuit and method for testing same using single pin to control test mode and normal mode operation |
-
2006
- 2006-02-16 US US11/355,619 patent/US7603601B2/en active Active
- 2006-02-16 AT AT06735222T patent/ATE534077T1/de active
- 2006-02-16 WO PCT/US2006/005462 patent/WO2006091468A2/en active Application Filing
- 2006-02-16 CN CN2006800058951A patent/CN101128803B/zh active Active
- 2006-02-16 KR KR1020077018878A patent/KR101087225B1/ko active IP Right Grant
- 2006-02-16 EP EP06735222A patent/EP1851635B1/de active Active
Also Published As
| Publication number | Publication date |
|---|---|
| KR20070106521A (ko) | 2007-11-01 |
| US20060190791A1 (en) | 2006-08-24 |
| WO2006091468A2 (en) | 2006-08-31 |
| WO2006091468A3 (en) | 2006-12-21 |
| CN101128803A (zh) | 2008-02-20 |
| EP1851635A2 (de) | 2007-11-07 |
| US7603601B2 (en) | 2009-10-13 |
| EP1851635B1 (de) | 2011-11-16 |
| CN101128803B (zh) | 2013-06-26 |
| KR101087225B1 (ko) | 2011-11-29 |
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