ATE197746T1 - Verfahren zur verdrahtung eines halbleiterbauelementes - Google Patents

Verfahren zur verdrahtung eines halbleiterbauelementes

Info

Publication number
ATE197746T1
ATE197746T1 AT91304658T AT91304658T ATE197746T1 AT E197746 T1 ATE197746 T1 AT E197746T1 AT 91304658 T AT91304658 T AT 91304658T AT 91304658 T AT91304658 T AT 91304658T AT E197746 T1 ATE197746 T1 AT E197746T1
Authority
AT
Austria
Prior art keywords
wiring
semiconductor component
insulating film
metallic substance
conductive metallic
Prior art date
Application number
AT91304658T
Other languages
English (en)
Inventor
Shunsuke Inoue
Mitsutoshi Hasegawa
Nobuo Watanabe
Original Assignee
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP14373390A external-priority patent/JPH0437029A/ja
Priority claimed from JP14370190A external-priority patent/JPH0437133A/ja
Application filed by Canon Kk filed Critical Canon Kk
Application granted granted Critical
Publication of ATE197746T1 publication Critical patent/ATE197746T1/de

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3205Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
    • H01L21/32051Deposition of metallic or metal-silicide layers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
AT91304658T 1990-05-31 1991-05-22 Verfahren zur verdrahtung eines halbleiterbauelementes ATE197746T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP14373390A JPH0437029A (ja) 1990-05-31 1990-05-31 半導体装置の配線形成方法
JP14370190A JPH0437133A (ja) 1990-06-01 1990-06-01 半導体装置の配線形成方法

Publications (1)

Publication Number Publication Date
ATE197746T1 true ATE197746T1 (de) 2000-12-15

Family

ID=26475367

Family Applications (1)

Application Number Title Priority Date Filing Date
AT91304658T ATE197746T1 (de) 1990-05-31 1991-05-22 Verfahren zur verdrahtung eines halbleiterbauelementes

Country Status (3)

Country Link
EP (1) EP0459700B1 (de)
AT (1) ATE197746T1 (de)
DE (1) DE69132474T2 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100335968C (zh) 2000-05-04 2007-09-05 英国技术集团国际有限公司 纳米结构
DE102004028031A1 (de) * 2004-06-09 2006-01-05 Infineon Technologies Ag Selektives Beschichtungsverfahren und Dünnschichtsystem

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3483982D1 (de) * 1983-06-29 1991-02-28 Siemens Ag Verfahren zur herstellung einer elektrisch leitfaehigen verbindung und vorrichtung zur durchfuehrung eines solchen verfahrens.
JPS61214539A (ja) * 1985-03-20 1986-09-24 Hitachi Ltd 配線形成方法
JPH0763064B2 (ja) * 1986-03-31 1995-07-05 株式会社日立製作所 Ic素子における配線接続方法
JPS62281349A (ja) * 1986-05-29 1987-12-07 Seiko Instr & Electronics Ltd 金属パタ−ン膜の形成方法及びその装置
JPH01217946A (ja) * 1988-02-26 1989-08-31 Hitachi Ltd 半導体集積回路装置およびその製造方法

Also Published As

Publication number Publication date
EP0459700B1 (de) 2000-11-22
EP0459700A2 (de) 1991-12-04
DE69132474T2 (de) 2001-05-03
DE69132474D1 (de) 2000-12-28
EP0459700A3 (en) 1992-10-07

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Legal Events

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