ATE496484T1 - Thermischer matrixbildsensor mit bolometrischen pixeln und verfahren zur reduzierung von speziellen geräuschen - Google Patents

Thermischer matrixbildsensor mit bolometrischen pixeln und verfahren zur reduzierung von speziellen geräuschen

Info

Publication number
ATE496484T1
ATE496484T1 AT08167221T AT08167221T ATE496484T1 AT E496484 T1 ATE496484 T1 AT E496484T1 AT 08167221 T AT08167221 T AT 08167221T AT 08167221 T AT08167221 T AT 08167221T AT E496484 T1 ATE496484 T1 AT E496484T1
Authority
AT
Austria
Prior art keywords
image sensor
bolometric
value
pixels
matrix image
Prior art date
Application number
AT08167221T
Other languages
English (en)
Inventor
S Gilles Chamming
Original Assignee
Commissariat Energie Atomique
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat Energie Atomique filed Critical Commissariat Energie Atomique
Application granted granted Critical
Publication of ATE496484T1 publication Critical patent/ATE496484T1/de

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/771—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising storage means other than floating diffusion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
    • G01J5/22—Electrical features thereof
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/20—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming only infrared radiation into image signals
    • H04N25/21—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming only infrared radiation into image signals for transforming thermal infrared radiation into image signals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/673—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Solid State Image Pick-Up Elements (AREA)
AT08167221T 2007-10-23 2008-10-22 Thermischer matrixbildsensor mit bolometrischen pixeln und verfahren zur reduzierung von speziellen geräuschen ATE496484T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0707418A FR2922683B1 (fr) 2007-10-23 2007-10-23 Capteur d'image thermique matriciel a pixel bolometrique et procede de reduction de bruit spatial.

Publications (1)

Publication Number Publication Date
ATE496484T1 true ATE496484T1 (de) 2011-02-15

Family

ID=39365778

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08167221T ATE496484T1 (de) 2007-10-23 2008-10-22 Thermischer matrixbildsensor mit bolometrischen pixeln und verfahren zur reduzierung von speziellen geräuschen

Country Status (8)

Country Link
US (1) US20090121139A1 (de)
EP (1) EP2059030B1 (de)
JP (1) JP2009103700A (de)
CN (1) CN101419094A (de)
AT (1) ATE496484T1 (de)
CA (1) CA2641376A1 (de)
DE (1) DE602008004611D1 (de)
FR (1) FR2922683B1 (de)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2920872B1 (fr) * 2007-09-10 2009-11-06 Centre Nat Rech Scient Bolometre a asservissement de chaleur.
FR2946743B1 (fr) * 2009-06-15 2012-01-27 Commissariat Energie Atomique Dispositif de detection de rayonnements electromagnetiques a detecteur bolometrique polarise, application a une detection infrarouge
FR2959013B1 (fr) * 2010-04-16 2012-05-11 Commissariat Energie Atomique Dispositif de detection de rayonnement electromagnetique a sensibilite reduite au bruit spacial
FR2968078A1 (fr) * 2010-11-29 2012-06-01 Commissariat Energie Atomique Circuit électronique de polarisation et de lecture de détecteur thermique résistif
FR2972851B1 (fr) 2011-03-18 2013-12-20 Commissariat Energie Atomique Capteur d'images
CN103335716B (zh) * 2013-06-21 2016-06-08 中国科学院西安光学精密机械研究所 基于变积分时间的面阵红外相机定标与非均匀性校正方法
CN103335717B (zh) * 2013-06-21 2015-11-18 中国科学院西安光学精密机械研究所 一种基于变积分模式的红外热像仪高精度抗温漂测温方法
FR3009388B1 (fr) * 2013-07-30 2015-07-17 Ulis Diagnostic de l'etat defectueux d'une matrice de detection bolometrique
US9410850B2 (en) * 2013-09-20 2016-08-09 Vlad Joseph Novotny Infrared imager readout electronics
FR3015770B1 (fr) * 2013-12-19 2016-01-22 Commissariat Energie Atomique Procede et systeme de controle de qualite de cellules photovoltaiques
WO2015162876A1 (ja) * 2014-04-22 2015-10-29 日本電気株式会社 半導体装置と該半導体装置を備えた赤外線撮像装置、及び半導体装置の制御方法
US11108975B2 (en) 2017-04-11 2021-08-31 Mikrosens Elektronik San. Ve Tic. On-chip bias calibration for microbolometer detectors and readout integrated circuits
JP6874578B2 (ja) * 2017-07-26 2021-05-19 富士通株式会社 アレイセンサおよび撮像装置
WO2020041651A1 (en) 2018-08-23 2020-02-27 Raytheon Company Per-pixel detector bias control
TWI705235B (zh) * 2019-07-19 2020-09-21 財團法人工業技術研究院 感測裝置
FR3105444B1 (fr) * 2019-12-24 2022-01-07 Commissariat Energie Atomique Procédé de détermination d'un biais affectant des pixels d'un détecteur pixellisé de rayonnement ionisant
US11561132B2 (en) 2020-06-04 2023-01-24 Raytheon Company Per-pixel detector bias control
CN112214953B (zh) * 2020-10-20 2022-08-05 中国科学院新疆理化技术研究所 一种电路级总剂量辐射效应仿真方法
US12455193B2 (en) * 2021-08-25 2025-10-28 Flir Systems Ab Variable sensitivity in infrared imaging systems and methods
CN114878033B (zh) * 2022-03-29 2023-12-22 深圳国微感知技术有限公司 一种矩阵式压力分布测量系统及方法
US20240264003A1 (en) * 2023-02-07 2024-08-08 Owl Autonomous Imaging, Inc. Methods and systems for thermal image sensing
TWI866362B (zh) * 2023-07-28 2024-12-11 高爾科技股份有限公司 熱影像陣列像素動態校正之方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5756999A (en) * 1997-02-11 1998-05-26 Indigo Systems Corporation Methods and circuitry for correcting temperature-induced errors in microbolometer focal plane array
US6953932B2 (en) * 1999-10-07 2005-10-11 Infrared Solutions, Inc. Microbolometer focal plane array with temperature compensated bias
FR2848666B1 (fr) * 2002-12-16 2005-01-21 Fr De Detecteurs Infrarouges S Dispositif de detection de rayonnements electromagnetiques

Also Published As

Publication number Publication date
FR2922683A1 (fr) 2009-04-24
FR2922683B1 (fr) 2010-09-17
US20090121139A1 (en) 2009-05-14
CN101419094A (zh) 2009-04-29
JP2009103700A (ja) 2009-05-14
EP2059030A1 (de) 2009-05-13
CA2641376A1 (en) 2009-04-23
DE602008004611D1 (de) 2011-03-03
EP2059030B1 (de) 2011-01-19

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