ATE412256T1 - Verfahren zur herstellung strukturierter schichten - Google Patents

Verfahren zur herstellung strukturierter schichten

Info

Publication number
ATE412256T1
ATE412256T1 AT03012228T AT03012228T ATE412256T1 AT E412256 T1 ATE412256 T1 AT E412256T1 AT 03012228 T AT03012228 T AT 03012228T AT 03012228 T AT03012228 T AT 03012228T AT E412256 T1 ATE412256 T1 AT E412256T1
Authority
AT
Austria
Prior art keywords
transfer member
ridges
film
transfer
structured layers
Prior art date
Application number
AT03012228T
Other languages
English (en)
Inventor
Norio Shibata
Junji Nakada
Jun Fujinawa
Original Assignee
Fujifilm Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujifilm Corp filed Critical Fujifilm Corp
Application granted granted Critical
Publication of ATE412256T1 publication Critical patent/ATE412256T1/de

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76838Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/0005Separation of the coating from the substrate
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/08Oxides
    • C23C14/086Oxides of zinc, germanium, cadmium, indium, tin, thallium or bismuth
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/283Deposition of conductive or insulating materials for electrodes conducting electric current
    • H01L21/285Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
    • H01L21/28506Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • H10K71/16Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
    • H10K71/164Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using vacuum deposition
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • H10K71/18Deposition of organic active material using non-liquid printing techniques, e.g. thermal transfer printing from a donor sheet
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/30Devices specially adapted for multicolour light emission
    • H10K59/35Devices specially adapted for multicolour light emission comprising red-green-blue [RGB] subpixels
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • H10K71/12Deposition of organic active material using liquid deposition, e.g. spin coating
    • H10K71/13Deposition of organic active material using liquid deposition, e.g. spin coating using printing techniques, e.g. ink-jet printing or screen printing
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/40Thermal treatment, e.g. annealing in the presence of a solvent vapour
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K77/00Constructional details of devices covered by this subclass and not covered by groups H10K10/80, H10K30/80, H10K50/80 or H10K59/80
    • H10K77/10Substrates, e.g. flexible substrates
    • H10K77/111Flexible substrates
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K85/00Organic materials used in the body or electrodes of devices covered by this subclass
    • H10K85/30Coordination compounds
    • H10K85/311Phthalocyanine
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K85/00Organic materials used in the body or electrodes of devices covered by this subclass
    • H10K85/30Coordination compounds
    • H10K85/321Metal complexes comprising a group IIIA element, e.g. Tris (8-hydroxyquinoline) gallium [Gaq3]
    • H10K85/324Metal complexes comprising a group IIIA element, e.g. Tris (8-hydroxyquinoline) gallium [Gaq3] comprising aluminium, e.g. Alq3
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K85/00Organic materials used in the body or electrodes of devices covered by this subclass
    • H10K85/30Coordination compounds
    • H10K85/341Transition metal complexes, e.g. Ru(II)polypyridine complexes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K85/00Organic materials used in the body or electrodes of devices covered by this subclass
    • H10K85/60Organic compounds having low molecular weight
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K85/00Organic materials used in the body or electrodes of devices covered by this subclass
    • H10K85/60Organic compounds having low molecular weight
    • H10K85/611Charge transfer complexes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K85/00Organic materials used in the body or electrodes of devices covered by this subclass
    • H10K85/60Organic compounds having low molecular weight
    • H10K85/631Amine compounds having at least two aryl rest on at least one amine-nitrogen atom, e.g. triphenylamine

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Mechanical Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • Materials Engineering (AREA)
  • Power Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Decoration By Transfer Pictures (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Processing And Handling Of Plastics And Other Materials For Molding In General (AREA)
  • Inorganic Fibers (AREA)
AT03012228T 2002-06-07 2003-06-06 Verfahren zur herstellung strukturierter schichten ATE412256T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002166533 2002-06-07

Publications (1)

Publication Number Publication Date
ATE412256T1 true ATE412256T1 (de) 2008-11-15

Family

ID=29545871

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03012228T ATE412256T1 (de) 2002-06-07 2003-06-06 Verfahren zur herstellung strukturierter schichten

Country Status (4)

Country Link
US (1) US7202007B2 (de)
EP (1) EP1369255B1 (de)
AT (1) ATE412256T1 (de)
DE (1) DE60324222D1 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005173558A (ja) * 2003-11-21 2005-06-30 Seiko Epson Corp 円周面の加工方法、現像ローラ及び感光ドラムの製造方法並びに現像ローラ及び感光ドラム
JP2006156439A (ja) 2004-11-25 2006-06-15 Nitto Denko Corp 光電気混載基板の製造方法
JP4601403B2 (ja) * 2004-11-25 2010-12-22 パナソニック株式会社 半導体レーザ素子の製造方法及びその製造装置
US8900655B2 (en) 2006-10-04 2014-12-02 Seagate Technology Llc Method for fabricating patterned magnetic recording device
US7704614B2 (en) * 2006-10-20 2010-04-27 Seagate Technology Llc Process for fabricating patterned magnetic recording media
GB0701909D0 (en) * 2007-01-31 2007-03-14 Imp Innovations Ltd Deposition Of Organic Layers
JP5018254B2 (ja) * 2007-06-06 2012-09-05 日立電線株式会社 ミラー付き光導波路及びその製造方法
GB2453766A (en) * 2007-10-18 2009-04-22 Novalia Ltd Method of fabricating an electronic device
JP5109982B2 (ja) * 2008-10-09 2012-12-26 日立電線株式会社 ミラー付き光伝送体の製造方法
EP2359172B1 (de) * 2008-12-22 2015-02-25 Panasonic Corporation Verfahren zum bilden eines spiegelreflexionsfilms in einer optischen leiterplatte
KR102013315B1 (ko) * 2012-07-10 2019-08-23 삼성디스플레이 주식회사 유기 발광 디스플레이 장치의 제조 방법 및 이에 따라 제조된 유기 발광 디스플레이 장치
US10043707B2 (en) * 2012-10-16 2018-08-07 Qorvo Us, Inc. Additive conductor redistribution layer (ACRL)
WO2018128025A1 (ja) * 2017-01-05 2018-07-12 株式会社アルバック 巻取式成膜装置及び巻取式成膜方法
CN112477391B (zh) * 2020-11-27 2022-05-10 浙江大学 基于双稳态结构的磁控转印印章及转印方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5017255A (en) * 1989-01-23 1991-05-21 Clyde D. Calhoun Method of transferring an inorganic image
US5399372A (en) * 1993-11-08 1995-03-21 Southwall Technologies, Inc. Method of patterning magnetic members
JPH08171008A (ja) 1994-12-16 1996-07-02 Toshiba Chem Corp カラーフィルタの製造方法
JP2918037B1 (ja) 1998-06-18 1999-07-12 日本電気株式会社 カラー有機elディスプレイとその製造方法
JP3694825B2 (ja) * 1999-11-18 2005-09-14 日本航空電子工業株式会社 導体パターンの形成方法及びコネクタ、フレキシブルプリント配線板、異方導電性部材
US6895667B2 (en) * 2001-04-13 2005-05-24 The Trustees Of Princeton University Transfer of patterned metal by cold-welding
US6946332B2 (en) * 2002-03-15 2005-09-20 Lucent Technologies Inc. Forming nanoscale patterned thin film metal layers

Also Published As

Publication number Publication date
US20040241570A1 (en) 2004-12-02
DE60324222D1 (de) 2008-12-04
EP1369255A2 (de) 2003-12-10
EP1369255A3 (de) 2005-12-28
EP1369255B1 (de) 2008-10-22
US7202007B2 (en) 2007-04-10

Similar Documents

Publication Publication Date Title
ATE412256T1 (de) Verfahren zur herstellung strukturierter schichten
WO2005114719A3 (en) Method of forming a recessed structure employing a reverse tone process
WO2005062908A3 (en) Methods of making a pattern of optical element shapes on a roll for use in making optical elements on or in substrates
WO2005039868A3 (de) Strukturierung von elektrischen funktionsschichten mittels einer transferfolie und strukturierung des klebers
ATE524837T1 (de) Verfahren zur herstellung eines lichtemittierenden bauelements
ATE541320T1 (de) Beleuchter und verfahren zur herstellung eines derartigen beleuchters
WO2005113257A3 (en) Compliant hard template for uv imprinting
WO2007053202A3 (en) Systems and methods for nanomaterial transfer
WO2008048928A3 (en) Methods of patterning a material on polymeric substrates
TW200607753A (en) Nanostructures and method of making the same
WO2008146869A3 (en) Pattern forming method, pattern or mold formed thereby
WO2002084722A3 (fr) Substrat demontable a tenue mecanique controlee et procede de realisation
EP1298489A3 (de) OPC-Verfahren mit nicht auflösenden Phasensprung-Hilfsstrukturen
ATE549795T1 (de) Oberflächenwellen-bauelement und verfahren zu seiner herstellung
WO2005045524A3 (en) A method of forming a patterned layer on a substrate
ATE501464T1 (de) Nanoimprint lithographie in mehrschichtsystemem
FI20020998A (fi) Menetelmä kalvon muodostamiseksi
EP0784216A3 (de) Verfahren zur Herstellung eines optischen Gerätes mit genau geformter Nut
TW200623948A (en) Manufacturing method for organic electronic device
WO2005004210A3 (en) Imprint lithography process and sensor
EP2146370A3 (de) Verfahren zur Bildung einer in situ vertieften Struktur
ATE292293T1 (de) Verfahren zur herstellung von im nanometerbereich oberflächendekorierten substraten
WO2006067694A3 (en) Nanofabrication based on sam growth
WO2005015311A3 (en) Near-field exposure method and apparatus, near-field exposure mask, and device manufacturing method
EP1327517A3 (de) Methode zur Metallschichtbildung und auf Metallfolie basierendes Mehrschichtprodukt

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties