CN110908359B - Function test equipment, method and device - Google Patents
Function test equipment, method and device Download PDFInfo
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- CN110908359B CN110908359B CN201911060014.1A CN201911060014A CN110908359B CN 110908359 B CN110908359 B CN 110908359B CN 201911060014 A CN201911060014 A CN 201911060014A CN 110908359 B CN110908359 B CN 110908359B
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
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Abstract
The application relates to a function testing device, a method and a device. The device comprises a switching circuit, a feedback circuit, a signal simulation device and a processor connected with the signal simulation device; the signal simulation equipment is used for connecting the platform door controller to be tested; the signal output end of the processor is used for being connected with a signal receiving end of the platform door controller to be tested through the switch circuit, and the signal input end of the processor is used for being connected with the signal output end of the platform door controller to be tested through the feedback circuit; the signal simulation equipment comprises a transformer and cut-off equipment; the transformer is used for connecting the platform door controller to be tested through the on-off equipment; the cut-off equipment is connected with the processor; the processor indicates the on or off of the on-off equipment and the connection between the transformer and the platform door controller to be tested according to the preset on-off frequency, and transmits command signals to the platform door controller to be tested through the switching circuit; the processor outputs a test result according to the feedback signal and the fault data table of the platform door controller to be tested, so that the detection efficiency can be improved, and the false detection rate is reduced.
Description
Technical Field
The present disclosure relates to the field of controller function testing technologies, and in particular, to a function testing apparatus, method and device.
Background
The shield door is also called a platform curtain door or a safety door, is arranged at the edge of a station platform along the urban rail transit, isolates a waiting area of the station platform from a rail running area, corresponds to a train door, and is an electromechanical equipment system. The shielding door is used for isolating passengers from the track and the train, so that the operation safety factor is improved, the platform environment for passengers to wait is improved, and the operation cost and the construction cost are saved. The opening and closing of the screen door is generally performed in cooperation with the movement of a train door when a train arrives at a station, so that a passage for passengers to get on and off the train is provided. Therefore, the normal operation of the screen door is very important for the rail traffic. The DCU (Door Control Unit, platform Door controller) is an electrical Control device for a screen Door or a safety Door, is responsible for opening or closing a sliding Door, and is an important link for daily equipment maintenance when performing function test on the DCU.
In the implementation process, the inventor finds that at least the following problems exist in the conventional technology: the traditional function test equipment has the problems of low test efficiency and low safety.
Disclosure of Invention
In view of the above, it is necessary to provide a functional test apparatus, a method and a device capable of improving test efficiency.
In order to achieve the above object, an embodiment of the present invention provides a function testing device, which includes a switch circuit, a feedback circuit, a signal simulation device, and a processor connected to the signal simulation device; the signal simulation equipment is used for connecting the platform door controller to be tested; the signal output end of the processor is used for being connected with a signal receiving end of the platform door controller to be tested through the switch circuit, and the signal input end of the processor is used for being connected with the signal output end of the platform door controller to be tested through the feedback circuit;
the signal simulation equipment comprises a transformer and cut-off equipment; the transformer is used for connecting the platform door controller to be tested through the on-off equipment; the cut-off equipment is connected with the processor;
the processor indicates the on or off of the on-off equipment and the connection between the transformer and the platform door controller to be tested according to the preset on-off frequency, and transmits command signals to the platform door controller to be tested through the switching circuit;
the processor receives a feedback signal transmitted by the platform door controller to be tested based on the command signal through the feedback circuit; and the processor outputs a test result according to the feedback signal and the fault data table of the platform door controller to be tested.
In one embodiment, the feedback signal comprises a hall signal; the fault data table comprises the names of fault components and parameters of fault states; the test result comprises a fault position and a fault type;
the processor acquires a motor rotating speed value corresponding to the Hall signal and compares the motor rotating speed value with a fault state parameter;
the processor judges whether the platform door controller to be tested has a fault according to the comparison result;
if the judgment result is yes, the processor outputs a fault position and a fault type corresponding to the name of the fault component according to the name of the fault component corresponding to the fault state;
and if the judgment result is negative, the processor outputs a fault-free position and a fault-free type.
In one embodiment, the feedback signal comprises a mode switch status signal; the fault data table comprises fault switch state combinations;
the processor acquires a feedback state combination based on the state signals of the mode switches, compares the feedback state combination with the fault switch state combination, and outputs a test result according to the comparison result.
In one embodiment, the switching circuit comprises a triode, a MOS (metal oxide semiconductor) tube and a divider resistor; the voltage dividing resistor comprises a first voltage dividing resistor and a second voltage dividing resistor connected with the first voltage dividing resistor in series;
the collector of the triode is connected with one end of the first divider resistor, the base of the triode is connected with the signal output end of the processor, and the emitter of the triode is grounded; the other end of the first voltage-dividing resistor is connected with one end of the second voltage-dividing resistor;
the grid electrode of the MOS tube is connected with one end of the second voltage-dividing resistor, the drain electrode of the MOS tube is connected with the signal input end of the station door controller to be tested, and the source electrode of the MOS tube is connected with the other end of the second voltage-dividing resistor and is used for being connected with an external power supply.
In one embodiment, the switching circuit further comprises a diode and a voltage regulator tube;
the anode of the diode is connected with the signal output end of the processor, and the cathode of the diode is connected with the base electrode of the triode; the anode of the voltage-stabilizing tube is connected with one end of the second voltage-dividing resistor, and the cathode of the voltage-stabilizing tube is connected with the other end of the second voltage-dividing resistor.
In one embodiment, the feedback circuit comprises a voltage division circuit, a current limiting circuit, a filter circuit and an optical coupling driving circuit which are connected in sequence;
the input end of the voltage division circuit is connected with the signal output end of the platform door controller to be tested, and the output end of the optocoupler driving circuit is connected with the signal input end of the processor.
In one embodiment, the feedback circuit further comprises a voltage detection circuit;
one end of the voltage detection circuit is connected with the signal input end of the processor, and the other end of the voltage detection circuit is connected with the signal output end of the platform door controller to be detected.
In one embodiment, the processor comprises an upper computer and a control chip; the upper computer is connected with the control chip;
and the upper computer receives the feedback signal transmitted by the control chip and outputs a test result based on the feedback signal and the fault data table of the platform door controller to be tested.
The embodiment of the invention also provides a function testing method based on the function testing equipment, which comprises the following steps:
indicating the on-off equipment to be switched on or off and the connection between the transformer and the platform door controller to be tested according to the preset on-off frequency, and transmitting a command signal to the platform door controller to be tested through the switching circuit;
receiving a feedback signal transmitted by the platform door controller to be tested based on the command signal through a feedback circuit;
and outputting a test result according to the feedback signal and a fault data table of the platform door controller to be tested.
The present invention also provides a function testing apparatus, comprising:
the signal simulation module is used for indicating the connection or disconnection of the switching-on and switching-off equipment and the connection of the transformer and the platform door controller to be tested according to the preset switching-on and switching-off frequency;
the command sending module is used for transmitting command signals to the platform door controller to be tested through the switching circuit;
the feedback signal receiving module is used for receiving a feedback signal transmitted by the platform door controller to be tested based on the command signal through the feedback circuit;
and the test result output module is used for outputting the test result by the processor according to the feedback signal and the fault data table of the platform door controller to be tested.
The invention also provides a function test tool device which comprises a box body, a tool clamp, a power supply, a load trolley and the function test equipment; the power supply and the tool clamp are arranged on the box body; the power supply is connected with a transformer of the function test equipment;
the load trolley comprises a bearing plate, wheels, supporting legs and a protective cover; the bearing plate comprises a first face and a second face which are opposite; the protective cover is arranged on the first surface, and the bearing plate is used for arranging a motor; the supporting legs and the wheels are arranged on the second surface; the motor is used for connecting the signal output end of the platform door controller to be tested.
An embodiment of the present invention further provides a functional test system, which includes a platform door controller and the functional test apparatus as claimed above.
In one embodiment, the system further comprises an electromagnetic lock, an indicator light, a door machine load and a mode switch which are all connected with the signal output end of the platform door controller.
One of the above technical solutions has the following advantages and beneficial effects:
the application provides a functional test equipment, including switch circuit, feedback circuit, signal simulation equipment to and the treater of being connected with signal simulation equipment. The signal simulation equipment comprises a transformer and a cut-off device. The processor indicates the on or off of the switching-on and switching-off equipment and the connection of the transformer and the platform door controller to be tested according to the preset switching frequency, so that a door opening or closing instruction is simulated, and the platform door controller to be tested is sent. The processor transmits command signals to the platform door controller to be tested through the switch circuit, and receives feedback signals transmitted by the platform door controller to be tested through the feedback circuit. After receiving the feedback signal, the processor compares the feedback signal with the fault data table, and therefore a test result is output. Through the functional test equipment, when the platform door controller to be tested is detected, the functional test equipment can complete the detection of the platform door controller to be tested only by electrifying the functional test equipment. Compared with the conventional functional test equipment which usually adopts manual and semi-manual control testing, the functional test equipment provided by the application obviously has the advantages of high efficiency and low false testing rate.
Drawings
The foregoing and other objects, features and advantages of the application will be apparent from the following more particular description of preferred embodiments of the application, as illustrated in the accompanying drawings. Like reference numerals refer to like parts throughout the drawings, and the drawings are not intended to be drawn to scale in actual dimensions, emphasis instead being placed upon illustrating the subject matter of the present application.
FIG. 1 is a block diagram showing the structure of a functional test apparatus according to an embodiment;
FIG. 2 is a first schematic flow diagram of a switching circuit in one embodiment;
FIG. 3 is a second schematic flow chart diagram of a switching circuit in one embodiment;
FIG. 4 is a first schematic flow chart diagram of a feedback circuit in one embodiment;
FIG. 5 is a second schematic flow chart diagram of a feedback circuit in one embodiment;
FIG. 6 is a flow diagram illustrating a method for functional testing in one embodiment;
FIG. 7 is a block diagram showing a functional test apparatus according to an embodiment.
Detailed Description
To facilitate an understanding of the present application, the present application will now be described more fully with reference to the accompanying drawings. Preferred embodiments of the present application are shown in the drawings. This application may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
It will be understood that when an element is referred to as being "connected" to another element, it can be directly connected to the other element and be integral therewith, or intervening elements may also be present. The terms "one end," "the other end," and the like are used herein for illustrative purposes only.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in the description of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
In one embodiment, as shown in fig. 1, there is provided a functional test device comprising a switching circuit 10, a feedback circuit 20, a signal simulation device 30, and a processor 40 connected to the signal simulation device 30; the signal simulation equipment 30 is used for connecting a platform door controller to be tested; the signal output end of the processor 40 is used for being connected with the signal receiving end of the platform door controller to be tested through the switch circuit 10, and the signal input end is used for being connected with the signal output end of the platform door controller to be tested through the feedback circuit 20;
the signal simulation device 30 comprises a transformer 301 and a switching device 303; the transformer 301 is used for connecting the platform door controller to be tested through the on-off equipment 303; the disconnection device 303 is connected to the processor 40;
the processor 40 instructs the switching-on/off equipment 303 to be switched on or off and the transformer 301 to be connected with the platform door controller to be tested according to the preset switching-on/off frequency, and transmits command signals to the platform door controller to be tested through the switching circuit 10;
the processor 40 receives a feedback signal transmitted by the door controller of the station to be tested based on the command signal through the feedback circuit 20; the processor 40 outputs a test result according to the feedback signal and the fault data table of the station door controller to be tested.
The system comprises a signal simulation device, a switching circuit, a feedback circuit and a platform door controller, wherein the signal simulation device is used for simulating door opening/closing signals, the switching circuit is used for realizing low-voltage control and high-voltage output of a processor, and the feedback circuit is used for receiving a feedback signal transmitted by the platform door controller to be tested based on a command signal;
and the signal output end of the processor is used for being connected with the signal receiving end of the platform door controller to be tested through the switch circuit. The input end of the switch circuit is connected with the signal output end of the processor, and the output end of the switch circuit is connected with the signal receiving end of the door controller of the station to be tested. The input end of the feedback circuit is connected with the signal output end of the platform door controller to be tested, and the output end of the feedback circuit is connected with the signal receiving end of the processor. It should be noted that the switch circuit may be any circuit for implementing low-voltage control and high-voltage output, and is not limited herein. The feedback circuit may be any circuit for converting a high-voltage signal into a low-voltage signal that can be recognized and processed by a processor, and the specific circuit structure is not limited herein.
In a specific example, the number of the output terminals of the switch circuit may be multiple, and the number of the signal receiving terminals of the station door controller to be tested may correspond to the number of the output terminals, that is, signals with the same characteristic may be simultaneously output to the station door controller to be tested through the multiple output terminals of the switch circuit. For example, the command signals may include a panic or end gate monitoring signal, a close lock signal, a manual release signal, and a mode switch signal. When the controller outputs closing locking signals DLLS1, DLLS2, DCLS1 and DCLS2 to the controllers of the stations to be tested, the signals can be simultaneously output to the controller of the station door to be tested through a plurality of output ends of one switch circuit. It should be noted that the command signals with different characteristics may be output respectively in sequence, or may be output simultaneously by using a plurality of switch circuits, that is, the switch circuit may include a first switch circuit, a second switch circuit, a third switch circuit and a fourth switch circuit, and the monitoring signal, the close locking signal, the manual release signal and the mode switch signal of the emergency gate or the end gate are output through one of the switch circuits respectively. For example, the processor outputs an emergency door or end door monitoring signal to the platform door controller to be tested through the first switch circuit, outputs a closing locking signal to the platform door controller to be tested through the second switch circuit, outputs a manual release signal to the platform door controller to be tested through the third switch circuit, and outputs a module switch signal through the fourth switch circuit. The signal output terminal and the signal receiving terminal may include I/O ports.
The signal simulation equipment comprises a transformer and a cut-off device. The disconnection device may be any component having disconnection capability. In one particular example, the disconnect device is a relay. The movable contact of the relay is connected with the platform door controller to be tested, the fixed contact is connected with the transformer, and the coil is connected with the processor. The processor controls the conduction between the transformer and the platform door controller to be tested by electrifying the coil. Specifically, the transformer generates one path of alternating current double-cut signal and one path of alternating current single-cut signal, and sends the signals to a platform door controller to be tested, so as to simulate enable and open commands in an actual scene. The enable hard-line command is used for unlocking the electromagnetic lock, and the open command is used for opening the platform door. It should be noted that the processor may include a chip and a timer controller; the chip is used for sending the command signal, and the timer controller is used for conducting connection between the transformer and the platform controller of the door to be tested according to the preset on-off frequency.
And the processor outputs a test result according to the feedback signal and the fault data table of the platform door controller to be tested.
In one embodiment, the feedback signal comprises a hall signal; the fault data table comprises the names of fault components and parameters of fault states; the test result comprises a fault position and a fault type;
the processor acquires a motor rotating speed value corresponding to the Hall signal and compares the motor rotating speed value with a fault state parameter; the processor judges whether the platform door controller to be tested has a fault according to the comparison result; if the judgment result is yes, the processor outputs a fault position and a fault type corresponding to the name of the fault component according to the name of the fault component corresponding to the fault state; and if the judgment result is negative, the processor outputs a fault-free position and a fault-free type.
The Hall signal is a signal which is transmitted to the motor by the platform door controller to be tested to enable the motor to act, the processor can obtain a corresponding motor rotating speed value according to the Hall signal, and the motor rotating speed value is compared with the fault data table to obtain a test result. For example, the fault data table includes the name of the faulty component and the parameters of the fault status. And comparing the parameters of the fault state with the obtained motor rotating speed value, so that whether the fault occurs or not and the name of the fault component under the condition of the fault can be known, and the fault position and the fault type can be obtained.
In one embodiment, the feedback signal comprises a mode switch status signal; the fault data table comprises fault switch state combinations; the processor acquires a feedback state combination based on the state signals of the mode switches, compares the feedback state combination with the fault switch state combination, and outputs a test result according to the comparison result.
Specifically, the mode switch includes a combination switch state of four gears of automatic, isolation, manual on and manual off, and also includes a platform door serial loop state (on or off), a feedback state combination is obtained by obtaining a combination switch state signal and a platform door serial loop state signal, the feedback state combination is compared with a fault switch state combination, and whether the mode switch is abnormal or not can be judged according to a comparison result. The fault switch state combination table may be as follows:
in one embodiment, the processor comprises an upper computer and a control chip; the upper computer is connected with the control chip; and the upper computer receives the feedback signal transmitted by the control chip and outputs a test result based on the feedback signal and the fault data table of the platform door controller to be tested.
Specifically, the processor may be configured to send a command signal, receive a feedback signal, and output a test result according to the feedback signal and the fault data table. The control chip can also be used for sending command signals, receiving feedback signals and transmitting the feedback signals to the upper computer, and the upper computer outputs test results based on the feedback signals and a fault data table of the platform door controller to be tested.
In one embodiment, the processor comprises a timing controller, a chip and an upper computer; the timing controller indicates the on-off equipment to be switched on or off, the transformer is connected with the platform door controller to be tested according to the preset on-off frequency, the chip sends a command signal, receives a feedback signal and transmits the feedback signal to the upper computer, and the upper computer outputs a test result based on the feedback signal and a fault data table of the platform door controller to be tested. In one particular example, the chip may be a stm32 chip.
The function test device comprises a switch circuit, a feedback circuit, a signal simulation device and a processor connected with the signal simulation device. The signal simulation equipment comprises a transformer and a cut-off device. The processor indicates the on or off of the switching-on and switching-off equipment and the connection of the transformer and the platform door controller to be tested according to the preset switching frequency, so that a door opening or closing instruction is simulated, and the platform door controller to be tested is sent. The processor transmits command signals to the platform door controller to be tested through the switch circuit, and receives feedback signals transmitted by the platform door controller to be tested through the feedback circuit. After receiving the feedback signal, the processor compares the feedback signal with the fault data table, and therefore a test result is output. Through the functional test equipment, when the platform door controller to be tested is detected, the functional test equipment can complete the detection of the platform door controller to be tested only by electrifying the functional test equipment. Compared with the conventional functional test equipment which usually adopts manual and semi-manual control testing, the functional test equipment provided by the application obviously has the advantages of high efficiency and low false testing rate.
In one embodiment, as shown in fig. 2, the switching circuit 10 includes a transistor 101, a MOS transistor 103, and a voltage dividing resistor 105;
the voltage dividing resistor 105 includes a first voltage dividing resistor 1051 and a second voltage dividing resistor 1053 connected in series with the first voltage dividing resistor 1051;
the collector of the triode 101 is connected with one end of the first divider resistor 1051, the base is connected with the signal output end of the processor, and the emitter is grounded; the other end of the first voltage-dividing resistor 1051 is connected with one end of the second voltage-dividing resistor 1053;
the gate of the MOS 103 is connected to one end of the second voltage-dividing resistor 1053, the drain is connected to the signal input end of the station door controller to be tested, and the source is connected to the other end of the second voltage-dividing resistor 1053 and is used for connecting to an external power supply.
Specifically, the processor outputs a driving signal to the triode, the triode can be controlled to be switched on and off by controlling current, so that the voltage on the divider resistor is changed, the MOS tube is driven by voltage, the on-off of the MOS tube can be controlled by controlling the voltage change of the divider resistor, and the command signal input of the same characteristic is controlled. Further, the drain electrode of the MOS tube can be simultaneously divided into a plurality of circuits to be output to the gate controller of the station to be tested. It should be noted that, the first voltage-dividing resistor and the second voltage-dividing resistor are connected in series, and the two resistors may be connected through other components as intermediate elements, or may be directly connected in series, and are not limited herein.
The switch circuit can simultaneously output the command signals with the same characteristic and simultaneously detect, so that the efficiency is improved, the saving of IO ports and circuit components of an ARM chip is reduced, the test time is saved, and the software processing process is simplified.
In one embodiment, as shown in fig. 3, the switching circuit 10 further includes a diode 107 and a voltage regulator 109;
the anode of the diode 107 is connected with the signal output end of the processor, and the cathode of the diode is connected with the base electrode of the triode; the anode of the voltage regulator tube 109 is connected to one end of the second voltage-dividing resistor, and the cathode is connected to the other end of the second voltage-dividing resistor.
In particular, the use of diodes prevents reverse direction voltages from damaging the processor. The voltage stabilizing tube is used for stabilizing voltage of the voltage dividing resistor.
In one embodiment, as shown in fig. 4, the feedback circuit 20 includes a voltage dividing circuit 201, a current limiting circuit 203, a filter circuit 205, and an optical coupler driving circuit 207 connected in sequence;
the input end of the voltage division circuit 201 is connected with the signal output end of the platform door controller to be tested, and the output end of the optical coupling drive circuit 207 is connected with the signal input end of the processor.
The voltage dividing circuit may be any one of the voltage dividing circuits in the field, the current limiting circuit may be any one of the voltage dividing circuits in the field, and the filter circuit may be any one of the voltage dividing circuits in the field. When 110VDC high level is input, the optical coupler driving circuit is conducted, 5V of the input end of the optical coupler is input into the processor through voltage division of 3.3V, and the processor detects a feedback signal to judge whether the platform door controller to be detected is normal.
In one embodiment, as shown in fig. 5, the feedback circuit 20 further includes a voltage detection circuit 209;
one end of the voltage detection circuit 209 is connected to the signal input end of the processor, and the other end is connected to the signal output end of the door controller of the station to be tested.
Specifically, the voltage detection circuit detects the hall signal output by the platform door controller to be detected so as to judge whether the working voltage output to the motor by the platform door controller to be detected is normal. The voltage detection circuit may be any circuit for detecting a voltage, and the specific structure is not limited.
In an embodiment, as shown in fig. 6, the present application provides a functional testing method based on the above functional testing device, including:
s610, indicating the on or off of the on-off equipment and the connection between the transformer and the platform door controller to be tested according to the preset on-off frequency, and transmitting command signals to the platform door controller to be tested through the switching circuit;
specifically, the switching device is instructed to be switched on or off according to the preset switching frequency, the transformer is connected with the platform door controller to be tested, and therefore actual door opening/closing instructions are simulated. The command signals may include emergency door or port door monitoring signals, close lock signals, manual release signals, and mode switch signals.
S620, receiving a feedback signal transmitted by the platform door controller to be tested based on the command signal through a feedback circuit;
it should be noted that the feedback signal is converted into a signal that can be processed by the processor through the feedback circuit.
And S630, outputting a test result according to the feedback signal and the fault data table of the platform door controller to be tested.
Specifically, the test result is output by comparing the feedback signal with the content of the fault data table.
It should be understood that, although the steps in the flowchart of fig. 6 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least a portion of the steps in fig. 6 may include multiple sub-steps or multiple stages that are not necessarily performed at the same time, but may be performed at different times, and the order of performance of the sub-steps or stages is not necessarily sequential, but may be performed in turn or alternately with other steps or at least a portion of the sub-steps or stages of other steps.
In one embodiment, as shown in fig. 7, there is provided a function testing apparatus including:
the signal simulation module 710 is used for indicating the connection or disconnection of the disconnection equipment and the connection between the transformer and the platform door controller to be tested according to the preset disconnection frequency;
the command sending module 720 is used for transmitting a command signal to the platform door controller to be tested through the switching circuit;
the feedback signal receiving module 730 is used for receiving a feedback signal transmitted by the station door controller to be tested based on the command signal through the feedback circuit;
and the test result output module 740 is used for outputting the test result by the processor according to the feedback signal and the fault data table of the platform door controller to be tested.
For the specific definition of the function testing device, reference may be made to the definition of the function testing method above, and details are not repeated here. All or part of each module in the functional test method can be realized by software, hardware and a combination thereof. The modules can be embedded in a hardware form or independent from a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules.
The invention also provides a function test tool device which comprises a box body, a tool clamp, a power supply, a load trolley and the function test equipment; the power supply and the tool clamp are arranged on the box body; the power supply is connected with a transformer of the function test equipment; the power supply is connected with a transformer of the function test equipment;
the load trolley comprises a bearing plate, wheels, supporting legs and a protective cover; the bearing plate comprises a first face and a second face which are opposite; the protective cover is arranged on the first surface, and the bearing plate is used for arranging a motor; the supporting legs and the wheels are arranged on the second surface; the motor is used for connecting the signal output end of the platform door controller to be tested.
The protective cover is used for preventing workers from touching the charged part and opening the air holes simultaneously in the test process, and gas generated by the problems of short circuit and the like of the electronic board can be released through the air holes; increase volt ammeter and platform door controller board end to be tested and add the self-resuming protective tube, the circuit can automatic protection when overflowing, and the staff also can know that volt ammeter is unusual through observing the current voltmeter simultaneously, can in time break off the power, avoids long-time short circuit circular telegram, plays safe dual protection effect.
The embodiment of the invention also provides a function test system, which comprises the platform door controller and the function test equipment.
In one embodiment, the system further comprises an electromagnetic lock, an indicator light, a door machine load and a mode switch which are all connected with the signal output end of the platform door controller.
In one embodiment, a computer-readable storage medium is provided, having a computer program stored thereon, which when executed by a processor, performs the steps of:
indicating the on-off equipment to be switched on or off and the connection between the transformer and the platform door controller to be tested according to the preset on-off frequency, and transmitting a command signal to the platform door controller to be tested through the switching circuit;
receiving a feedback signal transmitted by the platform door controller to be tested based on the command signal through a feedback circuit;
and outputting a test result according to the feedback signal and a fault data table of the platform door controller to be tested.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in the embodiments provided herein may include non-volatile and/or volatile memory, among others. Non-volatile memory can include read-only memory (ROM), Programmable ROM (PROM), Electrically Programmable ROM (EPROM), Electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), Dynamic RAM (DRAM), Synchronous DRAM (SDRAM), Double Data Rate SDRAM (DDRSDRAM), Enhanced SDRAM (ESDRAM), Synchronous Link DRAM (SLDRAM), Rambus Direct RAM (RDRAM), direct bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (13)
1. A function test device is characterized by comprising a switch circuit, a feedback circuit, a signal simulation device and a processor connected with the signal simulation device; the signal simulation equipment is used for connecting a platform door controller to be tested; the signal output end of the processor is used for being connected with the signal receiving end of the platform door controller to be tested through the switch circuit, and the signal input end of the processor is used for being connected with the signal output end of the platform door controller to be tested through the feedback circuit;
the signal simulation equipment comprises a transformer and a switching-off device; the transformer is used for being connected with the platform door controller to be tested through the on-off equipment; the cut-off equipment is connected with the processor;
the processor instructs the on-off equipment to be switched on or off and the transformer to be connected with the platform door controller to be tested according to a preset on-off frequency, and transmits command signals to the platform door controller to be tested through the switching circuit; the command signals comprise emergency door or end door monitoring signals, closing locking signals, manual releasing signals and mode switch signals;
the processor receives a feedback signal through the feedback circuit; the feedback signal is obtained by the platform door controller to be tested based on the command signal transmission; and the processor outputs a test result according to the feedback signal and the fault data table of the platform door controller to be tested.
2. The functional test device of claim 1, wherein the feedback signal comprises a hall signal; the fault data table comprises the names of fault components and parameters of fault states; the test result comprises a fault position and a fault type;
the processor acquires a motor rotating speed value corresponding to the Hall signal and compares the motor rotating speed value with the fault state parameter;
the processor judges whether the platform door controller to be tested is in fault according to the comparison result;
if the judgment result is yes, the processor outputs a fault position and a fault type corresponding to the name of the fault component according to the name of the fault component corresponding to the fault state;
and if the judgment result is negative, the processor outputs a fault-free position and a fault-free type.
3. The functional test apparatus of claim 1 or 2, wherein the feedback signal comprises a mode switch status signal; the fault data table comprises fault switch state combinations;
and the processor acquires a feedback state combination based on each mode switch state signal, compares the feedback state combination with the fault switch state combination, and outputs the test result according to the comparison result.
4. The functional test apparatus according to claim 1, wherein the switching circuit includes a transistor, a MOS transistor, and a voltage dividing resistor; the voltage dividing resistor comprises a first voltage dividing resistor and a second voltage dividing resistor connected with the first voltage dividing resistor in series;
the collector of the triode is connected with one end of the first divider resistor, the base of the triode is connected with the signal output end of the processor, and the emitter of the triode is grounded; the other end of the first voltage-dividing resistor is connected with one end of the second voltage-dividing resistor;
the grid electrode of the MOS tube is connected with one end of the second voltage-dividing resistor, the drain electrode of the MOS tube is connected with the signal input end of the platform door controller to be tested, and the source electrode of the MOS tube is connected with the other end of the second voltage-dividing resistor and is used for being connected with an external power supply.
5. The functional test apparatus of claim 4, wherein the switching circuit further comprises a diode and a voltage regulator tube;
the anode of the diode is connected with the signal output end of the processor, and the cathode of the diode is connected with the base electrode of the triode; and the anode of the voltage-stabilizing tube is connected with one end of the second voltage-dividing resistor, and the cathode of the voltage-stabilizing tube is connected with the other end of the second voltage-dividing resistor.
6. The function test equipment according to claim 1, wherein the feedback circuit comprises a voltage division circuit, a current limiting circuit, a filter circuit and an optical coupling driving circuit which are connected in sequence;
the input end of the voltage division circuit is connected with the signal output end of the platform door controller to be tested, and the output end of the optocoupler driving circuit is connected with the signal input end of the processor.
7. The functional test apparatus of claim 6, wherein the feedback circuit further comprises a voltage detection circuit;
one end of the voltage detection circuit is connected with the signal input end of the processor, and the other end of the voltage detection circuit is connected with the signal output end of the platform door controller to be detected.
8. The functional test apparatus of claim 1, wherein the processor comprises an upper computer and a control chip; the upper computer is connected with the control chip;
and the upper computer receives the feedback signal transmitted by the control chip and outputs a test result based on the feedback signal and the fault data table of the platform door controller to be tested.
9. A function test method based on the function test apparatus of any one of claims 1 to 8, comprising:
according to a preset on-off frequency, indicating the on-off equipment to be turned on or off, connecting the transformer with the platform door controller to be tested, and transmitting a command signal to the platform door controller to be tested through the switching circuit; the command signals comprise emergency door or end door monitoring signals, closing locking signals, manual releasing signals and mode switch signals;
receiving a feedback signal by the feedback circuit; the feedback signal is obtained by the platform door controller to be tested based on the command signal transmission;
and outputting a test result according to the feedback signal and the fault data table of the platform door controller to be tested.
10. A function test apparatus to which the function test method of claim 9 is applied, comprising:
the signal simulation module is used for indicating the connection or disconnection of the switching-on and switching-off equipment and the connection of the transformer and the platform door controller to be tested according to a preset switching-on and switching-off frequency;
the command sending module is used for transmitting command signals to the platform door controller to be tested through the switching circuit; the command signals comprise emergency door or end door monitoring signals, closing locking signals, manual releasing signals and mode switch signals;
the feedback signal receiving module is used for receiving a feedback signal through a feedback circuit; the feedback signal is obtained by the platform door controller to be tested based on the command signal transmission;
and the test result output module is used for outputting a test result according to the feedback signal and the fault data table of the platform door controller to be tested.
11. A functional test tooling device, which is characterized by comprising a box body, a tooling clamp, a power supply, a load trolley and functional test equipment according to any one of claims 1 to 8; the power supply and the tool clamp are arranged on the box body; the power supply is connected with a transformer of the function test equipment;
the load trolley comprises a bearing plate, wheels, supporting legs and a protective cover; the bearing plate comprises a first face and a second face which are opposite; the protective cover is arranged on the first surface, and the bearing plate is used for arranging a motor; the supporting legs and the wheels are arranged on the second surface; the motor is used for connecting the signal output end of the platform door controller to be tested.
12. A functional test system comprising a station door controller and a functional test apparatus according to any one of claims 1 to 8.
13. The functional test system of claim 12, further comprising an electromagnetic lock, an indicator light, a door operator load, and a mode switch, all connected to the station door controller signal output.
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| CN112034280B (en) * | 2020-07-23 | 2023-08-08 | 郑州地铁集团有限公司运营分公司 | Portable platform door system multiplex detection switch testing arrangement |
| CN114115196A (en) * | 2021-11-24 | 2022-03-01 | 国汽智控(北京)科技有限公司 | Method, device, equipment and storage medium for detecting equipment reliability |
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