ATE355532T1 - Verfahren zur anzeige von kalibrierparametern eines geräts zum testen eines prüflings über signaltore, und das entsprechende gerät - Google Patents

Verfahren zur anzeige von kalibrierparametern eines geräts zum testen eines prüflings über signaltore, und das entsprechende gerät

Info

Publication number
ATE355532T1
ATE355532T1 AT02257253T AT02257253T ATE355532T1 AT E355532 T1 ATE355532 T1 AT E355532T1 AT 02257253 T AT02257253 T AT 02257253T AT 02257253 T AT02257253 T AT 02257253T AT E355532 T1 ATE355532 T1 AT E355532T1
Authority
AT
Austria
Prior art keywords
testing
ports
calibration parameters
via signal
test via
Prior art date
Application number
AT02257253T
Other languages
German (de)
English (en)
Inventor
Takashi Yamasaki
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Application granted granted Critical
Publication of ATE355532T1 publication Critical patent/ATE355532T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
AT02257253T 2001-10-19 2002-10-18 Verfahren zur anzeige von kalibrierparametern eines geräts zum testen eines prüflings über signaltore, und das entsprechende gerät ATE355532T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001322787A JP2003130904A (ja) 2001-10-19 2001-10-19 パラメータの補正条件の表示方法、および、パラメータの補正条件を表示するためのプログラムを記録した記録媒体

Publications (1)

Publication Number Publication Date
ATE355532T1 true ATE355532T1 (de) 2006-03-15

Family

ID=19139770

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02257253T ATE355532T1 (de) 2001-10-19 2002-10-18 Verfahren zur anzeige von kalibrierparametern eines geräts zum testen eines prüflings über signaltore, und das entsprechende gerät

Country Status (5)

Country Link
US (1) US6909982B2 (https=)
EP (1) EP1316804B1 (https=)
JP (1) JP2003130904A (https=)
AT (1) ATE355532T1 (https=)
DE (1) DE60218409D1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7869367B2 (en) * 2005-11-30 2011-01-11 Hewlett-Packard Development Company, L.P. Methods and systems for checking expected network traffic
DE102006008063A1 (de) * 2006-02-21 2007-08-23 Rohde & Schwarz Gmbh & Co. Kg Verfahren zur Darstellung der Messergebnisse eines Netzwerkanalysators mit gleichzeitiger Toleranzanzeige
GB2519946A (en) * 2013-10-29 2015-05-13 Socowave Technologies Ltd Active antenna system and methods of testing
US11190284B2 (en) * 2019-06-20 2021-11-30 Rohde & Schwarz Gmbh & Co. Kg Switching system and method for sequential switching of radio frequency paths
WO2021242967A1 (en) * 2020-05-27 2021-12-02 Stryker Corporation Systems and methods for a user interface for calibrating a load cell
JP7417571B2 (ja) * 2021-11-05 2024-01-18 アンリツ株式会社 移動端末試験装置とそのポート接続方法
CN114839443B (zh) * 2022-07-04 2022-09-02 广东健博通科技股份有限公司 多端口天线散射参数测量系统、校准系统及方法
CN120686177B (zh) * 2025-08-22 2026-01-06 深圳市万里眼技术有限公司 校准方法、待校准设备、校准装置、校准系统及存储介质

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4816767A (en) * 1984-01-09 1989-03-28 Hewlett-Packard Company Vector network analyzer with integral processor
AU650865B2 (en) * 1990-09-07 1994-07-07 Caterpillar Inc. Adaptive vehicle display
JP2521843B2 (ja) * 1990-10-04 1996-08-07 大日本スクリーン製造株式会社 セットアップパラメ―タ決定特性を修正する方法及び自動セットアップ装置
JPH1141629A (ja) * 1997-07-15 1999-02-12 Minolta Co Ltd 校正パターン表示装置及びこの校正パターン表示装置が適用されるカラー表示装置の表示特性測定装置
US6421624B1 (en) * 1999-02-05 2002-07-16 Advantest Corp. Multi-port device analysis apparatus and method and calibration method thereof

Also Published As

Publication number Publication date
JP2003130904A (ja) 2003-05-08
DE60218409D1 (de) 2007-04-12
EP1316804A3 (en) 2004-04-21
EP1316804A2 (en) 2003-06-04
US6909982B2 (en) 2005-06-21
US20030076115A1 (en) 2003-04-24
EP1316804B1 (en) 2007-02-28

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