ZA200307712B - Method and device for surface evaluation. - Google Patents

Method and device for surface evaluation. Download PDF

Info

Publication number
ZA200307712B
ZA200307712B ZA200307712A ZA200307712A ZA200307712B ZA 200307712 B ZA200307712 B ZA 200307712B ZA 200307712 A ZA200307712 A ZA 200307712A ZA 200307712 A ZA200307712 A ZA 200307712A ZA 200307712 B ZA200307712 B ZA 200307712B
Authority
ZA
South Africa
Prior art keywords
sample
light
light source
recording
imaging device
Prior art date
Application number
ZA200307712A
Other languages
English (en)
Inventor
Klaas Hendrik De Haas
Ivo Bernardus Nicolaas Va Lans
Gerrit Cornelis Dubbeldam
Robin Paul Fries
Original Assignee
Akzo Nobel Coatings Int Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Akzo Nobel Coatings Int Bv filed Critical Akzo Nobel Coatings Int Bv
Publication of ZA200307712B publication Critical patent/ZA200307712B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0216—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using light concentrators or collectors or condensers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/504—Goniometric colour measurements, for example measurements of metallic or flake based paints
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/52—Measurement of colour; Colour measuring devices, e.g. colorimeters using colour charts
    • G01J3/524—Calibration of colorimeters

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
ZA200307712A 2001-04-06 2003-10-02 Method and device for surface evaluation. ZA200307712B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP01201276 2001-04-06

Publications (1)

Publication Number Publication Date
ZA200307712B true ZA200307712B (en) 2004-07-06

Family

ID=8180117

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA200307712A ZA200307712B (en) 2001-04-06 2003-10-02 Method and device for surface evaluation.

Country Status (9)

Country Link
EP (1) EP1373867A1 (cg-RX-API-DMAC10.html)
JP (1) JP3933581B2 (cg-RX-API-DMAC10.html)
KR (1) KR100875806B1 (cg-RX-API-DMAC10.html)
CN (1) CN100403011C (cg-RX-API-DMAC10.html)
AU (1) AU2002338353B2 (cg-RX-API-DMAC10.html)
BR (1) BR0208660A (cg-RX-API-DMAC10.html)
RU (1) RU2292037C2 (cg-RX-API-DMAC10.html)
WO (1) WO2002082063A1 (cg-RX-API-DMAC10.html)
ZA (1) ZA200307712B (cg-RX-API-DMAC10.html)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0625890D0 (en) * 2006-12-23 2007-02-07 Colormatrix Holdings Inc Polymeric materials
US9025153B2 (en) * 2011-11-16 2015-05-05 Axalta Coating Systems Ip Co., Llc Process for predicting degree of mottling in coating compositions by wet color measurement
JP5475057B2 (ja) 2012-04-20 2014-04-16 株式会社 オフィス・カラーサイエンス 変角分光イメージング測定方法およびその装置
EP2847556A4 (en) * 2012-05-09 2016-01-27 Seagate Technology Llc MAPPING SURFACE FEATURES
CN103674903A (zh) * 2013-12-31 2014-03-26 爱彼思(苏州)自动化科技有限公司 非接触式光泽度仪
US9880098B2 (en) * 2014-10-28 2018-01-30 Axalta Coatings Systems Ip Co., Llc Method and systems for quantifying differences between colored surfaces
US9678018B2 (en) 2015-03-30 2017-06-13 Gemological Institute Of America Inc. (Gia) Apparatus and method for assessing optical quality of gemstones
CN106908149A (zh) * 2017-04-11 2017-06-30 上海电机学院 一种机器人物体颜色识别系统及方法
KR102047206B1 (ko) * 2018-10-31 2019-11-20 한국과학기술원 체적함수비별 반사율 측정을 위한 함수특성곡선-초분광 캠 테스트 방법 및 장치
JP7341835B2 (ja) * 2019-10-09 2023-09-11 株式会社日立製作所 粉体混合システム及び粉体混合方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH552197A (de) * 1972-11-24 1974-07-31 Bbc Brown Boveri & Cie Einrichtung zum messen der rauhigkeit einer oberflaeche.
FR2515823B1 (fr) * 1980-11-24 1986-04-11 Cegedur Procede et dispositif de controle optique des etats de surface de produits metallurgiques
JP2588297B2 (ja) * 1990-06-20 1997-03-05 日産自動車株式会社 塗装表面の鮮映性評価方法
US5078496A (en) * 1990-08-14 1992-01-07 Autospect, Inc. Machine vision surface characterization system
GB9307279D0 (en) * 1993-04-07 1993-06-02 Feather James W Goniophotometer
US5640237A (en) * 1995-08-29 1997-06-17 Kla Instruments Corporation Method and apparatus for detecting non-uniformities in reflective surafaces
JP3312849B2 (ja) * 1996-06-25 2002-08-12 松下電工株式会社 物体表面の欠陥検出方法
US5909276A (en) * 1997-03-31 1999-06-01 Microtherm, Llc Optical inspection module and method for detecting particles and defects on substrates in integrated process tools
JPH11281584A (ja) * 1998-03-30 1999-10-15 Minolta Co Ltd 検査方法およびその装置

Also Published As

Publication number Publication date
RU2292037C2 (ru) 2007-01-20
KR100875806B1 (ko) 2008-12-26
CN1505757A (zh) 2004-06-16
JP2004526969A (ja) 2004-09-02
BR0208660A (pt) 2004-03-09
RU2003132476A (ru) 2005-03-20
AU2002338353B2 (en) 2006-05-25
WO2002082063A1 (en) 2002-10-17
CN100403011C (zh) 2008-07-16
EP1373867A1 (en) 2004-01-02
KR20040012743A (ko) 2004-02-11
JP3933581B2 (ja) 2007-06-20

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