KR930003670B1 - Testing devices of lcd i.t.o. electrode - Google Patents

Abstract

The tester for connecting probes to ITO electrodes to check the off and short of the electrodes comprises a sensing unit (10) for electrically checking the ITO electrodes of the planar display plate, a system unit (20) having control programs to read the output information of the sensing unit (10) to display the information to a monitor (40), a keyboard unit (30) for inputting the line number and pitch to transmit control informations to the system unit (20), and the monitor (40). The sensing unit includes first and third probes (A,C) connected to the both sides of the line, and a second probe (B) connected to the adjacent line.

Description

ITO electrode inspection device of flat panel display device

1 is a block diagram of an ITO electrode inspection apparatus according to the present invention.

2 is a circuit diagram of a sensing unit in FIG. 1.

3 is an explanatory view of a line scan of an ITO pattern according to the present invention.

4 is an electrical equivalent circuit diagram of the first probe in FIG.

5 is a flow chart according to FIG.

* Explanation of symbols for main parts of the drawings

10: sensing unit 20: system unit

30: keyboard portion 40: monitor portion

A: first probe B: second probe

C: third probe C ': sensing input terminal

a, b: output stage 1a: high potential

Ra: high resistance 2a: contact terminal

BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to an ITO electrode inspection apparatus for flat panel display devices such as liquid crystal display devices, and more particularly, to an inspection apparatus for checking the off (disruption) and short (short circuit) of the ITO electrode of a flat panel display device.

Conventionally, in order to detect an abnormality of the ITO electrode of a flat panel display device such as a liquid crystal display device, a voltage is applied to one electrode pattern line every day to inspect the short and the opening of the electrode, or trace the electrode pattern line with a microscope. Open and short were detected.

Therefore, in order to check the abnormality of the ITO electrode of one flat panel display device, it is necessary to spend a lot of time. For example, when checking the ITO electrode pattern of a flat panel display device having 640 × 200 lines. There was a very inefficient way to spend 1 hour-2 hours. In addition, the reliability of the inspection was low because of visual or manual checks.

SUMMARY OF THE INVENTION The present invention has been made to solve such a problem, and an object of the present invention is to contact a probe having a predetermined power supply to open or short the ITO electrode of a flat panel display device and check its electrical signal to open and short the line. The present invention provides an ITO electrode inspection apparatus for a flat panel display element which detects an abnormality such as or the like.

The present invention for achieving the above object is a sensing unit for electrically detecting the abnormality of the ITO electrode of the flat panel display device, a system unit for controlling the sensing unit by displaying the output information of the sensing unit on the monitor, system unit and Han The keyboard unit, which serves as an input unit and inputs the number of ITO electrode lines, pitch, and the like, the monitor unit that displays predetermined information by the control of the system unit, and the ITO electrode inspection apparatus of the flat panel display element.

An embodiment of the ITO electrode inspection apparatus according to the present invention will be described in detail according to the accompanying drawings.

First, Figure 1 shows a schematic block configuration of the ITO electrode inspection apparatus according to the present invention, wherein (10) is a sensing unit for detecting the presence of abnormality by applying a predetermined power to the pattern line of the ITO electrode of the flat panel display device 20 denotes a system unit having a series of control programs to receive the detection information of the sensing unit 10 and display the detected information on a monitor. 30 is a keyboard unit for inputting data such as the number of ITO electrode lines to be checked by the sensing unit 10 and the pitch between the lines to the system unit 20. 40 displays the general data according to the control command of the system unit 20 to the monitor unit so that the user can recognize the abnormality of the ITO electrode pattern line.

The sensing unit 10 constitutes the same detection circuit as the embodiment of FIG. That is, the sensing input terminal C 'is electrically connected to the resistors R2 and R12 so as to be connected to the base of the NPN transistor Q1 through the resistor R2, and through the resistor R12, the PNP transistor. Connected to the base of (Q2). In addition, the transistor Q1 receives the power supply Vcc through the collector resistor R1 with the collector side as the output terminal a, and the resistor R3 is connected between the emitter and the base. The detector side is connected to the ground through the collector resistor (R11) with the output terminal (b), the emitter side is connected to the power supply (Vcc), and the resistor (R13) is connected between the emitter and the base to form a detection circuit. .

3 shows an embodiment of line detection by the first, second and third probes A, B and C according to the present invention. That is, the first probe A and the third probe C are in contact with both ends of one line, respectively, and the second probe B is in contact with one side of the adjacent line with a predetermined pitch. Let's do it. In addition, the third probe C is connected to the sensing input terminal C ′ of the second circuit. Here, the first probe A has a configuration in which the high potential terminal 1a, the high resistance Ra, and the contact terminal 2a, to which the logic "H" is applied, are connected in series as in the fourth diagram.

The first probe A contacts one end of one line L1 of the ITO electrode as shown in FIG. 3, and the second probe B contacts one end of the other adjacent line L2, and the third probe C ) Contacts the other end of the line L1 and applies a logic "H" potential to the first probe A to open the line L1 and to short the line between the lines L1 and L2. Is determined. Table 1 shows the relationship between the open and short statuses based on the potentials of the output terminals a and b in the detection circuit of FIG. 2, i.e., when the lines L1 and L2 are all normal. Transistor Q1 because the potential through the first probe A is applied to the third probe C with logic " H " on line L1 and the input signal of this logic " H " is applied to the sensing input terminal C '. ) Is turned on, and the collector side output terminal a becomes the logic " L ".

Table-1

On the other hand, logic " H " is also applied to the base of transistor Q2, and transistor Q2 is reverse biased, so that it is in a cutoff state, and the collector-side output terminal b becomes logic " L ". When the line L1 and the line L2 are shorted, a residual flows from the first probe A to the second probe B, and the high potential terminal 1a of the first probe A is the logic " H " And the voltage drop is generated by the high resistance Ra as shown in FIG. 4 so that the contact terminal 2a becomes the logic " L ", so that the third probe C becomes the logic " L ". Therefore, since the forward bias is applied to the transistor Q2, the output terminal b becomes the logic "H", and the transistor Q1 is blocked because no bias is applied, and the output terminal a becomes the logic "H". In addition, when the line L1 is open (disconnected), the third probe C has no application of power by the line L1 and is in a very high impedance state, so that the transistor Q2 is turned on and the transistor Q1 is turned on. ) Is also conducted so that the output terminals a and b become logic "L" and logic "H", respectively.

The output value detected as described above becomes the output data of the sensing unit 10 and is input to the system unit 20. The system unit 20 reads an output value as shown in Table 1 to determine normal, short, and open, and then displays the state on the monitor unit 40. Table 2 shows an embodiment in which the state of each line is displayed on the monitor unit 40.

TABLE 2

That is, in the above description, after checking the line L1 and the line L2, one line is moved to connect the first and third probes A and C to the line L2, respectively, and to the line L3. When the second probe B is connected, it is determined whether a short between the opening of the line L2 and the lines L2 and L3 is made. In this manner, all line scans are performed in sequence.

5 shows an operation flowchart according to the block diagram of FIG. That is, the staff 110 inputs the number of lines L1... Ln, the pitch between the lines, and the like into the system unit 20 through the keyboard unit 30, and the first, second, and third probes (A, B and C are mechanical sets for setting the lines of the ITO electrode pattern, and then a line scan is performed (step 120) so that the output values detected for each line are input to the system unit 20 (step 130). In (20), the detection output values as shown in Table 1 above are read (step 140), and the data are output to the monitor unit 40 (step 150). If it is determined that the number of lines is the same as the number of lines set (steps 160 and 170), and if it is not the same, the entire line is not checked yet, the process returns to step 12Φ and the line scan is repeated again. The result of each line is displayed as follows. Therefore, it is determined whether the ITO electrode pattern is defective by viewing the information displayed on the monitor unit 40.

As described above, according to the ITO electrode inspection device of the flat panel display device according to the present invention, the sensing unit for electrically detecting the abnormality of the ITO electrode of the flat panel display device, and a series of control programs, the output information of the sensing unit A system unit for reading and displaying on a monitor, a keyboard unit for inputting lines, pitches, etc. of the ITO electrode to provide control information of the system unit, and a monitor unit for displaying the detection result by command of the control of the system unit. Therefore, the pattern of the ITO electrode formed by the fine pitch of the flat panel display device can be checked at the same time for the short and open at the same time, and it can be checked whether the product is defective or not, thereby increasing the reliability of the inspection and improving the productivity. . In addition, the pressure of the keyboard unit makes it easy to check each panel of the flat panel display device having various sizes, and the utility thereof is very large.

Claims (3)

A sensing unit 10 which electrically detects an abnormality of the ITO electrode of the flat panel display device, a system unit 20 which reads the output information of the sensing unit 10 and displays it on a monitor by receiving a series of control programs; And a keyboard unit 30 for providing control information of the system unit 20 by inputting lines and pitches of the ITO electrode, and a monitor unit 40 for displaying the detection result by the control command of the system unit 20. And ITO electrode inspection device for a flat panel display device. According to claim 1, wherein the sensing unit 10, the first probe (A) and the third probe (C) in contact with both ends of one line, respectively, and the second probe (B) in contact with the adjacent line ITO electrode inspection device of a flat panel display device. 3. The sensing unit (10) according to claim 1 or 2, wherein the sensing unit (10) includes transistors (Q1) and (Q2) which are turned on and off in accordance with the level of the third probe (C) serving as an input terminal. And (Q2) an ITO electrode inspection apparatus for a flat panel display element serving as a detection circuit for detecting an abnormality at the level of the output terminals (a) and (b).

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