ATE397207T1 - Verfahren zur zerstörungsfreien bestimmung des brechungsindexes eines klarlacks - Google Patents

Verfahren zur zerstörungsfreien bestimmung des brechungsindexes eines klarlacks

Info

Publication number
ATE397207T1
ATE397207T1 AT05008719T AT05008719T ATE397207T1 AT E397207 T1 ATE397207 T1 AT E397207T1 AT 05008719 T AT05008719 T AT 05008719T AT 05008719 T AT05008719 T AT 05008719T AT E397207 T1 ATE397207 T1 AT E397207T1
Authority
AT
Austria
Prior art keywords
pigmented
coating
specular component
refractive index
reflection spectrum
Prior art date
Application number
AT05008719T
Other languages
English (en)
Inventor
Wilhelm Kettler
Original Assignee
Du Pont
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Du Pont filed Critical Du Pont
Application granted granted Critical
Publication of ATE397207T1 publication Critical patent/ATE397207T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/065—Integrating spheres

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
AT05008719T 2004-04-27 2005-04-21 Verfahren zur zerstörungsfreien bestimmung des brechungsindexes eines klarlacks ATE397207T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/832,856 US7248350B2 (en) 2004-04-27 2004-04-27 Non-destructive method of determining the refractive index of clear coats

Publications (1)

Publication Number Publication Date
ATE397207T1 true ATE397207T1 (de) 2008-06-15

Family

ID=34935506

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05008719T ATE397207T1 (de) 2004-04-27 2005-04-21 Verfahren zur zerstörungsfreien bestimmung des brechungsindexes eines klarlacks

Country Status (4)

Country Link
US (1) US7248350B2 (de)
EP (1) EP1591771B1 (de)
AT (1) ATE397207T1 (de)
DE (1) DE602005007101D1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7349107B2 (en) * 2003-07-07 2008-03-25 Lockheed Martin Corporation System and method for correction for angular spread in determining optical properties of materials
EP1789763B1 (de) * 2004-09-17 2009-08-05 Akzo Nobel Coatings International BV Verfahren zur farbabstimmung
US8854734B2 (en) * 2009-11-12 2014-10-07 Vela Technologies, Inc. Integrating optical system and methods
US8426800B2 (en) 2010-09-09 2013-04-23 Vela Technologies, Inc. Integrating optical systems and methods
EP2722664A1 (de) * 2012-10-19 2014-04-23 Sika Technology AG Verfahren und Anordnung zur quantitativen Bestimmung von Inhomogenitäten in einer Fluidschicht
CN103542938B (zh) * 2013-10-24 2015-01-21 中国计量学院 基于d/8条件对sci误差修正的分光测色仪及其方法
JP6894672B2 (ja) * 2016-05-18 2021-06-30 キヤノン株式会社 情報処理装置、情報処理方法、プログラム
CN107389620A (zh) * 2017-09-08 2017-11-24 江苏省农业科学院 一种准确快速测定樱桃番茄果实表面光泽度的方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3916168A (en) 1973-10-09 1975-10-28 Mobil Oil Corp Color matching surface coatings containing metallic pigments
DE3037810C2 (de) 1980-10-07 1982-11-04 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Inkrementale Längen- oder Winkelmeßeinrichtung
US4479718A (en) * 1982-06-17 1984-10-30 E. I. Du Pont De Nemours And Company Three direction measurements for characterization of a surface containing metallic particles
US5042949A (en) * 1989-03-17 1991-08-27 Greenberg Jeffrey S Optical profiler for films and substrates
JP3309101B2 (ja) * 1992-08-31 2002-07-29 株式会社シンクロン 薄膜の屈折率測定方法および装置
DE4243885A1 (de) 1992-12-23 1994-06-30 Fogra Forschungsgesellschaft D Verfahren und Anordnung zur Messung von Farbe und Glanz
US5754283A (en) 1994-10-26 1998-05-19 Byk-Gardner Usa, Division Of Atlana Color measuring device having interchangeable optical geometries
KR100454834B1 (ko) 1995-06-26 2005-06-17 미네소타 마이닝 앤드 매뉴팩춰링 캄파니 광확산성접착제
DE19720887C2 (de) 1997-05-17 1999-04-01 Herberts & Co Gmbh Verfahren zur Farbrezeptberechnung pigmentierter Effektfarbtöne
JPH11241949A (ja) * 1997-12-26 1999-09-07 Minolta Co Ltd 反射特性測定装置
JP3469767B2 (ja) 1998-01-26 2003-11-25 関西ペイント株式会社 メタリツク塗色の分類整理方法
IL125964A (en) * 1998-08-27 2003-10-31 Tevet Process Control Technolo Method and apparatus for measuring the thickness of a transparent film, particularly of a photoresist film on a semiconductor substrate
US6583879B1 (en) * 2002-01-11 2003-06-24 X-Rite, Incorporated Benchtop spectrophotometer with improved targeting
JP4056064B2 (ja) * 2002-11-21 2008-03-05 株式会社リコー 薄膜コート微粉体のコート層膜厚測定方法および膜厚測定装置
US7158672B2 (en) 2003-06-11 2007-01-02 E. I. Du Pont De Nemours And Company Recipe calculation method for matt color shades

Also Published As

Publication number Publication date
EP1591771B1 (de) 2008-05-28
US20050237515A1 (en) 2005-10-27
EP1591771A1 (de) 2005-11-02
DE602005007101D1 (de) 2008-07-10
US7248350B2 (en) 2007-07-24

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