ATE286261T1 - Datenoptimierungsverfahren für sondenkartenanalyse und riebmarkanalyse - Google Patents

Datenoptimierungsverfahren für sondenkartenanalyse und riebmarkanalyse

Info

Publication number
ATE286261T1
ATE286261T1 AT00112260T AT00112260T ATE286261T1 AT E286261 T1 ATE286261 T1 AT E286261T1 AT 00112260 T AT00112260 T AT 00112260T AT 00112260 T AT00112260 T AT 00112260T AT E286261 T1 ATE286261 T1 AT E286261T1
Authority
AT
Austria
Prior art keywords
analysis
probe card
optimization methods
data optimization
mark
Prior art date
Application number
AT00112260T
Other languages
English (en)
Inventor
John Strom
Original Assignee
Applied Prec Llc A Washington
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Prec Llc A Washington filed Critical Applied Prec Llc A Washington
Application granted granted Critical
Publication of ATE286261T1 publication Critical patent/ATE286261T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06794—Devices for sensing when probes are in contact, or in position to contact, with measured object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AT00112260T 1999-06-07 2000-06-07 Datenoptimierungsverfahren für sondenkartenanalyse und riebmarkanalyse ATE286261T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/327,106 US6414477B1 (en) 1999-06-07 1999-06-07 Method for optimizing probe card analysis and scrub mark analysis data

Publications (1)

Publication Number Publication Date
ATE286261T1 true ATE286261T1 (de) 2005-01-15

Family

ID=23275190

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00112260T ATE286261T1 (de) 1999-06-07 2000-06-07 Datenoptimierungsverfahren für sondenkartenanalyse und riebmarkanalyse

Country Status (5)

Country Link
US (2) US6414477B1 (de)
EP (2) EP1519200B1 (de)
JP (1) JP3800394B2 (de)
AT (1) ATE286261T1 (de)
DE (2) DE60017016T2 (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6414477B1 (en) * 1999-06-07 2002-07-02 Applied Precision, Inc. Method for optimizing probe card analysis and scrub mark analysis data
US20020097062A1 (en) * 2000-10-30 2002-07-25 Strom John Timothy Method and process of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing analysis, and manufacture
US8466703B2 (en) 2003-03-14 2013-06-18 Rudolph Technologies, Inc. Probe card analysis system and method
JP5089166B2 (ja) 2003-03-14 2012-12-05 ルドルフテクノロジーズ インコーポレイテッド プローブカードアナライザにおける部品のたわみの影響を軽減する方法
WO2004084124A1 (en) * 2003-03-14 2004-09-30 Applied Precision, Llc System and method of point matching measured positions to template positions
US6911814B2 (en) * 2003-07-01 2005-06-28 Formfactor, Inc. Apparatus and method for electromechanical testing and validation of probe cards
KR20070075589A (ko) * 2006-01-13 2007-07-24 삼성전자주식회사 프로브 카드 이상 확인 방법
US8311758B2 (en) 2006-01-18 2012-11-13 Formfactor, Inc. Methods and apparatuses for dynamic probe adjustment
JP2007200934A (ja) * 2006-01-23 2007-08-09 Fujitsu Ltd プローブカードのプローブ針の針跡評価方法
WO2009048618A1 (en) * 2007-10-11 2009-04-16 Veraconnex, Llc Probe card test apparatus and method
JP4997127B2 (ja) * 2008-01-23 2012-08-08 東京エレクトロン株式会社 検査方法及びこの検査方法を記録したプログラム記録媒体
JP5433266B2 (ja) * 2009-03-19 2014-03-05 東京エレクトロン株式会社 針跡の判定方法及び針跡判定用プログラム
EP2652544B1 (de) 2010-12-14 2020-08-19 Alcon Inc. Gefärbte kontaktlinse
US10295591B2 (en) * 2013-01-02 2019-05-21 Texas Instruments Incorporated Method and device for testing wafers
US9768134B2 (en) 2015-01-29 2017-09-19 Micron Technology, Inc. Methods of forming conductive materials on semiconductor devices, and methods of forming electrical interconnects
TWI652484B (zh) 2018-03-06 2019-03-01 均豪精密工業股份有限公司 探針卡線上調針維修系統及其方法
TWI744805B (zh) * 2020-02-24 2021-11-01 頎邦科技股份有限公司 電路板
DE102021129067A1 (de) * 2020-11-13 2022-05-19 Mpi Corporation Verfahren zur halbleiterinspektion

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4583298A (en) * 1984-03-07 1986-04-22 Hewlett-Packard Company Auto calibration method suitable for use in electron beam lithography
US4864227A (en) 1987-02-27 1989-09-05 Canon Kabushiki Kaisha Wafer prober
US4918374A (en) 1988-10-05 1990-04-17 Applied Precision, Inc. Method and apparatus for inspecting integrated circuit probe cards
JP3723232B2 (ja) * 1992-03-10 2005-12-07 シリコン システムズ インコーポレーテッド プローブ針調整ツール及びプローブ針調整法
US5657394A (en) * 1993-06-04 1997-08-12 Integrated Technology Corporation Integrated circuit probe card inspection system
US5644245A (en) 1993-11-24 1997-07-01 Tokyo Electron Limited Probe apparatus for inspecting electrical characteristics of a microelectronic element
JP2632136B2 (ja) * 1994-10-17 1997-07-23 日本電子材料株式会社 高温測定用プローブカード
US6414477B1 (en) * 1999-06-07 2002-07-02 Applied Precision, Inc. Method for optimizing probe card analysis and scrub mark analysis data

Also Published As

Publication number Publication date
DE60017016D1 (de) 2005-02-03
EP1061381A2 (de) 2000-12-20
EP1519200B1 (de) 2007-01-10
JP2001118890A (ja) 2001-04-27
JP3800394B2 (ja) 2006-07-26
DE60017016T2 (de) 2005-05-25
EP1061381A3 (de) 2001-09-26
US6414477B1 (en) 2002-07-02
DE60032953D1 (de) 2007-02-22
EP1061381B1 (de) 2004-12-29
US6621262B2 (en) 2003-09-16
US20020171414A1 (en) 2002-11-21
EP1519200A1 (de) 2005-03-30

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