ATE148558T1 - Probenträgervorrichtung für ein rastermikroskop - Google Patents

Probenträgervorrichtung für ein rastermikroskop

Info

Publication number
ATE148558T1
ATE148558T1 AT93308790T AT93308790T ATE148558T1 AT E148558 T1 ATE148558 T1 AT E148558T1 AT 93308790 T AT93308790 T AT 93308790T AT 93308790 T AT93308790 T AT 93308790T AT E148558 T1 ATE148558 T1 AT E148558T1
Authority
AT
Austria
Prior art keywords
sample
carrier device
sample carrier
scanning microscope
carriage
Prior art date
Application number
AT93308790T
Other languages
English (en)
Inventor
David William Abraham
James Michael Hammond
Martin Allen Klos
Kenneth Gilbert Roessler
Robert Marshall Stowell
Hemantha Kumar Wickramasinghe
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Application granted granted Critical
Publication of ATE148558T1 publication Critical patent/ATE148558T1/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/02—Probe holders
    • G01Q70/04—Probe holders with compensation for temperature or vibration induced errors
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/872—Positioner

Landscapes

  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Radiology & Medical Imaging (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
AT93308790T 1992-11-09 1993-11-03 Probenträgervorrichtung für ein rastermikroskop ATE148558T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/973,796 US5260577A (en) 1992-11-09 1992-11-09 Sample carriage for scanning probe microscope

Publications (1)

Publication Number Publication Date
ATE148558T1 true ATE148558T1 (de) 1997-02-15

Family

ID=25521236

Family Applications (1)

Application Number Title Priority Date Filing Date
AT93308790T ATE148558T1 (de) 1992-11-09 1993-11-03 Probenträgervorrichtung für ein rastermikroskop

Country Status (6)

Country Link
US (1) US5260577A (de)
EP (1) EP0597622B1 (de)
JP (1) JP2625636B2 (de)
AT (1) ATE148558T1 (de)
CA (1) CA2107048C (de)
DE (1) DE69307833T2 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5410910A (en) * 1993-12-22 1995-05-02 University Of Virginia Patent Foundation Cryogenic atomic force microscope
US5483064A (en) * 1994-01-21 1996-01-09 Wyko Corporation Positioning mechanism and method for providing coaxial alignment of a probe and a scanning means in scanning tunneling and scanning force microscopy
US5831181A (en) * 1995-09-29 1998-11-03 The Regents Of The University Of California Automated tool for precision machining and imaging
US5654546A (en) * 1995-11-07 1997-08-05 Molecular Imaging Corporation Variable temperature scanning probe microscope based on a peltier device
US5821545A (en) * 1995-11-07 1998-10-13 Molecular Imaging Corporation Heated stage for a scanning probe microscope
JP2004522989A (ja) * 2000-12-15 2004-07-29 ザ テクノロジー パートナーシップ パブリック リミテッド カンパニー 光学走査装置機器
CN100489491C (zh) * 2005-11-17 2009-05-20 钢铁研究总院 金属原位分析仪悬浮式扫描方法及样品夹具
GB0602083D0 (en) 2006-02-02 2006-03-15 Smartdrive Technology Ltd Microscopes
AT519344B1 (de) * 2016-10-18 2019-11-15 Anton Paar Gmbh Definiert schaltbare magnetische Haltevorrichtung
US10867782B2 (en) * 2019-01-10 2020-12-15 Shimadzij Corporation Time-of-flight mass spectrometer

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB842495A (en) * 1958-01-18 1960-07-27 Darwins Ltd Improvements in or relating to magnetic blocks and workholders
GB1052542A (de) * 1964-01-21
US3412991A (en) * 1966-07-28 1968-11-26 Burndy Corp Reproducible position platform
JPS5918182Y2 (ja) * 1979-02-02 1984-05-26 「国」華工業株式会社 磁石の反発力を利用した磁気スプリング
JPS57169212A (en) * 1981-04-13 1982-10-18 Kokka Kogyo Kk Vibration suppressing device
US4560880A (en) * 1983-09-19 1985-12-24 Varian Associates, Inc. Apparatus for positioning a workpiece in a localized vacuum processing system
DE3570012D1 (en) * 1985-01-29 1989-06-08 Ibm Field-emission scanning auger electron microscope
JP2896794B2 (ja) * 1988-09-30 1999-05-31 キヤノン株式会社 走査型トンネル電流検出装置，走査型トンネル顕微鏡，及び記録再生装置
US4908519A (en) * 1988-10-11 1990-03-13 The Board Of Thustees Of The Leland Stanford Jr. University Loading mechanism and support structure having improved vibration damping useful in scanning tunneling microscopy
JP2501897B2 (ja) * 1988-12-13 1996-05-29 三菱電機株式会社 走査型トンネル顕微鏡のトンネル・ユニット及びスキャン・ヘッド
US4947042A (en) * 1988-12-13 1990-08-07 Mitsubishi Denki Kabushiki Kaisha Tunnel unit and scanning head for scanning tunneling microscope
US5041783A (en) * 1989-02-13 1991-08-20 Olympus Optical Co., Ltd. Probe unit for an atomic probe microscope
US4935634A (en) * 1989-03-13 1990-06-19 The Regents Of The University Of California Atomic force microscope with optional replaceable fluid cell
JP2815196B2 (ja) * 1989-10-02 1998-10-27 オリンパス光学工業株式会社 微細表面形状計測装置
US5103095A (en) * 1990-05-23 1992-04-07 Digital Instruments, Inc. Scanning probe microscope employing adjustable tilt and unitary head
JP3060527B2 (ja) * 1990-11-13 2000-07-10 松下電器産業株式会社 位置決め装置

Also Published As

Publication number Publication date
JPH06207807A (ja) 1994-07-26
DE69307833T2 (de) 1997-07-24
CA2107048C (en) 1998-08-11
EP0597622A1 (de) 1994-05-18
CA2107048A1 (en) 1994-05-10
US5260577A (en) 1993-11-09
JP2625636B2 (ja) 1997-07-02
EP0597622B1 (de) 1997-01-29
DE69307833D1 (de) 1997-03-13

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Legal Events

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