ATE511196T1 - Elektrischer kontakt für eine cadmium-tellur- komponente - Google Patents

Elektrischer kontakt für eine cadmium-tellur- komponente

Info

Publication number
ATE511196T1
ATE511196T1 AT08776443T AT08776443T ATE511196T1 AT E511196 T1 ATE511196 T1 AT E511196T1 AT 08776443 T AT08776443 T AT 08776443T AT 08776443 T AT08776443 T AT 08776443T AT E511196 T1 ATE511196 T1 AT E511196T1
Authority
AT
Austria
Prior art keywords
layer
electrical contact
cadmium
tellurium component
component
Prior art date
Application number
AT08776443T
Other languages
English (en)
Inventor
Veen Nicolaas Van
Asselt Rob Van
Gerard Kums
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Application granted granted Critical
Publication of ATE511196T1 publication Critical patent/ATE511196T1/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H1/00—Contacts
    • H01H1/02—Contacts characterised by the material thereof
    • H01H1/021—Composite material
    • H10W72/01225—
    • H10W72/019—
    • H10W72/252—
    • H10W72/923—
    • H10W72/9415—
    • H10W72/952—
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
    • Y10T156/10—Methods of surface bonding and/or assembly therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Composite Materials (AREA)
  • Materials Engineering (AREA)
  • Wire Bonding (AREA)
  • Measurement Of Radiation (AREA)
  • Contacts (AREA)
  • Solid State Image Pick-Up Elements (AREA)
AT08776443T 2007-06-29 2008-06-23 Elektrischer kontakt für eine cadmium-tellur- komponente ATE511196T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP07111421 2007-06-29
PCT/IB2008/052479 WO2009004522A1 (en) 2007-06-29 2008-06-23 Electrical contact for a cadmium tellurium component

Publications (1)

Publication Number Publication Date
ATE511196T1 true ATE511196T1 (de) 2011-06-15

Family

ID=39926576

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08776443T ATE511196T1 (de) 2007-06-29 2008-06-23 Elektrischer kontakt für eine cadmium-tellur- komponente

Country Status (5)

Country Link
US (1) US8847386B2 (de)
EP (1) EP2193533B1 (de)
CN (1) CN101720490B (de)
AT (1) ATE511196T1 (de)
WO (1) WO2009004522A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5644286B2 (ja) * 2010-09-07 2014-12-24 オムロン株式会社 電子部品の表面実装方法及び電子部品が実装された基板
CN102683490A (zh) * 2012-05-09 2012-09-19 上海大学 在碲锌镉晶体表面制备In重掺杂的Au/In欧姆接触电极的方法
US11125904B2 (en) 2014-12-12 2021-09-21 Lingacom Ltd. Large scale gas electron multiplier with sealable opening
US10191180B2 (en) * 2014-12-12 2019-01-29 Lingacom Ltd. Large scale gas electron multiplier and detection method
CN113707633A (zh) * 2021-08-31 2021-11-26 艾普柯微电子(江苏)有限公司 光电传感器及其制备方法
CN115020257A (zh) * 2022-06-22 2022-09-06 中国电子科技集团公司第十三研究所 芯片堆叠的互连方法

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL122459C (de) * 1960-05-13
NL274815A (de) * 1962-02-14
GB1224171A (en) * 1967-02-07 1971-03-03 Associated Semiconductor Mft Improvements in and relating to gunn-effect devices
US4215577A (en) * 1978-08-28 1980-08-05 Purdue Research Foundation Utilization of diodes as wide range responsive thermometers
US4369458A (en) * 1980-07-01 1983-01-18 Westinghouse Electric Corp. Self-aligned, flip-chip focal plane array configuration
US4633050A (en) * 1984-04-30 1986-12-30 Allied Corporation Nickel/indium alloy for use in the manufacture of electrical contact areas electrical devices
US4785137A (en) * 1984-04-30 1988-11-15 Allied Corporation Novel nickel/indium/other metal alloy for use in the manufacture of electrical contact areas of electrical devices
JPS63268278A (ja) 1987-04-24 1988-11-04 Matsushita Electric Ind Co Ltd 半導体放射線検出器
FR2633101B1 (fr) * 1988-06-16 1992-02-07 Commissariat Energie Atomique Photodiode et matrice de photodiodes sur hgcdte et leurs procedes de fabrication
US5510644A (en) * 1992-03-23 1996-04-23 Martin Marietta Corporation CDTE x-ray detector for use at room temperature
US6410922B1 (en) * 1995-11-29 2002-06-25 Konstantinos Evangelos Spartiotis Forming contacts on semiconductor substrates for radiation detectors and imaging devices
GB2307785B (en) * 1995-11-29 1998-04-29 Simage Oy Forming contacts on semiconductor substrates for radiation detectors and imaging devices
US20020158207A1 (en) * 1996-11-26 2002-10-31 Simage, Oy. Forming contacts on semiconductor substrates for radiation detectors and imaging devices
US6524966B1 (en) * 1997-05-28 2003-02-25 Sandia National Laboratories Surface treatment and protection method for cadmium zinc telluride crystals
US6064114A (en) * 1997-12-01 2000-05-16 Motorola, Inc. Semiconductor device having a sub-chip-scale package structure and method for forming same
GB2369724B (en) * 2000-12-04 2003-04-30 Infrared Integrated Syst Ltd Improving individual detector performance in radiation detector arrays
WO2002067014A1 (en) * 2001-02-18 2002-08-29 Real-Time Radiography Ltd. Wide band gap semiconductor composite detector plates for x-ray digital radiography
US6909100B2 (en) * 2002-07-25 2005-06-21 Ii-Vi Incorporated Radiation detector assembly
GB0224689D0 (en) * 2002-10-23 2002-12-04 Simage Oy Formation of contacts on semiconductor substrates
DE10261303B3 (de) * 2002-12-27 2004-06-24 Wieland-Werke Ag Verbundmaterial zur Herstellung elektrischer Kontakte und Verfahren zu dessen Herstellung
CA2541256A1 (en) * 2006-02-22 2007-08-22 Redlen Technologies Inc. Shielding electrode for monolithic radiation detector

Also Published As

Publication number Publication date
WO2009004522A1 (en) 2009-01-08
EP2193533A1 (de) 2010-06-09
CN101720490B (zh) 2013-10-23
US20100184341A1 (en) 2010-07-22
US8847386B2 (en) 2014-09-30
CN101720490A (zh) 2010-06-02
EP2193533B1 (de) 2011-05-25

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Legal Events

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RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties