ATE479102T1 - Verfahren und vorrichtung zur genauen messung der abhängigkeit von amplitude und phase einer vielzahl von hochfrequenzsignalen - Google Patents

Verfahren und vorrichtung zur genauen messung der abhängigkeit von amplitude und phase einer vielzahl von hochfrequenzsignalen

Info

Publication number
ATE479102T1
ATE479102T1 AT04468003T AT04468003T ATE479102T1 AT E479102 T1 ATE479102 T1 AT E479102T1 AT 04468003 T AT04468003 T AT 04468003T AT 04468003 T AT04468003 T AT 04468003T AT E479102 T1 ATE479102 T1 AT E479102T1
Authority
AT
Austria
Prior art keywords
signals
digital
analogue
directing
digital signals
Prior art date
Application number
AT04468003T
Other languages
English (en)
Inventor
Rok Ursic
Original Assignee
Instrumentation Technologies D
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Instrumentation Technologies D filed Critical Instrumentation Technologies D
Application granted granted Critical
Publication of ATE479102T1 publication Critical patent/ATE479102T1/de

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H13/00Magnetic resonance accelerators; Cyclotrons
    • H05H13/04Synchrotrons
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2506Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
    • G01R19/2509Details concerning sampling, digitizing or waveform capturing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0046Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
    • G01R19/0061Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Particle Accelerators (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Measurement Of Radiation (AREA)
  • Amplifiers (AREA)
AT04468003T 2003-05-05 2004-01-29 Verfahren und vorrichtung zur genauen messung der abhängigkeit von amplitude und phase einer vielzahl von hochfrequenzsignalen ATE479102T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SI200300115A SI21524B (sl) 2003-05-05 2003-05-05 Postopek natančnega merjenja amplitudne in fazneodvisnosti večjega števila visokofrekvenčnih signalov in naprava za izvedbo postopka

Publications (1)

Publication Number Publication Date
ATE479102T1 true ATE479102T1 (de) 2010-09-15

Family

ID=32986119

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04468003T ATE479102T1 (de) 2003-05-05 2004-01-29 Verfahren und vorrichtung zur genauen messung der abhängigkeit von amplitude und phase einer vielzahl von hochfrequenzsignalen

Country Status (7)

Country Link
US (1) US6972552B2 (de)
EP (1) EP1475641B1 (de)
AT (1) ATE479102T1 (de)
DE (1) DE602004028778D1 (de)
DK (1) DK1475641T3 (de)
ES (1) ES2354250T3 (de)
SI (1) SI21524B (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3947185B2 (ja) * 2004-06-01 2007-07-18 株式会社アドバンテスト アナログディジタル変換方法、及びアナログディジタル変換装置
SI22820A (sl) 2008-05-30 2009-12-31 Instrumentation Technologies D.O.O. Postopek natančnega merjenja amplitudne in fazne odvisnosti večjega števila visokofrekvenčnih signalov in naprava za izvedbo postopka
SI23045A (sl) * 2009-04-29 2010-10-29 Instrumentation Technologies D.D. Optični sistem za prenos signala časovne reference
SI23620A (sl) * 2011-01-13 2012-07-31 Instrumentation@Technologies@d@d Postopek natančnega merjenja položaja in časa prihoda pospešenih delcev in naprava za izvedbo postopka
CN102495254A (zh) * 2011-12-12 2012-06-13 江苏绿扬电子仪器集团有限公司 一种示波器高速信号采样系统
CN102565481A (zh) * 2011-12-12 2012-07-11 江苏绿扬电子仪器集团有限公司 一种基于数字预失真的采样信号处理系统
US9330283B2 (en) 2013-02-21 2016-05-03 Linear Technology Corporation High-frequency RMS-DC converter using chopper-stabilized square cells
CN106501604B (zh) * 2016-10-24 2019-03-19 中国科学院上海应用物理研究所 一种测量粒子加速器束团纵向相位的方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3832145A1 (de) * 1988-09-22 1990-03-29 Philips Patentverwaltung Verfahren und schaltungsanordnung zur messung kleiner elektrischer signale
US5057766A (en) * 1989-06-06 1991-10-15 Mitsubishi Denki Kabushiki Kaisha Apparatus for detecting position of charged particle
US5001416A (en) * 1990-03-05 1991-03-19 Associated Universities, Inc. Apparatus and method for detecting and measuring changes in linear relationships between a number of high frequency signals

Also Published As

Publication number Publication date
DK1475641T3 (da) 2010-12-13
EP1475641B1 (de) 2010-08-25
SI21524B (sl) 2010-11-30
SI21524A (sl) 2004-12-31
US20040222778A1 (en) 2004-11-11
EP1475641A2 (de) 2004-11-10
DE602004028778D1 (de) 2010-10-07
ES2354250T3 (es) 2011-03-11
US6972552B2 (en) 2005-12-06
EP1475641A3 (de) 2006-05-03

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