ZA842056B - Radiation scatter apparatus and method - Google Patents

Radiation scatter apparatus and method

Info

Publication number
ZA842056B
ZA842056B ZA842056A ZA842056A ZA842056B ZA 842056 B ZA842056 B ZA 842056B ZA 842056 A ZA842056 A ZA 842056A ZA 842056 A ZA842056 A ZA 842056A ZA 842056 B ZA842056 B ZA 842056B
Authority
ZA
South Africa
Prior art keywords
density
determined
radiation scatter
pavement
radiation
Prior art date
Application number
ZA842056A
Other languages
English (en)
Inventor
John L Molbert
Eddie R Riddle
Original Assignee
Troxler Electronic Lab Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Troxler Electronic Lab Inc filed Critical Troxler Electronic Lab Inc
Publication of ZA842056B publication Critical patent/ZA842056B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Radiation-Therapy Devices (AREA)
  • Measurement Of Radiation (AREA)
  • Heating, Cooling, Or Curing Plastics Or The Like In General (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
ZA842056A 1983-03-22 1984-03-20 Radiation scatter apparatus and method ZA842056B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/477,820 US4525854A (en) 1983-03-22 1983-03-22 Radiation scatter apparatus and method

Publications (1)

Publication Number Publication Date
ZA842056B true ZA842056B (en) 1984-10-31

Family

ID=23897498

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA842056A ZA842056B (en) 1983-03-22 1984-03-20 Radiation scatter apparatus and method

Country Status (11)

Country Link
US (1) US4525854A (cs)
EP (1) EP0120676B1 (cs)
JP (1) JPS59218941A (cs)
AT (1) ATE40750T1 (cs)
AU (1) AU557007B2 (cs)
CA (1) CA1219970A (cs)
DE (1) DE3476698D1 (cs)
ES (1) ES8607546A1 (cs)
IL (1) IL71299A (cs)
NZ (1) NZ207628A (cs)
ZA (1) ZA842056B (cs)

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EP1357382A1 (en) * 2002-04-26 2003-10-29 Rijksuniversiteit te Groningen Method and system for determining a property of a pavement by measuring natural gamma radiation
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US7963695B2 (en) 2002-07-23 2011-06-21 Rapiscan Systems, Inc. Rotatable boom cargo scanning system
US8503605B2 (en) 2002-07-23 2013-08-06 Rapiscan Systems, Inc. Four sided imaging system and method for detection of contraband
US8275091B2 (en) 2002-07-23 2012-09-25 Rapiscan Systems, Inc. Compact mobile cargo scanning system
US6995667B2 (en) * 2002-12-23 2006-02-07 Instrotek, Inc. Systems, methods, and computer program products for automatic tracking and/or remote monitoring of nuclear gauges and/or data communication therewith
US6928141B2 (en) 2003-06-20 2005-08-09 Rapiscan, Inc. Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers
US7809109B2 (en) 2004-04-09 2010-10-05 American Science And Engineering, Inc. Multiple image collection and synthesis for personnel screening
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US7471764B2 (en) 2005-04-15 2008-12-30 Rapiscan Security Products, Inc. X-ray imaging system having improved weather resistance
EP1943479B1 (en) 2005-08-30 2019-11-13 Troxler Electronics Laboratories, Inc. Method and system for measuring the density of material
US7605366B2 (en) * 2005-09-21 2009-10-20 Troxler Electronic Laboratories, Inc. Nuclear density gauge
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US7526064B2 (en) 2006-05-05 2009-04-28 Rapiscan Security Products, Inc. Multiple pass cargo inspection system
RU2448342C2 (ru) * 2006-08-11 2012-04-20 Эмерикэн Сайэнс Энд Энджиниэринг, Инк. Система контроля объекта (варианты)
US8576982B2 (en) 2008-02-01 2013-11-05 Rapiscan Systems, Inc. Personnel screening system
US8638904B2 (en) 2010-03-14 2014-01-28 Rapiscan Systems, Inc. Personnel screening system
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JP6385369B2 (ja) 2013-01-31 2018-09-05 ラピスカン システムズ、インコーポレイテッド 運搬可能な安全性検査システム
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US9885566B2 (en) 2014-07-24 2018-02-06 Johnson Matthey Public Limited Company Apparatus for determining thickness of lining layer
EP3224797A4 (en) 2014-11-25 2018-07-18 Rapiscan Systems, Inc. Intelligent security management system
EP3271709B1 (en) 2015-03-20 2022-09-21 Rapiscan Systems, Inc. Hand-held portable backscatter inspection system
EP3520120A4 (en) 2016-09-30 2020-07-08 American Science & Engineering, Inc. X-RAY RADIATION SOURCE FOR TWO-DIMENSIONAL SCANNING RADIATION
SK8449Y1 (sk) * 2018-05-11 2019-05-06 Fulop Marko Zariadenie na odhaľovanie nelegálnych úkrytov v náklade železnej rudy
EP3811117A4 (en) 2018-06-20 2022-03-16 American Science & Engineering, Inc. SCINTILLATION DETECTORS COUPLED TO WAVELENGTH OFFSET SHEET
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JP2022137873A (ja) * 2021-03-09 2022-09-22 東芝Ｉｔコントロールシステム株式会社 放射線検査装置
CN118235216A (zh) 2021-10-01 2024-06-21 拉皮斯坎控股公司 用于并发产生多个基本相似的x射线束的方法和系统
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US3854042A (en) * 1973-05-10 1974-12-10 A Ott Device for measuring the thickness of layers with a radionuclide irradiating the layer
DE2544354A1 (de) * 1975-10-03 1977-04-14 Siemens Ag Verfahren zur bestimmung der dichte von koerpern mittels durchdingender strahlen und geraet zu seiner durchfuehrung
US4297575A (en) * 1979-08-13 1981-10-27 Halliburton Company Simultaneous gamma ray measurement of formation bulk density and casing thickness

Also Published As

Publication number Publication date
AU557007B2 (en) 1986-11-27
ATE40750T1 (de) 1989-02-15
JPS59218941A (ja) 1984-12-10
IL71299A (en) 1988-11-15
NZ207628A (en) 1988-02-29
DE3476698D1 (en) 1989-03-16
EP0120676A2 (en) 1984-10-03
IL71299A0 (en) 1984-06-29
CA1219970A (en) 1987-03-31
EP0120676A3 (en) 1985-06-12
ES8607546A1 (es) 1986-06-01
US4525854A (en) 1985-06-25
JPH0247697B2 (cs) 1990-10-22
AU2598684A (en) 1984-09-27
ES531211A0 (es) 1986-06-01
EP0120676B1 (en) 1989-02-08

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