ATE299416T1 - Halbleiterpolierhalter mit drei kammern und verfahren zur verwendung desselben - Google Patents

Halbleiterpolierhalter mit drei kammern und verfahren zur verwendung desselben

Info

Publication number
ATE299416T1
ATE299416T1 AT00920955T AT00920955T ATE299416T1 AT E299416 T1 ATE299416 T1 AT E299416T1 AT 00920955 T AT00920955 T AT 00920955T AT 00920955 T AT00920955 T AT 00920955T AT E299416 T1 ATE299416 T1 AT E299416T1
Authority
AT
Austria
Prior art keywords
wafer
pressure
polishing
affect
controls
Prior art date
Application number
AT00920955T
Other languages
English (en)
Inventor
Paul Jackson
Original Assignee
Ebara Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/363,980 external-priority patent/US6068549A/en
Application filed by Ebara Corp filed Critical Ebara Corp
Application granted granted Critical
Publication of ATE299416T1 publication Critical patent/ATE299416T1/de

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • B24B37/30Work carriers for single side lapping of plane surfaces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • B24B37/30Work carriers for single side lapping of plane surfaces
    • B24B37/32Retaining rings
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/16Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the load
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B53/00Devices or means for dressing or conditioning abrasive surfaces
    • B24B53/017Devices or means for dressing, cleaning or otherwise conditioning lapping tools

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Liquid Crystal (AREA)
  • Polishing Bodies And Polishing Tools (AREA)
AT00920955T 1999-07-28 2000-03-30 Halbleiterpolierhalter mit drei kammern und verfahren zur verwendung desselben ATE299416T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/363,980 US6068549A (en) 1999-06-28 1999-07-28 Structure and method for three chamber CMP polishing head
PCT/IB2000/000534 WO2001007208A1 (en) 1999-07-28 2000-03-30 Cmp polishing head with three chambers and method for using the same

Publications (1)

Publication Number Publication Date
ATE299416T1 true ATE299416T1 (de) 2005-07-15

Family

ID=23432542

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00920955T ATE299416T1 (de) 1999-07-28 2000-03-30 Halbleiterpolierhalter mit drei kammern und verfahren zur verwendung desselben

Country Status (8)

Country Link
EP (1) EP1117506B1 (de)
JP (1) JP3648200B2 (de)
KR (1) KR100468178B1 (de)
AT (1) ATE299416T1 (de)
AU (1) AU4136400A (de)
DE (1) DE60021246T2 (de)
HK (1) HK1037569A1 (de)
WO (1) WO2001007208A1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100492330B1 (ko) * 2002-10-30 2005-05-27 두산디앤디 주식회사 화학기계적 연마장치의 캐리어 헤드
CN105313234B (zh) * 2015-11-17 2017-07-11 哈尔滨秋冠光电科技有限公司 一种双面抛光蓝宝石晶片的加工方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5820448A (en) * 1993-12-27 1998-10-13 Applied Materials, Inc. Carrier head with a layer of conformable material for a chemical mechanical polishing system
ATE228915T1 (de) * 1996-01-24 2002-12-15 Lam Res Corp Halbleiterscheiben-polierkopf
US6146259A (en) * 1996-11-08 2000-11-14 Applied Materials, Inc. Carrier head with local pressure control for a chemical mechanical polishing apparatus
EP0881039B1 (de) * 1997-05-28 2003-04-16 Tokyo Seimitsu Co.,Ltd. Halbleiterscheibe Poliervorrichtung mit Halterring
JPH11226865A (ja) * 1997-12-11 1999-08-24 Speedfam Co Ltd キャリア及びcmp装置

Also Published As

Publication number Publication date
HK1037569A1 (en) 2002-02-15
KR20010075404A (ko) 2001-08-09
JP3648200B2 (ja) 2005-05-18
AU4136400A (en) 2001-02-13
WO2001007208A1 (en) 2001-02-01
EP1117506A1 (de) 2001-07-25
DE60021246D1 (de) 2005-08-18
DE60021246T2 (de) 2006-04-27
KR100468178B1 (ko) 2005-01-26
EP1117506B1 (de) 2005-07-13
JP2003505872A (ja) 2003-02-12

Similar Documents

Publication Publication Date Title
US6612903B2 (en) Workpiece carrier with adjustable pressure zones and barriers
US5899745A (en) Method of chemical mechanical polishing (CMP) using an underpad with different compression regions and polishing pad therefor
DE60043469D1 (de) Chemisch-mechanische Polierkopfvorrichtung mit einem schwimmenden Waferhaltering und Waferträger mit mehrzoniger Polierdrucksteuerung
US6325696B1 (en) Piezo-actuated CMP carrier
WO2001071796A3 (en) Method for electrochemical polishing of a conductive material
US6764387B1 (en) Control of a multi-chamber carrier head
WO2002053322A3 (en) System and method for polishing and planarization of semiconductor wafers using reduced surface area polishing pads
TW376350B (en) Process for polishing a semiconductor device substrate
MY132155A (en) Process of polishing wafers
JPH08243913A (ja) 基板の研磨方法および装置
MY133888A (en) Process and device for polishing semiconductor wafers
MY132505A (en) Apparatus and method for chamfering wafer with loose abrasive grains
US6569771B2 (en) Carrier head for chemical mechanical polishing
TW430587B (en) Grinding or polishing method and device for semiconductor silicon single crystal wafer
US6939212B1 (en) Porous material air bearing platen for chemical mechanical planarization
US6267659B1 (en) Stacked polish pad
AU2002353628A1 (en) Carrier head for chemical mechanical polishing apparatus
TW375554B (en) Wafer holder for chemical and mechanical planarization machines
TW200725723A (en) Both sides grinding device of semiconductor wafer, static pressure pad and both sides grinding method using the same
US6991512B2 (en) Apparatus for edge polishing uniformity control
JPH0615563A (ja) ウェーハ加圧用ポリッシングプレート及びウェーハのポリッシング方法
ATE299416T1 (de) Halbleiterpolierhalter mit drei kammern und verfahren zur verwendung desselben
US6769970B1 (en) Fluid venting platen for optimizing wafer polishing
JPH02208931A (ja) 化合物半導体基板の研磨方法
US6790128B1 (en) Fluid conserving platen for optimizing edge polishing

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties