ZA898492B - Sensing the shape of an object - Google Patents

Sensing the shape of an object

Info

Publication number
ZA898492B
ZA898492B ZA898492A ZA898492A ZA898492B ZA 898492 B ZA898492 B ZA 898492B ZA 898492 A ZA898492 A ZA 898492A ZA 898492 A ZA898492 A ZA 898492A ZA 898492 B ZA898492 B ZA 898492B
Authority
ZA
South Africa
Prior art keywords
sensing
shape
Prior art date
Application number
ZA898492A
Other languages
English (en)
Inventor
Martin Phillip Smith
Phillip Smith Martin
Robin Wyncliffe Smith
Wyncliffe Smith Robin
Original Assignee
Gersan Anstalt
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gersan Anstalt filed Critical Gersan Anstalt
Publication of ZA898492B publication Critical patent/ZA898492B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2522—Projection by scanning of the object the position of the object changing and being recorded

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Lenses (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
  • Length Measuring Devices By Optical Means (AREA)
ZA898492A 1988-11-09 1989-11-08 Sensing the shape of an object ZA898492B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB888826224A GB8826224D0 (en) 1988-11-09 1988-11-09 Sensing shape of object

Publications (1)

Publication Number Publication Date
ZA898492B true ZA898492B (en) 1990-08-29

Family

ID=10646564

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA898492A ZA898492B (en) 1988-11-09 1989-11-08 Sensing the shape of an object

Country Status (10)

Country Link
US (1) US5076698A (xx)
EP (1) EP0368647B1 (xx)
JP (1) JPH03183904A (xx)
AU (1) AU619056B2 (xx)
CA (1) CA2002547C (xx)
DE (1) DE68908347T2 (xx)
GB (2) GB8826224D0 (xx)
IE (1) IE62699B1 (xx)
IL (1) IL92228A (xx)
ZA (1) ZA898492B (xx)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3204406B2 (ja) * 1991-10-30 2001-09-04 株式会社ニコン 面位置検出方法及び装置、半導体露光装置、並びに前記方法を用いた露光方法
FR2685764B1 (fr) * 1991-12-30 1995-03-17 Kreon Ind Capteur optique compact et a haute resolution pour l'analyse de formes tridimensionnelles.
DE4413758C2 (de) * 1993-04-21 1998-09-17 Fraunhofer Ges Forschung Vorrichtung und Verfahren zur Prüfung der Gestalt einer Oberfläche eines zu vermessenden Objektes
JPH0918234A (ja) * 1995-04-27 1997-01-17 Seiko Epson Corp 温度補償圧電発振器
US6141105A (en) * 1995-11-17 2000-10-31 Minolta Co., Ltd. Three-dimensional measuring device and three-dimensional measuring method
US6873340B2 (en) 1997-05-15 2005-03-29 Visimatix, Inc. Method and apparatus for an automated reference indicator system for photographic and video images
AU8492998A (en) * 1997-07-16 1999-02-10 Diversified Scientific, Inc. Method for acquiring, storing and analyzing crystal images
USD427243S (en) * 1997-12-15 2000-06-27 Visimatix, Inc. Reference indicator patch for use in an automated reference indicator system for photographic and video images
US6980283B1 (en) 1997-12-18 2005-12-27 Imagestatistics, Inc. Method and associated apparatus for the standardized grading of gemstones
US6020954A (en) * 1997-12-18 2000-02-01 Imagestatistics, Inc. Method and associated apparatus for the standardized grading of gemstones
DE19911419A1 (de) 1998-03-16 1999-10-14 Cyberoptics Corp Digitales Bereichssensorsystem
IL126809A (en) * 1998-10-29 2001-08-26 Sarin Technologies Ltd Apparatus and method of examining the shape of gemstones
US7244396B2 (en) 1999-04-06 2007-07-17 Uab Research Foundation Method for preparation of microarrays for screening of crystal growth conditions
US7250305B2 (en) 2001-07-30 2007-07-31 Uab Research Foundation Use of dye to distinguish salt and protein crystals under microcrystallization conditions
US20020164812A1 (en) * 1999-04-06 2002-11-07 Uab Research Foundation Method for screening crystallization conditions in solution crystal growth
US7247490B2 (en) 1999-04-06 2007-07-24 Uab Research Foundation Method for screening crystallization conditions in solution crystal growth
US7214540B2 (en) * 1999-04-06 2007-05-08 Uab Research Foundation Method for screening crystallization conditions in solution crystal growth
US6100990A (en) * 1999-06-14 2000-08-08 Ford Motor Company Method and apparatus for determining reflective optical quality using gray-scale patterns
US6208412B1 (en) 1999-06-14 2001-03-27 Visteon Global Technologies, Inc. Method and apparatus for determining optical quality
US6630006B2 (en) * 1999-06-18 2003-10-07 The Regents Of The University Of California Method for screening microcrystallizations for crystal formation
AU779164B2 (en) * 1999-11-05 2005-01-06 Imagestatistics, Inc. Method and associated apparatus for the standardized grading of gemstones
US6603561B2 (en) 2001-02-20 2003-08-05 Thomas D. Ditto Chromatic diffraction range finder
US7670429B2 (en) 2001-04-05 2010-03-02 The California Institute Of Technology High throughput screening of crystallization of materials
AT410602B (de) * 2001-12-12 2003-06-25 Swarovski & Co Verfahren zur vermessung der oberfläche eines geschliffenen schmucksteines
US7436498B2 (en) * 2005-06-08 2008-10-14 Sarin Technologies Ltd. Apparatus for determining the shape of a gemstone
JP2012225700A (ja) * 2011-04-18 2012-11-15 Mitsutoyo Corp 形状測定装置
US11574282B2 (en) 2019-12-20 2023-02-07 International Business Machines Corporation Optimal cargo space utilization based on detection of items

Family Cites Families (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US751347A (en) * 1904-02-02 -scheimpflug
FR1534762A (fr) * 1967-05-18 1968-08-02 Cilas Procédé et dispositif de palpage optique
DE1673927A1 (de) * 1968-02-09 1971-08-12 Philips Patentverwaltung Verfahren und Anordnung zur Wiedererkennung eines Koerpers oder seiner Position und Orientierung im Raum
GB1184633A (en) * 1968-02-16 1970-03-18 Trw Inc Image Spectrophotometer.
DE2113522C3 (de) * 1971-03-19 1974-05-09 Siemens Ag Verfahren zuna berühningsfreien Messen eines Oberflächenprofils
BE789234A (fr) * 1971-09-29 1973-01-15 Colorant Schmuckstein G M B H Procede et dispositif pour l'enregistrement des qualites de pierres de bijouterie
BE789819A (fr) * 1971-10-08 1973-02-01 Western Electric Co Procede et dispositif pour mesurer une dimension d'une piece
US3758188A (en) * 1972-06-06 1973-09-11 American Optical Corp Image-transmitting optical system
GB1416568A (en) * 1972-10-20 1975-12-03 Wilson S S Method of and apparatus for evaluating registering and identifying gemstones
US3879131A (en) * 1974-02-06 1975-04-22 Bell Telephone Labor Inc Photomask inspection by real time diffraction pattern analysis
US3943278A (en) * 1974-08-22 1976-03-09 Stanford Research Institute Surface deformation gauging system by moire interferometry
US4202630A (en) * 1975-01-15 1980-05-13 Fuji Photo Optical Co., Ltd. Method of and apparatus for recording surface irregularity of object
US4017188A (en) * 1975-02-26 1977-04-12 The Bendix Corporation Surface profile measuring device and method
SE404549B (sv) * 1976-12-07 1978-10-09 Hard Av Segerstad Sverker Anordning for faststellande av konditionen hos en yta eller inhomogeniteter i en transparent volym
US4158507A (en) * 1977-07-27 1979-06-19 Recognition Equipment Incorporated Laser measuring system for inspection
US4168908A (en) * 1977-12-30 1979-09-25 The United States Of America As Represented By The Secretary Of The Air Force Precision pointing and tracking control system
DE2929694A1 (de) * 1979-07-21 1981-02-12 Roland Man Druckmasch Vorrichtung zum messen des anstelldruckes zwischen zwei schmitzringen
US4336989A (en) * 1979-11-29 1982-06-29 Canon Kabushiki Kaisha Focusing screen
HU182123B (en) * 1980-04-17 1983-12-28 Budapesti Mueszaki Egyetem Method and apparatus for mesuring the physical characteristics of materials in motion using coherent light source with heterodyn sensing of the reflected or scattered light from the materials
GB2081439B (en) * 1980-06-04 1984-08-08 Gersan Ets Examining a gem stone
GB2080712B (en) * 1980-06-04 1983-12-21 Gersan Ets Centering and working gem stones
EP0042361A1 (de) * 1980-06-17 1981-12-23 GRETAG Aktiengesellschaft Verfahren und Vorrichtung zur maschinellen Identifikation von Edelsteinen
US4463600A (en) * 1980-09-23 1984-08-07 University Of Birmingham Automatic measurement of areas
JPS5767815A (en) * 1980-10-16 1982-04-24 Mitsuhiro Ueda Measuring method for position of reflector using light
US4455087A (en) * 1981-04-06 1984-06-19 Hamamatsu Systems Inc. Monochromatic imaging apparatus
GB2096793B (en) * 1981-04-06 1985-02-20 Gersan Ets Visually examining a gem stone
GB2103355B (en) * 1981-08-03 1985-08-07 Gersan Ets Examining a gemstone
US4428676A (en) * 1981-10-23 1984-01-31 International Business Machines Corporation Optical system for oblique viewing
EP0118504B1 (en) * 1982-09-04 1988-01-07 BERGSTRÖM, Arne Image monochromator
US4630925A (en) * 1982-11-01 1986-12-23 Hamamatsu Corp. Compact temporal spectral photometer
US4564295A (en) * 1983-03-07 1986-01-14 New York Institute Of Technology Apparatus and method for projection moire topography
GB2140503B (en) * 1983-05-27 1987-03-18 Graham Frank Loft Ejectors in i.c. engine exhaust systems
JPS6042606A (ja) * 1983-08-04 1985-03-06 ナノメトリツクス・インコ−ポレ−テツド 光学的寸法測定装置
US4657394A (en) * 1984-09-14 1987-04-14 New York Institute Of Technology Apparatus and method for obtaining three dimensional surface contours
SE447848B (sv) * 1985-06-14 1986-12-15 Anders Bengtsson Instrument for metning av ytors topografi
US4678324A (en) * 1985-12-04 1987-07-07 Thomas De Witt Range finding by diffraction
GB8603563D0 (en) * 1986-02-13 1986-03-19 Pilkington Brothers Plc Surface measurement
US4758093A (en) * 1986-07-11 1988-07-19 Robotic Vision Systems, Inc. Apparatus and method for 3-D measurement using holographic scanning
IE862086L (en) * 1986-08-05 1988-02-05 Bramleigh Ass Ltd Glass inspection
JPH0615972B2 (ja) * 1986-12-05 1994-03-02 ライトロン株式会社 距離測定方法及びその装置
US4786815A (en) * 1987-02-12 1988-11-22 K. J. Law Engineers, Inc. Non-contact sensor with particular utility for measurement of road profile
CA1297285C (en) * 1987-04-17 1992-03-17 Kevin G. Harding High accuracy structured light profiler
US4875777A (en) * 1987-09-30 1989-10-24 Industrial Technology Institute Off-axis high accuracy structured light profiler

Also Published As

Publication number Publication date
GB2226133A (en) 1990-06-20
EP0368647A2 (en) 1990-05-16
AU619056B2 (en) 1992-01-16
IL92228A0 (en) 1990-07-26
EP0368647A3 (en) 1990-12-19
GB8925307D0 (en) 1989-12-28
AU4443489A (en) 1990-05-17
US5076698A (en) 1991-12-31
EP0368647B1 (en) 1993-08-11
IL92228A (en) 1992-07-15
GB2226133B (en) 1993-05-05
JPH03183904A (ja) 1991-08-09
GB8826224D0 (en) 1988-12-14
IE62699B1 (en) 1995-02-22
CA2002547C (en) 2002-01-08
DE68908347D1 (de) 1993-09-16
CA2002547A1 (en) 1990-05-09
IE893612L (en) 1990-05-09
DE68908347T2 (de) 1993-11-25

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