ATE434847T1 - Verfahren und vorrichtung zum messen der temperatur vonthermischen abstimmelementen in abstimmbaren optischen einrichtungen - Google Patents

Verfahren und vorrichtung zum messen der temperatur vonthermischen abstimmelementen in abstimmbaren optischen einrichtungen

Info

Publication number
ATE434847T1
ATE434847T1 AT03814793T AT03814793T ATE434847T1 AT E434847 T1 ATE434847 T1 AT E434847T1 AT 03814793 T AT03814793 T AT 03814793T AT 03814793 T AT03814793 T AT 03814793T AT E434847 T1 ATE434847 T1 AT E434847T1
Authority
AT
Austria
Prior art keywords
temperature
rtd
tunable optical
thermal tuning
resistance
Prior art date
Application number
AT03814793T
Other languages
English (en)
Inventor
Douglas Sprock
Robert Carney
Timothy Robertson
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Application granted granted Critical
Publication of ATE434847T1 publication Critical patent/ATE434847T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
    • G01K7/18—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer
    • G01K7/20—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer in a specially-adapted circuit, e.g. bridge circuit
    • G01K7/206—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer in a specially-adapted circuit, e.g. bridge circuit in a potentiometer circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
    • G01K7/18—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer
    • G01K7/20—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer in a specially-adapted circuit, e.g. bridge circuit

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Lasers (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Radiation Pyrometers (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
AT03814793T 2002-12-30 2003-12-12 Verfahren und vorrichtung zum messen der temperatur vonthermischen abstimmelementen in abstimmbaren optischen einrichtungen ATE434847T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/334,509 US6798800B2 (en) 2002-12-30 2002-12-30 Method and apparatus to sense temperature of thermal tuning elements in tunable optical devices
PCT/US2003/039827 WO2004062052A2 (en) 2002-12-30 2003-12-12 Method and apparatus to sense temperature of thermal tuning elements in tunable optical devices

Publications (1)

Publication Number Publication Date
ATE434847T1 true ATE434847T1 (de) 2009-07-15

Family

ID=32655079

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03814793T ATE434847T1 (de) 2002-12-30 2003-12-12 Verfahren und vorrichtung zum messen der temperatur vonthermischen abstimmelementen in abstimmbaren optischen einrichtungen

Country Status (8)

Country Link
US (1) US6798800B2 (de)
EP (1) EP1579541B1 (de)
JP (1) JP4659459B2 (de)
CN (1) CN100536264C (de)
AT (1) ATE434847T1 (de)
AU (1) AU2003297092A1 (de)
DE (1) DE60328130D1 (de)
WO (1) WO2004062052A2 (de)

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US7097110B2 (en) * 2003-09-02 2006-08-29 Texas Instruments Incorporated Temperature compensation systems and methods for use with read/write heads in magnetic storage devices
DE102005029045A1 (de) * 2005-06-21 2007-01-04 Endress + Hauser Wetzer Gmbh + Co Kg Vorrichtung und Verfahren zur Bestimmung und/oder Überwachung der Temperatur
US7891865B2 (en) * 2006-05-03 2011-02-22 International Business Machines Corporation Structure for bolometric on-chip temperature sensor
US8182139B2 (en) * 2008-05-30 2012-05-22 Apple Inc. Calibration of temperature sensing circuitry in an electronic device
US20110150014A1 (en) * 2009-08-13 2011-06-23 Andrew Daiber Analog temperature control for tunable lasers
US8864275B2 (en) * 2011-12-14 2014-10-21 Xerox Corporation System for detecting leakage of phase change inks
US9470580B2 (en) * 2013-09-26 2016-10-18 Rosemount Inc. Infrared sensor
CN105223654B (zh) * 2014-06-11 2019-02-01 上海诺基亚贝尔股份有限公司 用于热可调谐滤波器的波长跳跃的方法和装置
DE102017130135A1 (de) 2017-12-15 2019-06-19 Endress + Hauser Wetzer Gmbh + Co. Kg Zustandsüberwachung eines Temperatursensors
US11359979B2 (en) * 2018-06-01 2022-06-14 Analog Devices International Unlimited Company Hybrid temperature sensor
JP7202160B2 (ja) * 2018-12-05 2023-01-11 浜松ホトニクス株式会社 光学フィルタ装置、及び光学フィルタ装置の制御方法
IT201800020677A1 (it) * 2018-12-21 2020-06-21 Nuovo Pignone Tecnologie Srl Turbomacchine con dispositivi saw e baw, disposizioni di misura e metodi di installazione
US12264977B2 (en) * 2022-01-12 2025-04-01 Hamilton Sundstrand Corporation Common signal conditioning circuit for temperature sensor
US12359983B2 (en) * 2022-04-25 2025-07-15 Hamilton Sundstrand Corporation High accuracy computational method in resistance temperature detector measurements
US20250137853A1 (en) * 2023-11-01 2025-05-01 Analog Devices, Inc. Resistive thermometer excitation and calibration

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GB936613A (de) *
JPS61167827A (ja) * 1985-01-21 1986-07-29 Omron Tateisi Electronics Co 電子温度計
JPS6488218A (en) * 1987-09-30 1989-04-03 Hitachi Ltd Heat ray type air flowmeter
US5038352A (en) * 1990-11-13 1991-08-06 International Business Machines Incorporation Laser system and method using a nonlinear crystal resonator
US5183039A (en) * 1991-08-23 1993-02-02 Baxter International Inc. Temperature control device for fluid filled pad
DE4221922C1 (de) * 1992-07-03 1994-01-13 Bosch Gmbh Robert Wärmetönungssensor
US5325229A (en) * 1993-05-10 1994-06-28 Phillips Petroleum Company Temperature control of crystals used in optical oscillators
US5555253A (en) * 1995-01-09 1996-09-10 Amoco Corporation Technique for locking a laser diode to a passive cavity
JP3081141B2 (ja) * 1995-09-26 2000-08-28 日本無線株式会社 レーザーモジュール温度制御回路
JP3823262B2 (ja) * 1996-06-19 2006-09-20 株式会社トプコン レーザー発振装置
US6231153B1 (en) * 1997-04-25 2001-05-15 Hewlett-Packard Company Method and apparatus for controlling an ink-jet print head temperature
JP4408010B2 (ja) * 1999-07-01 2010-02-03 富士通株式会社 Ｗｄｍ用光送信装置
US6853654B2 (en) * 1999-07-27 2005-02-08 Intel Corporation Tunable external cavity laser
JP3646620B2 (ja) * 2000-04-24 2005-05-11 住友金属鉱山株式会社 非破壊透過式光測定装置用較正器とこの較正器を用いた較正方法およびこの較正器が組込まれた非破壊透過式光測定装置
AU2001292973A1 (en) * 2000-09-22 2002-04-02 Blue Leaf, Inc. Optical transmitter comprising a stepwise tunable laser

Also Published As

Publication number Publication date
US20040125857A1 (en) 2004-07-01
CN1732603A (zh) 2006-02-08
JP4659459B2 (ja) 2011-03-30
JP2006508546A (ja) 2006-03-09
CN100536264C (zh) 2009-09-02
US6798800B2 (en) 2004-09-28
AU2003297092A8 (en) 2004-07-29
EP1579541B1 (de) 2009-06-24
DE60328130D1 (de) 2009-08-06
WO2004062052A3 (en) 2004-11-25
EP1579541A2 (de) 2005-09-28
WO2004062052A2 (en) 2004-07-22
AU2003297092A1 (en) 2004-07-29

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