ES2157065T3 - Metodo y aparato para medir formas de objetos. - Google Patents
Metodo y aparato para medir formas de objetos.Info
- Publication number
- ES2157065T3 ES2157065T3 ES97908377T ES97908377T ES2157065T3 ES 2157065 T3 ES2157065 T3 ES 2157065T3 ES 97908377 T ES97908377 T ES 97908377T ES 97908377 T ES97908377 T ES 97908377T ES 2157065 T3 ES2157065 T3 ES 2157065T3
- Authority
- ES
- Spain
- Prior art keywords
- measuring object
- distribution
- phase
- object forms
- calculated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2536—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings with variable grating pitch, projected on the object with the same angle of incidence
Landscapes
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Image Analysis (AREA)
Abstract
SE DESCRIBE UN METODO PARA MEDIR LA FORMA DE OBJETOS QUE PUEDEN TENER DISCONTINUIDADES SUPERFICIALES USANDO UNOS BORDES PROYECTADOS, EN CUYO METODO LA SEPARACION DE LOS BORDES SE HACE VARIAR RESPECTO AL TIEMPO Y LA SECUENCIA DE LAS IMAGENES CON FASE ESCALONADA SE GRABA, CALCULANDOSE UNA INTENSIDAD COMPLEJA TRIDIMENSIONAL Y LA FASE DE LA DISTRIBUCION SE DESARROLLA A LO LARGO DEL EJE DE TIEMPOS O SE CALCULA LA TRANSFORMADA DE FOURIER DE LA DISTRIBUCION A LO LARGO DEL EJE DE TIEMPOS.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB9606127.0A GB9606127D0 (en) | 1996-03-22 | 1996-03-22 | Measuring shape of objects |
GBGB9606330.0A GB9606330D0 (en) | 1996-03-26 | 1996-03-26 | Measuring shape of objects |
GBGB9626632.5A GB9626632D0 (en) | 1996-12-21 | 1996-12-21 | Measuring shape of objects |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2157065T3 true ES2157065T3 (es) | 2001-08-01 |
Family
ID=27268199
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES97908377T Expired - Lifetime ES2157065T3 (es) | 1996-03-22 | 1997-03-20 | Metodo y aparato para medir formas de objetos. |
Country Status (11)
Country | Link |
---|---|
US (1) | US6208416B1 (es) |
EP (1) | EP0888522B1 (es) |
JP (1) | JP3856838B2 (es) |
AT (1) | ATE201762T1 (es) |
AU (1) | AU2035597A (es) |
DE (1) | DE69705037T2 (es) |
DK (1) | DK0888522T3 (es) |
ES (1) | ES2157065T3 (es) |
GR (1) | GR3036298T3 (es) |
PT (1) | PT888522E (es) |
WO (1) | WO1997036144A1 (es) |
Families Citing this family (46)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6639685B1 (en) * | 2000-02-25 | 2003-10-28 | General Motors Corporation | Image processing method using phase-shifted fringe patterns and curve fitting |
JP2001343208A (ja) * | 2000-03-30 | 2001-12-14 | Fuji Photo Optical Co Ltd | フーリエ変換を用いた縞解析方法および装置 |
JP4529227B2 (ja) * | 2000-04-19 | 2010-08-25 | Nok株式会社 | 平面検査装置および平面検査方法 |
RU2185598C1 (ru) * | 2001-03-19 | 2002-07-20 | Климов Андрей Владимирович | Способ бесконтактного контроля линейных размеров трехмерных объектов |
KR100415477B1 (ko) * | 2001-05-22 | 2004-01-24 | 한국과학기술원 | 광위상간섭법을 적용한 3차원 공간상에서의 좌표결정 방법및 시스템 |
GB0119036D0 (en) * | 2001-08-06 | 2001-09-26 | South Bank Univ Entpr Ltd | Three dimensional imaging |
GB0200819D0 (en) * | 2002-01-15 | 2002-03-06 | Cole Polytechnique Federale De | Microscopy imaging apparatus and method for generating an image |
KR100470933B1 (ko) * | 2002-01-15 | 2005-03-08 | (주) 인텍플러스 | 경사단면 광섬유 광원을 이용한 위상천이 점회절 간섭계 |
KR100462071B1 (ko) * | 2002-01-29 | 2004-12-16 | 한국과학기술원 | 멀티레터레이션에 근거한 점회절 광원을 이용한 대영역형상 측정법 및 시스템 |
GB0220228D0 (en) | 2002-09-02 | 2002-10-09 | Univ Heriot Watt | Absolute phase measuring sensor |
US6891370B2 (en) | 2003-07-08 | 2005-05-10 | General Electric Company | Method and system for three dimensional phase unwrapping |
US7525669B1 (en) | 2004-07-09 | 2009-04-28 | Mohsen Abdollahi | High-speed, scanning phase-shifting profilometry using 2D CMOS sensor |
US20060072122A1 (en) * | 2004-09-30 | 2006-04-06 | Qingying Hu | Method and apparatus for measuring shape of an object |
KR100740249B1 (ko) * | 2005-10-19 | 2007-07-18 | (주) 인텍플러스 | 영상 측정 장치 및 그 방법 |
US7595894B2 (en) | 2006-06-02 | 2009-09-29 | General Electric Company | Profilometry apparatus and method of operation |
US8265375B2 (en) * | 2006-06-16 | 2012-09-11 | Shirley Lyle G | Method and apparatus for remote sensing of objects utilizing radiation speckle |
WO2009120643A2 (en) * | 2008-03-22 | 2009-10-01 | Lyle Shirley | Dimensional probe and methods of use |
EP2015022A1 (en) * | 2007-07-11 | 2009-01-14 | General Electric Company | Profilometry apparatus and method of operation |
EP2977719A1 (en) | 2007-08-17 | 2016-01-27 | Renishaw plc | Non-contact measurement apparatus and method |
EP2211696B1 (en) * | 2007-11-01 | 2018-12-26 | Dental Imaging Technologies Corporation | Intra-oral three-dimensional imaging system |
US8059280B2 (en) * | 2008-01-31 | 2011-11-15 | Cyberoptics Corporation | Method for three-dimensional imaging using multi-phase structured light |
WO2009117015A1 (en) * | 2008-03-18 | 2009-09-24 | Shenzhen Tcl New Technology Ltd | Apparatus and method for managing the power of an electronic device |
EP2291686A4 (en) * | 2008-05-09 | 2017-01-04 | Exxonmobil Upstream Research Company | Method for geophysical and stratigraphic interpretation using waveform anomalies |
WO2010006081A1 (en) | 2008-07-08 | 2010-01-14 | Chiaro Technologies, Inc. | Multiple channel locating |
US9046355B2 (en) * | 2009-07-29 | 2015-06-02 | Canon Kabushiki Kaisha | Measuring apparatus, measuring method, and program |
CN101650164B (zh) * | 2009-09-07 | 2011-02-09 | 东南大学 | 三维扫描系统中基于错位条纹的相位展开方法 |
GB0915904D0 (en) | 2009-09-11 | 2009-10-14 | Renishaw Plc | Non-contact object inspection |
US20110298891A1 (en) * | 2010-06-04 | 2011-12-08 | Iowa State University Research Foundation, Inc. | Composite phase-shifting algorithm for 3-d shape compression |
EP2596320A4 (en) | 2010-07-24 | 2015-08-26 | Focused Innovation Inc | METHOD AND APPARATUS FOR IMAGING |
US8314938B2 (en) * | 2010-07-30 | 2012-11-20 | Canon Kabushiki Kaisha | Method and apparatus for measuring surface profile of an object |
US9984474B2 (en) | 2011-03-04 | 2018-05-29 | General Electric Company | Method and device for measuring features on or near an object |
US9875574B2 (en) | 2013-12-17 | 2018-01-23 | General Electric Company | Method and device for automatically identifying the deepest point on the surface of an anomaly |
US10019812B2 (en) | 2011-03-04 | 2018-07-10 | General Electric Company | Graphic overlay for measuring dimensions of features using a video inspection device |
US10157495B2 (en) | 2011-03-04 | 2018-12-18 | General Electric Company | Method and device for displaying a two-dimensional image of a viewed object simultaneously with an image depicting the three-dimensional geometry of the viewed object |
US10586341B2 (en) | 2011-03-04 | 2020-03-10 | General Electric Company | Method and device for measuring features on or near an object |
EP2791618A4 (en) * | 2011-12-12 | 2015-07-29 | Zygo Corp | TOUCHLESS SURFACE CHARACTERIZATION WITH MODULATED LIGHTING |
US9020293B2 (en) * | 2012-02-07 | 2015-04-28 | National Cheung Kung University | Integration of filters and phase unwrapping algorithms for removing noise in image reconstruction |
US8463077B1 (en) * | 2012-03-26 | 2013-06-11 | National Cheng Kung University | Rotation phase unwrapping algorithm for image reconstruction |
EP2890987B1 (en) * | 2012-08-31 | 2017-03-08 | Dantec Dynamics A/S | Optical velocimetry systems and methods for determining the velocity of a body using fringes generated by a spatial light modulator |
US9459094B2 (en) * | 2013-09-12 | 2016-10-04 | Hong Kong Applied Science and Technology Research Institute Company Limited | Color-encoded fringe pattern for three-dimensional shape measurement |
US9842430B2 (en) | 2013-12-17 | 2017-12-12 | General Electric Company | Method and device for automatically identifying a point of interest on a viewed object |
US9600928B2 (en) | 2013-12-17 | 2017-03-21 | General Electric Company | Method and device for automatically identifying a point of interest on the surface of an anomaly |
US9818039B2 (en) | 2013-12-17 | 2017-11-14 | General Electric Company | Method and device for automatically identifying a point of interest in a depth measurement on a viewed object |
US20190011380A1 (en) * | 2017-07-10 | 2019-01-10 | Brigham Young University | Wave interference systems and methods for measuring objects and waves |
JP6847088B2 (ja) * | 2018-12-04 | 2021-03-24 | Ckd株式会社 | 投影装置及び三次元計測装置 |
CN113029042B (zh) * | 2021-05-25 | 2021-08-03 | 四川大学 | 一种高温熔融态金属表面形貌动态测量装置及方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5321497A (en) * | 1992-03-09 | 1994-06-14 | Wyko Corporation | Interferometric integration technique and apparatus to confine 2π discontinuity |
-
1997
- 1997-03-20 DK DK97908377T patent/DK0888522T3/da active
- 1997-03-20 ES ES97908377T patent/ES2157065T3/es not_active Expired - Lifetime
- 1997-03-20 JP JP53411597A patent/JP3856838B2/ja not_active Expired - Fee Related
- 1997-03-20 EP EP97908377A patent/EP0888522B1/en not_active Expired - Lifetime
- 1997-03-20 PT PT97908377T patent/PT888522E/pt unknown
- 1997-03-20 WO PCT/GB1997/000771 patent/WO1997036144A1/en active IP Right Grant
- 1997-03-20 AU AU20355/97A patent/AU2035597A/en not_active Abandoned
- 1997-03-20 US US09/142,707 patent/US6208416B1/en not_active Expired - Lifetime
- 1997-03-20 AT AT97908377T patent/ATE201762T1/de not_active IP Right Cessation
- 1997-03-20 DE DE69705037T patent/DE69705037T2/de not_active Expired - Lifetime
-
2001
- 2001-07-31 GR GR20010401147T patent/GR3036298T3/el not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
EP0888522A1 (en) | 1999-01-07 |
DE69705037T2 (de) | 2002-01-03 |
JP2000508066A (ja) | 2000-06-27 |
DK0888522T3 (da) | 2001-08-27 |
DE69705037D1 (de) | 2001-07-05 |
AU2035597A (en) | 1997-10-17 |
ATE201762T1 (de) | 2001-06-15 |
US6208416B1 (en) | 2001-03-27 |
WO1997036144A1 (en) | 1997-10-02 |
EP0888522B1 (en) | 2001-05-30 |
GR3036298T3 (en) | 2001-10-31 |
JP3856838B2 (ja) | 2006-12-13 |
PT888522E (pt) | 2001-10-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FG2A | Definitive protection |
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