ZA814878B - Goniometer for measuring strain - Google Patents

Goniometer for measuring strain

Info

Publication number
ZA814878B
ZA814878B ZA814878A ZA814878A ZA814878B ZA 814878 B ZA814878 B ZA 814878B ZA 814878 A ZA814878 A ZA 814878A ZA 814878 A ZA814878 A ZA 814878A ZA 814878 B ZA814878 B ZA 814878B
Authority
ZA
South Africa
Prior art keywords
slide
guide path
adapter
goniometer
semicircular guide
Prior art date
Application number
ZA814878A
Inventor
H Wolf
E Stuecker
Original Assignee
Kraftwerk Union Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kraftwerk Union Ag filed Critical Kraftwerk Union Ag
Publication of ZA814878B publication Critical patent/ZA814878B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/25—Measuring force or stress, in general using wave or particle radiation, e.g. X-rays, microwaves, neutrons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
    • G01L5/0047—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes measuring forces due to residual stresses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Abstract

1. A goniometer for measuring mechanical stresses using X-rays, with an X-ray tube (4) arranged on a first slide (2), and a detector (7) arranged on a second slide (5), where the first slide runs on the convex side of a semicircular guide path (1) and the second slide runs on the first slide, characterised in that the semicircular guide path (1) is accommodated in a bend-resistant and basically U-shaped adapter (8), the adapter (8) having a first flank (81) which bears the semicircular guide path (1) on a curvature (810) of this flank which runs concentrically with the semicircular guide path (1), and where an adapter holder (83) is arranged on the other flank (82) of the adapter (8).
ZA814878A 1980-07-17 1981-07-16 Goniometer for measuring strain ZA814878B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE3027165A DE3027165C1 (en) 1980-07-17 1980-07-17 Stress measuring goniometer for the roentgenographic measurement of mechanical stresses

Publications (1)

Publication Number Publication Date
ZA814878B true ZA814878B (en) 1982-07-28

Family

ID=6107463

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA814878A ZA814878B (en) 1980-07-17 1981-07-16 Goniometer for measuring strain

Country Status (5)

Country Link
EP (1) EP0044492B1 (en)
JP (1) JPS5752842A (en)
AT (1) ATE11456T1 (en)
DE (1) DE3027165C1 (en)
ZA (1) ZA814878B (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3740614C1 (en) * 1987-12-01 1988-12-29 Deutsches Elektronen Synchr Method and device for the contactless measurement of mechanical stresses on rapidly moving objects with a crystalline structure
JP2967052B2 (en) * 1995-09-08 1999-10-25 キヤノン株式会社 Method and apparatus for manufacturing color filter
US5966423A (en) * 1997-03-28 1999-10-12 Philips Electronics North America Corporation Arc diffractometer
CN114720496B (en) * 2022-06-08 2022-08-26 四川大学 Diffraction analysis device and method for realizing full-field X-ray fluorescence imaging analysis

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2633114C2 (en) * 1976-07-23 1978-08-03 Allianz-Zentrum Fuer Technik Gmbh, 8000 Muenchen Stress measuring goniometer for component testing

Also Published As

Publication number Publication date
DE3027165C1 (en) 1981-10-15
ATE11456T1 (en) 1985-02-15
JPS5752842A (en) 1982-03-29
EP0044492B1 (en) 1985-01-23
EP0044492A2 (en) 1982-01-27
EP0044492A3 (en) 1982-10-27

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