ATE201762T1 - Verfahren und vorrichtung zum messen der form eines objekts - Google Patents
Verfahren und vorrichtung zum messen der form eines objektsInfo
- Publication number
- ATE201762T1 ATE201762T1 AT97908377T AT97908377T ATE201762T1 AT E201762 T1 ATE201762 T1 AT E201762T1 AT 97908377 T AT97908377 T AT 97908377T AT 97908377 T AT97908377 T AT 97908377T AT E201762 T1 ATE201762 T1 AT E201762T1
- Authority
- AT
- Austria
- Prior art keywords
- measuring
- shape
- distribution
- phase
- calculated
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2536—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings with variable grating pitch, projected on the object with the same angle of incidence
Landscapes
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Image Analysis (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB9606127.0A GB9606127D0 (en) | 1996-03-22 | 1996-03-22 | Measuring shape of objects |
GBGB9606330.0A GB9606330D0 (en) | 1996-03-26 | 1996-03-26 | Measuring shape of objects |
GBGB9626632.5A GB9626632D0 (en) | 1996-12-21 | 1996-12-21 | Measuring shape of objects |
PCT/GB1997/000771 WO1997036144A1 (en) | 1996-03-22 | 1997-03-20 | Method and apparatus for measuring shape of objects |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE201762T1 true ATE201762T1 (de) | 2001-06-15 |
Family
ID=27268199
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT97908377T ATE201762T1 (de) | 1996-03-22 | 1997-03-20 | Verfahren und vorrichtung zum messen der form eines objekts |
Country Status (11)
Country | Link |
---|---|
US (1) | US6208416B1 (de) |
EP (1) | EP0888522B1 (de) |
JP (1) | JP3856838B2 (de) |
AT (1) | ATE201762T1 (de) |
AU (1) | AU2035597A (de) |
DE (1) | DE69705037T2 (de) |
DK (1) | DK0888522T3 (de) |
ES (1) | ES2157065T3 (de) |
GR (1) | GR3036298T3 (de) |
PT (1) | PT888522E (de) |
WO (1) | WO1997036144A1 (de) |
Families Citing this family (47)
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---|---|---|---|---|
US6639685B1 (en) * | 2000-02-25 | 2003-10-28 | General Motors Corporation | Image processing method using phase-shifted fringe patterns and curve fitting |
JP2001343208A (ja) * | 2000-03-30 | 2001-12-14 | Fuji Photo Optical Co Ltd | フーリエ変換を用いた縞解析方法および装置 |
JP4529227B2 (ja) * | 2000-04-19 | 2010-08-25 | Nok株式会社 | 平面検査装置および平面検査方法 |
RU2185598C1 (ru) * | 2001-03-19 | 2002-07-20 | Климов Андрей Владимирович | Способ бесконтактного контроля линейных размеров трехмерных объектов |
KR100415477B1 (ko) * | 2001-05-22 | 2004-01-24 | 한국과학기술원 | 광위상간섭법을 적용한 3차원 공간상에서의 좌표결정 방법및 시스템 |
GB0119036D0 (en) * | 2001-08-06 | 2001-09-26 | South Bank Univ Entpr Ltd | Three dimensional imaging |
GB0200819D0 (en) * | 2002-01-15 | 2002-03-06 | Cole Polytechnique Federale De | Microscopy imaging apparatus and method for generating an image |
KR100470933B1 (ko) * | 2002-01-15 | 2005-03-08 | (주) 인텍플러스 | 경사단면 광섬유 광원을 이용한 위상천이 점회절 간섭계 |
KR100462071B1 (ko) * | 2002-01-29 | 2004-12-16 | 한국과학기술원 | 멀티레터레이션에 근거한 점회절 광원을 이용한 대영역형상 측정법 및 시스템 |
GB0220228D0 (en) | 2002-09-02 | 2002-10-09 | Univ Heriot Watt | Absolute phase measuring sensor |
US6891370B2 (en) | 2003-07-08 | 2005-05-10 | General Electric Company | Method and system for three dimensional phase unwrapping |
US7525669B1 (en) | 2004-07-09 | 2009-04-28 | Mohsen Abdollahi | High-speed, scanning phase-shifting profilometry using 2D CMOS sensor |
US20060072122A1 (en) * | 2004-09-30 | 2006-04-06 | Qingying Hu | Method and apparatus for measuring shape of an object |
KR100740249B1 (ko) * | 2005-10-19 | 2007-07-18 | (주) 인텍플러스 | 영상 측정 장치 및 그 방법 |
US7595894B2 (en) | 2006-06-02 | 2009-09-29 | General Electric Company | Profilometry apparatus and method of operation |
WO2009120643A2 (en) * | 2008-03-22 | 2009-10-01 | Lyle Shirley | Dimensional probe and methods of use |
US8265375B2 (en) | 2006-06-16 | 2012-09-11 | Shirley Lyle G | Method and apparatus for remote sensing of objects utilizing radiation speckle |
US8736847B2 (en) | 2010-07-24 | 2014-05-27 | Focused Innovation, Inc. | Method and apparatus for imaging |
EP2015022A1 (de) * | 2007-07-11 | 2009-01-14 | General Electric Company | Profilometrie-Vorrichtung und Betriebsverfahren dafür |
CN101821578B (zh) * | 2007-08-17 | 2014-03-12 | 瑞尼斯豪公司 | 非接触式测量装置和方法 |
EP2211696B1 (de) * | 2007-11-01 | 2018-12-26 | Dental Imaging Technologies Corporation | Intraorales dreidimensionales bildgebungssystem |
US8059280B2 (en) * | 2008-01-31 | 2011-11-15 | Cyberoptics Corporation | Method for three-dimensional imaging using multi-phase structured light |
EP2253134A1 (de) * | 2008-03-18 | 2010-11-24 | Shenzhen TCL New Technology LTD | Vorrichtung und verfahren zur verwaltung der leistung eines elektronischen geräts |
US8360144B2 (en) * | 2008-05-09 | 2013-01-29 | Exxonmobil Upstream Research Company | Method for geophysical and stratigraphic interpretation using waveform anomalies |
US8531650B2 (en) | 2008-07-08 | 2013-09-10 | Chiaro Technologies LLC | Multiple channel locating |
US9046355B2 (en) * | 2009-07-29 | 2015-06-02 | Canon Kabushiki Kaisha | Measuring apparatus, measuring method, and program |
CN101650164B (zh) * | 2009-09-07 | 2011-02-09 | 东南大学 | 三维扫描系统中基于错位条纹的相位展开方法 |
GB0915904D0 (en) | 2009-09-11 | 2009-10-14 | Renishaw Plc | Non-contact object inspection |
US20110298891A1 (en) * | 2010-06-04 | 2011-12-08 | Iowa State University Research Foundation, Inc. | Composite phase-shifting algorithm for 3-d shape compression |
US8314938B2 (en) * | 2010-07-30 | 2012-11-20 | Canon Kabushiki Kaisha | Method and apparatus for measuring surface profile of an object |
US10019812B2 (en) | 2011-03-04 | 2018-07-10 | General Electric Company | Graphic overlay for measuring dimensions of features using a video inspection device |
US10157495B2 (en) | 2011-03-04 | 2018-12-18 | General Electric Company | Method and device for displaying a two-dimensional image of a viewed object simultaneously with an image depicting the three-dimensional geometry of the viewed object |
US10586341B2 (en) | 2011-03-04 | 2020-03-10 | General Electric Company | Method and device for measuring features on or near an object |
US9984474B2 (en) | 2011-03-04 | 2018-05-29 | General Electric Company | Method and device for measuring features on or near an object |
US9875574B2 (en) | 2013-12-17 | 2018-01-23 | General Electric Company | Method and device for automatically identifying the deepest point on the surface of an anomaly |
JP2015505039A (ja) * | 2011-12-12 | 2015-02-16 | ザイゴ コーポレーションZygo Corporation | 変調光を使用した非接触表面形状評価 |
US9020293B2 (en) * | 2012-02-07 | 2015-04-28 | National Cheung Kung University | Integration of filters and phase unwrapping algorithms for removing noise in image reconstruction |
US8463077B1 (en) * | 2012-03-26 | 2013-06-11 | National Cheng Kung University | Rotation phase unwrapping algorithm for image reconstruction |
EP2890987B1 (de) * | 2012-08-31 | 2017-03-08 | Dantec Dynamics A/S | Optische geschwindigkeitsmessungssysteme und verfahren zur bestimmung der geschwindigkeit eines körpers mit von einem räumlichen lichtmodulator erzeugten streifen |
US9459094B2 (en) * | 2013-09-12 | 2016-10-04 | Hong Kong Applied Science and Technology Research Institute Company Limited | Color-encoded fringe pattern for three-dimensional shape measurement |
US9818039B2 (en) | 2013-12-17 | 2017-11-14 | General Electric Company | Method and device for automatically identifying a point of interest in a depth measurement on a viewed object |
US9600928B2 (en) | 2013-12-17 | 2017-03-21 | General Electric Company | Method and device for automatically identifying a point of interest on the surface of an anomaly |
US9842430B2 (en) | 2013-12-17 | 2017-12-12 | General Electric Company | Method and device for automatically identifying a point of interest on a viewed object |
US20190011380A1 (en) * | 2017-07-10 | 2019-01-10 | Brigham Young University | Wave interference systems and methods for measuring objects and waves |
JP6847088B2 (ja) * | 2018-12-04 | 2021-03-24 | Ckd株式会社 | 投影装置及び三次元計測装置 |
CN113029042B (zh) * | 2021-05-25 | 2021-08-03 | 四川大学 | 一种高温熔融态金属表面形貌动态测量装置及方法 |
CN116659448B (zh) * | 2023-05-31 | 2024-08-06 | 重庆大学 | 一种橡胶支座变形智能监控系统及设备 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5321497A (en) * | 1992-03-09 | 1994-06-14 | Wyko Corporation | Interferometric integration technique and apparatus to confine 2π discontinuity |
-
1997
- 1997-03-20 DE DE69705037T patent/DE69705037T2/de not_active Expired - Lifetime
- 1997-03-20 DK DK97908377T patent/DK0888522T3/da active
- 1997-03-20 US US09/142,707 patent/US6208416B1/en not_active Expired - Lifetime
- 1997-03-20 EP EP97908377A patent/EP0888522B1/de not_active Expired - Lifetime
- 1997-03-20 ES ES97908377T patent/ES2157065T3/es not_active Expired - Lifetime
- 1997-03-20 AT AT97908377T patent/ATE201762T1/de not_active IP Right Cessation
- 1997-03-20 AU AU20355/97A patent/AU2035597A/en not_active Abandoned
- 1997-03-20 PT PT97908377T patent/PT888522E/pt unknown
- 1997-03-20 WO PCT/GB1997/000771 patent/WO1997036144A1/en active IP Right Grant
- 1997-03-20 JP JP53411597A patent/JP3856838B2/ja not_active Expired - Fee Related
-
2001
- 2001-07-31 GR GR20010401147T patent/GR3036298T3/el not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
GR3036298T3 (en) | 2001-10-31 |
DE69705037T2 (de) | 2002-01-03 |
AU2035597A (en) | 1997-10-17 |
DK0888522T3 (da) | 2001-08-27 |
ES2157065T3 (es) | 2001-08-01 |
EP0888522A1 (de) | 1999-01-07 |
PT888522E (pt) | 2001-10-30 |
JP2000508066A (ja) | 2000-06-27 |
US6208416B1 (en) | 2001-03-27 |
WO1997036144A1 (en) | 1997-10-02 |
JP3856838B2 (ja) | 2006-12-13 |
EP0888522B1 (de) | 2001-05-30 |
DE69705037D1 (de) | 2001-07-05 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
UEP | Publication of translation of european patent specification | ||
REN | Ceased due to non-payment of the annual fee |