CN109084961B - Optical device spectral response measurement method and device based on suppressed carrier frequency - Google Patents
Optical device spectral response measurement method and device based on suppressed carrier frequency Download PDFInfo
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- G—PHYSICS
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- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
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Abstract
The optical device spectral response measurement method based on suppressed carrier frequency that the invention discloses a kind of.In the case where the small index of modulation by frequency be ωeRF signal strength be modulated to frequency be ω0Light carrier on, generate carrier wave and the repressed light double-sideband signal of even order sideband；The light double-sideband signal is divided into two-way, is all the way reference arm electric signal as the direct photoelectric conversion of reference arm, another way is as test road, and photoelectric conversion is test road electric signal after optical device to be measured；With 2 ω in reference arm electric signaleComponent extracts 2 ω e component I (2 ω in test road electric signal as referencee)；Then amplitude response of the optical device to be measured at 0 frequency of ω is obtained | H (ω0) |, DELAY RESPONSE τ (ω0).The optical device spectral response measuring device based on suppressed carrier frequency that the invention also discloses a kind of.The present invention can measure the amplitude spectrum response and time delay spectral response of optical device simultaneously, and can greatly improve measuring accuracy and dynamic range.
Description
Technical field
The present invention relates to optical device field of measuring technique more particularly to a kind of optical device spectral responses based on suppressed carrier frequency
Measurement method and device.
Background technique
The measurement of the spectral response of photonic device is very crucial for device manufactures and system designs.In recent years,
With the rapid development of laser technology, photonic system is widely used, and speed fiber optic communication systems of new generation, backbone pass
It is defeated, airborne carrier-borne fly by light system, in Optical Controlled Phased Array Antenna system and E-O Weapons system, to high speed optical electrical and
The test of electrical/optical converter, fiber amplifier, laser, detector etc. proposes requirements at the higher level.However, optical measurement techniques
Development but stagnates, and makes the research and development of high-precision optical device and has difficulty in taking a step, but also but also existing optical device
Maximum utility can not be played in photosystem.
Modulation phase shift method is used to measure the group delay of long-distance optical fiber, SHIRO RYU, YUKIO in 1989 earliest
HORIUCHI and KIYOFUMI MOCHIZUKI is in " Novel Chromatic Dispersion Measurement Method
Over Continuous Gigahertz Tuning Range”(S.Ryu,Y.Horiuchi,and K.Mochizuki,
“Novel chromatic dispersion measurement method over continuous gigahertz
Tuning range, " J.Lightwave Technol., vol.7, pp.1177-1180, Aug.1989.) in detail derive
The principle formula of modulation phase shift method, and the dispersion of optical fiber is measured, as a result coincide with traditional interferometry fine, card
The feasibility of the method is illustrated.Modulation phase shift method formally enters in the sight of people later, starts to be widely used in measuring optical fiber
Dispersion, Bragg grating the optical devices parameter such as group delay.
In order to realize fine, the various dimensions measurement of high-precision optical device spectral response, J.E.Roman is proposed within 1998
Light vector analysis method based on optical SSB modulation.The essence of this method be the frequency sweep operation of area of light is transformed into electrical domain into
Row, benefits from mature electric spectrum analysis technique, and test fineness haves a qualitative leap.There is researcher 38GHz's
The optical device for realizing Measurement Resolution up to 78kHz in frequency range measures, compared to the measurement knot of commercial light vector analyzer
Fruit, response measured by this method more clearly from reflect the response of optical device to be measured.However the light vector analytical technology is still
Face that measurement range is relatively narrow, dynamic range is smaller and these three larger key challenges of measurement error.
Summary of the invention
The technical problem to be solved by the present invention is to overcome the deficiencies of the prior art and to provide a kind of light based on suppressed carrier frequency
Device spectral response measurement method, can measure the amplitude spectrum response and time delay spectral response of optical device simultaneously, and can substantially mention
High measurement accuracy and dynamic range.
The present invention specifically uses following technical scheme to solve above-mentioned technical problem:
Frequency is by a kind of optical device spectral response measurement method based on suppressed carrier frequency in the case where the small index of modulation
ωeRF signal strength be modulated to frequency be ω0Light carrier on, generate carrier wave and the repressed light double-sideband of even order sideband
Signal；The light double-sideband signal is divided into two-way, is all the way reference arm electric signal as the direct photoelectric conversion of reference arm, it is another
Road is as test road, and photoelectric conversion is test road electric signal after optical device to be measured；With 2 ω in reference arm electric signalePoint
Amount extracts 2 ω in test road electric signal as referenceeComponent I (2 ωe)；Then optical device to be measured is obtained according to following formula
In ω0Amplitude response at frequency | H (ω0) |, DELAY RESPONSE τ (ω0)
Wherein, Ical(2ωe) it is to be not connected in test road under the conditions of optical device to be measured in the electric signal of extracted test road
2 ωeComponent；Ang () is the function for seeking angle, for plural A=a*exp (j θ), defines ang (A)=θ.
Further, this method further include: it controls the light carrier frequency sweep and repeats the above measurement process in each Frequency point,
Obtain the amplitude spectrum response and time delay spectral response of optical device to be measured.
Preferably, 2 ω in test road electric signal are extracted using vector network analyzereComponent.
Following technical scheme can also be obtained according to identical invention thinking:
A kind of optical device spectral response measuring device based on suppressed carrier frequency, comprising:
Electro-optical Modulation unit is used in the case where the small index of modulation be ω by frequencyeRF signal strength be modulated to
Frequency is ω0Light carrier on, generate carrier wave and the repressed light double-sideband signal of even order sideband；
Beam splitter is used as reference arm, another way is as test for the light double-sideband signal to be divided into two-way all the way
Road；
Two photodetectors are respectively used to the optical signal photoelectric conversion of reference arm and test road be reference arm telecommunications
Number, test road electric signal；
Width phase extraction unit, for 2 ω in reference arm electric signaleComponent extracts test road electric signal as reference
In 2 ωeComponent；
Main control unit, for obtaining optical device to be measured in ω according to following formula0Amplitude response at frequency | H (ω0)|、
DELAY RESPONSE τ (ω0)
Wherein, I (2 ωe)、Ical(2ωe) it is respectively to connect optical device to be measured in test road and be not connected to optical device item to be measured
2 ω under part in extracted test road electric signaleComponent；Ang () is the function for seeking angle, for plural A=a*exp (j
θ), ang (A)=θ is defined.
Further, the main control unit is also used to control the light carrier frequency sweep and measures more than each Frequency point repeats
Process obtains the amplitude spectrum response and time delay spectral response of optical device to be measured.
Preferably, the width phase extraction unit is vector network analyzer.
Compared with prior art, technical solution of the present invention has the advantages that
One, the present invention does not use traditional modulation phase shift method based on double sideband modulation, can using carrier suppressed modulation
Phase error caused by reducing because as the amplitude response of double-side band is incomplete, improves the precision of measurement；
Two, positive and negative single order sideband is only remained after suppressed carrier of the present invention under small signal hypothesis, under even order sideband is all suppressed
It goes, eliminates the high-order sideband bring error of traditional double-sideband modulation system.
Detailed description of the invention
Fig. 1 is the principle schematic diagram of one preferred embodiment of optical device spectral response measuring device of the present invention；
Fig. 2 is the spectrum comparison in Fig. 1 at different location.
Specific embodiment
In view of the shortcomings of the prior art, resolving ideas of the invention is improved to modulation phase shift method, inhibited using carrier wave
Modulate reduce because the amplitude response of double-side band it is not exclusively the same caused by phase error, improve the precision of measurement, and by small
Signal modulation inhibits even order sideband, to eliminate high-order sideband bring error.
Optical device spectral response measurement method based on suppressed carrier frequency proposed by the invention is specific as follows:
In the case where the small index of modulation by frequency be ωeRF signal strength be modulated to frequency be ω0Light carrier
On, generate carrier wave and the repressed light double-sideband signal of even order sideband；The light double-sideband signal is divided into two-way, conduct all the way
The direct photoelectric conversion of reference arm is reference arm electric signal, and another way is as test road, and photoelectric conversion is after optical device to be measured
Test road electric signal；With 2 ω in reference arm electric signaleComponent extracts 2 ω in test road electric signal as referenceeComponent I
(2ωe)；Then optical device to be measured is obtained in ω according to following formula0Amplitude response at frequency | H (ω0) |, DELAY RESPONSE τ
(ω0)
Wherein, Ical(2ωe) it is to be not connected in test road under the conditions of optical device to be measured in the electric signal of extracted test road
2 ωeComponent；Ang () is the function for seeking angle, for plural A=a*exp (j θ), defines ang (A)=θ.
Further, this method further include: it controls the light carrier frequency sweep and repeats the above measurement process in each Frequency point,
Obtain the amplitude spectrum response and time delay spectral response of optical device to be measured.
For the ease of public understanding, below with a preferred embodiment and in conjunction with attached drawing come to technical solution of the present invention into
Row is described in detail:
As shown in Figure 1, the optical device spectral response measuring device in the present embodiment includes: tunable laser source, intensity tune
Device, microwave module, Bias point control device, beam splitter, photodetector 1 and photodetector 2 processed, width phase extraction module, control
System and data processing module.Microwave signal (the frequency ω that intensity modulator exports microwave modulee) intensity modulated is in adjustable
Light carrier (the frequency ω of humorous laser source output0) on, intensity modulator is biased in by minimum transfer by Bias point control device
Operating point, generate carrier wave inhibit, the repressed light double-sideband signal of even order sideband, then two-way is divided by beam splitter, all the way for
Reference arm directly converts optical signals to reference arm electric signal by photodetector 2；It is all the way test road, detectable signal is first
After optical device to be measured transmission, then inputs photodetector 1 and convert optical signals to test road electric signal, width phase extraction module
(vector network analyzer is used in the present embodiment) is with 2 ω in reference arm electric signaleComponent extracts test road electricity as reference
2 ω in signaleComponent；Control and data processing module are to extracted 2 ωeComponent information is handled, and can be obtained to be measured
Optical device is in optical carrier frequency ω0The amplitude response and DELAY RESPONSE information at place；Change tunable laser source output optical signal
Wavelength simultaneously repeats the above process, and the amplitude spectrum response and time delay spectral response of optical device to be measured can be obtained.
In order to make the public be more clearly understood that technical solution of the present invention, the measuring principle of Fig. 1 shown device is carried out below
It is discussed in detail:
This programme, in the intensity modulator of minimum transfer point, the rf-signal modulation of low frequency is swashed to tunable using work
On the light carrier of light device output, the light modulating signal of suppressed carrier is generated.The power for controlling radiofrequency signal makes modulator work exist
In the case of the small index of modulation, at this point, the influence of negligible high-order sideband.Thus, the light modulating signal of output is represented by
E1(t)=A1exp(j(ω0-ωe)t)+A1exp[j(ω0+ωe)t]
(1)
Wherein, A1It is the complex magnitude of ± 1 rank sideband of carrier suppressed signal.And ωoAnd ωeRespectively light carrier and radio frequency
The angular frequency of signal.Spectrum comparison in Fig. 1 at two positions a, b is as shown in Figure 2.
After beam splitter, carrier wave inhibits optical signal to be divided into test road and reference arm, and test road is inputting device to be measured
Optical signal before part is
Ein(t)=A1'exp[j(ω0-ωe)t]+A1'exp[j(ω0+ωe)t] (2)
Wherein, A1' it is the complex magnitude for measuring ± 1 rank sideband in road.After device under test, which carries device to be measured
Part transfer function H (ω) information, may be expressed as:
Eout(t)=A1'H(ω0-ωe)exp(j(ω0-ωe)t)+A1'H(ω0+ωe)exp[j(ω0+ωe)t]
(3)
Wherein H (ω0-ωe) and H (ω0+ωe) it is device under test in ω0-ωeAnd ω0+ωeOn frequency response.Using
Photodetector carries out square law detection to optical signal, and the transfer function information taken is transferred to electrical domain.Due to width Phase Receiver
Module only receives 2 ωeFrequency component, thus the photoelectric current received are as follows:
I (t)=η | A1'|2H(ωo+ωe)H*(ωo-ωe)exp(2jωet) (4)
Wherein, η is the transfer efficiency of photodetector, and (4) formula is written as frequency domain form:
I(2ωe)=η | A1'|2H(ωo+ωe)H*(ωo-ωe) (5)
It is reference with the photoelectric current of reference arm, width phase extraction module can obtain the amplitude and phase information of the photoelectric current.For
Influence of the measuring system to measurement result is eliminated, the amplitude and phase response letter of measuring system is obtained by the way of thru calibration
Breath (it is not connected to optical device to be measured in test road, and beam splitter output end detection light is directly inputted into photodetector 1,
And measure 2 ω of test road at this timeeFrequency component photoelectric current).In this case, the expression formula of photoelectric current is
Ical(2ωe)=η | A1'|2 (6)
Due to ωeMuch smaller than the swept frequency interval of laser, the amplitude at similar frequency is equal
|H(ω0-ωe)|≈|H(ω0+ωe)|≈|H(ω0)| (7)
By the available amplitude response of (5)~(7) formula are as follows:
DELAY RESPONSE can also be obtained from (5), (6) formula:
Wherein, ang () is the function for seeking angle, for plural A=a*exp (j θ), defines ang (A)=θ.
The frequency sweep process of control and data processing module control tunable laser source, and width Phase Receiver module is exported simultaneously
Amplitude and phase information handled and export optical device to be measured amplitude spectrum response and time delay spectral response.
Claims (6)
1. a kind of optical device spectral response measurement method based on suppressed carrier frequency, which is characterized in that the small index of modulation the case where
It is lower by frequency be ωeRF signal strength be modulated to frequency be ω0Light carrier on, generate carrier wave and even order sideband and be suppressed
Light double-sideband signal；The light double-sideband signal is divided into two-way, is all the way reference arm as the direct photoelectric conversion of reference arm
Electric signal, another way is as test road, and photoelectric conversion is test road electric signal after optical device to be measured；With reference arm electric signal
In 2 ωeComponent extracts 2 ω in test road electric signal as referenceeFrequency component photoelectric current I (2 ωe)；Then according to
Lower formula obtains optical device to be measured in ω0Amplitude response at frequency | H (ω0) |, DELAY RESPONSE τ (ω0)
Wherein, Ical(2ωe) it is extracted 2 ω tested in the electric signal of road under the conditions of being not connected to optical device to be measured in test roade
Frequency component photoelectric current；Ang () is the function for seeking angle, for plural A=a*exp (j θ), defines ang (A)=θ.
2. method as described in claim 1, which is characterized in that this method further include: control the light carrier frequency sweep and in each frequency
Rate point repeats the above measurement process, obtains the amplitude spectrum response and time delay spectral response of optical device to be measured.
3. method as claimed in claim 1 or 2, which is characterized in that extracted in test road electric signal using vector network analyzer
2 ωeComponent.
4. a kind of optical device spectral response measuring device based on suppressed carrier frequency characterized by comprising
Electro-optical Modulation unit is used in the case where the small index of modulation be ω by frequencyeRF signal strength be modulated to frequency and be
ω0Light carrier on, generate carrier wave and the repressed light double-sideband signal of even order sideband；
Beam splitter is used as reference arm, another way is as test road for the light double-sideband signal to be divided into two-way all the way；
Two photodetectors are respectively used to the optical signal photoelectric conversion of reference arm and test road be reference arm electric signal, survey
Try road electric signal；
Width phase extraction unit, for 2 ω in reference arm electric signaleComponent extracts 2 in test road electric signal as reference
ωeFrequency component photoelectric current；
Main control unit, for obtaining optical device to be measured in ω according to following formula0Amplitude response at frequency | H (ω0) |, time delay
Respond τ (ω0)
Wherein, I (2 ωe)、Ical(2ωe) it is respectively to connect optical device to be measured in test road and be not connected under the conditions of optical device to be measured
2 ω in extracted test road electric signaleFrequency component photoelectric current；Ang () is the function for seeking angle, for plural A=a*
Exp (j θ) defines ang (A)=θ.
5. device as claimed in claim 4, which is characterized in that the main control unit be also used to control the light carrier frequency sweep and
Each Frequency point repeats the above measurement process, obtains the amplitude spectrum response and time delay spectral response of optical device to be measured.
6. such as claim 4 or 5 described devices, which is characterized in that the width phase extraction unit is vector network analyzer.
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| CN110572215B (en) * | 2019-09-19 | 2020-09-08 | 南京航空航天大学 | Photon-assisted radio frequency signal receiving method and device and simultaneous same-frequency full duplex system |
| CN112268685B (en) * | 2020-10-20 | 2022-02-01 | 南京航空航天大学 | Optical device frequency response measuring method and measuring device |
| CN114448500A (en) * | 2020-11-03 | 2022-05-06 | 富士通株式会社 | Phase frequency response measuring method and device |
| CN112683495B (en) * | 2020-12-08 | 2022-11-25 | 苏州六幺四信息科技有限责任公司 | Optical device frequency response measuring method and device with time domain analysis capability |
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| CN103067075B (en) * | 2012-12-20 | 2016-01-06 | 南京航空航天大学 | Optical device measurement mechanism, method of measurement |
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