JPS6371715A - Instrument for measuring contact resistance value of keyboard contact - Google Patents

Instrument for measuring contact resistance value of keyboard contact

Info

Publication number
JPS6371715A
JPS6371715A JP61216307A JP21630786A JPS6371715A JP S6371715 A JPS6371715 A JP S6371715A JP 61216307 A JP61216307 A JP 61216307A JP 21630786 A JP21630786 A JP 21630786A JP S6371715 A JPS6371715 A JP S6371715A
Authority
JP
Japan
Prior art keywords
contact
keyboard
contact resistance
microprocessor
constant current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61216307A
Other languages
Japanese (ja)
Inventor
Yukikazu Kogai
小飼 幸和
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP61216307A priority Critical patent/JPS6371715A/en
Publication of JPS6371715A publication Critical patent/JPS6371715A/en
Pending legal-status Critical Current

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  • Input From Keyboards Or The Like (AREA)

Abstract

PURPOSE:To surely operate a measuring instrument with a simple constitution to measure the contact resistance value of a keyboard contact by flowing a constant current from one side of a terminal train to measure voltages in both ends of the contact and detecting the contact resistance of the contact. CONSTITUTION:All contacts of a keyboard contact group 1 are turned on by a prescribed method like pressing to a plane plate. Connections of switches 8 to a transverse terminal row are fixed and those to a longitudinal terminal row are successively switched. They are switched in the order preliminarily reported to a microprocessor or by switching relays or the like by the control of the microprocessor. Since a constant current flows from a constant current source circuit 6 through the contact resistance of the contact which is changed in the transverse direction at each time of switching, voltage drop is detected. The voltage drop value is amplified by an amplifier 7 to facilitate performing the following processing and is measured by a microprocessor 2 or the like. The contact has a large contact resistance value and is judged too be defective if the voltage drop value larger than a prescribed value is generated for this contact.

Description

【発明の詳細な説明】 [+既要] キーホード接点をオンとしたときメンブレンシートを用
いるような場合は、端子列の一方から定電流を流して接
点両端電圧を測定し、接点の接触抵抗を知ることにより
キーホード検査を確実化するものである。
[Detailed description of the invention] [+Already required] When a membrane sheet is used when the keyboard contacts are turned on, a constant current is applied from one side of the terminal row, the voltage across the contacts is measured, and the contact resistance of the contacts is calculated. Knowing this will ensure keyhole inspection.

[産業上の利用分野] 本発明はメンブレンシートを用いるキーボードにおいて
接点をオンとしたときの接触抵抗値を測定する装置に関
する。
[Industrial Field of Application] The present invention relates to a device for measuring contact resistance when the contacts are turned on in a keyboard using a membrane sheet.

従来メンブレンシートを用いるキーボードでは接点をオ
ンとしても、接触抵抗値が可成り大きいため、キーの誤
操作となることがあり、検査工程において正確な接触抵
抗値を求めることが要望された。
In conventional keyboards using membrane sheets, even when the contacts are turned on, the contact resistance value is quite large, which can lead to erroneous key operations, and it has been desired to determine accurate contact resistance values in the inspection process.

[従来の技術] キーボードに設ける接点として、機械的接点を使用する
代わりにメンブレンシートをコスト低下のため使用する
ようになった。メンブレンシートを使用すると、導体を
印刷したシートを導体が直交するように重ね合わせるこ
とで多量の接点を簡易に構成することができる。しかし
その接点をオン操作したとき、導体間接触抵抗値は極め
て大きな値となり、機械的接点の場合の数千倍にも達す
る。その場合キーボード試験回路として第3図に示す構
成のものを使用し、実用上の可否を判断していた。メン
ブレンシートを使用する場合、組合せた状態で検査する
ことなく、キーボードに組込んだ状態でのテストを行え
ば、検査工程が一部省略できるからである。第3図にお
いて、1はキーボード接点群、Xi、X2・・・Xnは
横方向端子列、Yl、Y2・・・Ynは縦方向端子列、
2はマイクロプロセッサ、21はそのIOボート、3は
デコーダ、4はエンコーダ、5は横方向端子列に接続し
たプルアップ抵抗(10にΩ程度)を示す、キーボード
接点群はそのマトリックスの交点に接点があるから、成
る接点をオン操作したとき、マイクロプロセッサ2はそ
の10ポート21から端子列を走査する信号(スキャン
信号)を送出する。まずデコーダ3において例えば10
10が入力されると、デコードして「5」の端子を1L
3とする。他の端子はH゛のままである。そのためYl
の端子列の電位が ′″L”となる0次にエンコーダ4
に入力された走査信号に対応する接点側の電位が“L”
となったものを、エンコーダ4の出力端子0υTに表示
し、マイクロプロセッサ2に知らせる。
[Prior Art] Membrane sheets have come to be used as contacts provided on keyboards in order to reduce costs, instead of using mechanical contacts. When using a membrane sheet, a large number of contacts can be easily constructed by overlapping sheets on which conductors are printed so that the conductors are perpendicular to each other. However, when the contact is turned on, the contact resistance between the conductors becomes extremely large, reaching several thousand times that of a mechanical contact. In that case, a keyboard test circuit having the configuration shown in FIG. 3 was used to determine whether it was practical or not. This is because when using a membrane sheet, a part of the inspection process can be omitted by testing the membrane sheet when it is incorporated into the keyboard instead of inspecting it in a combined state. In FIG. 3, 1 is a keyboard contact group, Xi, X2...Xn are horizontal terminal rows, Yl, Y2...Yn are vertical terminal rows,
2 is a microprocessor, 21 is its IO board, 3 is a decoder, 4 is an encoder, 5 is a pull-up resistor (approximately 10Ω) connected to the horizontal terminal row, and the keyboard contact group is a contact at the intersection of the matrix. When the contact is turned on, the microprocessor 2 sends a signal (scan signal) to scan the terminal array from its 10 ports 21. First, in the decoder 3, for example, 10
When 10 is input, it is decoded and the "5" terminal is set to 1L.
Set it to 3. The other terminals remain high. Therefore, Yl
The zero-order encoder 4, where the potential of the terminal row becomes ``L''
The potential on the contact side corresponding to the scanning signal input to is “L”
The resulting value is displayed on the output terminal 0υT of the encoder 4 and notified to the microprocessor 2.

そのためエンコーダ4は所謂セレクタのように動作する
。エンコーダ4の接点側は常時プルアップ抵抗5により
“H”に保持されている。そこでエンコーダ4に対しマ
イクロプロセッサ2から000より101に至るビット
列を入力すれば、Ylの端子列のうちで成るX端子がオ
ンと操作されたので、その電位“L”を検出し、そのエ
ンコーダ入力ビツト列から接点操作位置を知ることがで
きる。
Therefore, the encoder 4 operates like a so-called selector. The contact side of the encoder 4 is always held at "H" by a pull-up resistor 5. Therefore, if a bit string from 000 to 101 is input to the encoder 4 from the microprocessor 2, the X terminal of the terminal string of Yl is turned on, so its potential "L" is detected, and the encoder inputs it. The contact operating position can be determined from the bit string.

[発明が解決しようとする問題点] 第3図に示す回路においてエンコーダ4の接点側端子は
、接点端子列の電位が“H”から“L”に変化したこと
を検出していて、それを出力端子OUTに表示する必要
がある。このときエンコーダ4として半導体素子を用い
たTTL回路を使用することが多い。そのため電位“H
”から“L”への変化が十分に大きくないと誤った判定
を行うことがあった。電位変化は使用電源の電圧・接続
抵抗値・回路構成に関係するので、正確な動作を行う回
路の設計は難しかった。
[Problems to be Solved by the Invention] In the circuit shown in FIG. 3, the contact side terminals of the encoder 4 detect that the potential of the contact terminal row changes from "H" to "L", and It is necessary to display it on the output terminal OUT. At this time, a TTL circuit using a semiconductor element is often used as the encoder 4. Therefore, the potential “H”
If the change from "" to "L" was not large enough, an incorrect judgment could be made.The change in potential is related to the voltage of the power supply used, the connection resistance value, and the circuit configuration, so it is important to ensure that the circuit operates correctly. The design was difficult.

本発明の目的は前述の欠点を改善し、簡易な構成で確実
に動作し、キーボード接点の接触抵抗値を測定可能とし
た装置を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide an apparatus which improves the above-mentioned drawbacks, operates reliably with a simple configuration, and is capable of measuring the contact resistance value of keyboard contacts.

E問題点を解決するための手段] 第1図は本発明の原理構成を示す図である。第1図にお
いて、工はマトリックス状のキーボード接点群、X 1
 、 X 2・−X nは横方向端子列、yi。
Means for Solving Problem E] FIG. 1 is a diagram showing the principle configuration of the present invention. In Fig. 1, the number is a matrix of keyboard contacts,
, X 2 -X n is a horizontal terminal row, yi.

Y2・・・Ynは縦方向端子列、2はマイクロプロセッ
サで測定結果を記録できるもの、6は定電流源回路、7
は増幅器、8は切換開閉器で、横方向端子列と縦方向端
子列について選択開閉するものを示す。
Y2...Yn is a vertical terminal array, 2 is a microprocessor that can record measurement results, 6 is a constant current source circuit, 7
8 is an amplifier, and 8 is a switching switch that selectively opens and closes the horizontal terminal row and the vertical terminal row.

本発明の構成はキーボード接点群1に対する縦方向端子
列Y1.Y2・・−或いは横方向端子列X1、X2−・
−の一方に接続された定電流源回路6と、前記端子列の
両方に接続された増幅器7と、全端子毎に切換開閉器8
とを具備し、該増幅器7の出力をマイクロプロセッサ2
に印加し、キーボードの接点の接触抵抗値を測定するこ
とである。
The configuration of the present invention is as follows: vertical terminal row Y1. Y2...- or horizontal terminal rows X1, X2-...
- a constant current source circuit 6 connected to one of the terminals, an amplifier 7 connected to both of the terminal rows, and a switching switch 8 for each terminal.
The output of the amplifier 7 is sent to the microprocessor 2.
, and measure the contact resistance value of the keyboard contacts.

[作用] 第1図において、キーボード接点群を例えば平板を押し
付けるなどの所定の方法で全部をオンに操作する。次に
切換開閉器8について横方向端子列との接続を固定し、
縦方向端子列を順次に切換える。その切換順序は予めマ
イクロプロセッサに通知したとおり行うか、マイクロプ
ロセッサの制御でリレーなどを切換える。切換える毎に
横方向に異なる接点の、各接触抵抗を介して定電流が定
電流源回路6から流れるため、電圧降下が検出できる。
[Operation] In FIG. 1, all of the keyboard contacts are turned on in a predetermined manner, such as by pressing a flat plate. Next, fix the connection with the horizontal terminal row for the switching switch 8,
Switch the vertical terminal rows sequentially. The switching order is carried out as notified to the microprocessor in advance, or relays etc. are switched under the control of the microprocessor. Since a constant current flows from the constant current source circuit 6 through the contact resistances of different contacts in the lateral direction each time the switch is switched, a voltage drop can be detected.

そのため電圧降下値を増幅器7で増幅し、次の処理がや
り易いようにしてマイクロプロセッサ2などにより測定
する。所定値より大きな値の電圧降下を起こしている接
点は、接触抵抗値が大きく不良と判断される。
Therefore, the voltage drop value is amplified by the amplifier 7 and measured by the microprocessor 2 to facilitate the next processing. A contact that causes a voltage drop larger than a predetermined value has a large contact resistance value and is determined to be defective.

[実施例] 第2図は本発明の実施例を示す、第1図と同一符号は同
様のものを示す。切換開閉器8として機械的リレーによ
る切換開閉回路を使用し、増幅器7には差動増幅器を使
用する。差動増幅器7の出力にアナログ/ディジタル変
換器を接続する。切換開閉器8にはリレー接点を2回路
並列的に設け、一方に定電流を流し、他方から電圧降下
を取り出している。そして電圧降下取り出し端子側を差
動増幅器7と接続している。リレードライブ回路にはマ
イクロプロセッサ2からスキャン番号を印加し、ドライ
ブ回路内にはデコーダ回路を含み、所定のリレーをドラ
イブすることは第3図の場合と同様である。リレードラ
イブ回路は前述のようにX方向端子列・Y方向端子列の
一方を固定し、他方を走査すること、1回の走査の次に
固定側を1つ動かして走査を続けることを繰り返す、定
電流源回路6にはマイクロプロセッサ2から定電流設定
を行うことを可能とすることが良い。それはキーボード
の載物について極めて良好のとき、確実にチェックする
ため、より大電流を必要とする場合な“どに設定を変え
るからである。
[Embodiment] FIG. 2 shows an embodiment of the present invention. The same reference numerals as in FIG. 1 indicate the same elements. A switching circuit using a mechanical relay is used as the switching switch 8, and a differential amplifier is used as the amplifier 7. An analog/digital converter is connected to the output of the differential amplifier 7. The switching switch 8 is provided with two circuits of relay contacts in parallel, a constant current is passed through one circuit, and a voltage drop is extracted from the other circuit. The voltage drop extraction terminal side is connected to the differential amplifier 7. A scan number is applied from the microprocessor 2 to the relay drive circuit, the drive circuit includes a decoder circuit, and predetermined relays are driven in the same manner as in the case of FIG. As mentioned above, the relay drive circuit fixes one of the X-direction terminal rows and Y-direction terminal rows, scans the other, and repeats one scan and then moves the fixed side one place to continue scanning. It is preferable that the constant current source circuit 6 be capable of setting a constant current from the microprocessor 2. This is because when the keyboard is in very good condition, the settings are changed to ensure that a larger current is required to check.

[発明の効果] このようにして本発明によると、オン操作された接点に
定電流を流し、所定値以下の電圧降下を生じている接点
は良好、所定値以上となる場合は不良というように処理
することが確実にできる。またメンブレンシートを使用
する接点の場合はキーボードに組み込んでからテストす
ることで良く、検査工程を一部省略できる効果を有する
[Effects of the Invention] Thus, according to the present invention, a constant current is passed through a contact that is turned on, and a contact that causes a voltage drop of less than a predetermined value is considered to be good, and a contact that causes a voltage drop of less than a predetermined value is considered to be defective. It can definitely be processed. In addition, in the case of contacts that use membrane sheets, it is sufficient to test them after incorporating them into the keyboard, which has the effect of partially omitting the inspection process.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の原理構成を示す図、 第2図は本発明の実施例の構成を示す図、第3図は従来
の装置構成を示す図である。 1・−キーボード接点群 Xl、X2・・−Xn・−・横方向端子列Y 1 、 
Y 2−=Y n ・−縦方向端子列2・・・マイクロ
プロセッサ 3・・・デコーダ 4・・・エンコーダ 6一定電流源回路 7・・・増幅器 8−切換開閉器
FIG. 1 is a diagram showing the basic configuration of the present invention, FIG. 2 is a diagram showing the configuration of an embodiment of the present invention, and FIG. 3 is a diagram showing the configuration of a conventional device. 1.-Keyboard contact group Xl, X2..-Xn.--Horizontal terminal row Y1,
Y 2-=Y n -Vertical terminal row 2...Microprocessor 3...Decoder 4...Encoder 6 Constant current source circuit 7...Amplifier 8-Switch switch

Claims (1)

【特許請求の範囲】 キーボード接点群(1)に対する縦方向端子列(Y1)
(Y2)・・・・・(Yn)或いは横方向端子列(X1
)(X2)・・・・・(Xn)の一方に接続された定電
流源回路(6)と、 両方に接続された増幅器(7)と、 全端子列毎にオン・オフ可能な切換開閉器(8)とを具
備し、 該増幅器(7)出力により前記キーボードの接点の接触
抵抗値を測定すること を特徴とするキーボード接点の接触抵抗値測定装置。
[Claims] Vertical terminal row (Y1) for keyboard contact group (1)
(Y2)...(Yn) or horizontal terminal row (X1
) (X2)... (Xn), a constant current source circuit (6) connected to one side, an amplifier (7) connected to both, and a switching switch that can be turned on and off for each terminal row. 1. A contact resistance value measuring device for keyboard contacts, comprising: an amplifier (8), and measures a contact resistance value of the contacts of the keyboard using the output of the amplifier (7).
JP61216307A 1986-09-13 1986-09-13 Instrument for measuring contact resistance value of keyboard contact Pending JPS6371715A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61216307A JPS6371715A (en) 1986-09-13 1986-09-13 Instrument for measuring contact resistance value of keyboard contact

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61216307A JPS6371715A (en) 1986-09-13 1986-09-13 Instrument for measuring contact resistance value of keyboard contact

Publications (1)

Publication Number Publication Date
JPS6371715A true JPS6371715A (en) 1988-04-01

Family

ID=16686472

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61216307A Pending JPS6371715A (en) 1986-09-13 1986-09-13 Instrument for measuring contact resistance value of keyboard contact

Country Status (1)

Country Link
JP (1) JPS6371715A (en)

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