WO2023225772A9 - Fully automatic method and system for testing read and write functions of dram storage cell - Google Patents
Fully automatic method and system for testing read and write functions of dram storage cell Download PDFInfo
- Publication number
- WO2023225772A9 WO2023225772A9 PCT/CN2022/094352 CN2022094352W WO2023225772A9 WO 2023225772 A9 WO2023225772 A9 WO 2023225772A9 CN 2022094352 W CN2022094352 W CN 2022094352W WO 2023225772 A9 WO2023225772 A9 WO 2023225772A9
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- read
- function test
- write function
- silk screen
- storage cell
- Prior art date
Links
- 238000012360 testing method Methods 0.000 title abstract 7
- 238000000034 method Methods 0.000 title abstract 3
- 210000000352 storage cell Anatomy 0.000 title abstract 3
- 238000010998 test method Methods 0.000 abstract 3
Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/04—Architecture, e.g. interconnection topology
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/08—Learning methods
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- General Engineering & Computer Science (AREA)
- Biophysics (AREA)
- Computational Linguistics (AREA)
- Data Mining & Analysis (AREA)
- Evolutionary Computation (AREA)
- Artificial Intelligence (AREA)
- Molecular Biology (AREA)
- Computing Systems (AREA)
- Biomedical Technology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Mathematical Physics (AREA)
- Software Systems (AREA)
- Health & Medical Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
The present invention relates to the technical field of integrated circuit testing. Provided are a fully automatic method and system for testing read and write functions of a DRAM storage cell. The method comprises the following steps: acquiring a silk screen image of a chip to be tested, and performing recognition on the silk screen image using a ResNet, so as to obtain silk screen information; reading, according to the silk screen information and from a preset database, a read and write function test method that matches the silk screen information, and transmitting the read and write function test method to an ATE; and electrically connecting the ATE to said chip, and the ATE performing a read and write function test on said chip according to the received read and write function test method. In the present invention, the automation of the read and write function test work for a DRAM storage cell is realized, the efficiency of the read and write function test work is effectively increased, and a relatively high accuracy rate of the read and write function test is also ensured.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/CN2022/094352 WO2023225772A1 (en) | 2022-05-23 | 2022-05-23 | Fully automatic method and system for testing read and write functions of dram storage cell |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/CN2022/094352 WO2023225772A1 (en) | 2022-05-23 | 2022-05-23 | Fully automatic method and system for testing read and write functions of dram storage cell |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2023225772A1 WO2023225772A1 (en) | 2023-11-30 |
| WO2023225772A9 true WO2023225772A9 (en) | 2024-01-04 |
Family
ID=88918091
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/CN2022/094352 WO2023225772A1 (en) | 2022-05-23 | 2022-05-23 | Fully automatic method and system for testing read and write functions of dram storage cell |
Country Status (1)
| Country | Link |
|---|---|
| WO (1) | WO2023225772A1 (en) |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102004012279B3 (en) * | 2004-03-12 | 2005-06-09 | Infineon Technologies Ag | Self-testing method for memories embedded in semicomnductor chip using memory self-testing control with memory self-testing register for storing memory test configuration data |
| CN106847343A (en) * | 2016-12-08 | 2017-06-13 | 上海精密计量测试研究所 | The method of testing of the mram memory based on ATE |
| CN110961364B (en) * | 2019-12-18 | 2022-06-17 | 浪潮(北京)电子信息产业有限公司 | Chip full-function self-test system based on FPGA platform and method thereof |
-
2022
- 2022-05-23 WO PCT/CN2022/094352 patent/WO2023225772A1/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| WO2023225772A1 (en) | 2023-11-30 |
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