WO2025200868A1 - 槽盖及基板液处理槽 - Google Patents
槽盖及基板液处理槽Info
- Publication number
- WO2025200868A1 WO2025200868A1 PCT/CN2025/077940 CN2025077940W WO2025200868A1 WO 2025200868 A1 WO2025200868 A1 WO 2025200868A1 CN 2025077940 W CN2025077940 W CN 2025077940W WO 2025200868 A1 WO2025200868 A1 WO 2025200868A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- limiting
- tank
- main cover
- cover
- cover body
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0404—Apparatus for fluid treatment for general liquid treatment, e.g. etching followed by cleaning
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B13/00—Accessories or details of general applicability for machines or apparatus for cleaning
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/08—Cleaning involving contact with liquid the liquid having chemical or dissolving effect
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
Definitions
- the present application relates to the field of semiconductor manufacturing technology, and in particular to a tank cover and a substrate liquid processing tank.
- the tank cover plays an important role. On the one hand, it prevents cleaning fluid from splashing around the tank during wafer cleaning, potentially impacting the surrounding environment. On the other hand, it prevents contaminants from entering the tank and affecting the cleaning effect. Furthermore, it maintains the cleaning temperature within the tank, reduces cleaning fluid evaporation, and ensures process requirements are met.
- U.S. Patent US7900640B2 discloses a cleaning device including a cleaning tank with an improved cover, which drives the tank cover to move by providing a vertically movable follow-up mechanism so that the tank cover follows the liquid surface and maintains contact with the liquid surface.
- a driving device i.e., a follow-up mechanism
- the addition of a driving device not only makes the structure of the original tank body and tank cover more complicated, but also requires additional energy to drive the tank cover to move.
- a feedback device to achieve closed-loop control, it is difficult to ensure that the tank cover can accurately follow the liquid surface.
- an object of the present invention is to provide a tank cover for solving the technical problem in the prior art that the tank cover is difficult to maintain contact with the liquid surface.
- one aspect of the present invention provides a tank cover, which is applied to a substrate liquid processing tank, including a tank cover assembly, wherein the tank cover assembly includes a main cover body and a limiting member for forming a limiting space; the periphery of the main cover body is at least partially movably located in the limiting space, and the limiting space is used to limit the range of movement of the main cover body; the main cover body is configured to float as the liquid level of the processing liquid in the substrate liquid processing tank changes when the tank cover is closed under the action of its own gravity and the buoyancy of the processing liquid, so that the bottom surface of the main cover body remains in contact with the liquid surface.
- the limiting member includes a circumferential limiting portion, which is used to cooperate with the peripheral edge of the main cover body located in the limiting space to limit the circumferential movable range of the main cover body.
- the limiting member further includes an upper limiting portion and a lower limiting portion, which are used to cooperate with the periphery of the main cover body located in the limiting space to limit the upper and lower movable range of the main cover body, wherein the upper limiting portion is located above the lower limiting portion, and the circumferential limiting portion is arranged on the upper limiting portion or the lower limiting portion.
- the limiting member further includes a first protrusion, which extends from the limiting member toward the interior of the limiting space and is configured to contact a peripheral edge of the main cover in the limiting space to limit the range of movement of the main cover.
- the slot cover assembly further includes a blocking portion, the limiting space has an opening, and the blocking portion is located in an area close to the opening, for preventing particles generated by the contact between the periphery of the main cover body located in the limiting space and the limiting member from leaving the limiting space.
- the limiting member further includes an exhaust port for extracting air from the limiting space to the outside.
- the main cover body further includes a through hole, and the through hole is arranged on the periphery of the main cover body located in the limiting space.
- the tank cover assembly further includes a support member, the limiting member is fixedly mounted on the support member, and the support member is configured to be rotatably mounted above the substrate liquid processing tank to drive the main cover body to move between a closed position and an open position.
- the slot cover assembly further includes a mounting member, wherein the mounting member is located below the limiting member, the limiting member is mounted on the mounting member, and is fixedly mounted on the supporting member through the mounting member.
- the limiting member is provided with a drainage hole for discharging liquid accumulated in the main cover.
- the main cover includes a bottom wall and a side wall extending upward from the bottom wall, wherein the side wall close to the support member and extending along the rotation axis of the support member is inclined from the bottom wall toward the support member.
- the tank cover assembly further includes a shielding portion for shielding an area at the slot of the substrate liquid processing tank that is not covered by the main cover body.
- a substrate liquid processing tank comprising a tank body and the tank cover as described above, wherein the tank cover is located at the notch of the tank body.
- the present invention provides a tank cover and a substrate liquid treatment tank, which have at least the following beneficial effects:
- the main cover body floats along with the liquid surface and maintains contact with the liquid surface by relying on the gravity of the main cover body and the buoyancy of the processing liquid in the substrate liquid processing tank, without the need for an additional follower mechanism to drive the main cover body to move;
- the main cover itself has a certain amount of space for movement, so there is a certain amount of room for error during installation, making installation easier and eliminating the need for precise positioning and installation like traditional fixed slot covers.
- FIG. 1 and 2 are perspective views of a substrate liquid treatment tank using a tank cover according to a first embodiment of the present invention
- FIG3 is a schematic cross-sectional view taken along the A-A direction in FIG1 ;
- FIG4 is an exploded view of the slot cover assembly according to the first embodiment of the present invention.
- FIG5 is a partial view of a sectional perspective view taken along the B-B direction in FIG1 ;
- FIG6 is a cross-sectional view of a substrate liquid treatment tank using the tank cover of the second embodiment
- FIG7 is a perspective view of a slot cover according to a second embodiment of the present invention.
- FIG8 is an exploded view of the slot cover assembly according to the second embodiment of the present invention.
- the limiter 12 is further optimized in this embodiment.
- the limiter 12 also includes a first protrusion 124, which extends from the limiter 12 to the inside of the limiting space and is used to contact the extension 113 to limit the range of motion of the main cover 11.
- the upper limiter 121, the lower limiter 122 and the circumferential limiter 123 are all provided with a first protrusion 124, and the first protrusion 124 of each part is continuous.
- the slot cover assembly 10 also includes a blocking portion, and the limiting space has an opening 129 so that the periphery of the main cover body 11 located in the limiting space can enter the limiting space.
- the blocking portion is located in the area near the opening 129 and is used to prevent the particles generated by the contact between the periphery of the main cover body 11 located in the limiting space and the limiting member 12 from leaving the limiting space.
- one first blocking portion 151 is disposed on an end of the upper limiting member 121 near the opening 129 and extends downward, while another first blocking portion 151 is disposed on an end of the lower limiting member 122 near the opening 129 and extends upward.
- the blocking portion may further include a second blocking portion 152 disposed on the periphery of the main cover 11 located within the limiting space, namely, on the extension portion 113 in this embodiment, extending from the extension portion 113 into the limiting space, further enhancing the blocking effect on particulate matter.
- the through hole 115 is provided on the extension portion 113, which can enhance the fluidity of the airflow in the confined space when extracting air from the exhaust port 126, thereby enhancing the exhaust effect.
- the provision of the through hole 115 can also reduce the weight of the main cover 11.
- the tank cover assembly 10 further includes a shielding portion for shielding the area of the notch of the substrate liquid processing tank that is not covered by the main cover 11.
- the extension 13 and the stopper 12 in this embodiment are located at both ends of the main cover 11 in the front-to-back direction (X direction) to reduce the area of contact or collision between the extension 113 and the stopper 12. Therefore, as shown in Figure 3, a gap J exists between the side wall 112 near the support member 13 and the wall of the inner tank 21 to prevent it from affecting the floating of the main cover 11.
- the shielding portion includes a first shielding portion 161 for shielding the gap J between the main cover 11 and the wall of the inner tank 21.
- the upper mounting portion 141 near the support member 13 extends and connects with each other to form the first shielding portion 161.
- the extension portion 113 may extend over the edge of the main cover body 11, and correspondingly, the limit member 12 may also extend over the edge of the main cover body 11, so that the gap J will be blocked by the extension portion 113 and the limit member 12, so the first shielding portion 161 can be formed by the limit member 12 located above the gap J.
- Figure 7 shows a perspective schematic diagram of the tank cover 1 in the second embodiment
- Figure 8 shows an exploded view of the tank cover assembly 10 in the second embodiment
- the shape and structure of the main cover 11 are substantially the same as those in the first embodiment, comprising a bottom wall 111 and side walls 112 extending upward from the bottom wall 111.
- the main cover 11 also includes an extension 113 extending horizontally outward from the upper end of the side wall 112, i.e., extending away from the side wall 112.
- the primary difference is that the extension 113 constitutes the entire periphery of the main cover 11, i.e., the extension 113 extends over the entire area of the upper end of the side wall 112.
- the lower end of the circumferential limiting portion 123 extends outward in the horizontal direction to form a lip portion 1231, and the circumferential limiting portion 123 is fixedly connected to the lower limiting portion 122 via the lip portion 1231.
- the lip portion 1231 and the lower limiting portion 122 are correspondingly provided with limiting member connection holes 127 for screws 128 to pass through, and the fixed connection is achieved by screws.
- the limiting member 12 surrounds the periphery of the main cover 11, and the periphery of the main cover 11 is entirely located within the limiting space of the limiting member 12, which has a better limiting effect and can enhance the stability of the main cover 11.
- the mounting member 14 is configured as a frame structure adapted to the position-limiting member 12, and the mounting member 14 is located below the lower position-limiting portion 122.
- the mounting member 14 may be provided with a mounting member connection hole 147 corresponding to the connection hole 127, so that the position-limiting member 12 is mounted and fixed to the mounting member 14 via screws 128.
- the function of the mounting member 14 is to install the limiting member 12 so that the limiting member 12 can be more firmly connected to the supporting member 13. Therefore, in other possible embodiments, the mounting member 14 is not limited to the complete frame structure surrounding the periphery of the main cover body 11 as shown in Figure 8, and it may also be possible that only a partial structure or other form in the frame structure can realize the installation and fixation of the limiting member 12.
- the limiting member 12 is also provided with a drainage hole 17.
- the lower limiting portion 122 is provided with a drainage hole 17
- the mounting member 14 is provided with a hole 18 that coincides with the drainage hole 17.
- the sidewall 112 adjacent to the support member 13 has a certain inclination.
- the sidewall 112 which is adjacent to the support member 13 and extends along the rotation axis of the support member 13, is inclined from the bottom wall 111 of the main cover 11 toward the support member 13. After the main cover 11 is flipped open, liquid accumulated within the main cover 11 flows along this inclined sidewall 112 toward the drainage hole 17.
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Coating Apparatus (AREA)
Abstract
一种槽盖(1),应用于基板液处理槽,包括槽盖组件(10),槽盖组件(10)包括主盖体(11)和用于形成限位空间的限位件(12);主盖体(11)的周缘至少部分可活动地位于限位空间内,限位空间用于限制主盖体(11)的活动范围;主盖体(11)被配置为在槽盖(1)闭合时,在自身重力和基板液处理槽中处理液的浮力作用下随处理液的液面变化而浮动,使得主盖体(11)的底面与液面保持贴合。该槽盖无需额外设置随动机构驱动主盖体移动即可实现主盖体与液面保持贴合;并且主盖体本身具有一定的活动空间,因此安装时具有一定的容错空间,安装更加简便。
Description
本申请涉及半导体制造技术领域,尤其涉及一种槽盖及基板液处理槽。
在基板(例如晶圆)的槽式清洗装置中,清洗槽的槽盖具有重要作用。一方面,槽盖能够防止清洗晶圆时清洗液向清洗槽周围飞溅,影响周围环境;另一方面,槽盖也可以防止脏污进入清洗槽影响清洗效果,并且还能保持槽内清洗温度,减少清洗液挥发,保证工艺要求。
为了更好地防止清洗液飞溅和减少挥发,并且避免环境中的气体进入清洗槽从而与清洗液发生反应,影响清洗液的纯洁性,需要保证槽盖始终与清洗槽内的液面贴合。
然而,常规的槽盖在安装好后,除非拆卸后重新安装,否则槽盖的位置通常无法改变,通常难以保证槽盖始终与清洗槽内的液面贴合。美国专利US7900640B2公开了一种包括带有改进盖的清洗槽的清洗装置,通过设置可以垂直移动的随动机构(follow-up mechanism)驱动槽盖移动以使得槽盖跟随液面并保持与液面接触。尽管可以一定程度上保证槽盖与液面始终贴合,但是增加了驱动装置(即随动机构),不仅使得原有的槽体和槽盖的结构更加复杂,需要耗费额外的能源来驱动槽盖移动,而且在不增加反馈装置以实现闭环控制的情况下,很难保证槽盖能够准确地跟随液面。
因此,如何提供一种结构简单,能够保证有效贴合液面的槽盖成为需要解决的技术问题。
鉴于以上所述现有技术的缺点,本发明的目的在于提供一种槽盖,用于解决现有技术中槽盖难以与液面保持贴合的技术问题。
为实现上述目的及其它相关目的,本发明的一方面提供了一种槽盖,应用于基板液处理槽,包括槽盖组件,所述槽盖组件包括主盖体和用于形成限位空间的限位件;所述主盖体的周缘至少部分可活动地位于所述限位空间内,所述限位空间用于限制所述主盖体的活动范围;所述主盖体被配置为在所述槽盖闭合时,在自身重力和基板液处理槽中处理液的浮力作用下随所述处理液的液面变化而浮动,使得所述主盖体的底面与所述液面保持贴合。
可选地,所述限位件包括周向限位部,用于与所述主盖体位于所述限位空间中的周缘配合以限制所述主盖体的周向活动范围。
可选地,所述限位件还包括上限位部和下限位部,用于与所述主盖体位于所述限位空间中的周缘配合以限制所述主盖体的上下活动范围,其中,所述上限位部位于所述下限位部的上方,所述周向限位部设置于所述上限位部或者所述下限位部。
可选地,所述限位件还包括第一凸起部,所述第一凸起部自所述限位件向所述限位空间的内部延伸,用于与所述主盖体位于所述限位空间中的周缘接触以限制所述主盖体的活动范围。
可选地,所述槽盖组件还包括阻挡部,所述限位空间具有开口,所述阻挡部位于靠近所述开口的区域,用于阻挡所述主盖体位于所述限位空间中的周缘与所述限位件接触而产生的颗粒物离开所述限位空间。
可选地,所述限位件还包括抽风口,用于从所述限位空间内向外抽风。
可选地,所述主盖体还包括通孔,所述通孔设置于所述主盖体位于所述限位空间内的周缘上。
可选地,所述槽盖组件还包括支持件,所述限位件固定安装于所述支持件上,所述支持件被配置为可转动地安装于所述基板液处理槽上方,用于带动所述主盖体在闭合位置和打开位置之间移动。
可选地,所述槽盖组件还包括安装件,所述安装件位于所述限位件的下方,所述限位件安装于所述安装件上,通过所述安装件固定安装于所述支持件上。
可选地,所述限位件设置有排液孔,用于排出所述主盖体内积存的液体。
可选地,所述主盖体包括底壁和自所述底壁向上延伸的侧壁,其中,靠近所述支持件且沿所述支持件的转动轴线延伸的侧壁,自所述底壁向所述支持件倾斜。
可选地,所述槽盖组件还包括遮蔽部,用于遮蔽所述基板液处理槽的槽口处所述主盖体覆盖不到的区域。
本发明的另一方面提供了一种基板液处理槽,包括槽体和如上所述的槽盖,所述槽盖位于所述槽体的槽口处。
如上所述,本发明提供一种槽盖及基板液处理槽,至少具有以下有益效果:
1)依靠主盖体自身的重力和基板液处理槽内处理液的浮力实现主盖体跟随液面浮动并与液面保持贴合,无需额外设置随动机构驱动主盖体移动;
2)主盖体本身具有一定的活动空间,因此安装时具有一定的容错空间,安装更加简便,无需像传统的固定式槽盖那样精确地定位安装。
3)通过优化限位件的设计,减少因主盖体与限位件接触而产生的颗粒物,并阻止该颗粒物污染槽盖下方的处理液。
附图概述
本申请的特征、性能由以下的实施例及其附图进一步描述。
图1和图2显示为应用本发明实施例一的槽盖的基板液处理槽的立体示意图;
图3显示为图1中A-A方向的剖面示意图;
图4显示为本发明实施例一的槽盖组件的爆炸图;
图5显示为图1中B-B方向的剖视立体图的局部图;
图6显示为应用本实施例二的槽盖的基板液处理槽的剖面示意图;
图7显示为本发明实施例二的槽盖的立体示意图;以及
图8显示为本发明实施例二的槽盖组件的爆炸图。
本申请的较佳实施方式
以下通过特定的具体实例说明本发明的实施方式,本领域技术人员可由本说明书所揭露的内容轻易地了解本发明的其它优点与功效。本发明还可以通过另外不同的具体实施方式加以实施或应用,本公开中的各项细节也可以基于不同观点与应用,在没有背离本发明的精神下进行各种修饰或改变。
需要说明的是,本公开的附图仅以示意方式说明本发明的基本构想,所以附图中仅显示与本发明中有关的组件而非按照实际实施时的组件数目、形状及尺寸绘制,其实际实施时各组件的形态、数量及比例可为一种随意的改变,且其组件布局形态也可能更为复杂。
下面的描述涉及附图时,除非另有表示,不同附图中的相同数字表示相同或相似的要素。以下示例性实施例中所描述的实施方式并不代表与本发明相一致的所有实施方式。相反,它们仅是与如所附权利要求书中所详述的、本发明的一些方面相一致的装置的例子。
在本公开使用的术语是仅仅出于描述特定实施例的目的,而非旨在限制本公开。在本公开和所附权利要求书中所使用的单数形式的“一种”、“所述”和“该”也旨在包括多数形式,除非上下文清楚地表示其他含义。还应当理解,本文中使用的术语“和/或”是指并包含一个或多个相关联的列出项目的任何或所有可能组合。
在本公开的描述中,除非另有规定和限定,需要说明的是,术语“安装”、“相连”、“连接”应做广义理解,例如,可以是机械连接或电连接,也可以是两个元件内部的连通,可以是直接相连,也可以通过中间媒介间接相连,对于本领域技术人员而言,可以根据具体情况理解上述术语的具体含义。
应当理解,尽管在本公开可能采用术语第一、第二、第三等来描述各种信息,但这些信息不应限于这些术语。这些术语仅用来将同一类型的信息彼此区分开。
为了便于描述,在本公开的附图中设定XYZ正交坐标系,根据需要加以参照。此外,也有时将X方向称为“前后方向”,将正方向称为“前侧”或“前方”,将X负方向称为“后侧”或“后方”;将Y方向称为“左右方向”,将Y正方向称为“右侧”或“右方”,将Y负方向称为“左侧”或“左方”;将Z方向称为“上下方向”,将Z正方向称为“上侧”或“上方”,将Z负方向称为“下侧”或“下方”。
实施例一
本实施例一提供了一种槽盖1,应用于基板液处理槽。图1和图2示出了应用本实施例一中的槽盖1的基板液处理槽的立体示意图,其中,图1中槽盖1处于闭合位置,图2中槽盖1处于打开位置。图3示出了图1中A-A方向的剖面示意图。槽盖1包括槽盖组件10,本实施例中,槽盖1为翻转开合的双开盖结构,包括对称设置的两个槽盖组件10。槽盖组件10包括主盖体11和限位件12。限位件12用于形成限位空间,主盖体11的周缘至少部分可活动地位于限位空间内,限位空间用于限制主盖体11的活动范围。
应当理解的是,在其他可能的实施例中,槽盖1也可以是单开盖结构,即包括一个槽盖组件10,且该一个槽盖组件10的尺寸与基板液处理槽的尺寸相适应。可选地,槽盖1还可以采用其他的开合方式,包括但不限于垂直升降或者水平滑移等惯用的盖体开合方式。具体采用何种开合方式,需要本领域技术人员结合实际使用场景进行合理选择。
需要说明的是,本发明的另一方面还提供了一种基板液处理槽。如图1至图3所示,基板液处理槽包括槽体2和槽盖1,槽盖1位于槽体的槽口处。
示例性地,本实施例中,基板液处理槽为基板清洗槽,槽体2具有内槽21和外槽22,内槽21中形成基板处理空间,容纳有待处理的基板W和处理液(为了清晰展示各部件结构和位置关系,图3中仅示出处理液的液面S),内槽21中的处理液持续喷涌以清洗基板W,并从内槽21的槽口边缘溢流至外槽22。槽盖1安装于基板液处理槽顶部的开口处,用于在闭合时遮盖内槽21的槽口。
如图3所示,主盖体11被配置为在槽盖1闭合时,在自身重力和基板液处理槽中处理液的浮力作用下随处理液的液面S变化而浮动,使得主盖体11的底面与液面S保持贴合。一方面,依靠主盖体11自身的重力和基板液处理槽内处理液的浮力实现主盖体11跟随液面S浮动并与液面S保持贴合,无需额外设置随动机构驱动主盖体11移动;另一方面,传统的固定式槽盖在安装过程中,需要精确地定位才能保证槽盖与液面贴合,而本实施例中的主盖体11本身具有一定的活动空间,因此安装时具有一定的容错空间,安装更加简便,无需像传统的固定式槽盖那样需要精确地定位安装。
下面参阅图4和图5,图4示出了槽盖组件10的爆炸图,图5示出了图1中B-B方向的剖视立体图的局部图,其中,槽体2被省略。本实施例中,主盖体11包括位于底部的底壁111和自底壁111向上延伸的侧壁112,底壁111和侧壁112围合成一定的容纳空间。主盖体11进一步包括延伸部113,延伸部113自侧壁112的上端沿水平方向向外延伸,即向远离侧壁112的方向延伸,构成主盖体11的周缘的部分或者全部,延伸部113位于限位空间内。由此,在主盖体11处于闭合位置时,在底壁111的下表面与液面S贴合的同时,具有一定高度的侧壁112能够阻止处理液溢出到底壁111的上表面。并且,即便有处理液从侧壁112的上方溢出,或者其他设备(例如经过基板液处理槽上方的机械手)携带的液体滴落在主盖体11的上表面,底壁111和侧壁112围合成的容纳空间也具有一定的容纳功能,从而能够阻止处理液四处溢流而污染环境,损伤其他部件。
应当理解的是,本实施例中的主盖体11形状只是示例性的,其他可能的实施例中,主盖体11也可以是板状结构,或者是,主盖体11可以是由位于顶部的顶壁、位于底部的底壁111以及连接顶壁和底壁111的侧壁112围合而成的盒体结构,延伸部113可以自顶壁沿水平方向向外延伸,即向远离顶壁的方向延伸,该盒体结构的顶壁与底壁111具有一定的高度差,能够避免基板液处理槽中的处理液溢流到顶壁,同时盒体结构由顶壁、底壁111和侧壁112围合而成,内部具有空腔以减轻主盖体11的重量,确保主盖体11能够跟随液面S浮动。
具体地,限位件12包括周向限位部123,周向限位部123围合成一限位空间,用于与延伸部113配合以限制主盖体12的周向活动范围。如图4和图5所示,本实施例延伸部113设置于主盖体11的前后方向(X方向)的两端,位于前端的延伸部113的左右两侧(Y方向两侧)和前侧分别对应有周向限位部123,位于后端的延伸部113的左右两侧和后侧分别对应有周向限位部123。延伸部113位于限位空间内,既不阻碍主盖体11跟随液面S浮动,又能够限制主盖体11的活动范围,从而避免主盖体11发生偏移甚至脱离限位件12而无法发挥必要的遮盖作用。
在其他可能的实施例中,在不影响槽盖1的开合和主盖体11随液面S变化而浮动的情况下,延伸部113也可以遍及侧壁112上端或者设置于侧壁112上端的其他位置。
进一步地,如前所述,本实施例中,槽盖1为双开盖结构,示例性地,槽盖组件10还包括支持件13,限位件12固定安装于支持件上13,支持件13被配置为可转动地安装于基板液处理槽上,用于带动主盖体11在闭合位置和打开位置之间移动。结合图1至图2,示例性地,支持件13为沿X方向延伸的转轴,对于位于右侧的槽盖组件10,支持件13设置于主盖体11的右侧,相应地,对称设置的另一槽盖组件10上,支持件13设置于主盖体11的左侧。支持件13绕自身轴线转动,以带动主盖体11在闭合位置和打开位置之间转动,进而实现槽盖1的开合。具体地,如图1中箭头C所示,右侧的支持件13顺时针转动以带动右侧的主盖体11向右翻转,左侧的支持件13逆时针转动以带动左侧的主盖体11向左翻转,进而带动图1中槽盖1运动至图2中的位置以打开槽盖1;相应地,如图2中箭头D所示,右侧的支持件13逆时针转动以带动右侧的主盖体11向左翻转,左侧的支持件13顺时针转动以带动左侧的主盖体11向右翻转,进而带动图2中槽盖1运动至图1中的位置以闭合槽盖1。
进一步地,本实施例中,限位件12还包括上限位部121和下限位部122,用于与延伸部113配合以限制主盖体11的上下活动范围,其中,上限位部121位于下限位部122的上方,周向限位部123设置于上限位部121或者下限位部122上。
具体地,本实施例中,周向限位部123设置于下限位部122上,自下限位部122向上延伸,如图4所示,以位于主盖体11前端的限位件12为例,其包括分别位于延伸部113左右两侧和前侧的三个周向限位部123,示例性地,周向限位部123可以是与下限位部122一体成型。在槽盖组件10安装完毕后,上限位部121、下限位部122和周向限位部123共同围合成一限位空间。
一方面,延伸部113位于该限位空间中,在主盖体11在闭合位置和打开位置之间翻转时,限位件12能够限制主盖体11的活动范围,避免主盖体11脱离限位件12,掉落到基板液处理槽中或者槽外。另一方面,在主盖体11处于闭合位置时,上限位部121和下限位部122能够分别起到上限位和下限位的作用,在不妨碍主盖体11随液面S浮动的情况下,能够进一步限制主盖体11的活动范围,提高槽盖1的稳定性,即使液面S波动较为剧烈,主盖体11也不会从限位件12中脱离,或者向下接触到基板而对基板W造成损伤。此外,本实施例中,上限位部121、下限位部122和周向限位部123均为板状结构,具有一定的覆盖面积,由此,在主盖体11处于闭合位置时,限位件12可以对主盖体与槽体之间的间隙起到遮盖作用。
应当理解的是,在主盖体11随液面S变化而浮动的过程中,延伸部113可能会与限位件12接触甚至发生碰撞,可能会因此产生颗粒物,这些颗粒物有可能进入到基板液处理槽中,污染基板液处理槽中的处理液。为降低颗粒物产生的几率,本实施例中,延伸部113设置于主盖体11的前后方向(X方向)的两端,而主盖体11的左右方向(Y方向)的两端处未设置延伸部113,相应地也未设置限位件12,故而有效降低延伸部113与限位件12可能接触的面积,降低颗粒物产生的几率。
优选地,为了尽可能减少因延伸部113与限位件12接触而可能产生的颗粒物和阻止该颗粒物进入到基板液处理槽中,本实施例对限位件12进行了进一步优化。结合图4和图5,本实施例中,限位件12还包括第一凸起部124,第一凸起部124自限位件12向限位空间的内部延伸,用于与延伸部113接触以限制主盖体11的活动范围。示例性地,本实施例中,上限位部121、下限位部122和周向限位部123均设置有第一凸起部124,且各部分的第一凸起部124是连续的,在其他可能的实施例中,各部分的第一凸起部124也可以是间隔的。可选地,第一凸起部124也可以只设置在上限位部121、下限位部122和周向限位部123中的部分区域。
在主盖体11随液面S(请参考图3中的液面S)波动而浮动时,延伸部113与限位件12的第一凸起部124接触,减小了延伸部113与限位件12的接触面积,从而减少因延伸部113与限位件12接触而可能产生的颗粒物。
进一步地,本实施例中,槽盖组件10还包括阻挡部,限位空间具有开口129,以使得主盖体11位于限位空间中的周缘可以进入限位空间,阻挡部位于靠近开129的区域,用于阻挡主盖体11位于限位空间中的周缘与限位件12接触而产生的颗粒物离开限位空间。
如图4和图5所示,本实施例中,阻挡部包括设置于限位件12上的第一阻挡部151,第一阻挡部151自限位件12向限位空间延伸,可以对限位空间内的颗粒物起到一定的阻挡作用,从一定程度上阻挡颗粒物从开口129到达到限位空间外部,进而减少颗粒物进入到主盖体11下方的基板液处理槽(请参阅图1至图3中的基板液处理槽)中的几率。具体地,一第一阻挡部151设置在上限位部121靠近开口129的一端并向下延伸,另一第一阻挡部151设置在下限位部122靠近开129的一端并向上延伸。可选地,阻挡部还可以包括第二阻挡152,设置于主盖体11位于限位空间中的周缘上,即本实施例中的延伸部113上,自延伸部113向限位空间延伸,进一步增加对颗粒物的阻挡效果。
更进一步地,本实施例中,限位件12还包括抽风口126,用于从限位空间内向外抽风。如图4和图5所示,本实施例中,抽风口126设置于上限位部121上,在其他可能的实施例中,抽风口126也可以设置在限位件12上的其他合适的位置。抽风口126外接抽风设备,可以将限位空间内可能存在的颗粒物抽走,维持限位空间内的清洁。优选地,主盖体11还包括通孔115,通孔115设置于主盖体11位于限位空间内的周缘上。本实施例中,通孔115设置于延伸部113上,能够在自抽风口126向外抽风时增强限位空间内的气流流动性,增强抽风的效果。此外,设置通孔115,还能减轻主盖体11的重量。
本实施例中,槽盖组件10还包括安装件14,安装件14与支持件13固定连接,限位件12安装于安装件14上,通过安装件14固定安装于支持件13上。如图4所示,本实施例中,安装件14的形状与限位件12相适应,安装件14包括与上限位部121相适应的上安装部141,与下限位部122相适应的下安装部142,与周向限位部123相适应的周向安装部143。具体地,本实施例,上限位部121固定安装于上安装部141上,上安装部141、下安装部142和周向安装部143围合成了一安装空间,周向限位部123容置于周向安装部143的内侧,并且左右方向(Y方向)两侧的周向限位部123容置于上安装部141的下方,被上安装部141和左右方向两侧的周向安装部143包围。
可选地,槽盖组件10还包括遮蔽部,用于遮蔽基板液处理槽的槽口处主盖体11覆盖不到的区域。如前所述,本实施例中的延伸部13和限位件12位于主盖体11的前后方向(X方向)的两端以减少延伸部113与限位件12接触或者碰撞的面积,因此,如图3所示,靠近支持件13的侧壁112与内槽21的槽壁之间存在间隙J,以避免影响主盖体11的浮动。为了避免在槽盖1处于闭合位置时,内槽21内的处理液从该间隙J溢出,本实施例中,遮蔽部包括第一遮蔽部161,用于遮蔽主盖体11与内槽21的槽壁之间的间隙J。结合图1和图3至图5,本实施例中,靠近支持件13的上安装部141相互延伸并衔接,形成第一遮蔽部161。在其他可能的实施中,延伸部113可能遍及主盖体11的边缘,相应地限位件12也会遍及主盖体11的边缘,因此,间隙J的上方会有延伸部113和限位件12遮挡,因此第一遮蔽部161可以由位于间隙J上方的限位件12形成。可选地,本实施例中,槽盖1为双开盖设计,因此左右两侧的槽盖组件10之间应当具有一定的缝隙,以避免两个槽盖组件10在开合过程中相互干涉。为了避免在槽盖1处于闭合位置时,内槽21内的处理液从该缝隙溢出,可选地,遮蔽部还包括第二遮蔽部162。如图1和图3所示,第二遮蔽部162设置于上限位部121上,用于遮盖左右两侧的两个槽盖组件10之间的缝隙。
实施例二
本实施例二提供一种槽盖1,应用于基板液处理槽。图6示出了应用本实施例二中的槽盖1的基板液处理槽的剖面示意图。与实施例一相类似的,本实施例二中,槽盖1也是双开盖结构。与实施例一相比,主要区别在于主盖体11的周缘全部位于限位件12的限位空间中,且限位件12的形状和结构不同。
结合图7和图8,其中,图7示出了本实施例二中槽盖1的立体示意图,图8示出了本实施例二中槽盖组件10的爆炸图。主盖体11的形状和结构与实施例一中的大致相同,具有底壁111和自底壁111向上延伸的侧壁112,主盖体11还包括延伸部113,自侧壁112的上端沿水平方向向外延伸,即向远离侧壁112的方向延伸。主要区别在于,延伸部113构成主盖体11的周缘的全部,即延伸部113遍及侧壁112的上端的全部区域。
限位件12被配置为环绕主盖体11的周缘的框架结构。周向限位部123沿延伸部113的外侧环绕设置,与延伸部113配合,实现周向限位。上限位部121位于延伸部113的上方,沿延伸部113的上侧环绕设置,下限位部122位于延伸部113下方,沿延伸部113的下侧环绕设置。其中,上限位部121与周向限位部123连接成一体,与下限位部122可拆卸地固定连接。示例性地,周向限位部123的下端沿水平方向向外延伸形成唇缘部1231,周向限位部123通过唇缘部1231与下限位部122固定连接。例如,唇缘部1231和下限位部122对应设置供螺钉128穿设的限位件连接孔127,通过螺钉实现固定连接。
与实施例一相比,本实施例中,限位件12环绕主盖体11的周缘,主盖体11的周缘全部位于限位件12的限位空间内,具有更好的限位效果。能够增强主盖体11的稳定性。
进一步地,本实施例中,安装件14被配置为与限位件12相适应的框架结构,安装件14位于下限位部122的下方。可选地,安装件14可以设置与连接孔127对应的安装件连接孔147,使得限位件12通过螺钉128安装固定在安装件14上。
应当理解的是,安装件14的作用是安装限位件12,使得限位件12能够更稳固地与支持件13连接,因此,在其他可能的实施例中,安装件14并不局限于图8所示的环绕主盖体11周缘的完整框架结构,也可能只有该框架结构中的部分结构或者其他形式,能够实现限位件12的安装固定即可。
进一步地,考虑到本实施例中的主盖体11的底壁111与侧壁112围合成一个开口向上的盒体结构,具有一定的容纳空间,容纳空间内可能会积存液体。为了在主盖体11翻转打开后能够排出这些液体,限位件12还设置有排液孔17。如图6和图8所示,本实施例中,下限位部122和设置有排液孔17,安装件14上设置有与排液孔17重合的孔18,在主盖体11翻转打开后,主盖体11内积存的液体沿位于限位空间的周缘流入限位空间,经排液孔17和孔18排出。
优选地,为了便于主盖体11内积存的液体可以通过排液孔17排出,本实施例中,靠近支持件13的侧壁112具有一定的倾斜度。如图6所示,靠近支持件13且沿支持件13的转动轴线延伸的侧壁112,自主盖体11的底壁111向支持件13倾斜。在主盖体11翻转打开后,主盖体11内积存的液体沿该倾斜的侧壁112流向排液孔17。
上述实施例仅例示性说明本发明的原理及其功效,而非用于限制本发明。任何熟悉此技术的人士皆可在不违背本发明的精神及范畴下,对上述实施例进行修饰或改变。因此,举凡所属技术领域中具有通常知识者在未脱离本发明所揭示的精神与技术思想下所完成的一切等效修饰或改变,仍应由本发明的权利要求所涵盖。
Claims (13)
- 一种槽盖,应用于基板液处理槽,其特征在于,包括槽盖组件,所述槽盖组件包括主盖体和用于形成限位空间的限位件;所述主盖体的周缘至少部分可活动地位于所述限位空间内,所述限位空间用于限制所述主盖体的活动范围;所述主盖体被配置为在所述槽盖闭合时,在自身重力和基板液处理槽中处理液的浮力作用下随所述处理液的液面变化而浮动,使得所述主盖体的底面与所述液面保持贴合。
- 根据权利要求1所述的槽盖,其特征在于,所述限位件包括周向限位部,用于与所述主盖体位于所述限位空间中的周缘配合以限制所述主盖体的周向活动范围。
- 根据权利要求2所述的槽盖,其特征在于,所述限位件还包括上限位部和下限位部,用于与所述主盖体位于所述限位空间中的周缘配合以限制所述主盖体的上下活动范围,其中,所述上限位部位于所述下限位部的上方,所述周向限位部设置于所述上限位部或者所述下限位部。
- 根据权利要求1所述的槽盖,其特征在于,所述限位件还包括第一凸起部,所述第一凸起部自所述限位件向所述限位空间的内部延伸,用于与所述主盖体位于所述限位空间中的周缘接触以限制所述主盖体的活动范围。
- 根据权利要求1所述的槽盖,其特征在于,所述槽盖组件还包括阻挡部,所述限位空间具有开口,所述阻挡部位于靠近所述开口的区域,用于阻挡所述主盖体位于所述限位空间中的周缘与所述限位件接触而产生的颗粒物离开所述限位空间。
- 根据权利要求1所述的槽盖,其特征在于,所述限位件还包括抽风口,用于从所述限位空间内向外抽风。
- 根据权利要求6所述的槽盖,其特征在于,所述主盖体还包括通孔,所述通孔设置于所述主盖体位于所述限位空间内的周缘上。
- 根据权利要求1所述的槽盖,其特征在于,所述槽盖组件还包括支持件,所述限位件固定安装于所述支持件上,所述支持件被配置为可转动地安装于所述基板液处理槽上方,用于带动所述主盖体在闭合位置和打开位置之间移动。
- 根据权利要求8所述的槽盖,其特征在于,所述槽盖组件还包括安装件,所述限位件安装于所述安装件上,通过所述安装件固定安装于所述支持件上。
- 根据权利要求8所述的槽盖,其特征在于,所述限位件设置有排液孔,用于排出所述主盖体内积存的液体。
- 根据权利要求10所述的槽盖,其特征在于,所述主盖体包括底壁和自所述底壁向上延伸的侧壁,其中,靠近所述支持件且沿所述支持件的转动轴线延伸的侧壁,自所述底壁向所述支持件倾斜。
- 根据权利要求1所述的槽盖,其特征在于,所述槽盖组件还包括遮蔽部,用于遮蔽所述基板液处理槽的槽口处所述主盖体覆盖不到的区域。
- 一种基板液处理槽,其特征在于,包括槽体和如权利要求1至12任一项所述的槽盖,所述槽盖位于所述槽体的槽口处。
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202410363051.4A CN120714987A (zh) | 2024-03-27 | 2024-03-27 | 槽盖及基板液处理槽 |
| CN202410363051.4 | 2024-03-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2025200868A1 true WO2025200868A1 (zh) | 2025-10-02 |
Family
ID=97167547
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/CN2025/077940 Pending WO2025200868A1 (zh) | 2024-03-27 | 2025-02-19 | 槽盖及基板液处理槽 |
Country Status (3)
| Country | Link |
|---|---|
| CN (1) | CN120714987A (zh) |
| TW (1) | TW202539820A (zh) |
| WO (1) | WO2025200868A1 (zh) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06104234A (ja) * | 1992-09-18 | 1994-04-15 | Matsushita Electric Ind Co Ltd | 基板洗浄装置 |
| JPH10265988A (ja) * | 1997-03-25 | 1998-10-06 | Shinko Pantec Co Ltd | 水素・酸素発生装置 |
| US6050446A (en) * | 1997-07-11 | 2000-04-18 | Applied Materials, Inc. | Pivoting lid assembly for a chamber |
| CN1574237A (zh) * | 2003-05-30 | 2005-02-02 | 精工爱普生株式会社 | 药液处理装置、药液处理方法及电路基板的制造方法 |
| US20090120466A1 (en) * | 2005-06-30 | 2009-05-14 | Kazuyoshi Eshima | Washing Device and Washing Method |
| CN110600409A (zh) * | 2019-10-08 | 2019-12-20 | 安徽宏实自动化装备有限公司 | 一种用于晶圆清洗的槽体整体结构 |
-
2024
- 2024-03-27 CN CN202410363051.4A patent/CN120714987A/zh active Pending
-
2025
- 2025-02-19 WO PCT/CN2025/077940 patent/WO2025200868A1/zh active Pending
- 2025-03-18 TW TW114110159A patent/TW202539820A/zh unknown
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06104234A (ja) * | 1992-09-18 | 1994-04-15 | Matsushita Electric Ind Co Ltd | 基板洗浄装置 |
| JPH10265988A (ja) * | 1997-03-25 | 1998-10-06 | Shinko Pantec Co Ltd | 水素・酸素発生装置 |
| US6050446A (en) * | 1997-07-11 | 2000-04-18 | Applied Materials, Inc. | Pivoting lid assembly for a chamber |
| CN1574237A (zh) * | 2003-05-30 | 2005-02-02 | 精工爱普生株式会社 | 药液处理装置、药液处理方法及电路基板的制造方法 |
| US20090120466A1 (en) * | 2005-06-30 | 2009-05-14 | Kazuyoshi Eshima | Washing Device and Washing Method |
| CN110600409A (zh) * | 2019-10-08 | 2019-12-20 | 安徽宏实自动化装备有限公司 | 一种用于晶圆清洗的槽体整体结构 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN120714987A (zh) | 2025-09-30 |
| TW202539820A (zh) | 2025-10-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP6490845B2 (ja) | 極紫外線フォトマスクポッド | |
| JP5773011B2 (ja) | 搬送ロボット、筐体、半導体製造装置およびソータ装置 | |
| KR102618491B1 (ko) | 기판 이송 장치 | |
| US11249392B2 (en) | EUV reticle pod | |
| JP5370785B2 (ja) | ロードポート装置 | |
| JP6287515B2 (ja) | Efemシステム及び蓋開閉方法 | |
| KR101669326B1 (ko) | 기판 반송 로봇, 기판 반송 시스템 및 기판 반송 방법 | |
| WO2025200868A1 (zh) | 槽盖及基板液处理槽 | |
| JP2001102426A (ja) | 物品容器開閉・転送装置および物品容器開閉・転送方法 | |
| JP6583482B2 (ja) | Efem | |
| JP2002151373A (ja) | 防塵機能を備えた半導体ウェーハ処理装置 | |
| CN214542163U (zh) | 半导体处理设备 | |
| US20070068628A1 (en) | Vacuum processing apparatus | |
| KR20210132577A (ko) | 극자외선 레티클 포드 | |
| JP7183567B2 (ja) | 循環式efem | |
| TWI431716B (zh) | A storage box for handling jigs | |
| TWI307933B (en) | A substrate treatment apparatus | |
| WO2025175593A1 (zh) | 用于转移半导体晶圆盒的工作台 | |
| US20140219749A1 (en) | Substrate processing apparatus and robot controller | |
| US7537425B2 (en) | Wafer processing apparatus having dust proof function | |
| JP2018037543A (ja) | ロードポート装置 | |
| US20230311172A1 (en) | Substrate processing apparatus and substrate processing method | |
| JP2017037945A (ja) | 収納容器の蓋体及び収納容器 | |
| CN112687598A (zh) | 基板传送设备和基板处理设备 | |
| KR102826934B1 (ko) | 설비 전방 단부 모듈 및 이를 포함하는 기판 처리 설비 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 25775632 Country of ref document: EP Kind code of ref document: A1 |