AR080985A1 - Convertidor a/d, metodo de conversion a/d, elemento formador de imagenes en estado solido y sistema de camara - Google Patents

Convertidor a/d, metodo de conversion a/d, elemento formador de imagenes en estado solido y sistema de camara

Info

Publication number
AR080985A1
AR080985A1 ARP110101479A ARP110101479A AR080985A1 AR 080985 A1 AR080985 A1 AR 080985A1 AR P110101479 A ARP110101479 A AR P110101479A AR P110101479 A ARP110101479 A AR P110101479A AR 080985 A1 AR080985 A1 AR 080985A1
Authority
AR
Argentina
Prior art keywords
solid state
state image
conversion method
converter
camera system
Prior art date
Application number
ARP110101479A
Other languages
English (en)
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Publication of AR080985A1 publication Critical patent/AR080985A1/es

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0624—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by synchronisation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/745—Circuitry for generating timing or clock signals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/767—Horizontal readout lines, multiplexers or registers
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/1205—Multiplexed conversion systems
    • H03M1/123—Simultaneous, i.e. using one converter per channel but with common control or reference circuits for multiple converters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/14—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/50—Analogue/digital converters with intermediate conversion to time interval
    • H03M1/56—Input signal compared with linear ramp

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Multimedia (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Analogue/Digital Conversion (AREA)

Abstract

En la presente se describe un dispositivo formador de imágenes en estado solido que tiene un convertidor analogico-digital, y un método de conversion analogico-digital. Un ejemplo de un dispositivo formador de imágenes en estado solido incluye una seccion de prevencion de discrepancia de bits que está configurada para prevenir la discrepancia de bits entre la informacion de salida de una seccion de bloqueo de bits de nivel bajo y una seccion de recuento de bits de nivel alto.
ARP110101479A 2010-04-30 2011-04-28 Convertidor a/d, metodo de conversion a/d, elemento formador de imagenes en estado solido y sistema de camara AR080985A1 (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010105849 2010-04-30
JP2011048144A JP5799531B2 (ja) 2010-04-30 2011-03-04 Ａ／ｄ変換器、ａ／ｄ変換方法、固体撮像素子およびカメラシステム

Publications (1)

Publication Number Publication Date
AR080985A1 true AR080985A1 (es) 2012-05-23

Family

ID=44861140

Family Applications (1)

Application Number Title Priority Date Filing Date
ARP110101479A AR080985A1 (es) 2010-04-30 2011-04-28 Convertidor a/d, metodo de conversion a/d, elemento formador de imagenes en estado solido y sistema de camara

Country Status (12)

Country Link
US (2) US9053999B2 (es)
EP (1) EP2564508B1 (es)
JP (1) JP5799531B2 (es)
KR (1) KR101834021B1 (es)
CN (1) CN102934364B (es)
AR (1) AR080985A1 (es)
BR (1) BR112012027206A2 (es)
CO (1) CO6571876A2 (es)
RU (1) RU2012145106A (es)
TW (1) TWI452900B (es)
WO (1) WO2011135815A1 (es)
ZA (1) ZA201207893B (es)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5528204B2 (ja) * 2010-05-14 2014-06-25 パナソニック株式会社 固体撮像装置、撮像システム、及び固体撮像装置の駆動方法
EP2816731A4 (en) * 2012-02-17 2015-12-30 Univ Hokkaido Nat Univ Corp INTEGRATED ANALOG DIGITAL TRANSFORMER AND CMOS IMAGE SENSOR
US9357147B2 (en) 2012-02-29 2016-05-31 Sony Corporation Column A/D converter, column A/D conversion method, solid imaging device, and camera system
KR102075093B1 (ko) 2013-08-14 2020-03-03 삼성전자주식회사 이미지 센서, 아날로그-디지털 컨버터 및 아날로그-디지털 변환 방법
US10326953B2 (en) 2014-10-06 2019-06-18 Sony Semiconductor Solutions Corporation Signal processing device and method, imaging element, and electronic device
JP6525747B2 (ja) * 2015-06-05 2019-06-05 キヤノン株式会社 撮像装置、撮像システム
US9959856B2 (en) * 2015-06-15 2018-05-01 Cirrus Logic, Inc. Systems and methods for reducing artifacts and improving performance of a multi-path analog-to-digital converter
WO2017169446A1 (ja) * 2016-03-29 2017-10-05 株式会社ニコン 撮像素子および撮像装置
JP6726362B2 (ja) * 2017-06-20 2020-07-22 シャープ株式会社 アナログデジタル変換器および固体撮像素子
KR102593926B1 (ko) 2018-03-22 2023-10-26 삼성전자주식회사 그레이 코드 생성기
WO2020045140A1 (ja) * 2018-08-27 2020-03-05 株式会社Ｉｍａｇｉｎｇ Ｄｅｖｉｃｅ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ａｄ変換器、ａｄ変換器の駆動方法、及び固体撮像装置
US10659055B1 (en) 2018-11-14 2020-05-19 Omnivision Technologies, Inc. Two stage gray code counter with a redundant bit
US10659056B1 (en) * 2019-06-13 2020-05-19 Omnivision Technologies, Inc. Gray code counting signal distribution system
WO2021021787A1 (en) 2019-07-29 2021-02-04 Lightmatter, Inc. Systems and methods for analog computing using a linear photonic processor
KR20210065675A (ko) 2019-11-27 2021-06-04 삼성전자주식회사 그레이 카운터 및 그것을 포함하는 이미지 센서
US11777515B2 (en) * 2021-04-27 2023-10-03 Novatek Microelectronics Corp. Column analog-to-digital converter and local counting method thereof

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US5012246A (en) * 1990-01-31 1991-04-30 International Business Machines Corporation BiCMOS analog-to-digital converter with minimized metastability
IL118403A (en) * 1995-05-25 2001-09-13 Lockheed Martin Ir Imaging Sys Monolithic analog-digital converter and method for the same
US6225937B1 (en) 1996-05-24 2001-05-01 Lockheed-Martin Ir Imaging Systems, Inc. Metastability resolved monolithic analog-to-digital converter
SE516157C2 (sv) * 1999-05-28 2001-11-26 Ericsson Telefon Ab L M Rättning av statiska fel i en AD-omvandlare
JP4107269B2 (ja) 2004-02-23 2008-06-25 ソニー株式会社 固体撮像装置
US7484192B2 (en) * 2006-09-18 2009-01-27 International Business Machines Corporation Method for modeling metastability decay through latches in an integrated circuit model
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JP5076568B2 (ja) * 2007-03-12 2012-11-21 ソニー株式会社 データ処理方法、データ処理装置、固体撮像装置、撮像装置、電子機器
JP5040427B2 (ja) * 2007-05-11 2012-10-03 ソニー株式会社 データ処理方法、データ処理装置、固体撮像装置、撮像装置、電子機器
JP4953959B2 (ja) 2007-07-25 2012-06-13 パナソニック株式会社 物理量検知装置およびその駆動方法
JP4953970B2 (ja) * 2007-08-03 2012-06-13 パナソニック株式会社 物理量検知装置およびその駆動方法
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Also Published As

Publication number Publication date
US9053999B2 (en) 2015-06-09
WO2011135815A1 (en) 2011-11-03
EP2564508A4 (en) 2014-10-22
TW201206189A (en) 2012-02-01
KR101834021B1 (ko) 2018-03-02
JP2011250395A (ja) 2011-12-08
EP2564508B1 (en) 2017-02-15
EP2564508A1 (en) 2013-03-06
KR20130069585A (ko) 2013-06-26
JP5799531B2 (ja) 2015-10-28
BR112012027206A2 (pt) 2016-07-26
ZA201207893B (en) 2013-04-24
CN102934364B (zh) 2016-03-30
US9363452B2 (en) 2016-06-07
US20150229853A1 (en) 2015-08-13
CN102934364A (zh) 2013-02-13
CO6571876A2 (es) 2012-11-30
TWI452900B (zh) 2014-09-11
RU2012145106A (ru) 2014-04-27
US20130068931A1 (en) 2013-03-21

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