KR930003672B1 - Testing devices and method of lcd electrode - Google Patents

Abstract

The apparatus checks short or disconnection of a transparent electrode of indium tin oxide (ITO) formed on a trasparent glass board in manufacturing LCD panels. The method comprises supplying constant voltage to ITO transparent electrode (B) patterned on glass board (A) via flat conductor (9), arranging a plurality of coupled exclusive logic measuring bodies (3) with two probes at respective electrodes (B), scanning the bodies (3) sequentially and deciding short or disconnection by measuring voltage difference between first and second probes (1)(2) of the bodies (3).

Description

Method for measuring disconnection and short circuit of transparent electrode of liquid crystal display device

1 is an embodiment of a measuring method according to the present invention.

FIG. 2 is an exemplary view showing a state in which the transparent electrode of the liquid crystal display device is disconnected in order to explain the measuring method of the present invention.

3 is an exemplary view showing a short circuit between transparent electrodes of a liquid crystal display device to explain the measuring method of the present invention.

4 is a signal processing block diagram of an apparatus for measuring disconnection-short circuit of the transparent electrode of the present invention.

5 is a waveform diagram of each part of the measuring apparatus according to the present invention.

* Explanation of symbols for main parts of the drawings

1: 1st probe 2: 2nd probe

3: logic measuring member 4: lead wire

5: alarm driving unit 6: latching unit

7 pulse generating circuit 8 display unit

9: flat conductor 10: reset switch

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a measuring method and apparatus for screening out disconnection and short circuit of an I.T.O (Indium Tin Oxide) transparent electrode formed on a transparent glass substrate.

In general, a liquid crystal display device forms a pattern of an ITO common transparent electrode on a transparent glass substrate through a predetermined process such as photoetching or etching, and the patterned ITO common transparent electrode is disconnected or a common electrode. Frequent occurrences of a short circuit between the electrode and the electrode occur.

As a method for measuring the disconnection and short circuit of the ITO common transparent electrode pattern generated as described above, conventionally, the ITO common transparent electrode pattern is checked by carefully examining every pattern of the ITO common transparent electrode formed on the transparent glass substrate through a microscope. The defect of the transparent electrode was extracted. However, in the conventional method, since the ITO common transparent electrode is minutely formed on the transparent glass substrate, it is difficult to detect extremely small disconnection or short circuit of the electrode, and at the same time, no matter how good the microscope is, Through the ITO common transparent electrode through each pattern, even if you look at every detail, after the disconnection and short-circuit by the operator's sight, it takes a lot of measurement time, as well as tired eyes of the operator had many problems.

Accordingly, the present invention has been made in view of the conventional problem measured by the discriminating power of the operator using a microscope, the object is to apply a constant voltage to the pattern of the ITO common transparent electrode formed on the transparent glass substrate, the logical circuit device The present invention provides a method for measuring disconnection and short circuit of the transparent electrode of the liquid crystal display device, which enables the user to easily check the disconnection and the shorted point by shortening the measurement time according to the manufacturing process by searching in the manner to be alerted and displayed by means of have.

In still another object of the present invention, by using a logic measuring member configured with an exclusive logic circuit, circuit disconnection and short-circuit of electrodes are monitored and the signal output by the logic measuring member is monitored to the display unit for disconnection and short circuit. The present invention provides a disconnection-short measuring device for a liquid crystal display device transparent electrode capable of distinguishing a through a screen.

The measuring method of the present invention for achieving the above object is to contact the flat conductor used to uniformly apply a constant voltage to each ITO common transparent electrode formed on the transparent glass substrate in a direction crossing the ITO common transparent electrode array, At least several to several hundred pairs are arranged in pairs with an exclusive logic measuring member having two probes for each of the ITO common transparent electrode elements, and then the scanning elements are sequentially scanned in parallel with the formed pattern. The breakdown and short-circuit of the transparent electrode of the liquid crystal display device can be confirmed by the acoustic power generation of the measuring device and the display of the display device by the voltage values of the first and second probes of the respective logical measuring members. .

On the other hand, the measuring device for implementing the disconnection-short measuring method of the transparent electrode has a built-in timer and a buzzer, but the alarm driver 5 and the ITO common transparent electrode (B) pattern to adjust the alarm time by the timer A latch unit 6 which holds the input as it is unless the signals input from the first and second probes 1 and 2 configured in the hundreds to hundreds of pairs of logic measuring members 3 are reset, the latch A pulse generating circuit 7 for generating pulses necessary for displaying disconnection and short-circuit signals of each of the logic measuring members 3 input to the section 6, and each logic measuring member 3 output from the latch section 6; And the display unit 8 connected to the latch unit 6 so as to identify which part of the ITO common transparent electrode B is disconnected or shorted by the disconnection and short-circuit signals.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

1 shows an embodiment of the method according to the present invention, where (A) is a transparent glass substrate, (B) is a pattern of an ITO common transparent electrode, and (9) is on the transparent glass substrate (A). A flat conductor for supplying a constant voltage to the patterned ITO common transparent electrode (B), (3) is the first probe (1) and the second probe (1) for detecting the disconnection and short circuit of the ITO common transparent electrode (B) 2) and the output source as the lead wire 4, the logic measuring member incorporating an exclusive logic circuit is shown.

The ITO common transparent electrode B is patterned on the transparent glass substrate A through a process such as photoetching and etching in a conventional manner, and is uniform to the pattern of each ITO common transparent electrode B formed as described above. The flat conductor 9, which is capable of applying a voltage, is brought into contact with the arrayed ITO common transparent electrode B so as to intersect. Then, in order to detect disconnection and short-circuit of the entire ITO common transparent electrode B, all of the disconnection and short-circuit detections are used as the first probe 1 and the second probe 2, and the output source is a lead wire ( At least several to several hundred pairs of exclusive logic circuits are arranged in contact with each other on the pattern of the ITO common transparent electrode B with a pair of logic measuring members 3 as 4).

The arrangement form of the exclusive logic measuring member 3, which consists of several to several hundred pairs, does not have a predetermined standard, and only a pair of exclusive logical measuring members 3 and other exclusive logical measuring members arranged at the left and right sides thereof. It may be more preferable to form a narrow gap so that at least several to several hundred pairs of exclusive logic measuring members 3 are also present in the gaps C therebetween to check whether there is a short circuit between the ITO common transparent electrode B and the electrodes. It is configured to contact the first probe 1 and the second probe pole (2).

4 also deals with disconnection and short-circuit signals detected from the exclusive logic measurement members 3 which contact several to hundreds of pairs of pores C between the ITO common transparent electrode B and the electrodes B. FIG. As a block diagram of a measuring device, a timer and a buzzer are built in, and the alarm input unit 5, in which the alarm time is adjusted by the timer, and the signals input from the respective exclusive logic measuring members 3 are not reset. A pulse generating circuit for generating pulses necessary for displaying the disconnection and short-circuit detection signals of the latch unit 6 holding the input thereof and the exclusive logic measuring members 3 input to the latch unit 6 ( 7) and the disconnection and short-circuit signals of each exclusive logic measurement member 3 passed from the latch section 6 can be identified at which part of the ITO common transparent electrode B the disconnection and short-circuit are identified. By the number corresponding to the logic measuring member 3 It is composed of the display unit 8 formed.

In measuring the disconnection or short-circuit using the disconnection and short-circuit measuring device of each ITO common transparent electrode B configured as described above, first supplying a constant voltage from the flat conductor 9 to each ITO common transparent electrode B The same voltage is commonly applied to the ITO common transparent electrode B, and no voltage is applied to the space C between the electrodes B.

That is, when the first probe 1 and the second probe 2 of each exclusive logic measuring member 3 in contact with each ITO common transparent electrode B are not disconnected, the first and second probes The same voltage is sensed in (1) and (2), and each exclusive logic measurement part (3) which is in contact with the cavity C when the ITO common transparent electrode B and the electrode are not short-circuited. Since the first and second probes 1 and 2 do not have a circuit configuration with the planar body 9, no voltage is commonly applied to the first and second probes 1 and 2.

Therefore, when the ITO common transparent electrode B is not disconnected or short-circuited, and in a good state, the first and second probes 1 and 2 sense the same voltage, so that the lead wire of the exclusive logic measuring member 3 4) The output level is 0 (ZERO).

In addition, since the voltage is not applied to the first and second probes 1 and 2 when the gap C between the ITO common transparent electrode B and the electrode is not shorted and is in a good state, the exclusive logical measuring member 3 in this case is also used. ), The output level of the lead wire 4 becomes 0 (ZERO).

However, as shown in FIG. 2, when the first probe 1 and the second probe 2 of the exclusive logic measuring member 3 in contact with the ITO common transparent electrode B are disconnected, Since the voltage supplied from the flat conductor 9 is not applied to the second probe 2 in contact with the site, a voltage difference is formed from the first probe 1 which is energized, and as shown in FIG. Likewise, when there is a short circuit between the ITO common transparent electrode B and the electrode, the second probe 2 that is in contact with the shorted portion is subject to the voltage supplied from the flat conductor 9, so that the first probe is not energized. The voltage difference with (1) is formed.

Therefore, the truth values of the exclusive logic measuring member 3 according to the voltage sensing of the first probe 1 and the second probe 2 are as shown in Table 1.

TABLE 1

That is, the ON signal of "1" is output to the lead wire electrode 4 of the exclusive logic measuring member 3 at the time of disconnection and short circuit, and this signal is a timer as shown in FIG. Is applied to the built-in alarm driver 5 and at the same time operates the buzzer. As a result, the operator can know that the ITO common transparent electrode B patterned on the transparent glass substrate A is disconnected or shorted by the alarm sound of the buzzer.

At the same time, the signal is also applied to the latch unit 6 and the pulse generating circuit 7. The pulse generating circuit 7 generates a pulse shorter than the pulse width of (a) as shown in FIG. The latch unit 6, which is supplied to the unit 6 and receives the pulse thereof, receives a high signal that rises when the pulse (b) of the pulse generator circuit 7 falls low as shown in FIG. Output to display unit 8.

Accordingly, the display unit 8 displays disconnection and short-circuited points of the exclusive logic measuring member 3 that are scanned, and the operator recognizes the display, thereby making the ITO common transparent electrode B formed on the transparent glass substrate A. FIG. It can identify which part is disconnected or shorted.

The disconnection and short-circuit detection signals of the scanned exclusive logic measuring member 3 continue to be turned on through the latch unit 6, so that the latch unit is used to measure disconnection and short-circuit with respect to the transparent electrode pattern of the next liquid crystal display. Clear with the reset switch 10 connected to (6).

As described above, several to hundreds of pairs of exclusive logic measuring members contacting the ITO common transparent electrode pattern at narrow intervals are sequentially scanned to detect and detect disconnection and short circuit detection signals of the ITO transparent electrode pattern by circuit means. By displaying, the inspection efficiency according to the measurement can be improved and the measurement time can be shortened, and the disconnection and short-circuit points can be displayed, respectively, thereby increasing the productivity according to the manufacturing process.

Claims (2)

An exclusive logic measuring member having a constant voltage applied to the entire ITO common transparent electrode B patterned on the transparent glass substrate A through the flat conductor 9, and having two probes for each element of the ITO common transparent electrode B. At least several to several hundred pairs are formed by making (3) as a pair, and then sequentially scanning them to check whether the voltage difference between the first and second probes (1) and (2) of each exclusive logic measuring member (3) is present. The disconnection and short-circuit determination method according to claim 1, characterized in that the disconnection-short measuring method of the transparent electrode of the liquid crystal display device. Each probe, which is integrated with a timer and a buzzer, and which contacts an alarm driver 5 in which an alarm time is adjusted by the timer and several to several hundred pairs of exclusive logic measuring members 3 on an ITO common transparent electrode B pattern. (1) Disconnection of the latch unit 6 which holds the input as it is, and the exclusive logic measuring members 3 input to the latch unit 6, unless the signal input from (2) is reset, and The disconnection and short circuit signals of the pulse generating circuit 7 for generating the pulses necessary to display the short circuit detection signal and each exclusive logic measurement member 3 output from the latch unit 6 are connected to the ITO common transparent electrode B. Device for measuring short-circuit of the transparent electrode of the liquid crystal display device, characterized in that the display unit (8) is formed to correspond to the exclusive logic measuring member (3) so as to identify which part of the circuit is disconnected or short-circuited. .

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