CN112683495B - Optical device frequency response measuring method and device with time domain analysis capability - Google Patents
Optical device frequency response measuring method and device with time domain analysis capability Download PDFInfo
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Abstract
The invention discloses an optical device frequency response measuring method with time domain analysis capability, which is characterized in that single-frequency optical signals are subjected to coherent elimination treatment, the obtained low-coherent optical signals are used as optical carriers, an optical vector analysis method based on microwave photons is used for carrying out frequency response measurement on an optical link comprising a plurality of optical devices to be measured, superposed frequency response information of the plurality of optical devices to be measured is obtained, and finally, the frequency response information of each optical device to be measured is separated from the superposed frequency response information in a time domain. The invention also discloses an optical device frequency response measuring device with time domain analysis capability. Compared with the prior art, the method can simultaneously measure a plurality of to-be-measured optical devices in one link, and has high time domain resolution and frequency domain resolution.
Description
Technical Field
The present invention relates to a method for measuring frequency response of an optical device, and more particularly, to a method and an apparatus for measuring frequency response of an optical device with time domain analysis capability.
Background
Frequency response measurement (including amplitude response, phase response, etc.) of the optical device is an indispensable step in the development and production processes of the optical device.
The commonly used optical device frequency response measuring methods mainly comprise a frequency sweep interference method and a microwave photon-based light vector analysis technology. The two most common methods in the frequency-sweeping interferometry are a spectrometer and an optical vector analysis technology based on the frequency-sweeping interferometry. Spectrometers typically measure the amplitude response of an optical device under Test (d.derickson, c.hentschel, and j.vobis.fiber optical Test and Measurement [ M ]. Pre (Hall, 1998, chap.1.8.1.) using a swept laser and an optical power meter, which is simple and easy to implement, but has limited resolution and can only measure the amplitude response. The optical vector analysis technology based on the sweep frequency interference method uses sweep frequency light of different polarization states to measure a matrix transmission function (Dawn K.Gifford, brian J.Soller, matthew S.Wolfe, and Mark E.Froggatt.optical vector network analyzer for single-scan measures of loss, group delay, and polarization mode dispersion [ J ]. Applied Optics,2005,44 (34): 7282-7286). The method can measure the complete frequency response of the optical device to be measured, including amplitude phase response, polarization response and the like, but the resolution is still limited by the typical sweep frequency laser (sweep frequency value 200 MHz), the precision is influenced by nonlinearity, and the cost is high.
The optical vector analysis technology based on microwave photons changes fine microwave frequency sweep into fine optical frequency sweep by modulating microwave signals onto optical carriers through an electro-optic modulator, overcomes the defect of low frequency domain resolution of the traditional optical vector analysis technology using a frequency sweep laser, and adopts two common methods of optical single-side modulation and optical double-side band modulation. An optical vector analysis Technology based on optical single-sideband modulation uses a single sideband to perform fine frequency sweeping (Pan, S. & Xue, M.ultra high-resolution optical vector analysis based on optical single-side band modulation [ J ]. Journal of light wave Technology,2017,35 (4): 836-845.), and the resolution can reach sub-hertz theoretically, but the dynamic range is limited due to the influence of stray introduced by the high-order sideband. An optical vector analysis technology based on optical double sidebands introduces an intermediate frequency signal by using an acousto-optic frequency shifter to generate an asymmetric double-sideband signal, thereby avoiding spurious introduced by a high-order sideband, improving the dynamic range, simultaneously using an optical frequency comb as a light source, greatly improving the measurement frequency spectrum range, achieving the current bandwidth of 1THz and the frequency domain resolution of 334Hz, (T.Qing, S.Li, Z.Tang, B.Gao, and S.Pan.optical vector analysis with time meter resolution,90-dB dynamic range and THz band and width [ J ] Nature Communications,2019,10, 5135.), but the cost of the method is very high.
In recent years, with the wide application of complex photonic systems, such as optically controlled beam forming networks, long-distance optical fiber communication, submarine hydrophone arrays, and the like, a need is provided for an optical device frequency response measurement technology with time domain resolution capability. However, the existing measurement method can only measure the overall response of a single transmission path, or measure a single optical device to be measured, cannot distinguish and extract the frequency response of each optical device to be measured in the optical subsystem, cannot measure multiple optical devices to be measured in one link simultaneously, cannot position the specific position of the optical device to be measured in the link, and is limited to be used in some specific scenes, such as determining whether a breakpoint occurs in the optical device to be measured.
Disclosure of Invention
The technical problem to be solved by the present invention is to overcome the defects of the prior art, and provide a method for measuring the frequency response of an optical device with time domain analysis capability, which can simultaneously measure a plurality of optical devices to be measured in a link and has high time domain resolution and frequency domain resolution.
A frequency response measurement method of an optical device with time domain analysis capability is characterized in that single-frequency optical signals are subjected to coherent elimination processing, the obtained low-coherent optical signals are used as optical carriers, an optical vector analysis method based on microwave photons is used for carrying out frequency response measurement on an optical link comprising a plurality of optical devices to be measured, superposed frequency response information of the plurality of optical devices to be measured is obtained, and finally, the frequency response information of each optical device to be measured is separated from the superposed frequency response information in a time domain.
Preferably, the performing the coherent elimination processing on the single-frequency optical signal specifically includes: and performing acousto-optic modulation on the single-frequency optical signal.
Preferably, the vector balance detection method is used to perform frequency response measurement on an optical link including a plurality of devices to be measured, and the following steps are specifically performed: dividing the detection optical signal into two paths, wherein one path passes through the optical link comprising the plurality of optical devices to be detected, and the other path does not pass through the optical link; and simultaneously carrying out photoelectric conversion and amplitude and phase detection on the two paths of detection light signals, and extracting the superposed frequency response information of the plurality of optical devices to be detected.
Preferably, the method for separating the frequency response information of each optical device to be measured from the superimposed frequency response information in the time domain specifically includes: converting the superposed frequency response information of the plurality of optical devices to be tested into time domain to obtain time domain responses of the plurality of optical devices to be tested separated in the time domain; then extracting time domain responses corresponding to different optical devices to be tested by adding Hamming window functions with different time widths to the time domain responses of the optical devices to be tested; and finally, converting the time domain response of each optical device to be tested to a frequency domain to obtain the frequency response information of each optical device to be tested.
Preferably, the light vector analysis method based on microwave photons is a light vector analysis method based on light single-side modulation or a light vector analysis method based on light double-side band modulation.
Based on the same inventive concept, the following technical scheme can be obtained:
an optical device frequency response measuring device with time domain analysis capability, comprising:
the low-coherence optical module is used for performing coherent elimination processing on the single-frequency optical signal to obtain a low-coherence optical signal;
the microwave photon-based optical vector analysis module is used for taking the low-coherence optical signal as an optical carrier and performing frequency response measurement on an optical link comprising a plurality of optical devices to be tested by using a microwave photon-based optical vector analysis method to obtain superposed frequency response information of the plurality of optical devices to be tested;
and the resolving module is used for separating the frequency response information of each optical device to be tested from the superposed frequency response information in the time domain.
Preferably, the low coherence light module comprises an acousto-optic modulator for acousto-optic modulation of a single frequency light signal.
Preferably, the microwave photon-based optical vector analysis module performs frequency response measurement on an optical link including a plurality of devices to be measured by using a vector balance detection method, which specifically includes: dividing the detection optical signal into two paths, wherein one path passes through the optical link comprising the plurality of optical devices to be detected, and the other path does not pass through the optical link; and simultaneously carrying out photoelectric conversion and amplitude and phase detection on the two paths of detection optical signals, and extracting superposed frequency response information of the plurality of optical devices to be detected.
Preferably, the resolving module specifically includes:
the frequency-time conversion module is used for converting the superposed frequency response information of the plurality of optical devices to be tested into a time domain to obtain time domain responses of the plurality of optical devices to be tested separated in the time domain;
the time domain windowing module is used for extracting time domain responses corresponding to different optical devices to be tested by adding Hamming window functions with different time widths to the time domain responses of the optical devices to be tested;
and the time-frequency conversion module is used for converting the time domain response of each optical device to be tested to the frequency domain to obtain the frequency response information of each optical device to be tested.
Preferably, the microwave photon-based optical vector analysis module is an optical vector analysis module based on optical single-side modulation, or an optical vector analysis module based on optical double-side band modulation.
Compared with the prior art, the technical scheme of the invention has the following beneficial effects:
the invention has carried on the deep study to the problem that the existing light vector analysis technology based on microwave photon lacks the time domain resolving power, found the fundamental reason to produce this problem lies in the limit of light domain interference and light source phase noise, the invention is based on this discovery, use the low coherent light carrier as the carrier signal based on light vector analysis method of microwave photon, reduce the interference among the frequency response of a plurality of optical devices to be measured greatly, make the frequency response of each optical device to be measured separate in the time domain, thus have higher time domain resolution at the same time of the very high frequency domain resolution, can measure a plurality of optical devices to be measured in a periodic line;
the invention further improves the existing microwave photon-based optical vector analysis technology, adopts vector balance detection, divides the detection optical signals into a reference path and a detection path, and simultaneously carries out photoelectric conversion, amplitude and phase detection on the two detection optical signals, thereby effectively eliminating the dynamic error of the system and greatly reducing the jitter of phase response measurement, thereby improving the measurement stability of the system and further improving the time domain resolution precision of the system;
the time domain unambiguous range of the invention is determined by the reciprocal of the microwave sweep interval, the sweep range of 5MHz corresponds to the time domain unambiguous range of 200ns, and the high unambiguous range can be obtained by using fine sweep.
Drawings
FIG. 1 is a schematic structural diagram of an embodiment of the present invention;
FIG. 2 is a reflection-type measurement structure of the optical link to be measured in FIG. 1;
FIG. 3 is a straight-through measurement structure of the optical link to be measured in FIG. 1;
FIG. 4 shows the results of an effect verification test, wherein (a) is a reflection measurement scheme; (b) the measured superimposed frequency response; (c) time domain response after inverse fourier transform; (d) (f) mirror amplitude and phase responses measured by microwave photon single-sideband optical vector analysis are adopted; (e) (g) the mirror amplitude phase response measured by the method of the invention; (h) (i) (j) are respectively measured by adopting microwave photon single-sideband light vector analysis, microwave photon double-sideband light vector analysis and the method of the invention 12 C 2 H 2 A gas cavity amplitude response; (k) (l) (m) are respectively measured by adopting microwave photon single-sideband light vector analysis, microwave photon double-sideband light vector analysis and the method of the invention 12 C 2 H 2 A gas cavity phase response; (n) (o) (p) are respectively H measured by adopting microwave photon single-sideband light vector analysis, microwave photon double-sideband light vector analysis and the method of the invention 13 C 14 N gas chamber amplitude response; (q) (r)(s) are based on microwave photon single-sideband light vector analysis and microwave photon double-sideband light vector division respectivelyAnalysis of H measured by the method of the invention 13 C 14 N gas chamber phase response.
Detailed Description
Aiming at the defect of lack of time domain resolution capability in the existing frequency response measurement technology, the invention adopts a low-coherence optical carrier as a carrier signal of a microwave photon-based optical vector analysis method on the basis of the existing microwave photon-based optical vector analysis technology, thereby greatly reducing the interference among the frequency responses of a plurality of to-be-measured optical devices, enabling the frequency responses of the to-be-measured optical devices to be separated in the time domain, and further realizing the simultaneous measurement of the frequency responses of the to-be-measured optical devices in one link.
The inventor conducts a great deal of research and analysis on the existing light vector analysis technology based on microwave photons, and finds that the existing light vector analysis technology based on microwave photons only measures a single to-be-detected light device, and the coherence length of the optical carrier output by a laser (the line width is generally in the order of kHz) is longer (the coherence length corresponding to kHz is 10) because a laser with a narrower line width is used (the line width is generally in the order of kHz) 5 Meter), when a plurality of optical devices to be measured are measured, the responses of the optical devices to be measured are in a superposed state in both a frequency domain and a time domain due to a strong interference effect, so that the responses of different optical devices to be measured are difficult to distinguish.
Based on the above findings, the present invention proposes the following technical solutions:
a frequency response measurement method of an optical device with time domain analysis capability is characterized in that single-frequency optical signals are subjected to coherent elimination processing, the obtained low-coherent optical signals are used as optical carriers, an optical vector analysis method based on microwave photons is used for carrying out frequency response measurement on an optical link comprising a plurality of optical devices to be measured, superposed frequency response information of the plurality of optical devices to be measured is obtained, and finally, the frequency response information of each optical device to be measured is separated from the superposed frequency response information in a time domain.
An optical device frequency response measuring device with time domain analysis capability, comprising:
the low-coherence optical module is used for performing coherent removal processing on the single-frequency optical signal to obtain a low-coherence optical signal;
the microwave photon-based optical vector analysis module is used for taking the low-coherence optical signal as an optical carrier and performing frequency response measurement on an optical link comprising a plurality of optical devices to be measured by using a microwave photon-based optical vector analysis method to obtain superposed frequency response information of the plurality of optical devices to be measured;
and the resolving module is used for separating the frequency response information of each optical device to be tested from the superposed frequency response information in the time domain.
The coherent removal processing in the scheme can be realized by adopting the prior art of acousto-optic modulation, DFB laser direct modulation, external cavity laser direct modulation, modulation of a microwave signal with a certain bandwidth, or filtering of an optical carrier wave with a specific wavelength from an ASE source, and the like.
The light vector analysis method based on microwave photons in the scheme can be a light vector analysis method based on light single-side modulation, a light vector analysis method based on light double-side band modulation and further improvement schemes of the methods; however, because these methods lack the reference path signal or do not receive and process the reference path and the detection path at the same time, the dynamic error of the system can not be eliminated in real time in the measuring process, and the measuring precision is affected, the existing solution includes error compensation in the subsequent digital signal processing process, and measuring and taking the average value for many times to reduce the error, and the system structure is complex and the implementation cost is high; therefore, the invention further improves the existing light vector analysis technology based on microwave photons, and adopts a vector balance detection method, namely, the detection light signals are divided into a reference path and a detection path, and the two detection light signals simultaneously carry out photoelectric conversion and amplitude and phase detection; therefore, the dynamic error of the system can be effectively eliminated, and the jitter of phase response measurement is greatly reduced, so that the measurement stability of the system is improved, and the time domain resolution precision of the system is further improved.
The above technical solution is applicable to both reflection type measurement and straight-through type measurement.
For the public understanding, the technical scheme of the invention is explained in detail by a specific embodiment and the accompanying drawings:
the optical device frequency response measuring apparatus in this embodiment includes: the structure of the low coherent light module, the microwave photon-based light vector analysis module and the resolving module is shown in fig. 1 (the resolving module is not shown in fig. 1), and the low coherent light module specifically comprises a narrow line width laser, an arbitrary waveform generator, an acousto-optic modulator, a microwave source, an optical link to be detected, a photoelectric detector, a microwave amplitude-phase extraction module, a plurality of optical couplers and an optical circulator.
As shown in fig. 1, after a single-frequency optical signal output by a narrow linewidth laser is modulated into a low-coherence optical carrier by an acousto-optic modulator, an optical single-sideband modulation is performed on the low-coherence optical carrier by a microwave signal generated by a microwave source to generate an optical single-sideband modulation signal with the low-coherence optical carrier, wherein the specific operation of the de-coherence processing is to use an arbitrary waveform generator to generate a microwave signal (typical parameters: frequency 200MHz, bandwidth 100 MHz) with a certain bandwidth, and modulate the microwave signal with the certain bandwidth onto the optical carrier output by the narrow linewidth laser by the acousto-optic modulator; dividing the optical single-side band modulation signal into two paths, wherein one path is used as a detection signal to carry out photoelectric detection after passing through a plurality of to-be-detected optical devices in an optical link to be detected, so as to obtain a microwave signal carrying amplitude-frequency response information of the plurality of to-be-detected optical devices, and the other path is used as a reference signal to directly carry out photoelectric detection; making the ratio of the two paths of detected microwave signals, and extracting the superposed frequency response information of a plurality of optical devices to be detected; and respectively calculating the frequency response information of the optical devices to be detected by using inverse Fourier transform, time domain windowing and Fourier transform.
In order to obtain more accurate measurement results, it is necessary to perform system calibration before measurement. In the calibration process before measurement, under the condition of straight-through measurement, as shown in fig. 2, a detection path does not receive a light measuring device, and a detection light signal directly enters a photoelectric detector; as shown in fig. 3, the detection path in the case of the reflection measurement is: the reflector is connected to the output end of the optical circulator, and the detection loop signal is led to the optical detector from the other output port of the optical circulator through the optical circulator and the reflector.
Let the frequency of the optical carrier be omega c The frequency of the microwave source is omega e . FIG. 1 shows (a) a spectrum diagram of a narrow linewidth laser output and (b) a spectrum diagram of a narrow linewidth laser output modulated by an acousto-optic modulatorThe spectrum diagram of the low coherent light carrier is made, and (c) is the spectrum diagram of the low coherent light carrier after single side band modulation.
Let the optical single sideband modulation signal be:
wherein H sys (ω c ) To measure the dynamic response of the system, A -1 And A 0 The complex amplitudes of the-1 order sidebands and the carrier, respectively.
The optical splitter is divided into two paths, wherein a detection path signal measures a plurality of optical devices to be measured through the circulator, and a reflected signal is as follows:
wherein H tot And (omega) is the superposed spectral response of all the optical devices to be tested. The photocurrent after photodetection was:
wherein eta p To measure the responsivity of a photoelectric detector of a road. In the same way, the photocurrent of the reference path signal after photoelectric detection is as follows:
wherein eta is r Is the responsivity of the reference path photoelectric detector. The microwave amplitude-phase detector is used for simultaneously extracting amplitude-phase information of two paths of photocurrents, and the superposed spectrum response of all the optical devices to be detected can be obtained through the following formula:
the method for calculating the frequency response of each optical device to be measured from the superimposed spectrum response (as shown in fig. 4 (b)) specifically includes the following steps:
converting the obtained superposed frequency response into time domain information by using inverse Fourier transform to obtain a series of time domain response pulses corresponding to different optical devices to be tested, wherein the responses originally mixed together in the frequency domain are distinguished in the time domain; extracting time domain responses corresponding to different optical devices to be tested aiming at the time domain responses corresponding to the different optical devices to be tested and the hamming window functions with different time widths, wherein the time width of the window function comprises time domain response pulses of all the corresponding optical devices to be tested, and simultaneously avoids comprising time domain response pulses corresponding to other optical devices to be tested; and performing fast Fourier transform on the extracted time domain response to obtain the frequency response of different optical devices to be tested.
In order to verify the effect of the technical scheme of the invention, a verification test is carried out. FIG. 4 shows the actual measurement results by the above-mentioned scheme, and compared with the existing light vector analysis methods based on light single-sideband modulation and light double-sideband modulation, wherein the optical link under test adopts the reflective measurement method shown in (a), and the optical device 1 under test is the optical device under test 1 12 C 2 H 2 A gas cavity with the optical device 2 to be measured as H 13 C 14 An N gas cavity; wherein (b) is the measured superimposed frequency response information of the optical devices to be measured; performing inverse Fourier transform on the superimposed frequency response information to obtain time domain response shown in the step (c), wherein the responses which are originally mixed together in the frequency domain are distinguished in the time domain; the method comprises the steps of extracting time domain responses corresponding to different optical devices to be tested by aiming at the time domain responses corresponding to the different optical devices to be tested and different Hamming window functions with different time widths, and then using fast Fourier transform on the extracted time domain responses to obtain frequency responses of the different optical devices to be tested, wherein the frequency responses comprise amplitude responses (j) of the optical devices to be tested 1, phase responses (m) of the optical devices to be tested 1, amplitude responses (p) of the optical devices to be tested 2 and phase responses(s) of the optical devices to be tested 2, and the frequency responses (j), (m), (p) and(s) of the optical devices to be tested are shown.
The amplitude-phase response of the devices under test 1 and 2 using the optical vector analysis measuring mirror based on optical single-sideband modulation is shown in (d), (f), (h), (k), (n) and (q) of fig. 4, and the amplitude-phase response of the devices under test 1 and 2 using the optical vector analysis measuring mirror based on optical double-sideband modulation is shown in (e), (g), (i), (l), (o) and (r) of fig. 4. It can be seen that the method of the present invention is more accurate than the optical vector analysis measurement result based on optical single-sideband modulation, the measurement result jitter is similar to the optical vector analysis based on optical double-sideband modulation, and a plurality of optical devices to be measured can be measured at one time.
Claims (8)
1. A frequency response measurement method of an optical device with time domain analysis capability is characterized in that a single-frequency optical signal is subjected to coherent removal processing, the obtained low-coherence optical signal is used as an optical carrier, an optical vector analysis method based on microwave photons is used for carrying out frequency response measurement on an optical link comprising a plurality of optical devices to be measured, superposed frequency response information of the plurality of optical devices to be measured is obtained, and finally, the frequency response information of each optical device to be measured is separated from the superposed frequency response information in a time domain; the method for separating the frequency response information of each optical device to be tested from the superimposed frequency response information in the time domain specifically comprises the following steps: converting the superposed frequency response information of the plurality of optical devices to be tested into time domain to obtain time domain responses of the plurality of optical devices to be tested separated in the time domain; then extracting the time domain responses corresponding to different optical devices to be tested by adding Hamming window functions with different time widths to the time domain responses of the optical devices to be tested; and finally, converting the time domain response of each optical device to be tested to a frequency domain to obtain the frequency response information of each optical device to be tested.
2. The method for measuring frequency response of an optical device with time domain analysis capability according to claim 1, wherein the performing the decorrelation process on the single-frequency optical signal specifically comprises: and performing acousto-optic modulation on the single-frequency optical signal.
3. The method as claimed in claim 1, wherein the frequency response of the optical device with time domain analysis capability is measured by using a vector balance detection method for the optical link including a plurality of optical devices to be tested, and the method comprises the following steps: dividing the detection optical signal into two paths, wherein one path passes through the optical link comprising the plurality of optical devices to be detected, and the other path does not pass through the optical link; and simultaneously carrying out photoelectric conversion and amplitude and phase detection on the two paths of detection optical signals, and extracting superposed frequency response information of the plurality of optical devices to be detected.
4. The method as claimed in claim 1, wherein the method for analyzing the optical vector based on the microwave photons is a method for analyzing the optical vector based on single-side modulation or a method for analyzing the optical vector based on double-side band modulation.
5. An optical device frequency response measuring device with time domain analysis capability, comprising:
the low-coherence optical module is used for performing coherent elimination processing on the single-frequency optical signal to obtain a low-coherence optical signal;
the microwave photon-based optical vector analysis module is used for taking the low-coherence optical signal as an optical carrier and performing frequency response measurement on an optical link comprising a plurality of optical devices to be measured by using a microwave photon-based optical vector analysis method to obtain superposed frequency response information of the plurality of optical devices to be measured;
the calculating module is used for separating the frequency response information of each optical device to be tested from the superposed frequency response information in a time domain, and specifically comprises:
the frequency-time conversion module is used for converting the superposed frequency response information of the plurality of optical devices to be tested into a time domain to obtain time domain responses of the plurality of optical devices to be tested separated in the time domain;
the time domain windowing module is used for extracting time domain responses corresponding to different optical devices to be tested by adding Hamming window functions with different time widths to the time domain responses of the optical devices to be tested;
and the time-frequency conversion module is used for converting the time domain response of each optical device to be tested to the frequency domain to obtain the frequency response information of each optical device to be tested.
6. The optical device frequency response measurement apparatus with time domain analysis capability of claim 5, wherein the low coherence optical module comprises an acousto-optic modulator for acousto-optic modulation of a single frequency optical signal.
7. The apparatus of claim 5, wherein the microwave photon-based optical vector analysis module performs a frequency response measurement on an optical link including a plurality of optical devices to be measured by using a vector balance detection method, and the method comprises: dividing the detection optical signal into two paths, wherein one path passes through the optical link comprising the plurality of optical devices to be detected, and the other path does not pass through the optical link; and simultaneously carrying out photoelectric conversion and amplitude and phase detection on the two paths of detection light signals, and extracting the superposed frequency response information of the plurality of optical devices to be detected.
8. The time domain, optical device frequency response measuring apparatus of claim 5, wherein the microwave photon based optical vector analysis module is an optical single-side modulation based optical vector analysis module or an optical double-side band modulation based optical vector analysis module.
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