CN112924848B - Method and system for improving security of FCT test platform - Google Patents
Method and system for improving security of FCT test platform Download PDFInfo
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- CN112924848B CN112924848B CN202110096209.2A CN202110096209A CN112924848B CN 112924848 B CN112924848 B CN 112924848B CN 202110096209 A CN202110096209 A CN 202110096209A CN 112924848 B CN112924848 B CN 112924848B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
Abstract
The invention provides a method and a system for improving the safety of an FCT test platform, wherein the method comprises the following steps: the first electric signal INA and the second electric signal INB are received, and the unlocking of the electric control lock is controlled when the first electric signal INA and the second electric signal INB meet respective unlocking conditions. The first electric signal INA is controlled and output by an upper computer of the test platform, and the second electric signal INB is manually controlled and output. The protection cover cannot be opened directly by a worker in the testing process, so that the reliability of the functional testing process can be ensured, and meanwhile, the electricity utilization safety of the functional testing platform operator is ensured, and the contact with the strong test electricity is avoided.
Description
Technical Field
The invention belongs to the technical field of FET (field effect transistor) testing, and particularly relates to a method and a system for improving the safety of an FCT (flexible circuit test) testing platform.
Background
At the final stage of the factory production line, the electronic product can perform a PCBA function test FCT for verifying whether the function of the product meets the design requirement, enterprises generally use a self-grinding function test platform, and the platform is provided with a protective cover for protecting the stability and safety of the test platform. However, the lock catch of the protection cover is usually arranged outside the protection cover, and is only a common mechanical lock catch, and the method only needs to be operated by a tester to unlock or not, so that the protection cover can be locked, but the method has the defect:
1. whether or not the test is being performed, the tester can open the protective cover at any time; in the test process, if a tester opens a protective cover due to misoperation or a non-tester of a production line, the reliability of the functional test is reduced, and the electronic product to be tested can be damaged;
2. if the industrial product is subjected to strong electricity test, when the test is performed, the protective cover is opened, so that serious electric shock risks are caused, and the problem is very fatal.
Disclosure of Invention
The invention aims to solve the problems and provide a method and a system for improving the safety of an FCT test platform.
In order to achieve the above purpose, the present invention adopts the following technical scheme:
a method of improving FCT test platform security, comprising:
the first electric signal INA and the second electric signal INB are received, and the unlocking of the electric control lock is controlled when the first electric signal INA and the second electric signal INB meet respective unlocking conditions. The first electric signal INA is controlled and output by an upper computer of the test platform, and the second electric signal INB is manually controlled and output.
In the above method for improving the security of the FCT test platform, the first electrical signal INA is output by the test platform according to whether the test platform is currently in a test state;
the second electric signal INB is manually controlled to be output through a contact switch;
when the test platform is not in a test state, the output first electric signal INA meets the unlocking condition;
when the user operates the contact switch to be on, the second electric signal INB satisfies its unlocking condition.
In the above method for improving the security of the FCT test platform, the electric control lock is controlled by:
when a second electric signal INB meeting unlocking conditions is received, detecting whether the test platform is in a test state, if not, outputting a first electric signal INA meeting the unlocking conditions to control the unlocking of the electric control lock, otherwise, not outputting the first electric signal INA meeting the unlocking conditions to enable the electric control lock not to be unlocked in the test state; the second electric signal INB which does not output the unlocking condition may be an electric signal which does not output the unlocking condition, or may be an electric signal which does not output the unlocking condition;
the test power is disconnected before the electric control lock is unlocked.
In the method for improving the safety of the FCT test platform, the electric control lock is controlled by the AND gate circuit:
when the test platform is in a test state, the first electric signal INA is a high-level signal;
when the test platform is not in a test state, the first electric signal INA is a low-level signal;
when the user operates the contact switch to be on, the second electric signal INB is a high-level signal, otherwise, the second electric signal INB is a low level;
the first electric signal INA is reversely processed by the first NOT gate circuit and then is input to the first AND gate circuit, the second electric signal INB is filtered by the filter circuit and then is input to the first AND gate circuit, the first AND gate circuit outputs a third electric signal Y after AND processing of the two electric signals, and the electric control lock is unlocked when the third electric signal Y is in a high level.
In the method for improving the safety of the FCT test platform, the electric control lock comprises a relay circuit and an electromagnetic lock, and the electric control lock is unlocked when the electromagnetic lock is in an electrified state;
and the method further comprises:
and the third signal Y output by the first AND gate circuit is output in two ways, wherein one way is input to the second AND gate circuit, and the other way is processed by the NOT gate delay circuit and then is input to the second AND gate circuit so that the second AND gate circuit outputs a pulse width signal for controlling the electrifying of the electromagnetic lock.
The system for improving the safety of the FCT test platform comprises a signal processing circuit, wherein the input end of the signal processing circuit is connected with a first electric signal generating circuit and a second electric signal generating circuit, the output end of the signal processing circuit is connected with an electric control lock, and the signal processing circuit is used for outputting a third electric signal Y for unlocking the electric control lock when the first electric signal INA and the second electric signal INB meet respective unlocking conditions.
In the above system for improving the safety of the FCT test platform, the first electrical signal generating circuit includes an output channel for outputting an electrical signal according to whether the test platform is in a test state;
the second electric signal generating circuit comprises a contact switch;
when the test platform is not in the test state, the output first electric signal INA meets the unlocking condition;
when the contact switch is operated to be on, the output second electric signal INB satisfies the unlock condition.
In the above system for improving the safety of the FCT test platform, the signal processing circuit includes a first and gate circuit, the output channel and the contact switch are both connected to the input end of the first and gate circuit, so that the first and gate circuit outputs a third electrical signal Y after performing and processing on the first electrical signal and the second electrical signal, and the output end of the first and gate circuit is connected to the electric control lock so that the electric control lock is unlocked according to the third electrical signal Y.
In the above system for improving the security of the FCT test platform, the output channel is connected to the first and gate through a first not gate;
the contact switch is connected with the first AND gate circuit through the filter circuit;
the electric control lock comprises an electromagnetic lock and a relay circuit for controlling the electromagnetic lock to be powered on and powered off, and the first AND gate circuit is connected to the relay circuit so that the relay circuit controls the electromagnetic lock to be powered on and powered off according to a third electric signal Y.
In the system for improving the safety of the FCT test platform, the electromagnetic lock is configured to be unlocked when in an electrified state;
a narrow pulse generating circuit is connected between the first AND gate circuit and the relay circuit so that the electromagnetic lock is electrified under a pulse width signal Y_out generated by the narrow pulse generating circuit;
the narrow pulse generating circuit comprises a second AND gate circuit and a NOT gate delay circuit, the output end of the first AND gate circuit is connected with the second AND gate circuit and the NOT gate delay circuit at the same time, the output end of the NOT gate delay circuit is connected with the second AND gate circuit, and the output end of the second AND gate circuit is connected with the relay circuit;
the NOT gate delay circuit comprises a second NOT gate circuit and an RC delay circuit, wherein two ends of the second NOT gate circuit are respectively connected with the first AND gate circuit and the RC delay circuit, and one end, away from the second NOT gate circuit, of the RC delay circuit is connected with the second AND gate circuit.
The invention has the advantages that:
1. the protection cover cannot be opened directly by a worker in the test process, so that the reliability of the function test process can be ensured, and meanwhile, the electricity safety of a function test platform operator is ensured, and the contact with the strong test electricity is avoided;
2. when the protective cover is opened, the test electricity of the functional test platform is disconnected, so that the life safety of staff can be ensured;
3. the electromagnetic lock adopts a low-power consumption narrow pulse circuit, so that the power-on time of each electromagnetic lock can be maintained within a certain time, the power consumption of the electromagnetic lock can be reduced, and the electromagnetic lock is prevented from running for a long time to last high temperature.
Drawings
FIG. 1 is a block diagram of a circuit configuration in a first embodiment of the present invention;
FIG. 2 is a block diagram of a circuit configuration in a second embodiment of the present invention;
fig. 3 is a control timing chart in the second embodiment of the present invention.
Reference numerals: an electric control lock 1; a relay circuit 11; an electromagnetic lock 12; a contact switch 2; an output channel 3; a first NOT circuit 4; a first AND gate circuit 5; a filter circuit 6; a second AND gate 7; a NOT gate delay circuit 8; a second NOT circuit 81; an RC delay circuit 82; a narrow pulse generating circuit 9.
Detailed Description
The invention will be described in further detail with reference to the drawings and the detailed description.
Example 1
As shown in fig. 1, the embodiment discloses a system capable of improving the security of an FCT test platform, which comprises a signal processing circuit, wherein the input end of the signal processing circuit is respectively connected with a first electric signal generating circuit and a second electric signal generating circuit, and the output end of the signal processing circuit is connected with an electric control lock 1. The signal processing circuit is configured to receive the first electrical signal INA output by the first electrical signal generating circuit and the second electrical signal INB output by the second electrical signal generating circuit, and output a third electrical signal Y for controlling unlocking of the electronic control lock 1 when the first electrical signal INA and the second electrical signal INB simultaneously satisfy respective unlocking conditions.
Specifically, the first electric signal generating circuit comprises an output channel 3 for outputting an electric signal according to whether the test platform is in a test state, the output channel 3 is an electric signal output end of an upper computer in the test platform and is controlled by the upper computer, and the upper computer judges whether the test platform is in the test state by monitoring the running state of test software. When the test platform is not in the test state, the output channel 3 outputs a first electric signal INA meeting the unlocking condition, and for the first electric signal INA, the embodiment sets the unlocking condition meeting the test state when the first electric signal INA is in the low level, namely when the test platform is not in the test state, the output channel 3 outputs the low level;
the second electric signal generating circuit comprises a contact switch 2 which is controlled by a worker to operate, is positioned outside the protective cover and can be arranged at the front panel of the test platform. When the contact switch is operated to be on, the second electrical signal INB satisfies an unlocking condition, and for the second electrical signal INB, the embodiment sets that the second electrical signal INB is at a high level and satisfies a manually operated unlocking condition, that is, when a worker operates the contact switch 2 to unlock the electric control lock 1, the contact switch 2 outputs a high level.
Specifically, the signal processing circuit includes a first and gate 5, and the output channel 3 is connected to an input end of the first and gate 5 through a first not gate 4, and the first electric signal INA is inverted by the first not gate 4 and then output to the first and gate 5; the contact switch 2 is connected to the other input end of the first AND gate circuit 5 through a filter circuit 6; the first and circuit 5 performs and processing on the first electrical signal INA and the second electrical signal INB, and outputs a third electrical signal Y.
Further, the electric control lock 1 comprises an electromagnetic lock 12 and a relay circuit 11 for controlling the electromagnetic lock 12 to be powered on and powered off, the output end of the first AND gate circuit 5 is connected to the relay circuit 11, and the relay circuit 11 controls the electromagnetic lock 12 to be powered on and powered off according to the third electric signal Y, so that the electric control lock 1 is unlocked according to the third electric signal Y. The electromagnetic lock can be installed inside the protective cover, and the electromagnetic lock preferably adopts a switch supporting manual mechanical emergency, and a hole column communicated with the electromagnetic lock inside the protective cover is arranged outside the protective cover so that a worker can unlock the electromagnetic lock by using a specific long rod.
Specifically, as shown in the following table, when the test platform is not in a test state, the first electrical signal INA is at a low level L, the unlocking condition thereof is satisfied, the ina_not signal outputted after being inverted by the first not gate circuit 4 is at a high level H, and when the test platform is in a test state, the first electrical signal INA is at a high level H, the unlocking condition is not satisfied, and the ina_not signal outputted after being inverted by the first not gate circuit 4 is at a low level L; when the contact switch 2 is operated to be opened, the second electric signal INB is of a high level H, so that the unlocking condition is met, and otherwise, the second electric signal INB is of a low level L, so that the unlocking condition is not met; when the first electric signal is at a low level, the INA_not signal is at a high level, if the second electric signal INB is also at a high level at the moment, a third electric signal Y at a high level is output after the AND processing, the relay circuit 11 is driven to work, the electromagnetic lock 12 is electrified, and the electric control lock 1 is unlocked.
| INA | INA_not | INB | Y |
| L | H | L | L |
| L | H | H | H |
| H | L | L | L |
| H | L | H | L |
Preferably, since the electric control lock 1 is not in the test state on the premise of unlocking, no power is required to be supplied to the test platform at this time, the test power consumption of the test platform is preferably disconnected before the electric control lock 1 is unlocked so as to ensure the life safety of staff.
When the scheme is put into use, the protection cover cannot be opened manually in a test state, so that the reliability of a function test process can be ensured, and meanwhile, the electricity utilization safety of a function test platform operator is ensured, and the contact with the test strong electricity is avoided; and when the protective cover is opened, the test electricity of the functional test platform is disconnected, so that the life safety of staff can be ensured.
Example two
As shown in fig. 2 and 3, the present embodiment is similar to the embodiment in that a narrow pulse generating circuit 9 for shortening the energization time of the electromagnetic lock 12 is added on the basis of the first embodiment. The electromagnetic lock 12 is configured such that the electronic control lock 1 is unlocked when in an energized state; the electromagnetic lock is high in power consumption and large in heat generation amount in the electrified state, and if the electromagnetic lock is in the electrified state for a long time, the electromagnetic lock is in a high-temperature state for a long time, so that the electromagnetic lock 12 is damaged, and the service life of the electromagnetic lock is greatly reduced.
Specifically, the narrow pulse generating circuit 9 is arranged between the first AND gate circuit 5 and the relay circuit 11, so that the relay circuit 11 controls the power supply on time of the electromagnetic lock 12 to have time limitation, the electromagnetic lock 12 is electrified under the pulse width generated by the narrow pulse generating circuit 9, the electrifying time of the electromagnetic lock 12 is greatly shortened, the safety of the system is greatly improved, and the service life of the electromagnetic lock is prolonged.
Specifically, the narrow pulse generating circuit 9 includes a second and gate 7 and a not gate delay circuit 8, the output end of the first and gate 5 is connected to the second and gate 7 and the not gate delay circuit 8 at the same time, the output end of the not gate delay circuit 8 is connected to the second and gate 7, and the output end of the second and gate 7 is connected to the relay circuit 11;
the not gate delay circuit 8 comprises a second not gate 81 and an RC delay circuit 82, two ends of the second not gate 81 are respectively connected with the first AND gate 5 and the RC delay circuit 82, and one end of the RC delay circuit 82, which is far away from the second not gate 81, is connected with the second AND gate 7. The narrow pulse generating circuit 9 divides the output signal Y of the first and circuit 5 into two paths, one path is the original signal Y, and the other path is directly input to the second and circuit 7, and generates a signal with the level opposite to that of the original signal Y after passing through the second not gate circuit 81, and then outputs a Y1 signal to the second and circuit 7 through the RC delay circuit, the Y signal received by the second and circuit 7 is opposite to that of the Y1 signal, but when the original signal Y changes from low level to high level, the not gate delay circuit 8 has a delay of t, the Y signal and the Y1 signal have the same high level with the duration of t, at this time, the second and circuit will output the high level pulse width of t pulse width, and the electromagnetic lock 1 is powered on through the high level pulse width, i.e. the power on time of the electromagnetic lock 1 is t. the time t is related to the RC delay circuit:
t＝-RC*ln(U c /U vcc )
r: resistance value in RC delay circuit;
c: capacitance value in RC delay circuit;
U c : the capacitor is discharged to the low level V of the AND gate input IL Is the maximum value of (2);
U vcc : a power supply voltage.
The electromagnetic lock of this scheme adopts the narrow pulse circuit of low-power consumption, can make the circular telegram time of electromagnetic lock at every turn maintain in t time, can reduce the electromagnetic lock consumption, prevent that the electromagnetic lock from long-term operation and lasting high temperature.
The specific embodiments described herein are offered by way of example only to illustrate the spirit of the invention. Those skilled in the art may make various modifications or additions to the described embodiments or substitutions thereof without departing from the spirit of the invention or exceeding the scope of the invention as defined in the accompanying claims.
Although the electronically controlled lock 1 is used more herein; a relay circuit 11; an electromagnetic lock 12; a contact switch 2; an output channel 3; a first NOT circuit 4; a first AND gate circuit 5; a filter circuit 6; a second AND gate 7; a NOT gate delay circuit 8; a second NOT circuit 81; an RC delay circuit 82; the term narrow pulse generating circuit 9 is not exclusive of the possibility of using other terms. These terms are used merely for convenience in describing and explaining the nature of the invention; they are to be interpreted as any additional limitation that is not inconsistent with the spirit of the present invention.
Claims (6)
1. A method for improving security of an FCT test platform, comprising:
receiving a first electric signal INA and a second electric signal INB, and controlling the electric control lock (1) to unlock when the first electric signal INA and the second electric signal INB meet respective unlocking conditions;
the first electric signal INA is output by the test platform according to whether the test state is currently in;
the second electric signal INB is manually controlled to be output through the contact switch (2);
when the test platform is not in a test state, the output first electric signal INA meets the unlocking condition;
when the user operates the contact switch (2) to be on, the second electric signal INB meets the unlocking condition;
an electrically controlled lock (1) is controlled by:
when a second electric signal INB meeting unlocking conditions is received, detecting whether the test platform is in a test state, if not, outputting a first electric signal INA meeting the unlocking conditions to control the unlocking of the electric control lock (1), otherwise, not outputting the first electric signal INA meeting the unlocking conditions to enable the electric control lock (1) not to be unlocked in the test state;
the test electricity is disconnected before the electric control lock (1) is unlocked.
2. The method for improving the security of an FCT test platform according to claim 1, wherein the electrically controlled lock (1) is controlled by an and gate circuit:
when the test platform is in a test state, the first electric signal INA is a high-level signal;
when the test platform is not in a test state, the first electric signal INA is a low-level signal;
when the user operates the contact switch (2) to be on, the second electric signal INB is a high-level signal, otherwise, the second electric signal INB is a low level;
the first electric signal INA is reversely processed by the first NOT gate circuit (4) and then is input to the first AND gate circuit (5), the second electric signal INB is filtered by the filter circuit (6) and then is input to the first AND gate circuit (5), the first AND gate circuit (5) outputs a third electric signal Y after AND processing of the two electric signals, and the electric control lock (1) is unlocked when the third electric signal Y is at a high level.
3. The method for improving the safety of the FCT test platform according to claim 2, wherein the electric control lock (1) comprises a relay circuit (11) and an electromagnetic lock (12), and the electric control lock (1) is unlocked when the electromagnetic lock (12) is in an energized state;
the method further comprises:
and outputting a third signal Y output by the first AND gate circuit (5) in two ways, wherein one way is input to the second AND gate circuit (7), and the other way is processed by the NOT gate delay circuit (8) and then is input to the second AND gate circuit (7) so that the second AND gate circuit (7) outputs a pulse width signal for controlling the electrifying of the electromagnetic lock (12).
4. A system for improving the security of an FCT test platform based on the method of any one of claims 1-3, characterized by comprising a signal processing circuit, the input end of the signal processing circuit is connected to a first electrical signal generating circuit and a second electrical signal generating circuit, the output end of the signal processing circuit is connected to an electrical control lock (1), and the signal processing circuit is used for outputting a third electrical signal Y for unlocking the electrical control lock (1) when the first electrical signal INA and the second electrical signal INB each meet respective unlocking conditions;
the first electric signal generating circuit comprises an output channel (3) for outputting an electric signal according to whether the test platform is in a test state or not;
the second electric signal generating circuit comprises a contact switch (2);
when the test platform is not in the test state, the output first electric signal INA meets the unlocking condition;
when the contact switch (2) is operated to be on, the output second electric signal INB satisfies an unlocking condition;
the signal processing circuit comprises a first AND gate circuit (5), the output channel (3) and the contact switch (2) are both connected to the input end of the first AND gate circuit (5) so that the first AND gate circuit (5) can output a third electric signal Y after AND processing of the first electric signal and the second electric signal, and the output end of the first AND gate circuit (5) is connected to the electric control lock (1).
5. The system for improving the security of an FCT test platform according to claim 4, wherein the output channel (3) is connected to the first and circuit (5) through a first not gate circuit (4);
the contact switch (2) is connected with the first AND gate circuit (5) through a filter circuit (6);
the electric control lock (1) comprises an electromagnetic lock (12) and a relay circuit (11) for controlling the on-off of the electromagnetic lock (12), and the first AND gate circuit (5) is connected with the relay circuit (11).
6. The system for improving the security of an FCT test platform according to claim 5, wherein the electromagnetic lock (12) is configured such that the electrically controlled lock (1) is unlocked when in an energized state;
a narrow pulse generating circuit (9) is connected between the first AND gate circuit (5) and the relay circuit (11);
the narrow pulse generating circuit (9) comprises a second AND gate circuit (7) and a NOT gate delay circuit (8), the output end of the first AND gate circuit (5) is simultaneously connected with the second AND gate circuit (7) and the NOT gate delay circuit (8), the output end of the NOT gate delay circuit (8) is connected with the second AND gate circuit (7), and the output end of the second AND gate circuit (7) is connected with the relay circuit (11);
the NOT gate delay circuit (8) comprises a second NOT gate circuit (81) and an RC delay circuit (82), two ends of the second NOT gate circuit (81) are respectively connected with the first AND gate circuit (5) and the RC delay circuit (82), and one end, far away from the second NOT gate circuit (81), of the RC delay circuit (82) is connected with the second AND gate circuit (7).
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