TW201921524A - Adhesive film for use in semiconductor device manufacture, semiconductor device, and manufacturing method of semiconductor device - Google Patents

Adhesive film for use in semiconductor device manufacture, semiconductor device, and manufacturing method of semiconductor device

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Publication number
TW201921524A
TW201921524A TW107132902A TW107132902A TW201921524A TW 201921524 A TW201921524 A TW 201921524A TW 107132902 A TW107132902 A TW 107132902A TW 107132902 A TW107132902 A TW 107132902A TW 201921524 A TW201921524 A TW 201921524A
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Taiwan
Prior art keywords
adhesive
adhesive sheet
film
carrier film
semiconductor device
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TW107132902A
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Chinese (zh)
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TWI827551B (en
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大久保恵介
藤尾俊介
夏川昌典
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日商日立化成股份有限公司
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Publication of TW201921524A publication Critical patent/TW201921524A/en
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Publication of TWI827551B publication Critical patent/TWI827551B/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L21/6836Wafer tapes, e.g. grinding or dicing support tapes
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B37/00Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding
    • B32B37/12Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding characterised by using adhesives
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/02Physical, chemical or physicochemical properties
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/04Interconnection of layers
    • B32B7/12Interconnection of layers using interposed adhesives or interposed materials with bonding properties
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/04Interconnection of layers
    • B32B7/12Interconnection of layers using interposed adhesives or interposed materials with bonding properties
    • B32B7/14Interconnection of layers using interposed adhesives or interposed materials with bonding properties applied in spaced arrangements, e.g. in stripes
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/20Adhesives in the form of films or foils characterised by their carriers
    • C09J7/22Plastics; Metallised plastics
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/52Mounting semiconductor bodies in containers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2203/00Applications of adhesives in processes or use of adhesives in the form of films or foils
    • C09J2203/326Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/30Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier
    • C09J2301/312Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier parameters being the characterizing feature

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Adhesive Tapes (AREA)
  • Die Bonding (AREA)
  • Laminated Bodies (AREA)
  • Wire Bonding (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

This adhesive film is provided with a carrier film strip no more than 100 mm in width, and multiple adhesive pieces arranged on the carrier film aligned in the longitudinal direction of the carrier film, and the adhesive pieces have a rectangular or square shape with a protrusion and/or recess formed on at least one side thereof. This semiconductor device is provided with a semiconductor chip, a substrate to which the semiconductor chip is electrically connected, and an adhesive piece which is arranged between the semiconductor chip and the substrate and which bonds the semiconductor chip and the substrate together, and the shape of the semiconductor chip and the shape of the adhesive piece are different.

Description

半導體裝置製造用接著膜以及半導體裝置及其製造方法Adhesive film for manufacturing semiconductor device, semiconductor device and manufacturing method thereof

本揭示是有關於一種半導體裝置的製造製程中所使用的接著膜以及半導體裝置及其製造方法。The present disclosure relates to an adhesive film used in a manufacturing process of a semiconductor device, a semiconductor device, and a manufacturing method thereof.

先前,半導體裝置是經過以下的步驟而製造。首先,將半導體晶圓貼附於切晶用黏著片,於該狀態下,將半導體晶圓單片化為半導體晶片。其後,實施拾取步驟、裝配步驟、回焊步驟及黏晶步驟等。專利文獻1揭示兼具於切晶步驟中將半導體晶圓固定的功能及於黏晶步驟中使半導體晶片與基板接著的功能的黏接著片(切晶黏晶片)。 [現有技術文獻] [專利文獻]Previously, semiconductor devices were manufactured through the following steps. First, a semiconductor wafer is attached to an adhesive sheet for dicing, and in this state, the semiconductor wafer is singulated into a semiconductor wafer. Thereafter, a pick-up step, an assembly step, a re-soldering step, and a die-bonding step are performed. Patent Document 1 discloses an adhesive sheet (cut crystal sticky wafer) having both a function of fixing a semiconductor wafer in a dicing step and a function of adhering a semiconductor wafer to a substrate in a die bonding step. [Prior Art Literature] [Patent Literature]

[專利文獻1]日本專利特開2007-288170號公報[Patent Document 1] Japanese Patent Laid-Open No. 2007-288170

[發明所欲解決之課題] 然而,近年來,伴隨面向以智慧型手機為代表的小型元件的半導體裝置的進化,與先前相比,半導體裝置的製造製程亦發生顯著變化。例如,不實施使用專利文獻1中記載的黏接著片(切晶黏晶片)的切晶步驟及黏晶步驟的製程或者不實施回焊步驟的製程的實用化正在推進。伴隨於此,對半導體裝置的製造製程中所使用的接著膜亦要求新的態樣。除所述情況以外,本發明者等人為了應對搭載半導體裝置的小型元件的高功能化及薄型化等,而推進開發一種對於在基板的所限定的特定的區域內接著與其相對應的形狀的半導體晶片而言好用的接著膜。[Problems to be Solved by the Invention] However, in recent years, with the evolution of semiconductor devices for small components such as smart phones, the manufacturing process of semiconductor devices has also changed significantly compared to the past. For example, the practical use of a process of not performing a dicing step and a dicing step using the adhesive sheet (dicing die bonding wafer) described in Patent Document 1 or a process not performing a reflow step is progressing. Along with this, a new aspect of the adhesive film used in the manufacturing process of the semiconductor device is also required. In addition to the above, in order to cope with the increase in functionality and thickness of small components on which semiconductor devices are mounted, the inventors and others have promoted the development of a shape that adheres to a specific area of a substrate in a specific region. A good adhesive film for semiconductor wafers.

於先前的半導體裝置中,通常半導體晶片的形狀與用以將其接著於基板的接著劑片的形狀相同,例如該些的形狀為長方形或正方形。但是,例如,於應接著半導體晶片的基板的區域有限制的情況下,或者於需要在和先前不同的位置將半導體晶片與基板電性連接的情況下,使用較先前的形狀而言複雜的形狀的接著劑片的需求提高。In the conventional semiconductor device, the shape of the semiconductor wafer is generally the same as the shape of the adhesive sheet used to adhere it to the substrate. For example, these shapes are rectangular or square. However, for example, when the area of the substrate to be bonded to the semiconductor wafer is limited, or when it is necessary to electrically connect the semiconductor wafer to the substrate at a different position from the previous one, a more complicated shape than the previous shape is used. The demand for adhesive tablets has increased.

本揭示的目的在於提供一種對於有效率地實施半導體裝置的製造製程中的接著步驟而言有用的包括複雜形狀的接著劑片的接著膜。另外,本揭示的目的在於提供一種使用複雜形狀的接著劑片的半導體裝置及其製造方法。 [解決課題之手段]An object of the present disclosure is to provide an adhesive film including an adhesive sheet having a complicated shape, which is useful for efficiently performing a subsequent step in a manufacturing process of a semiconductor device. Another object of the present disclosure is to provide a semiconductor device using a complex-shaped adhesive sheet and a method for manufacturing the same. [Means for solving problems]

本揭示的半導體裝置製造用接著膜包括:寬度100 mm以下的帶狀的載體膜;以及以沿載體膜的長邊方向排列的方式配置於載體膜上的多個接著劑片;並且接著劑片具有於長方形或正方形的至少一邊形成有凸部及凹部的至少一者的形狀。The adhesive film for manufacturing a semiconductor device according to the present disclosure includes a belt-shaped carrier film having a width of 100 mm or less, and a plurality of adhesive sheets arranged on the carrier film so as to be aligned along the longitudinal direction of the carrier film; and It has a shape in which at least one of a convex portion and a concave portion is formed on at least one side of a rectangle or a square.

根據該接著膜,可依次拾取以排列於載體膜上的方式配置的多個接著劑片,其後,將各接著劑片配置於基板的規定的區域,且可有效率地實施基板與半導體晶片的接著步驟。例如,若設為將帶狀的接著膜捲繞於捲軸的態樣,則可藉由輥對輥方式而更進一步有效率地實施接著步驟。如上所述,接著劑片具有較長方形或正方形而言複雜的形狀。接著劑片的形狀只要根據應接著半導體晶片的基板的區域的形狀或半導體晶片的形狀而適宜設定即可。例如,接著劑片可具有6個以上的角,亦可具有8個以上的角。再者,作為具有6個角的接著劑片的形狀的一例,可列舉L字型。According to this adhesive film, a plurality of adhesive sheets arranged in order to be arranged on a carrier film can be sequentially picked up, and then each adhesive sheet can be arranged in a predetermined area of the substrate, and the substrate and the semiconductor wafer can be efficiently implemented. The next steps. For example, if a tape-shaped adhesive film is wound on a reel, a bonding process can be implemented more efficiently by a roll-to-roll method. As described above, the adhesive sheet has a more complicated shape than a rectangle or a square. The shape of the adhesive sheet may be appropriately set according to the shape of the region of the substrate to which the semiconductor wafer is to be attached or the shape of the semiconductor wafer. For example, the adhesive sheet may have 6 or more corners, or may have 8 or more corners. An example of the shape of the adhesive sheet having six corners is an L-shape.

配置於載體膜上的接著劑片的尺寸及個數等只要根據所製造的半導體裝置的設計而適宜設定即可。例如,一個接著劑片的面積可設為10 mm2 ~200 mm2 的範圍。以載體膜的面積為基準,載體膜的表面且為被多個接著劑片覆蓋的區域的比例可設為10%~60%。於載體膜上亦可形成一個或多個包含所述多個接著劑片的行。The size and number of the adhesive sheet arranged on the carrier film may be appropriately set according to the design of the semiconductor device to be manufactured. For example, the area of one adhesive sheet may be set to a range of 10 mm 2 to 200 mm 2 . Based on the area of the carrier film, the ratio of the surface of the carrier film to the area covered by the plurality of adhesive sheets can be set to 10% to 60%. One or more rows containing the plurality of adhesive sheets may also be formed on the carrier film.

多個接著劑片例如可藉由將以覆蓋載體膜的表面的方式形成的接著劑層模切而形成。就接著膜的加工性的觀點(進行模切時及其後,防止接著劑片自載體膜不經意地剝離的方面)而言,載體膜與接著劑片之間的密接力較佳為0.5 N/m~18 N/m。The plurality of adhesive sheets can be formed by, for example, die-cutting an adhesive layer formed so as to cover the surface of the carrier film. From the viewpoint of the processability of the adhesive film (in terms of preventing inadvertent peeling of the adhesive sheet from the carrier film during and after die cutting), the adhesion between the carrier film and the adhesive sheet is preferably 0.5 N / m ~ 18 N / m.

本揭示的接著膜亦可進而包括保護構件,所述保護構件覆蓋接著劑片的與載體膜側的第一面相反的一側的第二面且具有與接著劑片相同的形狀。藉由設為利用保護構件覆蓋接著劑片的狀態,可防止塵埃等附著於接著劑片,直至使用時為止。接著劑片及保護構件可藉由將以覆蓋載體膜的表面的方式形成的接著劑層與以覆蓋接著劑層的方式配置的保護膜模切而形成。The adhesive film of the present disclosure may further include a protective member covering the second surface of the adhesive agent sheet on the side opposite to the first surface on the carrier film side and having the same shape as the adhesive agent sheet. When the adhesive sheet is covered with a protective member, dust or the like can be prevented from adhering to the adhesive sheet until it is used. The adhesive sheet and the protective member can be formed by die-cutting an adhesive layer formed to cover the surface of the carrier film and a protective film disposed to cover the adhesive layer.

保護構件的光透過率較佳為低於載體膜的光透過率。藉由採用所述構成,可利用相機等元件來識別接著劑片的位置,且容易使接著步驟完全自動化。The light transmittance of the protective member is preferably lower than the light transmittance of the carrier film. By adopting such a configuration, the position of the adhesive sheet can be identified by a device such as a camera, and the subsequent step can be easily automated.

就半導體晶片與基板的接著步驟的作業性的觀點而言,接著劑片與保護構件之間的密接力較佳為16 N/m以下。例如,於接著劑片包含具有熱硬化性的樹脂組成物的情況下,較佳為:於在100℃下進行10分鐘的熱處理後,接著劑片與保護構件之間的密接力為16 N/m以下。 [發明的效果]From the viewpoint of the workability of the subsequent steps of the semiconductor wafer and the substrate, the adhesion between the adhesive sheet and the protective member is preferably 16 N / m or less. For example, in the case where the adhesive sheet contains a thermosetting resin composition, it is preferable that after the heat treatment at 100 ° C for 10 minutes, the adhesion between the adhesive sheet and the protective member is 16 N / m or less. [Effect of the invention]

根據本揭示,可提供一種對於有效率地實施半導體裝置的製造製程中的接著步驟而言有用的包括複雜形狀的接著劑片的接著膜。另外,根據本揭示,可提供一種使用複雜形狀的接著劑片的半導體裝置及其製造方法。According to the present disclosure, it is possible to provide an adhesive film including an adhesive sheet having a complicated shape, which is useful for efficiently performing a subsequent step in a manufacturing process of a semiconductor device. In addition, according to the present disclosure, a semiconductor device using a complex-shaped adhesive sheet and a method for manufacturing the same can be provided.

以下,一邊適宜參照圖式,一邊對本揭示的實施形態進行說明。再者,本發明並不限定於以下的實施形態。於本說明書中,所謂(甲基)丙烯酸,是指丙烯酸或甲基丙烯酸。Hereinafter, embodiments of the present disclosure will be described with reference to drawings as appropriate. The present invention is not limited to the following embodiments. As used herein, (meth) acrylic acid means acrylic acid or methacrylic acid.

<半導體裝置製造用接著膜> 圖1是示意性表示本實施形態的接著膜的立體圖。圖2是圖1所示的II-II線的剖面圖。該些圖所示的接著膜10包括:寬度100 mm以下的帶狀的載體膜1;以沿載體膜1的長邊方向(圖1所示的箭頭X的方向)排列的方式配置於載體膜1上的多個接著劑片3p;以及覆蓋接著劑片3p的表面F2且具有與接著劑片3p相同的形狀的保護構件5p。如圖2所示,接著劑片3p的表面F2(第二面)為接著劑片3p的與載體膜1側的面F1(第一面)相反的一側的面。<Adhesive Film for Semiconductor Device Manufacturing> FIG. 1 is a perspective view schematically showing an adhesive film according to this embodiment. FIG. 2 is a cross-sectional view taken along a line II-II shown in FIG. 1. The adhesive film 10 shown in these figures includes a strip-shaped carrier film 1 having a width of 100 mm or less, and is arranged on the carrier film so as to be aligned along the longitudinal direction of the carrier film 1 (direction of arrow X shown in FIG. 1). A plurality of adhesive sheets 3p on 1; and a protective member 5p covering the surface F2 of the adhesive sheet 3p and having the same shape as the adhesive sheet 3p. As shown in FIG. 2, the surface F2 (second surface) of the adhesive sheet 3 p is a surface on the side opposite to the surface F1 (first surface) of the carrier film 1 side of the adhesive sheet 3 p.

接著膜10可應用於半導體裝置的製造製程中的各種接著步驟(例如,半導體晶片與基板的接著)。根據接著膜10,可依次拾取以排列於載體膜1上的方式配置的多個接著劑片3p,其後,將各接著劑片3p配置於基板的規定的區域,且可有效率地實施基板與半導體晶片的接著步驟。再者,於圖1、圖2中,圖示了於載體膜1上設置有一行包含多個接著劑片3p的行3A的情況,亦可於載體膜1上設置兩個以上的行3A。The bonding film 10 can be applied to various bonding steps (for example, bonding of a semiconductor wafer and a substrate) in a manufacturing process of a semiconductor device. According to the adhesive film 10, a plurality of adhesive sheets 3p arranged in order to be arranged on the carrier film 1 can be sequentially picked up, and thereafter, each adhesive sheet 3p is arranged in a predetermined area of the substrate, and the substrate can be efficiently implemented. Next step with semiconductor wafer. Furthermore, FIG. 1 and FIG. 2 illustrate a case where a row 3A including a plurality of adhesive sheets 3p is provided on the carrier film 1, and two or more rows 3A may be provided on the carrier film 1.

如圖1所示,本實施形態的接著劑片3p具有如粗T字般的形狀(T字型)。如圖3(a)所示,該形狀具有8個角C1~角C8。再者,該形狀可稱為於長方形的一邊的中央部形成有一個凸部的形狀,亦可稱為於長方形的一邊的兩端分別形成有各一個凹部的形狀。As shown in FIG. 1, the adhesive sheet 3 p of this embodiment has a shape (T-shape) like a thick T-shape. As shown in FIG. 3 (a), the shape has eight corners C1 to C8. The shape may be referred to as a shape in which one convex portion is formed at a central portion of one side of the rectangle, or a shape in which one concave portion is formed at each end of one side of the rectangle.

接著劑片3p的形狀並不限定於圖3(a)所示的形狀,只要為於長方形或正方形的至少一邊形成有凸部及凹部的至少一者的形狀即可。例如,如圖3(b)所示,可為L字型,且可具有6個角C1~角C6。如圖3(c)所示,亦可為於長方形或正方形中形成有一個凹部的形狀且具有8個角C1~角C8。如圖3(d)所示,亦可為於長方形或正方形的一個角部(圖3(d)中的左下方)形成有凹部且於一邊(圖3(d)中的右側)形成有凸部的形狀且具有10個角C1~角C10。如圖3(e)所示,亦可為於長方形或正方形的一邊形成有凸部且於另一邊形成有凹部的形狀且具有12個角C1~角C12。再者,如圖3(f)所示,凹部或凸部的形狀可為三角形,亦可為圓弧狀。The shape of the adhesive agent sheet 3p is not limited to the shape shown in FIG. 3 (a), and may be a shape in which at least one of a convex portion and a concave portion is formed on at least one side of a rectangle or a square. For example, as shown in FIG. 3 (b), it may be L-shaped and may have six corners C1 to C6. As shown in FIG. 3 (c), it may have a shape in which a recess is formed in a rectangle or a square, and has eight corners C1 to C8. As shown in FIG. 3 (d), a concave portion may be formed at one corner of the rectangle or square (lower left in FIG. 3 (d)) and a convex may be formed at one side (right side in FIG. 3 (d)). The shape of the part has 10 corners C1 to C10. As shown in FIG. 3 (e), a rectangular or square shape may have a convex portion formed on one side and a concave portion formed on the other side, and may have 12 corners C1 to C12. Furthermore, as shown in FIG. 3 (f), the shape of the concave portion or the convex portion may be a triangle or an arc shape.

接著劑片的形狀只要根據應接著半導體晶片的基板的區域的形狀或半導體晶片的形狀而適宜設定即可。另外,半導體晶片例如具有長方形或正方形的形狀且於其角部設置有多個端子,於需要將該些端子與基板的配線連接的情況下,可以端子與配線不被接著劑片覆蓋的方式決定接著劑片的形狀。圖4是示出T字型的接著劑片3p與長方形的半導體晶片S的配置的一例的平面圖。圖4所示的區域R1、區域R2中,於基板與半導體晶片之間不存在接著劑,而可於該些區域R1、區域R2中將基板與半導體晶片電性連接。The shape of the adhesive sheet may be appropriately set according to the shape of the region of the substrate to which the semiconductor wafer is to be attached or the shape of the semiconductor wafer. In addition, a semiconductor wafer has, for example, a rectangular or square shape, and a plurality of terminals are provided at its corners. When these terminals need to be connected to the wiring of the substrate, the bonding may be determined so that the terminals and the wiring are not covered by the adhesive sheet. Tablet shape. FIG. 4 is a plan view showing an example of the arrangement of a T-shaped adhesive sheet 3 p and a rectangular semiconductor wafer S. FIG. In the regions R1 and R2 shown in FIG. 4, there is no adhesive between the substrate and the semiconductor wafer, and the substrate and the semiconductor wafer can be electrically connected in the regions R1 and R2.

本實施形態中的接著劑片3p假定為尺寸充分小者,一個接著劑片3p的面積例如為10 mm2 ~200 mm2 ,亦可為20 mm2 ~160 mm2 或25 mm2 ~100 mm2 。以載體膜1的面積為基準,載體膜1的表面且為被多個接著劑片3p覆蓋的區域的比例(接著劑片的面積率)例如為10%~60%,亦可為10%~35%或15%~33%。該面積率可藉由如下方式來算出:將一個接著劑片3p的面積A除以設置於載體膜1上的接著劑片3p的間距(圖1中的間距P)與載體膜1的寬度(圖1中的寬度W)的積。即,該面積率R亦可設為利用以下的式所算出的值。 面積率R(%)=A/(P×W)×100The adhesive sheet 3p in this embodiment is assumed to have a sufficiently small size. The area of one adhesive sheet 3p is, for example, 10 mm 2 to 200 mm 2 , and may also be 20 mm 2 to 160 mm 2 or 25 mm 2 to 100 mm. 2 . Based on the area of the carrier film 1, the ratio of the surface of the carrier film 1 to the area covered by the plurality of adhesive sheets 3 p (area ratio of the adhesive sheet) is, for example, 10% to 60%, or 10% to 35% or 15% to 33%. This area ratio can be calculated by dividing the area A of one adhesive sheet 3p by the pitch (pitch P in FIG. 1) of the adhesive sheet 3p provided on the carrier film 1 and the width ( The product of width W) in FIG. 1. That is, the area ratio R may be a value calculated by the following formula. Area ratio R (%) = A / (P × W) × 100

以下,對接著膜10的構成進行說明。 [載體膜] 如上所述,載體膜1為帶狀且具有100 mm以下的寬度。載體膜1的寬度只要根據配置於其上的接著劑片3p的尺寸及行3A的數量而適宜設定即可。例如,如圖1所示,於行3A的數量為一個的情況下,載體膜1的寬度較佳為10 mm~50 mm,亦可為10 mm~30 mm或10 mm~20 mm。藉由載體膜1的寬度為10 mm以上,於採用輥對輥方式的情況下,容易防止因撚載體膜1而導致作業性降低。Hereinafter, the structure of the adhesive film 10 is demonstrated. [Carrier film] As described above, the carrier film 1 has a band shape and has a width of 100 mm or less. The width of the carrier film 1 may be appropriately set according to the size of the adhesive sheet 3p disposed thereon and the number of rows 3A. For example, as shown in FIG. 1, when the number of rows 3A is one, the width of the carrier film 1 is preferably 10 mm to 50 mm, and may also be 10 mm to 30 mm or 10 mm to 20 mm. When the width of the carrier film 1 is 10 mm or more, when the roll-to-roll method is used, it is easy to prevent workability from being lowered by twisting the carrier film 1.

關於載體膜1的材質,若為可充分耐受於接著膜10的製造製程及半導體裝置的製造製程中所施加的張力者,則並無特別限制。關於載體膜1,就配置於其上的接著劑片3p及/或保護構件5p的視認性的觀點而言,較佳為透明。作為載體膜1,可使用聚對苯二甲酸乙二酯膜等聚酯系膜、聚四氟乙烯膜、聚乙烯膜、聚丙烯膜、聚甲基戊烯膜、聚乙烯乙酸酯膜、聚-4-甲基戊烯-1、乙烯-乙酸乙烯酯共聚物、乙烯-丙烯酸乙酯共聚物等均聚物或共聚物或者該些的混合物等聚烯烴系膜、聚氯乙烯膜、聚醯亞胺膜等塑膠膜等。載體膜1可為單層結構,亦可為多層結構。The material of the carrier film 1 is not particularly limited as long as it can sufficiently withstand the tension applied during the manufacturing process of the adhesive film 10 and the manufacturing process of the semiconductor device. The carrier film 1 is preferably transparent from the viewpoint of the visibility of the adhesive sheet 3p and / or the protective member 5p disposed thereon. As the carrier film 1, a polyester film such as a polyethylene terephthalate film, a polytetrafluoroethylene film, a polyethylene film, a polypropylene film, a polymethylpentene film, a polyethylene acetate film, Homopolymers or copolymers such as poly-4-methylpentene-1, ethylene-vinyl acetate copolymers, ethylene-ethyl acrylate copolymers, or mixtures thereof, such as polyolefin-based films, polyvinyl chloride films,塑胶 imine film and other plastic films. The carrier film 1 may have a single-layer structure or a multilayer structure.

載體膜1的厚度只要於不損及作業性的範圍內適宜選擇即可,例如為10 μm~200 μm,亦可為20 μm~100 μm或25 μm~80 μm。該些厚度範圍為於實用方面無問題且於經濟方面亦有效的範圍。The thickness of the carrier film 1 may be appropriately selected within a range that does not impair workability, and is, for example, 10 μm to 200 μm, or 20 μm to 100 μm, or 25 μm to 80 μm. These thickness ranges are ranges that are practically practical and economically effective.

為了提高接著劑片3p相對於載體膜1的密接力,可對載體膜1的表面實施電暈處理、鉻酸處理、臭氧暴露、火焰暴露、高壓電擊暴露、離子化放射線處理等化學性或物理性表面處理。作為載體膜1,亦可使用包含氟樹脂的表面能量低的膜。作為此種膜,例如存在帝人膜解決方案(Teijin film solutions)股份有限公司製造的A-63(模切處理劑:改質矽酮系)及帝人膜解決方案(Teijin film solutions)股份有限公司製造的A-31(模切處理劑:Pt系矽酮系)等。In order to improve the adhesion of the adhesive sheet 3p to the carrier film 1, the surface of the carrier film 1 may be chemically or physically treated by corona treatment, chromic acid treatment, ozone exposure, flame exposure, high-voltage electric shock exposure, ionizing radiation treatment, and the like Sexual surface treatment. As the carrier film 1, a film having a low surface energy including a fluororesin may be used. As such a film, there are, for example, A-63 (die-cutting treatment agent: modified silicone type) manufactured by Teijin film solutions Co., Ltd. and Teijin film solutions Co., Ltd. A-31 (die-cutting treatment agent: Pt-based silicone) and so on.

為了防止接著劑片3p相對於載體膜1的密接力過度變高,亦可於載體膜1的表面形成包含矽酮系剝離劑、氟系剝離劑、長鏈烷基丙烯酸酯系剝離劑等模切劑的模切層。In order to prevent the adhesive force of the adhesive sheet 3p from becoming excessively high with respect to the carrier film 1, a mold containing a silicone-based release agent, a fluorine-based release agent, a long-chain alkyl acrylate-based release agent, or the like may be formed on the surface of the carrier film 1. Die-cut layer of the cutting agent.

載體膜1與接著劑片3p之間的密接力較佳為0.5 N/m~18 N/m,更佳為2 N/m~10 N/m,亦可為2 N/m~6 N/m或2 N/m~4 N/m。藉由該密接力為0.5 N/m以上,於製造接著膜10的過程中,容易防止接著劑片3p自載體膜1不經意地剝離,另一方面,藉由該密接力為18 N/m以下,在使用接著膜10時,容易自載體膜1穩定地拾取接著劑片3p及覆蓋其的保護構件5p。再者,接著劑片3p相對於載體膜1的密接力是指90°剝離強度,具體而言,是指如下剝離強度:準備於載體膜1上形成有包含與接著劑片3p相同的組成的寬度20 mm的接著劑層的試樣,以90°的角度且以剝離速度50 mm/min將該接著劑層自載體膜剝離時所測定的剝離強度。The adhesion force between the carrier film 1 and the adhesive sheet 3p is preferably 0.5 N / m to 18 N / m, more preferably 2 N / m to 10 N / m, or 2 N / m to 6 N / m or 2 N / m to 4 N / m. With this adhesion force being 0.5 N / m or more, it is easy to prevent the adhesive sheet 3p from being unintentionally peeled from the carrier film 1 in the process of manufacturing the adhesion film 10. On the other hand, the adhesion force is 18 N / m or less When the adhesive film 10 is used, it is easy to stably pick up the adhesive sheet 3p and the protective member 5p covering the adhesive sheet 3p from the carrier film 1. In addition, the adhesive force of the adhesive sheet 3p with respect to the carrier film 1 is a 90 ° peel strength, and specifically, the peel strength is as follows: The carrier film 1 is prepared to have a composition containing the same composition as the adhesive sheet 3p. For a sample of the adhesive layer having a width of 20 mm, the peel strength measured when the adhesive layer was peeled from the carrier film at an angle of 90 ° and a peeling speed of 50 mm / min.

[接著劑片] 接著劑片3p是藉由將以覆蓋載體膜1的表面的方式形成的接著劑層3與以覆蓋接著劑層3的方式配置的保護膜5同時模切而與保護構件5p一起形成者(參照圖6)。接著劑片3p的厚度只要於不損及作業性的範圍內適宜選擇即可,例如為3 μm~50 μm,亦可為5 μm~40 μm或7 μm~30 μm。藉由接著劑片3p的厚度為3 μm以上,容易確保充分的接著性,另一方面,藉由接著劑片3p的厚度為50 μm以下,容易抑制構成接著劑片3p的接著劑組成物自保護構件5p滲出。[Adhesive Sheet] The adhesive sheet 3p is formed by die-cutting the adhesive layer 3 formed so as to cover the surface of the carrier film 1 and the protective film 5 disposed so as to cover the adhesive layer 3 simultaneously with the protective member 5p. Formed together (see Figure 6). The thickness of the adhesive agent sheet 3p may be appropriately selected within a range that does not impair workability, and is, for example, 3 μm to 50 μm, 5 μm to 40 μm, or 7 μm to 30 μm. When the thickness of the adhesive sheet 3p is 3 μm or more, it is easy to ensure sufficient adhesiveness. On the other hand, when the thickness of the adhesive sheet 3p is 50 μm or less, the adhesive composition constituting the adhesive sheet 3p is easily suppressed. The protective member 5p oozes.

構成接著劑片3p的接著劑組成物只要具有可無問題地用於半導體裝置的製造製程中的性質(例如,接著性及相對於150℃左右的熱的耐熱性)即可,只要適宜採用先前於半導體裝置的製造製程中所使用者即可。接著劑片3p較佳為包含熱塑性樹脂、熱硬化性樹脂、硬化促進劑及填料,視需要亦可包含光反應性單體及光聚合起始劑等。伴隨基板的薄化,而存在使用耐熱性低的基板的傾向,且存在要求半導體裝置的製造製程的低溫化的傾向。接著劑片3p較佳為可於160℃以下的溫度條件下接著對象物。As long as the adhesive composition constituting the adhesive sheet 3p has properties (for example, adhesiveness and heat resistance to heat of about 150 ° C) that can be used in the manufacturing process of a semiconductor device without any problem, as long as it is suitable It can be used by the user in the manufacturing process of the semiconductor device. The adhesive agent sheet 3p preferably contains a thermoplastic resin, a thermosetting resin, a hardening accelerator, and a filler, and may optionally include a photoreactive monomer, a photopolymerization initiator, and the like. Along with the thinning of the substrate, there is a tendency to use a substrate having low heat resistance, and there is a tendency to reduce the temperature of the manufacturing process of the semiconductor device. The adhesive agent sheet 3p is preferably capable of adhering an object at a temperature of 160 ° C. or lower.

(熱塑性樹脂) 作為熱塑性樹脂,可使用具有熱塑性的樹脂、或至少於未硬化狀態下具有熱塑性且於加熱後形成交聯結構的樹脂。作為熱塑性樹脂,就作為半導體加工用膠帶而收縮性、耐熱性及剝離性優異的觀點而言,較佳為具有反應性基的(甲基)丙烯酸共聚物(以下,亦有時稱為「含反應性基的(甲基)丙烯酸共聚物」)。 於包含含反應性基的(甲基)丙烯酸共聚物作為熱塑性樹脂的情況下,接著劑片3p亦可為不含熱硬化性樹脂的態樣。即,亦可為包含含反應性基的(甲基)丙烯酸共聚物、硬化促進劑及填料的態樣。 熱塑性樹脂可單獨使用一種或組合使用兩種以上。(Thermoplastic resin) As the thermoplastic resin, a resin having a thermoplastic property or a resin having a thermoplastic property at least in an uncured state and forming a crosslinked structure after heating can be used. As the thermoplastic resin, a (meth) acrylic copolymer having a reactive group (hereinafter, also sometimes referred to as "containing" Reactive (meth) acrylic copolymers "). When the (meth) acrylic acid copolymer containing a reactive group is contained as a thermoplastic resin, the adhesive agent sheet 3p may be a state which does not contain a thermosetting resin. That is, it may be a state including a reactive group-containing (meth) acrylic copolymer, a hardening accelerator, and a filler. The thermoplastic resin may be used singly or in combination of two or more kinds.

作為(甲基)丙烯酸共聚物,可列舉丙烯酸樹脂、丙烯酸橡膠等(甲基)丙烯酸酯共聚物等,較佳為丙烯酸橡膠。丙烯酸橡膠較佳為以丙烯酸酯為主成分且藉由選自(甲基)丙烯酸酯及丙烯腈中的單體的共聚而形成者。Examples of the (meth) acrylic copolymer include (meth) acrylic acid ester copolymers such as acrylic resins and acrylic rubbers, and acrylic rubbers are preferred. The acrylic rubber is preferably formed by copolymerizing a monomer selected from (meth) acrylate and acrylonitrile with acrylate as a main component.

作為(甲基)丙烯酸酯,可列舉:丙烯酸甲酯、丙烯酸乙酯、丙烯酸丙酯、丙烯酸異丙酯、丙烯酸丁酯、丙烯酸異丁酯、丙烯酸己酯、丙烯酸環己酯、丙烯酸2-乙基己酯、丙烯酸月桂酯、甲基丙烯酸甲酯、甲基丙烯酸乙酯、甲基丙烯酸丙酯、丙烯酸異丙酯、甲基丙烯酸丁酯、甲基丙烯酸異丁酯、甲基丙烯酸己酯、甲基丙烯酸環己酯、甲基丙烯酸2-乙基己酯、甲基丙烯酸月桂酯等。 作為(甲基)丙烯酸酯共聚物,較佳為包含丙烯酸丁酯及丙烯腈作為共聚成分的共聚物、包含丙烯酸乙酯及丙烯腈作為共聚成分的共聚物。Examples of the (meth) acrylate include methyl acrylate, ethyl acrylate, propyl acrylate, isopropyl acrylate, butyl acrylate, isobutyl acrylate, hexyl acrylate, cyclohexyl acrylate, and 2-ethyl acrylate Hexyl ester, lauryl acrylate, methyl methacrylate, ethyl methacrylate, propyl methacrylate, isopropyl acrylate, butyl methacrylate, isobutyl methacrylate, hexyl methacrylate, Cyclohexyl methacrylate, 2-ethylhexyl methacrylate, lauryl methacrylate, and the like. The (meth) acrylate copolymer is preferably a copolymer containing butyl acrylate and acrylonitrile as copolymerization components, and a copolymer containing ethyl acrylate and acrylonitrile as copolymerization components.

含反應性基的(甲基)丙烯酸共聚物較佳為包含具有反應性基的(甲基)丙烯酸單體作為共聚成分的含反應性基的(甲基)丙烯酸共聚物。此種含反應性基的(甲基)丙烯酸共聚物可藉由使包含具有反應性基的(甲基)丙烯酸單體與所述單體的單量體組成物共聚而獲得。The reactive group-containing (meth) acrylic copolymer is preferably a reactive group-containing (meth) acrylic copolymer containing a (meth) acrylic monomer having a reactive group as a copolymerization component. Such a (meth) acrylic copolymer containing a reactive group can be obtained by copolymerizing a monomer composition containing a (meth) acrylic monomer having a reactive group and the monomer.

作為反應性基,就提高耐熱性的觀點而言,較佳為環氧基、羧基、丙烯醯基、甲基丙烯醯基、羥基、環硫基,其中,就交聯性的方面而言,更佳為環氧基及羧基。As a reactive group, from a viewpoint of improving heat resistance, an epoxy group, a carboxyl group, an acrylfluorenyl group, a methacrylfluorenyl group, a hydroxyl group, and an epithio group are preferable. Among these, in terms of crosslinkability, More preferred are epoxy and carboxy.

於本實施形態中,含反應性基的(甲基)丙烯酸共聚物較佳為包含具有環氧基的(甲基)丙烯酸單體作為共聚成分的含環氧基的(甲基)丙烯酸共聚物。於該情況下,作為具有環氧基的(甲基)丙烯酸單體,可列舉:丙烯酸縮水甘油酯、丙烯酸4-羥基丁酯縮水甘油醚、丙烯酸3,4-環氧環己基甲酯、甲基丙烯酸縮水甘油酯、甲基丙烯酸4-羥基丁酯縮水甘油醚、甲基丙烯酸3,4-環氧環己基甲酯等。就耐熱性的觀點而言,具有反應性基的(甲基)丙烯酸單體較佳為丙烯酸縮水甘油酯、甲基丙烯酸縮水甘油酯。In this embodiment, the reactive group-containing (meth) acrylic copolymer is preferably an epoxy-containing (meth) acrylic copolymer containing a (meth) acrylic monomer having an epoxy group as a copolymerization component. . In this case, examples of the (meth) acrylic monomer having an epoxy group include glycidyl acrylate, 4-hydroxybutyl acrylate, glycidyl ether, 3,4-epoxycyclohexyl methyl acrylate, and methyl formate. Glycidyl acrylate, 4-hydroxybutyl methacrylate glycidyl ether, 3,4-epoxycyclohexyl methyl methacrylate, and the like. From the viewpoint of heat resistance, the (meth) acrylic monomer having a reactive group is preferably glycidyl acrylate or glycidyl methacrylate.

熱塑性樹脂的Tg較佳為-50℃~50℃。若熱塑性樹脂的Tg為50℃以下,則容易確保接著劑片3p的柔軟性。另外,在貼附於被黏著體時,於存在凹凸的情況下,容易追隨且具有適度的接著性。另一方面,若熱塑性樹脂的Tg為-50℃以上,則容易抑制接著劑片3p的柔軟性變得過高,可達成優異的處理性及接著性、剝離性。The Tg of the thermoplastic resin is preferably -50 ° C to 50 ° C. When the Tg of the thermoplastic resin is 50 ° C or lower, it is easy to ensure the flexibility of the adhesive sheet 3p. In addition, when attached to an adherend, when unevenness is present, it is easy to follow and has moderate adhesiveness. On the other hand, when the Tg of the thermoplastic resin is −50 ° C. or higher, it is easy to suppress the flexibility of the adhesive sheet 3 p from becoming too high, and excellent handleability, adhesion, and peelability can be achieved.

熱塑性樹脂的Tg為藉由示差掃描熱量測定(Differential Scanning Calorimetry,DSC)而獲得的中間點玻璃轉移溫度值。具體而言,熱塑性樹脂的Tg為於升溫速度10℃/min、測定溫度:-80℃~80℃的條件下測定熱量變化,藉由依據JIS K 7121:1987的方法而算出的中間點玻璃轉移溫度。The Tg of the thermoplastic resin is a midpoint glass transition temperature value obtained by differential scanning calorimetry (DSC). Specifically, the Tg of the thermoplastic resin is measured at a heating rate of 10 ° C./min and at a measurement temperature of −80 ° C. to 80 ° C. The heat change is measured, and the intermediate point glass transition is calculated by a method in accordance with JIS K 7121: 1987. temperature.

熱塑性樹脂的重量平均分子量較佳為10萬以上、200萬以下。若重量平均分子量為10萬以上,則在用於暫時固定的用途時,容易確保耐熱性。另一方面,若重量平均分子量為200萬以下,則在用於暫時固定的用途時,容易抑制流動性(flow)的降低及貼附性的降低。就所述觀點而言,熱塑性樹脂的重量平均分子量更佳為50萬以上、200萬以下,進而更佳為100萬以上、200萬以下。再者,重量平均分子量為利用凝膠滲透層析法(Gel Permeation Chromatography,GPC)並使用標準聚苯乙烯的標準曲線而得的聚苯乙烯換算值。The weight average molecular weight of the thermoplastic resin is preferably from 100,000 to 2 million. When the weight average molecular weight is 100,000 or more, it is easy to ensure heat resistance when it is used for temporary fixing applications. On the other hand, when the weight average molecular weight is 2 million or less, when it is used for a temporary fixing application, it is easy to suppress a decrease in flowability and a decrease in adhesion. From this viewpoint, the weight average molecular weight of the thermoplastic resin is more preferably 500,000 or more and 2 million or less, and even more preferably 1 million or more and 2 million or less. The weight average molecular weight is a polystyrene-equivalent value obtained by gel permeation chromatography (GPC) using a standard polystyrene calibration curve.

於具有反應性基的(甲基)丙烯酸共聚物包含丙烯酸縮水甘油酯或甲基丙烯酸縮水甘油酯作為共聚成分的情況下,以共聚成分總量為基準,該些的含量以合計計較佳為0.1質量%~20質量%,更佳為0.5質量%~15質量%,進而更佳為1.0質量%~10質量%。若含量為所述範圍內,則容易以更高水準達成接著劑片3p的柔軟性、接著性及剝離性的全部。In the case where the (meth) acrylic copolymer having a reactive group contains glycidyl acrylate or glycidyl methacrylate as a copolymerization component, based on the total amount of the copolymerization component, the content thereof is preferably 0.1 in total. Mass% to 20% by mass, more preferably 0.5% to 15% by mass, and even more preferably 1.0% to 10% by mass. If the content is within the above range, all of the flexibility, adhesiveness, and peelability of the adhesive sheet 3p can be easily achieved at a higher level.

作為如上所述的具有反應性基的(甲基)丙烯酸共聚物,亦可使用藉由珠狀聚合(pearl polymerization)、溶液聚合等聚合方法而獲得者。或者,亦可使用HTR-860P-3CSP(商品名,長瀨化成(Nagase ChemteX)股份有限公司製造)等市售品。As the (meth) acrylic copolymer having a reactive group as described above, one obtained by a polymerization method such as pearl polymerization and solution polymerization can also be used. Alternatively, a commercially available product such as HTR-860P-3CSP (trade name, manufactured by Nagase ChemteX Co., Ltd.) may be used.

(熱硬化性樹脂) 作為熱硬化性樹脂,若為藉由熱而硬化的樹脂,則可無特別限制地使用。作為熱硬化性樹脂,可列舉:環氧樹脂、丙烯酸樹脂、矽酮樹脂、酚樹脂、熱硬化型聚醯亞胺樹脂、聚胺基甲酸酯樹脂、三聚氰胺樹脂、脲樹脂等。該些可單獨使用一種或組合使用兩種以上。(Thermosetting resin) The thermosetting resin can be used without particular limitation as long as it is a resin that is cured by heat. Examples of the thermosetting resin include epoxy resin, acrylic resin, silicone resin, phenol resin, thermosetting polyimide resin, polyurethane resin, melamine resin, and urea resin. These can be used alone or in combination of two or more.

關於環氧樹脂,只要為進行硬化而具有耐熱作用者,則並無特別限定。環氧樹脂可使用雙酚A型環氧等二官能環氧樹脂;苯酚酚醛清漆型環氧樹脂、甲酚酚醛清漆型環氧樹脂等酚醛清漆型環氧樹脂等。另外,環氧樹脂可使用多官能環氧樹脂、縮水甘油胺型環氧樹脂、含雜環的環氧樹脂、脂環式環氧樹脂等現有公知者。The epoxy resin is not particularly limited as long as it has a heat-resistant effect for curing. As the epoxy resin, bifunctional epoxy resins such as bisphenol A epoxy resin, novolac epoxy resins such as phenol novolac epoxy resin, cresol novolac epoxy resin, and the like can be used. As the epoxy resin, a conventionally known one such as a polyfunctional epoxy resin, a glycidylamine type epoxy resin, a heterocyclic ring-containing epoxy resin, and an alicyclic epoxy resin can be used.

作為雙酚A型環氧樹脂,可列舉:愛皮克特(Epikote)807、愛皮克特(Epikote)815、愛皮克特(Epikote)825、愛皮克特(Epikote)827、愛皮克特(Epikote)828、愛皮克特(Epikote)834、愛皮克特(Epikote)1001、愛皮克特(Epikote)1004、愛皮克特(Epikote)1007、愛皮克特(Epikote)1009(均為三菱化學股份有限公司製造);DER-330、DER-301、DER-361(均為陶氏化學(Dow Chemical)公司製造);YD8125、YDF8170(均為新日鐵住金化學股份有限公司製造)等。 作為苯酚酚醛清漆型環氧樹脂,可列舉:愛皮克特(Epikote)152、愛皮克特(Epikote)154(均為三菱化學股份有限公司製造);EPPN-201(日本化藥股份有限公司製造);DEN-438(陶氏化學(Dow Chemical)公司製造)等。 作為鄰甲酚酚醛清漆型環氧樹脂,可列舉:YDCN-700-10(新日鐵住金化學股份有限公司製造);EOCN-102S、EOCN-103S、EOCN-104S、EOCN-1012、EOCN-1025、EOCN-1027(均為日本化藥股份有限公司製造);YDCN701、YDCN702、YDCN703、YDCN704(均為新日鐵住金化學股份有限公司製造)等。 作為多官能環氧樹脂,可列舉:愛普恩(Epon)1031S(三菱化學股份有限公司製造);愛牢達(Araldite)0163(日本巴斯夫(BASF Japan)公司製造);代那科(Denacol)EX-611、EX-614、EX-614B、EX-622、EX-512、EX-521、EX-421、EX-411、EX-321(均為長瀨化成(Nagase ChemteX)股份有限公司製造)等。 作為胺型環氧樹脂,可列舉:愛皮克特(Epikote)604(三菱化學股份有限公司製造);YH-434(新日鐵住金化學股份有限公司製造);泰拉德(TETRAD)-X、泰拉德(TETRAD)-C(均為三菱化學股份有限公司製造);ELM-120(住友化學股份有限公司製造)等。 作為含雜環的環氧樹脂,可列舉:愛牢達(Araldite)PT810(日本巴斯夫(BASF Japan)公司製造);ERL4234、ERL4299、ERL4221、ERL4206(均為聯合碳化物(Union Carbide)公司製造)等。該些環氧樹脂可單獨使用一種或組合使用兩種以上。Examples of the bisphenol A epoxy resin include: Epikote 807, Epikote 815, Epikote 825, Epikote 827, and Epiphan Epikote 828, Epikote 834, Epikote 1001, Epikote 1004, Epikote 1007, Epikote 1009 (all manufactured by Mitsubishi Chemical Corporation); DER-330, DER-301, DER-361 (all manufactured by Dow Chemical); YD8125, YDF8170 (both Nippon Steel & Sumitomo Chemical Co., Ltd.) Company)). Examples of the phenol novolac epoxy resin include: Epikote 152, Epikote 154 (all manufactured by Mitsubishi Chemical Corporation); EPPN-201 (Nippon Kayaku Co., Ltd.) (Manufactured); DEN-438 (manufactured by Dow Chemical). Examples of o-cresol novolac epoxy resin include: YDCN-700-10 (manufactured by Nippon Steel & Sumikin Chemical Co., Ltd.); EOCN-102S, EOCN-103S, EOCN-104S, EOCN-1012, EOCN-1025 , EOCN-1027 (all manufactured by Nippon Kayaku Co., Ltd.); YDCN701, YDCN702, YDCN703, YDCN704 (all manufactured by Nippon Steel & Sumikin Chemical Co., Ltd.), etc. Examples of the polyfunctional epoxy resin include: Epon 1031S (manufactured by Mitsubishi Chemical Corporation); Araldite 0163 (manufactured by BASF Japan); Denacol EX-611, EX-614, EX-614B, EX-622, EX-512, EX-521, EX-421, EX-411, EX-321 (all manufactured by Nagase ChemteX Co., Ltd.) Wait. Examples of the amine-type epoxy resin include Epikote 604 (manufactured by Mitsubishi Chemical Corporation); YH-434 (manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd.); and TETRAD-X , TETRAD-C (all manufactured by Mitsubishi Chemical Corporation); ELM-120 (made by Sumitomo Chemical Corporation), etc. Examples of the heterocyclic-containing epoxy resin include: Araldite PT810 (manufactured by BASF Japan); ERL4234, ERL4299, ERL4221, and ERL4206 (all manufactured by Union Carbide) Wait. These epoxy resins can be used alone or in combination of two or more.

關於作為熱硬化性樹脂成分的一部分的環氧樹脂硬化劑,可使用通常所使用的公知的樹脂。具體而言,可列舉:胺類;聚醯胺;酸酐;多硫化物;三氟化硼;如雙酚A、雙酚F、雙酚S般的於一分子中具有兩個以上酚性羥基的雙酚類;苯酚酚醛清漆樹脂、雙酚A酚醛清漆樹脂、甲酚酚醛清漆樹脂等酚樹脂等。作為環氧樹脂硬化劑,特別是就吸濕時的耐電蝕性優異的觀點而言,較佳為苯酚酚醛清漆樹脂、雙酚A酚醛清漆樹脂、甲酚酚醛清漆樹脂等酚樹脂。 再者,環氧硬化劑可與環氧樹脂同時使用,亦可單獨使用。As for the epoxy resin hardener which is a part of a thermosetting resin component, a well-known resin generally used can be used. Specific examples include: amines; polyamines; acid anhydrides; polysulfides; boron trifluoride; bisphenol A, bisphenol F, and bisphenol S having two or more phenolic hydroxyl groups in one molecule Phenols; phenol novolac resin, bisphenol A novolac resin, cresol novolac resin and other phenol resins. As an epoxy resin hardener, a phenol resin, such as a phenol novolak resin, a bisphenol A novolak resin, and a cresol novolak resin, is especially preferable from a viewpoint of being excellent in the electric-resistance at the time of moisture absorption. Furthermore, the epoxy hardener may be used simultaneously with the epoxy resin, or may be used alone.

所述酚樹脂硬化劑中,較佳為使用費恩利特(Phenolite)LF4871、費恩利特(Phenolite)TD-2090、費恩利特(Phenolite)TD-2149、費恩利特(Phenolite)VH-4150、費恩利特(Phenolite)VH4170(均為迪愛生(DIC)股份有限公司製造,商品名);H-1(明和化成股份有限公司製造,商品名);艾匹庫(Epi-Cure)MP402FPY、艾匹庫(Epi-Cure)YL6065、艾匹庫(Epi-Cure)YLH129B65、美萊克(Milex)XL、美萊克(Milex)XLC、美萊克(Milex)XLC-LL、美萊克(Milex)RN、美萊克(Milex)RS、美萊克(Milex)VR(均為三菱化學股份有限公司製造,商品名)等具有結構的材料。Among the phenol resin hardeners, it is preferable to use Phenolite LF4871, Phenolite TD-2090, Phenolite TD-2149, and Phenolite. VH-4150, Phenolite VH4170 (both are manufactured by DIC Corporation, trade name); H-1 (made by Meiwa Chemical Co., Ltd., trade name); Epi- Cure) MP402FPY, Epi-Cure YL6065, Epi-Cure YLH129B65, Milex XL, Milex XLC, Milex XLC-LL, Melex ( Milex) RN, Milex RS, Milex VR (all manufactured by Mitsubishi Chemical Corporation, trade names) and other structural materials.

相對於熱塑性樹脂100質量份,接著劑片3p中的熱硬化性樹脂的含量較佳為10質量份~500質量份,更佳為30質量份~450質量份,進而更佳為50質量份~400質量份。若熱硬化性樹脂的含量為所述範圍內,則容易達成接著劑片3p的熱硬化後的優異的密接性。The content of the thermosetting resin in the adhesive sheet 3p is preferably 10 to 500 parts by mass, more preferably 30 to 450 parts by mass, and even more preferably 50 parts by mass to 100 parts by mass of the thermoplastic resin. 400 parts by mass. When the content of the thermosetting resin is within the above range, it is easy to achieve excellent adhesion after the thermosetting of the adhesive sheet 3p.

(硬化促進劑) 作為硬化促進劑,可列舉:咪唑類、雙氰胺衍生物、二羧酸二醯肼、三苯基膦、四苯基鏻四苯基硼酸鹽、2-乙基-4-甲基咪唑-四苯基硼酸鹽、1,8-二氮雜雙環[5,4,0]十一烯-7-四苯基硼酸鹽等。該些可單獨使用一種或組合使用兩種以上。(Hardening accelerator) Examples of the hardening accelerator include imidazoles, dicyandiamide derivatives, dihydrazine dicarboxylic acid, triphenylphosphine, tetraphenylphosphonium tetraphenylborate, and 2-ethyl-4 -Methylimidazole-tetraphenylborate, 1,8-diazabicyclo [5,4,0] undecene-7-tetraphenylborate, and the like. These can be used alone or in combination of two or more.

於接著劑片3p含有具有環氧基的(甲基)丙烯酸共聚物的情況下,較佳為含有促進所述丙烯酸共聚物中所含的環氧基的硬化的硬化促進劑。作為促進環氧基的硬化的硬化促進劑,可列舉:酚系硬化劑、酸酐系硬化劑、胺系硬化劑、咪唑系硬化劑、咪唑啉系硬化劑、三嗪系硬化劑及膦系硬化劑。該些中,就快速硬化性、耐熱性及剝離性的觀點而言,較佳為可期待步驟時間的縮短及作業性的提高的咪唑系硬化劑。該些化合物可單獨使用一種或組合使用兩種以上。When the adhesive sheet 3p contains a (meth) acrylic acid copolymer which has an epoxy group, it is preferable to contain the hardening accelerator which accelerates hardening of the epoxy group contained in the said acrylic copolymer. Examples of the hardening accelerator that accelerates the hardening of epoxy groups include phenol-based hardeners, acid anhydride-based hardeners, amine-based hardeners, imidazole-based hardeners, imidazoline-based hardeners, triazine-based hardeners, and phosphine-based hardeners. Agent. Among these, from the viewpoints of rapid curing, heat resistance, and releasability, an imidazole-based curing agent that can be expected to reduce the step time and improve the workability. These compounds may be used alone or in combination of two or more.

相對於熱塑性樹脂100質量份,接著劑片3p中的硬化促進劑的含量較佳為0.01質量份~50質量份,更佳為0.02質量份~20質量份,進而更佳為0.025質量份~10質量份。若硬化促進劑的含量為所述範圍內,則存在可提高接著劑片3p的硬化性,同時可充分抑制保存穩定性的降低的傾向。The content of the hardening accelerator in the adhesive agent sheet 3p is preferably from 0.01 to 50 parts by mass, more preferably from 0.02 to 20 parts by mass, and even more preferably from 0.025 to 10 parts by mass based on 100 parts by mass of the thermoplastic resin. Parts by mass. When the content of the hardening accelerator is within the above-mentioned range, there is a tendency that the hardenability of the adhesive sheet 3p can be improved, and a decrease in storage stability can be sufficiently suppressed.

(無機填料) 接著劑片3p較佳為含有無機填料。作為無機填料,可列舉:銀粉、金粉、銅粉等金屬填料;二氧化矽(silica)、氧化鋁(alumina)、氮化硼、二氧化鈦(titania)、玻璃(glass)、氧化鐵、陶瓷(ceramic)等非金屬無機填料等。無機填料可根據所期望的功能而進行選擇。(Inorganic Filler) The adhesive sheet 3p preferably contains an inorganic filler. Examples of the inorganic filler include metal fillers such as silver powder, gold powder, and copper powder; silica, alumina, boron nitride, titania, glass, iron oxide, and ceramic ) And other non-metallic inorganic fillers. The inorganic filler can be selected according to a desired function.

所述無機填料較佳為表面具有有機基者。藉由無機填料的表面經有機基修飾,容易使製備用以形成接著劑片3p的清漆時於有機溶劑中的分散性以及接著劑片3p的高彈性係數及優異的剝離性併存。The inorganic filler is preferably one having an organic group on the surface. By modifying the surface of the inorganic filler with an organic group, it is easy to coexist the dispersibility of the varnish used to form the adhesive sheet 3p in an organic solvent, the high elastic coefficient of the adhesive sheet 3p, and excellent peelability.

表面具有有機基的無機填料例如可藉由如下方式來獲得:將下述式(B-1)所表示的矽烷偶合劑與無機填料混合,於30℃以上的溫度下進行攪拌。無機填料的表面經有機基修飾可利用紫外線(UV)測定、紅外線(Infrared Radiation,IR)測定、X射線光電子光譜(X-ray photoelectron spectroscopy,XPS)測定等來確認。The inorganic filler having an organic group on the surface can be obtained, for example, by mixing a silane coupling agent represented by the following formula (B-1) with an inorganic filler and stirring the mixture at a temperature of 30 ° C or higher. The modification of the surface of the inorganic filler with an organic group can be confirmed by ultraviolet (UV) measurement, infrared (Infrared Radiation) measurement, X-ray photoelectron spectroscopy (XPS) measurement, and the like.

[化1] [Chemical 1]

式(B-1)中,X表示選自由苯基、縮水甘油氧基、丙烯醯基、甲基丙烯醯基、巰基、胺基、乙烯基、異氰酸酯基及甲基丙烯醯氧基所組成的群組中的有機基,s表示0或1~10的整數,R11 、R12 及R13 分別獨立地表示碳數1~10的烷基。 作為碳數1~10的烷基,可列舉:甲基、乙基、丙基、丁基、戊基、己基、庚基、辛基、壬基、癸基、異丙基、異丁基等。 就容易獲取的觀點而言,碳數1~10的烷基較佳為甲基、乙基及戊基。就耐熱性的觀點而言,X較佳為胺基、縮水甘油氧基、巰基及異氰酸酯基,更佳為縮水甘油氧基及巰基。就抑制高熱時的膜流動性並提高耐熱性的觀點而言,式(B-1)中的s較佳為0~5,更佳為0~4。In the formula (B-1), X represents a member selected from the group consisting of a phenyl group, a glycidyloxy group, an acrylfluorenyl group, a methacrylfluorenyl group, a mercapto group, an amino group, a vinyl group, an isocyanate group, and a methacryloxy group. In the organic group in the group, s represents an integer of 0 or 1 to 10, and R 11 , R 12, and R 13 each independently represent an alkyl group having 1 to 10 carbon atoms. Examples of the alkyl group having 1 to 10 carbon atoms include methyl, ethyl, propyl, butyl, pentyl, hexyl, heptyl, octyl, nonyl, decyl, isopropyl, and isobutyl. . From the viewpoint of easy availability, the alkyl group having 1 to 10 carbon atoms is preferably a methyl group, an ethyl group, and an pentyl group. From the viewpoint of heat resistance, X is preferably an amine group, a glycidyloxy group, a mercapto group, and an isocyanate group, and more preferably a glycidyloxy group and a mercapto group. From the viewpoint of suppressing the fluidity of the film during high heat and improving the heat resistance, s in the formula (B-1) is preferably 0 to 5, and more preferably 0 to 4.

作為矽烷偶合劑,可列舉:三甲氧基苯基矽烷、二甲基二甲氧基苯基矽烷、三乙氧基苯基矽烷、二甲氧基甲基苯基矽烷、乙烯基三甲氧基矽烷、乙烯基三乙氧基矽烷、乙烯基三(2-甲氧基乙氧基)矽烷、N-(2-胺基乙基)-3-胺基丙基甲基二甲氧基矽烷、N-(2-胺基乙基)-3-胺基丙基三甲氧基矽烷、3-胺基丙基三乙氧基矽烷、3-胺基丙基三甲氧基矽烷、3-縮水甘油氧基丙基三甲氧基矽烷、3-縮水甘油氧基丙基甲基二甲氧基矽烷、2-(3,4-環氧環己基)乙基三甲氧基矽烷、3-異氰酸酯基丙基三乙氧基矽烷、3-甲基丙烯醯氧基丙基三甲氧基矽烷、3-巰基丙基三甲氧基矽烷、3-脲基丙基三乙氧基矽烷、N-(1,3-二甲基亞丁基)-3-(三乙氧基矽烷基)-1-丙胺、N,N'-雙(3-(三甲氧基矽烷基)丙基)乙二胺、聚氧乙烯丙基三烷氧基矽烷、聚乙氧基二甲基矽氧烷等。 該些中,較佳為3-胺基丙基三乙氧基矽烷、3-縮水甘油氧基丙基三甲氧基矽烷、3-異氰酸酯基丙基三乙氧基矽烷、3-巰基丙基三甲氧基矽烷,更佳為三甲氧基苯基矽烷、3-縮水甘油氧基丙基三甲氧基矽烷、3-巰基丙基三甲氧基矽烷。矽烷偶合劑可單獨使用一種或組合使用兩種以上。Examples of the silane coupling agent include trimethoxyphenylsilane, dimethyldimethoxyphenylsilane, triethoxyphenylsilane, dimethoxymethylphenylsilane, and vinyltrimethoxysilane , Vinyltriethoxysilane, vinyltri (2-methoxyethoxy) silane, N- (2-aminoethyl) -3-aminopropylmethyldimethoxysilane, N -(2-aminoethyl) -3-aminopropyltrimethoxysilane, 3-aminopropyltriethoxysilane, 3-aminopropyltrimethoxysilane, 3-glycidyloxy Propyltrimethoxysilane, 3-glycidoxypropylmethyldimethoxysilane, 2- (3,4-epoxycyclohexyl) ethyltrimethoxysilane, 3-isocyanatepropyltriethyl Oxysilane, 3-methacryloxypropyltrimethoxysilane, 3-mercaptopropyltrimethoxysilane, 3-ureidopropyltriethoxysilane, N- (1,3-dimethyl Butylene) -3- (triethoxysilyl) -1-propylamine, N, N'-bis (3- (trimethoxysilyl) propyl) ethylenediamine, polyoxyethylenepropyltriane Oxysilane, polyethoxydimethylsiloxane, etc. Among these, 3-aminopropyltriethoxysilane, 3-glycidyloxypropyltrimethoxysilane, 3-isocyanatepropyltriethoxysilane, and 3-mercaptopropyltrimethylsilane are preferred. The oxysilane is more preferably trimethoxyphenylsilane, 3-glycidyloxypropyltrimethoxysilane, and 3-mercaptopropyltrimethoxysilane. The silane coupling agent may be used singly or in combination of two or more kinds.

就實現耐熱性與保存穩定性的平衡的觀點而言,相對於無機填料100質量份,所述偶合劑的含量較佳為0.01質量份~50質量份,更佳為0.05質量份~20質量份,就提高耐熱性的觀點而言,進而更佳為0.5質量份~10質量份。From the viewpoint of achieving a balance between heat resistance and storage stability, the content of the coupling agent is preferably 0.01 to 50 parts by mass, and more preferably 0.05 to 20 parts by mass based on 100 parts by mass of the inorganic filler. From the viewpoint of improving heat resistance, it is more preferably 0.5 to 10 parts by mass.

相對於熱塑性樹脂100質量份,接著劑片3p中的無機填料的含量較佳為600質量份以下,更佳為500質量份以下,進而更佳為400質量份以下。無機填料的含量的下限並無特別限制,相對於熱塑性樹脂100質量份,較佳為5質量份以上,更佳為8質量份以上。藉由將無機填料的含量設為所述範圍,可抑制伴隨熱硬化的收縮,並且容易使接著劑片3p的高彈性係數及優異的剝離性併存。The content of the inorganic filler in the adhesive sheet 3p is preferably 600 parts by mass or less, more preferably 500 parts by mass or less, and still more preferably 400 parts by mass or less with respect to 100 parts by mass of the thermoplastic resin. The lower limit of the content of the inorganic filler is not particularly limited, but it is preferably 5 parts by mass or more, more preferably 8 parts by mass or more, based on 100 parts by mass of the thermoplastic resin. By setting the content of the inorganic filler within the above range, it is possible to suppress shrinkage due to thermal curing, and it is easy to coexist a high elastic modulus and excellent peelability of the adhesive sheet 3p.

(有機填料) 接著劑片3p亦可含有有機填料。作為有機填料,可列舉:碳、橡膠系填料、矽酮系微粒子、聚醯胺微粒子、聚醯亞胺微粒子等。相對於熱塑性樹脂100質量份,有機填料的含量較佳為300質量份以下,更佳為200質量份以下,進而更佳為100質量份以下。有機填料的含量的下限並無特別限制,相對於熱塑性樹脂100質量份,較佳為5質量份以上。(Organic Filler) The adhesive sheet 3p may contain an organic filler. Examples of the organic filler include carbon, rubber-based fillers, silicone-based fine particles, polyamidofine particles, polyamidofine particles, and the like. The content of the organic filler relative to 100 parts by mass of the thermoplastic resin is preferably 300 parts by mass or less, more preferably 200 parts by mass or less, and even more preferably 100 parts by mass or less. The lower limit of the content of the organic filler is not particularly limited, but is preferably 5 parts by mass or more with respect to 100 parts by mass of the thermoplastic resin.

(有機溶劑) 接著劑片3p視需要亦可使用有機溶劑進行稀釋。有機溶劑並無特別限定,可根據沸點來考慮製膜時的揮發性等而決定。具體而言,就在製膜時難以進行膜的硬化的觀點而言,較佳為甲醇、乙醇、2-甲氧基乙醇、2-乙氧基乙醇、2-丁氧基乙醇、甲基乙基酮、丙酮、甲基異丁基酮、甲苯、二甲苯等沸點相對低的溶劑。另外,出於提高製膜性等的目的,較佳為使用二甲基乙醯胺、二甲基甲醯胺、N-甲基吡咯啶酮、環己酮等沸點相對高的溶劑。該些溶劑可單獨使用一種或組合使用兩種以上。(Organic solvent) The adhesive agent sheet 3p may be diluted with an organic solvent if necessary. The organic solvent is not particularly limited, and can be determined in consideration of the volatility at the time of film formation and the like based on the boiling point. Specifically, methanol, ethanol, 2-methoxyethanol, 2-ethoxyethanol, 2-butoxyethanol, and methylethyl are preferred from the viewpoint that it is difficult to harden the film during film formation. Relatively low-boiling solvents such as ketones, acetone, methyl isobutyl ketone, toluene, and xylene. In addition, for the purpose of improving film forming properties, it is preferable to use a solvent having a relatively high boiling point, such as dimethylacetamide, dimethylformamide, N-methylpyrrolidone, or cyclohexanone. These solvents may be used alone or in combination of two or more.

[保護構件] 保護構件5p是藉由將以覆蓋載體膜1的表面的方式形成的接著劑層3與以覆蓋接著劑層3的方式配置的保護膜5同時模切而與接著劑片3p一起形成者(參照圖6)。本實施形態的保護構件5p是藉由模切而與接著劑片3p同時形成者,因此實質為與接著劑片3p相同的形狀。作為保護膜5,只要為於接著膜10的製造製程中可進行衝壓加工且於半導體裝置的製造製程中可容易將保護構件5p自接著劑片3p剝離者即可。[Protective member] The protective member 5p is formed by simultaneously die-cutting the adhesive layer 3 formed so as to cover the surface of the carrier film 1 and the protective film 5 disposed so as to cover the adhesive layer 3 together with the adhesive sheet 3p. The creator (see Figure 6). The protective member 5p of this embodiment is formed at the same time as the adhesive sheet 3p by die cutting, and therefore has substantially the same shape as the adhesive sheet 3p. The protective film 5 may be any one that can be press-processed in the manufacturing process of the adhesive film 10 and can easily peel the protective member 5p from the adhesive sheet 3p in the manufacturing process of the semiconductor device.

接著劑片3p與保護構件5p之間的密接力較佳為16 N/m以下,更佳為10 N/m以下,亦可為5 N/m以下或4.5 N/m以下。特別是,於接著劑片3p包含具有熱硬化性的樹脂組成物的情況下,較佳為:於在100℃下進行10分鐘的熱處理後,保護構件5p相對於接著劑片3p的密接力為所述範圍。藉由該密接力為16 N/m以下,可於使由保護構件5p覆蓋的狀態的接著劑片3p例如於100℃下且於3秒的條件下暫時壓接於被黏著體(例如基板)後,利用黏著膠帶等容易將保護構件5p自接著劑片3p剝離。再者,保護構件5p相對於接著劑片3p的密接力是指90°剝離強度,具體而言,是指如下剝離強度:準備於包含與接著劑片3p相同的組成的寬度20 mm的接著劑層上配置有相同寬度的保護膜的試樣,以90°的角度且以剝離速度300 mm/min將該保護膜自接著劑層剝離時所測定的剝離強度。The adhesive force between the adhesive agent sheet 3p and the protective member 5p is preferably 16 N / m or less, more preferably 10 N / m or less, and also 5 N / m or 4.5 N / m or less. In particular, when the adhesive sheet 3p contains a resin composition having a thermosetting property, it is preferable that the adhesive strength of the protective member 5p with respect to the adhesive sheet 3p after the heat treatment at 100 ° C for 10 minutes is The range. When the adhesion force is 16 N / m or less, the adhesive sheet 3p in a state covered by the protective member 5p can be temporarily pressure-bonded to the adherend (for example, a substrate) at 100 ° C. for 3 seconds. After that, the protective member 5p is easily peeled from the adhesive sheet 3p with an adhesive tape or the like. In addition, the adhesive force of the protective member 5p with respect to the adhesive sheet 3p is a 90 degree peeling strength, specifically, the peeling strength which is prepared for the adhesive agent with a width of 20 mm containing the same composition as the adhesive sheet 3p. A sample having a protective film of the same width arranged on the layer, and the peeling strength measured when the protective film was peeled from the adhesive layer at an angle of 90 ° and a peeling speed of 300 mm / min.

作為保護膜5,可使用聚對苯二甲酸乙二酯膜等聚酯系膜、聚四氟乙烯膜、聚乙烯膜、聚丙烯膜、聚甲基戊烯膜、聚乙烯乙酸酯膜、聚-4-甲基戊烯-1、乙烯-乙酸乙烯酯共聚物、乙烯-丙烯酸乙酯共聚物等均聚物或共聚物或者該些的混合物等聚烯烴系膜、聚氯乙烯膜、聚醯亞胺膜等塑膠膜等。保護膜5可為單層結構,亦可為多層結構。藉由利用保護膜5覆蓋接著劑層3,可抑制對接著劑層3施加過度的張力,並且在模切時,可防止異物混入至接著劑層3中。As the protective film 5, a polyester film such as a polyethylene terephthalate film, a polytetrafluoroethylene film, a polyethylene film, a polypropylene film, a polymethylpentene film, a polyethylene acetate film, Homopolymers or copolymers such as poly-4-methylpentene-1, ethylene-vinyl acetate copolymers, ethylene-ethyl acrylate copolymers, or mixtures thereof, such as polyolefin-based films, polyvinyl chloride films,塑胶 imine film and other plastic films. The protective film 5 may have a single-layer structure or a multilayer structure. By covering the adhesive layer 3 with the protective film 5, excessive tension on the adhesive layer 3 can be suppressed, and foreign matter can be prevented from being mixed into the adhesive layer 3 during die cutting.

保護膜5的厚度只要於不損及作業性的範圍內適宜選擇即可,例如為10 μm~200 μm,亦可為20 μm~100 μm或25 μm~80 μm。該些厚度範圍為於實用方面無問題且於經濟方面亦有效的範圍。The thickness of the protective film 5 may be appropriately selected within a range that does not impair workability, and is, for example, 10 μm to 200 μm, or 20 μm to 100 μm, or 25 μm to 80 μm. These thickness ranges are ranges that are practically practical and economically effective.

保護構件5p的光透過率較佳為低於載體膜1的光透過率。藉由採用所述構成,可利用相機等元件來識別接著劑片3p的位置及朝向等,且容易使半導體裝置的製造製程中的接著步驟自動化。例如,作為保護構件5p,較佳為使用著色成波長500 nm的光的透過率未滿10%(更佳為未滿7%)者。The light transmittance of the protective member 5 p is preferably lower than the light transmittance of the carrier film 1. By adopting such a configuration, the position and orientation of the adhesive sheet 3p can be recognized by using a device such as a camera, and the subsequent steps in the manufacturing process of the semiconductor device can be easily automated. For example, as the protective member 5p, it is preferable to use a light having a transmittance of less than 10% (more preferably less than 7%) colored with a wavelength of 500 nm.

<接著膜的製造方法> 繼而,對接著膜10的製造方法進行說明。本實施形態的製造方法包括以下的步驟。 (A)準備積層體20的步驟,所述積層體20具有寬度100 mm以下的帶狀的載體膜1、以覆蓋載體膜1的表面的方式形成的接著劑層3及以覆蓋接著劑層3的方式配置的保護膜5。 (B)藉由將積層體20中的接著劑層3及保護膜5模切而獲得以沿載體膜1的長邊方向排列的方式配置於載體膜1上的多個接著劑片3p的步驟。<The manufacturing method of an adhesive film> Next, the manufacturing method of the adhesive film 10 is demonstrated. The manufacturing method of this embodiment includes the following steps. (A) A step of preparing a laminated body 20 having a belt-shaped carrier film 1 having a width of 100 mm or less, an adhesive layer 3 formed to cover the surface of the carrier film 1, and an adhesive layer 3 to cover the surface. The protective film 5 is configured in a manner. (B) A step of obtaining a plurality of adhesive sheets 3p arranged on the carrier film 1 so as to be arranged in the longitudinal direction of the carrier film 1 by die-cutting the adhesive layer 3 and the protective film 5 in the laminated body 20 .

圖5是示意性表示利用(A)步驟所準備的積層體20的剖面圖。積層體20可以如下方式製作。首先,準備使接著劑層3的原料樹脂組成物溶解於有機溶劑等溶媒中並加以清漆化而成的塗敷液。將該塗敷液塗敷於載體膜1上後,將溶媒去除,藉此形成接著劑層3。作為塗敷方法,可列舉:刀塗法、輥塗法、噴塗法、凹版塗佈法、棒塗法及簾塗法等。繼而,於常溫~60℃的條件下將保護膜5貼合於接著劑層3的表面。藉此,可獲得積層體20。再者,亦可將接著劑層3形成於寬度廣的載體膜上後,以覆蓋其的方式貼合保護膜5,藉此製作積層膜,並將所述積層膜切斷(縱切)成100 mm以下的寬度,藉此獲得積層體20。FIG. 5 is a cross-sectional view schematically showing the laminated body 20 prepared in step (A). The laminated body 20 can be manufactured as follows. First, a coating liquid prepared by dissolving a raw resin composition of the adhesive layer 3 in a solvent such as an organic solvent and varnishing it is prepared. After this coating liquid is applied on the carrier film 1, the solvent is removed to form an adhesive layer 3. Examples of the coating method include a knife coating method, a roll coating method, a spray coating method, a gravure coating method, a bar coating method, and a curtain coating method. Then, the protective film 5 is adhered to the surface of the adhesive layer 3 under the conditions of normal temperature to 60 ° C. Thereby, the laminated body 20 can be obtained. Alternatively, the adhesive layer 3 may be formed on a wide carrier film, and then the protective film 5 may be bonded to cover the carrier film, thereby producing a laminated film, and cutting (slitting) the laminated film into A width of 100 mm or less, thereby obtaining a laminated body 20.

圖6是表示藉由(B)步驟中的模切而於載體膜1上形成多個接著劑片3p及覆蓋其的保護構件5p的情況的立體圖。如圖6所示,積層體20通過外周面具有用以實施模切的多個刀片51c的旋轉體51與和旋轉體51成對的輥52之間,藉此於載體膜1上連續地形成與刀片51c的形狀相對應的接著劑片3p及保護構件5p。此時,關於積層體20,保護膜5側的面朝向旋轉體51,載體膜1側的面朝向輥52。藉由調整旋轉體51的旋轉軸51a與輥52的旋轉軸52a的距離或變更刀片51c的高度,可調整藉由刀片51c而形成於積層體20上的切口的深度。FIG. 6 is a perspective view showing a case where a plurality of adhesive sheet 3p and a protective member 5p covering the adhesive sheet 3p are formed on the carrier film 1 by die cutting in the step (B). As shown in FIG. 6, the laminated body 20 is formed continuously on the carrier film 1 between a rotating body 51 having a plurality of blades 51 c for die cutting and a roller 52 paired with the rotating body 51 on the outer peripheral surface. The adhesive sheet 3p and the protective member 5p correspond to the shape of the blade 51c. At this time, regarding the laminated body 20, the surface on the protective film 5 side faces the rotating body 51, and the surface on the carrier film 1 side faces the roller 52. By adjusting the distance between the rotating shaft 51a of the rotating body 51 and the rotating shaft 52a of the roller 52 or changing the height of the blade 51c, the depth of the cut formed in the laminated body 20 by the blade 51c can be adjusted.

如圖6所示,通過旋轉體51及輥52之間的積層體20分離為接著膜10與不需要部分30,並捲繞於各自的捲軸(未圖示)。不需要部分30包含挖出了接著劑片3p及保護構件5p的接著劑層3與保護膜5。As shown in FIG. 6, the laminated body 20 between the rotating body 51 and the roller 52 is separated into an adhesive film 10 and an unnecessary portion 30, and is wound around a respective reel (not shown). The unnecessary portion 30 includes the adhesive layer 3 and the protective film 5 from which the adhesive sheet 3p and the protective member 5p have been cut out.

<接著膜的使用方法> 繼而,對接著膜10的使用方法進行說明。圖7是示意性表示自載體膜1拾取接著劑片3p及覆蓋其的保護構件5p的情況的剖面圖。於對接著膜10賦予一定的張力的狀態下,一邊使接著膜10的載體膜1側的面抵接於楔狀構件60,一邊使接著膜10沿圖7所示的箭頭的方向移動。藉此如該圖所示,成為接著劑片3p及保護構件5p的前方自載體膜1浮起的狀態。在為該狀態時,例如利用具有吸引力的拾取裝置65拾取接著劑片3p及保護構件5p。例如,藉由使用包括視認保護構件5p的相機等的拾取裝置作為拾取裝置65,可掌握接著劑片3p及保護構件5p的有無以及朝向等資訊。基於該些資訊,可適當地實施之後的接著步驟。<Usage method of adhesive film> Next, the usage method of the adhesive film 10 is demonstrated. FIG. 7 is a cross-sectional view schematically showing a state in which the adhesive sheet 3p and the protective member 5p covering the adhesive sheet 3p are picked up from the carrier film 1. In a state where a certain tension is applied to the adhesive film 10, the adhesive film 10 is moved in the direction of the arrow shown in FIG. 7 while the surface of the carrier film 1 side of the adhesive film 10 is brought into contact with the wedge-shaped member 60. Thereby, as shown in the figure, the front of the adhesive sheet 3p and the protective member 5p is in a state of being floated from the carrier film 1. In this state, for example, the adhesive sheet 3p and the protective member 5p are picked up by the attractive pickup device 65. For example, by using a pickup device such as a camera including the protective member 5p as the pickup device 65, it is possible to grasp information such as the presence or absence of the adhesive sheet 3p and the protective member 5p, and the orientation thereof. Based on this information, subsequent steps can be appropriately implemented.

繼而,以基板(未圖示)的規定的位置及朝向配置由保護構件5p覆蓋的狀態的接著劑片3p。於該狀態下,進行接著劑片3p相對於基板的暫時壓接。暫時壓接只要於例如溫度60℃~150℃、按壓力0.05 MPa~1 MPa的條件下進行0.1秒~10秒即可。藉由暫時壓接,接著劑片3p以相對於基板而言弱,但不自基板剝離的程度密接。於該狀態下,使用黏著膠帶等將保護構件5p自接著劑片3p剝離。將與接著劑片3p不同形狀的半導體晶片配置於因保護構件5p的剝離而露出的接著劑片3p的表面後,進行半導體晶片相對於基板的壓接。壓接只要於例如溫度60℃~150℃、按壓力0.05 MPa~1 MPa的條件下進行0.1秒~10秒即可。再者,伴隨基板的薄化,加熱溫度理想為低,壓接溫度較佳為160℃以下,其後的熱硬化溫度亦較佳為160℃以下。Then, the adhesive sheet 3p covered with the protective member 5p is arrange | positioned in predetermined position and direction of a board | substrate (not shown). In this state, temporary pressure bonding of the adhesive sheet 3p to the substrate is performed. The temporary compression bonding may be performed under conditions of, for example, a temperature of 60 ° C. to 150 ° C. and a pressing pressure of 0.05 MPa to 1 MPa for 0.1 to 10 seconds. The temporary pressure bonding causes the adhesive sheet 3p to be weaker than the substrate but not to be peeled off from the substrate. In this state, the protective member 5p is peeled from the adhesive sheet 3p using an adhesive tape or the like. A semiconductor wafer having a shape different from that of the adhesive sheet 3p is placed on the surface of the adhesive sheet 3p exposed by the peeling of the protective member 5p, and then the semiconductor wafer is pressure-bonded to the substrate. The compression bonding may be performed under conditions of, for example, a temperature of 60 ° C. to 150 ° C. and a pressing pressure of 0.05 MPa to 1 MPa for 0.1 to 10 seconds. In addition, as the substrate is thinned, the heating temperature is desirably low, the compression bonding temperature is preferably 160 ° C or lower, and the subsequent heat curing temperature is also preferably 160 ° C or lower.

<半導體裝置> 圖8是示意性表示使用接著劑片3p而製造的半導體裝置的一例的剖面圖。該圖所示的半導體裝置100包括:半導體晶片S;與半導體晶片S電性連接的基板50;以及配置於半導體晶片S與基板50之間且將半導體晶片S與基板50接著的接著劑片3p。半導體晶片S的形狀例如為長方形或正方形,相對於此,接著劑片3p的形狀為T字型,半導體晶片S的形狀與接著劑片3p的形狀不同。藉由採用所述構成,如圖4所示,於區域R1、區域R2中,可藉由導電材料A1、導電材料A2而將基板50與半導體晶片S電性連接。<Semiconductor Device> FIG. 8 is a cross-sectional view schematically showing an example of a semiconductor device manufactured using the adhesive sheet 3p. The semiconductor device 100 shown in the figure includes: a semiconductor wafer S; a substrate 50 electrically connected to the semiconductor wafer S; and an adhesive sheet 3p disposed between the semiconductor wafer S and the substrate 50 and connecting the semiconductor wafer S and the substrate 50. . The shape of the semiconductor wafer S is, for example, rectangular or square. In contrast, the shape of the adhesive sheet 3p is T-shaped, and the shape of the semiconductor wafer S is different from the shape of the adhesive sheet 3p. By adopting the configuration, as shown in FIG. 4, in the region R1 and the region R2, the substrate 50 and the semiconductor wafer S can be electrically connected by the conductive material A1 and the conductive material A2.

半導體裝置100的製造方法包括:準備依序積層有基板50、接著劑片3p及半導體晶片S的積層體(未圖示)的步驟;以及藉由對積層體進行加熱而介隔接著劑片來將基板50與半導體晶片S接著的步驟。將基板50與半導體晶片S接著時的溫度較佳為低溫,例如為160℃以下。The manufacturing method of the semiconductor device 100 includes a step of preparing a laminated body (not shown) in which a substrate 50, an adhesive sheet 3p, and a semiconductor wafer S are laminated in this order; and heating the laminated body with the adhesive sheet interposed therebetween. The step of attaching the substrate 50 to the semiconductor wafer S. The temperature at which the substrate 50 and the semiconductor wafer S are bonded is preferably a low temperature, for example, 160 ° C. or lower.

以上,對本揭示的實施形態進行了詳細說明,但本揭示並不限定於所述實施形態。例如,於所述實施形態中,為了可利用相機等掌握保護構件5p的有無及朝向等,而例示了使用經著色的保護膜5的情況,取而代之,亦可於保護構件5p的規定的位置標注標記。另外,若設為接著劑片3p被著色的態樣,則亦可不設置保護構件5p。再者,於接著劑片3p的朝向不會成為問題的情況下,無需識別朝向。 [實施例]As mentioned above, although embodiment of this indication was described in detail, this indication is not limited to the said embodiment. For example, in the embodiment described above, the use of a colored protective film 5 is exemplified so that the presence or absence of the protective member 5p can be grasped by a camera or the like. Alternatively, the protective member 5p may be marked at a predetermined position. mark. If the adhesive sheet 3p is colored, the protective member 5p may not be provided. Furthermore, if the orientation of the adhesive sheet 3p is not a problem, it is not necessary to identify the orientation. [Example]

以下,基於實施例而對本揭示進行說明。本揭示並不限定於以下的實施例。Hereinafter, the present disclosure will be described based on examples. The present disclosure is not limited to the following examples.

<實施例1> (接著劑清漆的製備) 藉由混合以下的材料,並且進行真空脫氣,從而獲得接著劑清漆。 ×熱塑性樹脂:HTR-860P-3(商品名,長瀨化成(Nagase ChemteX)股份有限公司製造,含縮水甘油基的丙烯酸橡膠,分子量100萬,Tg-7℃)100質量份 ×熱硬化性樹脂:YDCN-700-10(商品名,新日鐵住金化學股份有限公司製造,鄰甲酚酚醛清漆型環氧樹脂,環氧當量210)30質量份 ×熱硬化性樹脂:LF-4871(商品名,迪愛生(DIC)股份有限公司製造,雙酚A型環氧樹脂,環氧當量118)95質量份 ×熱硬化性樹脂:YDF-8170C(商品名,新日鐵住金化學股份有限公司製造,雙酚F型環氧樹脂,環氧當量157)100質量份 ×硬化促進劑:2PZ-CN(商品名,四國化成工業股份有限公司製造,咪唑化合物)0.3質量份 ×表面處理填料:SC-2050-HLG(商品名,亞都瑪科技(Admatechs)股份有限公司製造)330質量份 ×矽烷偶合劑:A-189(商品名,NUC股份有限公司製造,γ-巰基丙基三甲氧基矽烷)0.9質量份 ×矽烷偶合劑:A-1160(商品名,NUC股份有限公司製造,γ-脲基丙基三乙氧基矽烷)2質量份<Example 1> (Preparation of Adhesive Varnish) The following materials were mixed and vacuum degassed to obtain an adhesive varnish. × Thermoplastic resin: HTR-860P-3 (trade name, manufactured by Nagase ChemteX Co., Ltd., glycidyl-containing acrylic rubber, molecular weight 1 million, Tg-7 ° C) 100 parts by mass × thermosetting resin : YDCN-700-10 (trade name, manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd., o-cresol novolac epoxy resin, epoxy equivalent 210) 30 parts by mass × thermosetting resin: LF-4871 (trade name , Manufactured by Di Edison (DIC) Co., Ltd., 95 parts by mass of bisphenol A epoxy resin, epoxy equivalent 118) × thermosetting resin: YDF-8170C (trade name, manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd. Bisphenol F-type epoxy resin, epoxy equivalent 157) 100 parts by mass × hardening accelerator: 2PZ-CN (trade name, manufactured by Shikoku Chemical Industry Co., Ltd., imidazole compound) 0.3 parts by mass × surface treatment filler: SC- 2050-HLG (trade name, manufactured by Admatechs Co., Ltd.) 330 parts by mass × silane coupling agent: A-189 (trade name, manufactured by NUC Corporation, γ-mercaptopropyltrimethoxysilane) 0.9 Parts by mass × Silane coupling agent: A-1160 (trade name, manufactured by NUC Corporation, γ-ureidopropyltriethoxysilane) 2 parts by mass

(接著膜的製作) 將所述接著劑清漆塗敷於厚度50 μm的表面模切處理聚對苯二甲酸乙二酯膜(帝人膜解決方案(Teijin film solutions)股份有限公司製造,商品名:帝人帝特綸膜(teijin tetoron film)A-63)上。經過乾燥步驟,從而獲得於所述聚對苯二甲酸乙二酯膜(載體膜)的一面形成有厚度25 μm的接著劑層的膜。藉由將該膜與經著色的厚度50 μm的聚乙烯膜(塔瑪坡力(Tamapoly)股份有限公司製造,TDM-1)貼合,從而獲得積層膜。藉由將該積層膜縱切成15 mm寬度,從而獲得帶狀的積層體。(Production of Adhesive Film) The adhesive varnish was applied to a surface die-cut polyethylene terephthalate film (manufactured by Teijin film solutions Co., Ltd.) with a thickness of 50 μm, trade name: Teijin tetoron film (A-63). After the drying step, a film having an adhesive layer with a thickness of 25 μm formed on one side of the polyethylene terephthalate film (carrier film) was obtained. This film was laminated to a colored polyethylene film (Tamapoly Co., Ltd., TDM-1) having a thickness of 50 μm to obtain a laminated film. The laminated film was slit into a 15 mm width to obtain a band-shaped laminated body.

使用圖6所示的構成的裝置對以所述方式獲得的積層體進行模切,藉此獲得本實施例的接著膜。接著劑片的形狀設為縱約7 mm×橫約6 mm的矩形的欠缺一部分角的形狀(面積:29 mm2 )。間距P設為約9 mm。接著劑片的面積率R為23%。The laminated body obtained in the above-mentioned manner was die-cut using the apparatus having the configuration shown in FIG. 6, thereby obtaining an adhesive film of this embodiment. The shape of the adhesive sheet was a shape with a part of corners (area: 29 mm 2 ) of a rectangle with a length of about 7 mm and a width of about 6 mm. The pitch P is set to approximately 9 mm. The area ratio R of the adhesive sheet was 23%.

<實施例2> 除變更接著劑片的尺寸及間距以外,與實施例1同樣地製作接著膜。<Example 2> An adhesive film was produced in the same manner as in Example 1 except that the size and pitch of the adhesive sheet were changed.

<實施例3> 使用與實施例2中所使用的載體膜不同的實施了表面處理的載體膜且變更接著劑片的形狀,除此以外,與實施例2同樣地製作接著膜。作為載體膜,使用厚度50 μm的表面模切處理聚對苯二甲酸乙二酯膜(帝人膜解決方案(Teijin film solutions)股份有限公司製造,商品名:帝人帝特綸膜(teijin tetoron film)A-53)。<Example 3> An adhesive film was produced in the same manner as in Example 2 except that a surface-treated carrier film different from the carrier film used in Example 2 was used and the shape of the adhesive sheet was changed. As a carrier film, a 50 μm-thick surface die-cut polyethylene terephthalate film (manufactured by Teijin film solutions Co., Ltd., trade name: teijin tetoron film) A-53).

<實施例4> 除使用與實施例2中所使用的保護膜不同的保護膜以外,與實施例2同樣地製作接著膜。作為保護膜,使用未著色的聚乙烯膜(塔瑪坡力(Tamapoly)股份有限公司製造,商品名:NF-13,厚度:20 μm)。<Example 4> An adhesive film was produced in the same manner as in Example 2 except that a protective film different from the protective film used in Example 2 was used. As the protective film, an uncolored polyethylene film (manufactured by Tamapoly Co., Ltd., trade name: NF-13, thickness: 20 μm) was used.

<實施例5> 除使用與實施例2中所使用的保護膜不同的保護膜以外,與實施例2同樣地製作接著膜。作為保護膜,使用未著色的聚乙烯膜(塔瑪坡力(Tamapoly)股份有限公司製造,商品名:GF-3,厚度:30 μm)。<Example 5> An adhesive film was produced in the same manner as in Example 2 except that a protective film different from the protective film used in Example 2 was used. As the protective film, an uncolored polyethylene film (manufactured by Tamapoly Co., Ltd., trade name: GF-3, thickness: 30 μm) was used.

<實施例6> 除使用與實施例2中所使用的載體膜不同的載體膜以外,與實施例2同樣地製作接著膜。作為載體膜,使用未進行表面模切處理的聚對苯二甲酸乙二酯膜(帝人膜解決方案(Teijin film solutions)股份有限公司製造,商品名:帝人帝特綸膜(teijin tetoron film)G2,厚度:50 μm)。<Example 6> An adhesive film was produced in the same manner as in Example 2 except that a carrier film different from the carrier film used in Example 2 was used. As the carrier film, a polyethylene terephthalate film (manufactured by Teijin film solutions Co., Ltd. without surface die-cutting treatment) was used, trade name: Teijin tetoron film G2 , Thickness: 50 μm).

<實施例7> 除使用與實施例2中所使用的載體膜不同的載體膜以外,與實施例2同樣地製作接著膜。作為載體膜,使用未進行表面模切處理的聚對苯二甲酸乙二酯膜(帝人膜解決方案(Teijin film solutions)股份有限公司製造,商品名:帝人帝特綸膜(teijin tetoron film)G2,厚度:38 μm)。<Example 7> An adhesive film was produced in the same manner as in Example 2 except that a carrier film different from the carrier film used in Example 2 was used. As the carrier film, a polyethylene terephthalate film (manufactured by Teijin film solutions Co., Ltd. without surface die-cutting treatment) was used, trade name: Teijin tetoron film G2 , Thickness: 38 μm).

<實施例8> 除變更接著劑片的尺寸以外,與實施例2同樣地製作接著膜。<Example 8> An adhesive film was produced in the same manner as in Example 2 except that the size of the adhesive sheet was changed.

<實施例9> 除變更接著劑片的尺寸以外,與實施例2同樣地製作接著膜。<Example 9> An adhesive film was produced in the same manner as in Example 2 except that the size of the adhesive sheet was changed.

對所述實施例的接著膜進行以下項目的評價。將結果示於表1及表2中。 (1)接著劑片的面積率R 將表1所示的接著劑片的面積A(mm2 )、間距P(mm)及載體膜的寬度W(mm)代入下述式中,從而算出接著劑片的面積率R(%)。 面積率R(%)=A/(P×W)×100The following films were evaluated for the adhesive film of the example. The results are shown in Tables 1 and 2. (1) Area ratio R of the adhesive sheet The area A (mm 2 ), the pitch P (mm), and the width W (mm) of the carrier film of the adhesive sheet shown in Table 1 were substituted into the following formula to calculate the adhesive strength. The area ratio R (%) of the tablet. Area ratio R (%) = A / (P × W) × 100

(2)光透過率 使用日本分光股份有限公司製造的V-570(商品名)來測定於載體膜上設置有接著劑片及覆蓋其的保護構件的區域的波長500 nm的光的透過率。(2) Light transmittance V-570 (trade name) manufactured by JASCO Corporation was used to measure the light transmittance of light at a wavelength of 500 nm in a region where an adhesive sheet and a protective member covering the carrier film were provided on a carrier film.

(3)載體膜密接力(90°剝離強度) 將未進行模切的積層膜(載體膜/接著劑層/保護膜)切成20 mm寬度。使用雙面膠帶將載體膜側的面貼附於鋁板後,剝離保護膜。其後,一邊將接著劑層相對於載體膜的角度維持為90°,一邊向上方提拉接著劑層,藉此使接著劑層自載體膜剝離。提拉速度設為50 mm/min,測定環境溫度設為23℃±2℃。測定提拉所需要的力。將該測定值(mN)及試樣的寬度(20 mm)代入下述式中,藉此算出載體膜與接著劑層之間的密接力。 密接力(N/m)=測定值(mN)/20(mm)(3) Adhesion of carrier film (90 ° peel strength) The laminated film (carrier film / adhesive layer / protective film) without die cutting was cut to a width of 20 mm. After attaching the surface on the carrier film side to the aluminum plate using a double-sided tape, the protective film was peeled off. Thereafter, while maintaining the angle of the adhesive layer with respect to the carrier film at 90 °, the adhesive layer was pulled upward to peel the adhesive layer from the carrier film. The pulling speed was set to 50 mm / min, and the measurement ambient temperature was set to 23 ° C ± 2 ° C. Determine the force required to lift. The measured value (mN) and the width of the sample (20 mm) were substituted into the following formula to calculate the adhesion between the carrier film and the adhesive layer. Adhesion (N / m) = Measured value (mN) / 20 (mm)

(4)保護膜密接力(90°剝離強度) 將未進行模切的積層膜(載體膜/接著劑層/保護膜)切成20 mm寬度。剝離載體膜後,使用雙面膠帶將接著劑層側的面貼附於鋁板後,其後,一邊將保護膜相對於接著劑層的角度維持為90°,一邊向上方提拉保護膜,藉此使接著劑層自保護膜剝離。提拉速度設為300 mm/min,測定環境溫度設為23℃±2℃。測定提拉所需要的力。將該測定值(mN)及試樣的寬度(20 mm)代入下述式中,藉此算出保護膜與接著劑層的密接力。 密接力(N/m)=測定值(mN)/20(mm)(4) Adhesion of protective film (90 ° peel strength) The laminated film (carrier film / adhesive layer / protective film) without die cutting was cut into a width of 20 mm. After the carrier film was peeled off, the surface of the adhesive layer side was attached to an aluminum plate using a double-sided tape, and then, while maintaining the angle of the protective film with respect to the adhesive layer at 90 °, the protective film was pulled upwards, and This peels the adhesive layer from the protective film. The pulling speed was set to 300 mm / min, and the measurement ambient temperature was set to 23 ° C ± 2 ° C. Determine the force required to lift. The measured value (mN) and the width of the sample (20 mm) were substituted into the following formula to calculate the adhesion between the protective film and the adhesive layer. Adhesion (N / m) = Measured value (mN) / 20 (mm)

[表1] [Table 1]

[表2] [產業上的可利用性][Table 2] [Industrial availability]

根據本揭示,可提供一種對於有效率地實施半導體裝置的製造製程中的接著步驟而言有用的包括複雜形狀的接著劑片的接著膜。另外,根據本揭示,可提供一種使用複雜形狀的接著劑片的半導體裝置及其製造方法。According to the present disclosure, it is possible to provide an adhesive film including an adhesive sheet having a complicated shape, which is useful for efficiently performing a subsequent step in a manufacturing process of a semiconductor device. In addition, according to the present disclosure, a semiconductor device using a complex-shaped adhesive sheet and a method for manufacturing the same can be provided.

1‧‧‧載體膜1‧‧‧ carrier film

3‧‧‧接著劑層3‧‧‧ Adhesive layer

3A‧‧‧行3A‧‧‧Line

3p‧‧‧接著劑片3p‧‧‧ Adhesive Tablets

5‧‧‧保護膜5‧‧‧ protective film

5p‧‧‧保護構件5p‧‧‧protective member

10‧‧‧接著膜10‧‧‧ Adhesive film

20‧‧‧積層體20‧‧‧Laminated body

30‧‧‧不需要部分30‧‧‧ no need part

50‧‧‧基板50‧‧‧ substrate

51‧‧‧旋轉體51‧‧‧rotating body

51a、52a‧‧‧旋轉軸51a, 52a‧‧‧rotation shaft

51c‧‧‧刀片51c‧‧‧Blade

52‧‧‧輥52‧‧‧roller

60‧‧‧楔狀構件60‧‧‧ Wedge-shaped member

65‧‧‧拾取裝置65‧‧‧Pick up device

100‧‧‧半導體裝置100‧‧‧ semiconductor device

A1、A2‧‧‧導電材料A1, A2‧‧‧ conductive material

C1~C12‧‧‧接著劑片的角C1 ~ C12‧‧‧ Adhesive corner

F1‧‧‧接著劑片的面(第一面)F1‧‧‧ Adhesive film surface (first side)

F2‧‧‧接著劑片的面(第二面)F2‧‧‧ Adhesive film side (second side)

P‧‧‧間距P‧‧‧Pitch

R1、R2‧‧‧區域R1, R2‧‧‧ area

S‧‧‧半導體晶片S‧‧‧Semiconductor wafer

W‧‧‧寬度W‧‧‧Width

X‧‧‧箭頭X‧‧‧ arrow

II-II‧‧‧剖面線II-II‧‧‧ hatching

圖1是示意性表示本揭示的接著膜的一實施形態的立體圖。 圖2是圖1所示的II-II線的剖面圖。 圖3(a)至圖3(f)是表示接著劑片的形狀的變動的平面圖。 圖4是示出T字型的接著劑片與半導體晶片的配置的一例的平面圖。 圖5是示意性表示依序積層有載體膜、接著劑層及保護膜的積層體的剖面圖。 圖6是表示藉由模切而於載體膜上形成多個接著劑片的情況的立體圖。 圖7是示意性表示自載體膜拾取接著劑片及覆蓋其的保護構件的情況的剖面圖。 圖8是示意性表示使用本揭示的接著劑片而製造的半導體裝置的一例的剖面圖。FIG. 1 is a perspective view schematically showing an embodiment of the adhesive film of the present disclosure. FIG. 2 is a cross-sectional view taken along a line II-II shown in FIG. 1. 3 (a) to 3 (f) are plan views showing changes in the shape of the adhesive sheet. 4 is a plan view showing an example of the arrangement of a T-shaped adhesive sheet and a semiconductor wafer. FIG. 5 is a cross-sectional view schematically showing a laminated body in which a carrier film, an adhesive layer, and a protective film are sequentially laminated. FIG. 6 is a perspective view showing a case where a plurality of adhesive sheets are formed on a carrier film by die cutting. FIG. 7 is a cross-sectional view schematically showing a state in which an adhesive sheet and a protective member covering the adhesive sheet are picked up from a carrier film. FIG. 8 is a cross-sectional view schematically showing an example of a semiconductor device manufactured using the adhesive sheet of the present disclosure.

Claims (17)

一種半導體裝置製造用接著膜,其包括: 寬度100 mm以下的帶狀的載體膜;以及 以沿所述載體膜的長邊方向排列的方式配置於所述載體膜上的多個接著劑片;並且 所述接著劑片具有於長方形或正方形的至少一邊形成有凸部及凹部的至少一者的形狀。An adhesive film for manufacturing a semiconductor device, comprising: a belt-shaped carrier film having a width of 100 mm or less; and a plurality of adhesive agent sheets arranged on the carrier film so as to be aligned along the long-side direction of the carrier film; The adhesive sheet has a shape in which at least one of a convex portion and a concave portion is formed on at least one side of a rectangle or a square. 如申請專利範圍第1項所述的接著膜,其中所述接著劑片具有6個以上的角。The adhesive film according to item 1 of the patent application scope, wherein the adhesive sheet has more than 6 corners. 如申請專利範圍第2項所述的接著膜,其中所述接著劑片的形狀為L字型。The adhesive film according to item 2 of the patent application scope, wherein the shape of the adhesive sheet is L-shaped. 如申請專利範圍第1項所述的接著膜,其中所述接著劑片具有8個以上的角。The adhesive film according to item 1 of the patent application scope, wherein the adhesive sheet has more than 8 corners. 如申請專利範圍第1項至第4項中任一項所述的接著膜,其中所述接著劑片的面積為10 mm2 ~200 mm2The adhesive film according to any one of claims 1 to 4, wherein the area of the adhesive sheet is 10 mm 2 to 200 mm 2 . 如申請專利範圍第1項至第5項中任一項所述的接著膜,其中以所述載體膜的面積為基準,所述載體膜的表面且為被所述多個接著劑片覆蓋的區域的比例為10%~60%。The adhesive film according to any one of claims 1 to 5, in which the surface of the carrier film is covered by the plurality of adhesive sheets based on the area of the carrier film. The proportion of the area is 10% to 60%. 如申請專利範圍第1項至第6項中任一項所述的接著膜,其中於所述載體膜上形成有一個或多個包含所述多個接著劑片的行。The adhesive film according to any one of claims 1 to 6, wherein one or more rows including the plurality of adhesive sheets are formed on the carrier film. 如申請專利範圍第1項至第7項中任一項所述的接著膜,其中所述接著劑片是藉由將以覆蓋所述載體膜的表面的方式形成的接著劑層進行模切而形成者。The adhesive film according to any one of claims 1 to 7, wherein the adhesive sheet is formed by die-cutting an adhesive layer formed to cover a surface of the carrier film. Former. 如申請專利範圍第1項至第8項中任一項所述的接著膜,其中所述載體膜與所述接著劑片之間的密接力為0.5 N/m~18 N/m。The adhesive film according to any one of claims 1 to 8 in the scope of the patent application, wherein the adhesive force between the carrier film and the adhesive sheet is 0.5 N / m to 18 N / m. 如申請專利範圍第1項至第9項中任一項所述的接著膜,其進而包括保護構件,所述保護構件覆蓋所述接著劑片的與所述載體膜側的第一面相反的一側的第二面且具有與所述接著劑片相同的形狀。The adhesive film according to any one of claims 1 to 9, further comprising a protective member covering the first surface of the adhesive sheet opposite to the first surface of the carrier film side. The second surface on one side has the same shape as the adhesive sheet. 如申請專利範圍第10項所述的接著膜,其中所述接著劑片藉由將以覆蓋所述載體膜的表面的方式形成的接著劑層進行模切而形成且所述保護構件藉由將以覆蓋所述接著劑層的方式配置的保護膜進行模切而形成。The adhesive film according to claim 10, wherein the adhesive sheet is formed by die-cutting an adhesive layer formed so as to cover a surface of the carrier film, and the protective member is formed by applying The protective film arranged so as to cover the adhesive layer is formed by die cutting. 如申請專利範圍第10項或第11項所述的接著膜,其中所述保護構件的光透過率低於所述載體膜的光透過率。The adhesive film according to claim 10 or claim 11, wherein the light transmittance of the protective member is lower than the light transmittance of the carrier film. 如申請專利範圍第10項至第12項中任一項所述的接著膜,其中所述接著劑片與所述保護構件之間的密接力為16 N/m以下。The adhesive film according to any one of claims 10 to 12, in which the adhesive force between the adhesive sheet and the protective member is 16 N / m or less. 一種半導體裝置,其包括: 基板; 半導體晶片;以及 如申請專利範圍第1項至第13項中任一項所述的接著膜的所述接著劑片;並且 所述接著劑片配置於所述基板與所述半導體晶片之間且將所述基板與所述半導體晶片接著, 所述半導體晶片的形狀與所述接著劑片的形狀不同。A semiconductor device includes: a substrate; a semiconductor wafer; and the adhesive sheet of the adhesive film according to any one of claims 1 to 13 of a patent application range; and the adhesive sheet is disposed on the adhesive sheet A shape between the substrate and the semiconductor wafer and the substrate and the semiconductor wafer are different from each other. 一種半導體裝置的製造方法,其中使用如申請專利範圍第1項至第13項中任一項所述的接著膜的所述接著劑片。A method for manufacturing a semiconductor device, wherein the adhesive sheet for an adhesive film according to any one of claims 1 to 13 of a patent application range is used. 如申請專利範圍第15項所述的半導體裝置的製造方法,其包括: 準備依序積層有基板、所述接著劑片及半導體晶片的積層體的步驟;以及 藉由對所述積層體進行加熱而介隔所述接著劑片來將所述基板與所述半導體晶片接著的步驟;並且 所述半導體晶片的形狀與所述接著劑片的形狀不同。The method for manufacturing a semiconductor device according to item 15 of the scope of patent application, comprising: a step of preparing a laminated body having a substrate, the adhesive sheet, and a semiconductor wafer sequentially laminated; and heating the laminated body The step of bonding the substrate to the semiconductor wafer through the adhesive sheet; and the shape of the semiconductor wafer is different from the shape of the adhesive sheet. 如申請專利範圍第16項所述的半導體裝置的製造方法,其中藉由將所述積層體加熱至160℃以下的溫度而利用所述接著劑片將所述半導體晶片與所述基板接著。The method for manufacturing a semiconductor device according to item 16 of the scope of patent application, wherein the semiconductor wafer and the substrate are bonded by the adhesive sheet by heating the laminated body to a temperature of 160 ° C. or lower.
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