WO2023222046A1 - Plasma chamber arc suppression method and apparatus, and radio frequency power supply system - Google Patents

Plasma chamber arc suppression method and apparatus, and radio frequency power supply system Download PDF

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Publication number
WO2023222046A1
WO2023222046A1 PCT/CN2023/094827 CN2023094827W WO2023222046A1 WO 2023222046 A1 WO2023222046 A1 WO 2023222046A1 CN 2023094827 W CN2023094827 W CN 2023094827W WO 2023222046 A1 WO2023222046 A1 WO 2023222046A1
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WIPO (PCT)
Prior art keywords
arc
reflection coefficient
plasma cavity
plasma
cavity
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PCT/CN2023/094827
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French (fr)
Chinese (zh)
Inventor
唐亚海
林伟群
乐卫平
林桂浩
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深圳市恒运昌真空技术有限公司
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Publication of WO2023222046A1 publication Critical patent/WO2023222046A1/en

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32917Plasma diagnostics
    • H01J37/32935Monitoring and controlling tubes by information coming from the object and/or discharge
    • H01J37/32944Arc detection
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/321Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/32174Circuits specially adapted for controlling the RF discharge
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32917Plasma diagnostics
    • H01J37/3299Feedback systems

Definitions

  • This application relates to the technical field of radio frequency system measurement and control, and in particular to a plasma cavity arc suppression method, device and radio frequency power supply system.
  • the often mentioned RF power supply system generally includes a RF power supply and a plasma chamber.
  • the RF power supply is a supporting power supply for the plasma chamber and is mostly used in equipment such as RF sputtering, PECVD chemical vapor deposition, and reactive ion etching.
  • EMI electromagnetic interference
  • the traditional suppression technology is mainly based on the detection of the instantaneous change rate of voltage and current, while the arc extinguishing technology extinguishes the arc through hardware equipment and suppresses the arc by designing an arc suppressor.
  • the inventor discovered that there is at least a technical problem of low arc suppression accuracy in the traditional technology.
  • a plasma cavity arc suppression method which method includes:
  • the reflection coefficient in the plasma cavity through arc detection sampling; the reflection coefficient includes instantaneous reflection coefficient and average reflection coefficient;
  • the state machine is used to instruct the RF power supply system to freeze the working parameters of the last corresponding restoration node, pause arc detection sampling, and cut off the power to the output end of the docking plasma cavity through the control module of the PID controller. output;
  • the control module of the PID controller is instructed according to the working parameters. Restore power output at the output and resume arc detection sampling.
  • the process of determining whether there is arc generation in the plasma cavity based on the comparison results includes:
  • setting analysis and judgment conditions includes:
  • N is a positive integer not less than 2.
  • setting analysis and judgment conditions includes:
  • setting analysis and judgment conditions includes:
  • setting analysis and judgment conditions includes:
  • N is a positive integer not less than 2.
  • the detection time period of arc detection sampling includes multiple detection time periods from small to large, and the reflection coefficient threshold is set to a manually set coefficient threshold or a coefficient threshold set adaptively by the system;
  • the above method also includes the steps:
  • the detection time will be extended to the next larger detection time period
  • the detection time remains unchanged, and the coefficient threshold set by the system is adaptively increased by a multiple increase or a fixed value increase.
  • the above method further includes the steps:
  • the PID controller is maintained in the general control state
  • the general control status includes:
  • the process of freezing the radio frequency power supply system and finally corresponding to restoring the operating parameters of the node is instructed through a state machine, including:
  • the state machine instructs the freezing of the last average reflection coefficient in the normal working state, instructs the control module to freeze the operating parameters, and instructs the output terminal to freeze the operating variable parameters of each unit device.
  • the step of obtaining the reflection coefficient in the plasma cavity through arc detection sampling includes:
  • the average reflection coefficient is calculated using all the instantaneous reflection coefficients obtained by the current sampling; among them, each sampling, mean calculation and threshold comparison are all single-time interval synchronous multi-thread processing.
  • a plasma cavity arc suppression device which includes:
  • the detection sampling module is used to obtain the reflection coefficient in the plasma cavity through arc detection sampling; the reflection coefficient includes the instantaneous reflection coefficient and the average reflection coefficient;
  • the coefficient comparison module is used to compare the absolute value of the difference between the instantaneous reflection coefficient and the average reflection coefficient with the set reflection coefficient threshold;
  • the arc elimination module is used to instruct the freezing of the radio frequency power supply system through the state machine and finally the working parameters of the corresponding restoration node, suspend arc detection sampling, and cut off the docking through the control module of the PID controller when it is determined that an arc is generated in the plasma cavity based on the comparison results. power output at the output of the plasma chamber;
  • the output recovery module is used to instruct the control module of the PID controller to restore the power output at the output end and resume arc detection sampling according to the working parameters after the arc in the plasma cavity disappears.
  • a radio frequency power supply system including a radio frequency power supply, a PID controller and a plasma chamber, and the radio frequency power supply is electrically connected to the plasma chamber through the PID controller;
  • the PID controller is used to implement the following arc suppression processing steps:
  • the reflection coefficient in the plasma cavity through arc detection sampling; the reflection coefficient includes instantaneous reflection coefficient and average reflection coefficient;
  • the operating parameters of the last corresponding reduction node of the RF power supply system will be frozen, arc detection sampling will be suspended, and the power output of the output end connected to the plasma cavity will be cut off;
  • a computer-readable storage medium on which a computer program is stored.
  • the steps of any of the above plasma cavity arc suppression methods are implemented.
  • the above-mentioned plasma cavity arc suppression method, device and radio frequency power supply system obtain the instantaneous and average reflection coefficient in the plasma cavity through arc detection sampling, and then compare it with the set reflection coefficient threshold to accurately determine whether there is an arc in the plasma cavity. If determined If an arc occurs in the plasma cavity, the state machine will instruct the RF power supply system to freeze the working parameters of the final corresponding restoration node, suspend arc detection sampling, and cut off the power output of the output end of the docking plasma cavity through the control module of the PID controller, that is, The power output of the RF power supply to the plasma chamber is suspended.
  • the control module of the PID controller is instructed according to the working parameters to resume the power output at the output end and resume arc detection sampling, that is, the RF power supply is restored to the plasma chamber.
  • the power output of the chamber achieves high-precision suppression of arcs in the plasma chamber.
  • the above scheme greatly improves the accuracy of judging whether an arc is generated through the comparison mechanism between the average reflection coefficient (also called gamma average) and the critical value.
  • the state machine is used to instruct the freezing system to work parameters corresponding to the final restoration node, suspend arc detection and suspend power output. Therefore, after the arc disappears in the cavity, power output can be accurately and quickly restored according to the frozen working parameters, achieving high Precise intra-cavity arc suppression processing, with lower arc suppression cost, higher efficiency and stronger adaptability.
  • Figure 1 is a schematic process environment diagram of a plasma cavity arc suppression method in one embodiment
  • Figure 2 is a schematic diagram of instantaneous value sampling in an embodiment
  • Figure 3 is a schematic diagram of the ARC inhibition stage in one embodiment
  • Figure 4 is a schematic flow chart of ARC monitoring and suppression processing in one embodiment
  • Figure 5 is a module structural block diagram of a plasma cavity arc suppression device in one embodiment
  • Figure 6 is a schematic structural framework diagram of a radio frequency power supply system in an embodiment
  • Figure 7 is a schematic structural diagram of an ARC processing module in an embodiment.
  • a plasma cavity arc suppression method is provided, which can be applied to various types of radio frequency power supply systems.
  • the method can include the following steps S12 to S18:
  • the reflection coefficient in the plasma cavity through arc detection sampling includes the instantaneous reflection coefficient and the average reflection coefficient.
  • arc detection sampling refers to sampling the measurement information of the plasma chamber by using the existing sensor system of the system or an external sensor device, so as to calculate the reflection coefficient in the plasma chamber (which may also be called in this article). is the gamma value) detection method.
  • the sampled measurement information may be at least one or a combination of several voltage values, current values, power values, cavity impedance values and power supply impedance values, as long as the reflection coefficient in the plasma cavity can be accurately measured.
  • the instantaneous reflection coefficient refers to the real-time reflection coefficient in the plasma cavity sampled at the current moment, and the average reflection coefficient may refer to the average coefficient value calculated using the reflection coefficients sampled up to the current moment.
  • arc detection and sampling are performed on the system (mainly the relevant electrical parameters of the plasma chamber) to obtain the instantaneous reflection coefficient in the plasma chamber and calculate the corresponding average reflection coefficient.
  • the instantaneous reflection coefficient can be recorded as ⁇ cur and the average reflection coefficient as ⁇ aver .
  • the above comparison process can be described as a judgment: Is
  • the state machine is used to instruct the freezing of the working parameters of the last corresponding restoration node of the RF power supply system, the arc detection sampling is suspended, and the output of the docking plasma cavity is cut off through the control module of the PID controller. terminal power output.
  • the state machine is a state control unit that instructs each module of the system to freeze and/or unfreeze working parameters.
  • the PID controller can include general control state and shutdown control state.
  • the PID controller samples and obtains the instantaneous value of gamma to calculate its average value, and compares it with
  • the instantaneous value of gamma and the comparison result are obtained and it is judged that no arc is generated, it is a general control state.
  • the lower PID controller maintains the current operation of its control module and continues to detect
  • the gamma value also records various working parameters of the system's normal operation at the current time node. This time node can be identified as a restoration node, and the data of this restoration node will be continuously updated under general control conditions.
  • the PID controller switches to the shutdown control state.
  • the state machine will also switch to the operating state, instructing each module to freeze the working parameters of the last corresponding reduction node and suspend arc detection.
  • Sampling for a period of time X (the length of this time Open the power output of the output end of the docking plasma cavity to cut off the RF power output of the RF power supply to the plasma chamber.
  • the plasma chamber After disconnecting the power output, the plasma chamber will experience a potential drop, a period of inactivity (zero potential time), and subsequent restoration of power.
  • the subsequent potential re-raising time potential rise time).
  • the control module of the PID controller cuts off the power output of the output end connected to the plasma chamber, the potential of the plasma chamber drops and remains at zero potential for a set time to eliminate the arc generated in the chamber.
  • the static setting time (the length of this time can be set according to the statistical rules of the minimum arc elimination time/arc extinguishing time in actual applications)
  • the arc is eliminated.
  • the operating state can be switched by the state machine to instruct each module to follow the arc extinguishing time.
  • the instantaneous and average reflection coefficients in the plasma cavity are obtained through arc detection sampling, and then compared with the set reflection coefficient threshold to accurately determine whether there is an arc in the plasma cavity. If it is determined that there is an arc in the plasma cavity, generated, then the state machine will be used to instruct the RF power supply system to freeze the working parameters of the last corresponding restoration node, suspend arc detection sampling, and cut off the power output of the output end of the docking plasma cavity through the control module of the PID controller, that is, suspend the RF power supply to the plasma After the arc in the plasma chamber disappears, the control module of the PID controller is instructed according to the working parameters to restore the power output at the output end and resume arc detection sampling, that is, restore the power output of the RF power supply to the plasma chamber. This achieves high-precision suppression of arcs in the plasma cavity.
  • the above scheme greatly improves the accuracy of judging whether an arc is generated through the comparison mechanism between the average reflection coefficient (also called gamma average) and the critical value.
  • the state machine is used to instruct the freezing system to work parameters corresponding to the final restoration node, suspend arc detection and suspend power output. Therefore, after the arc disappears in the cavity, power output can be accurately and quickly restored according to the frozen working parameters, achieving high Precise intra-cavity arc suppression processing, with lower arc suppression cost, higher efficiency and stronger adaptability.
  • the method of determining whether the arc in the plasma cavity has disappeared can be, but is not limited to: performing energy detection in the cavity and determining whether the residual energy in the cavity has returned to zero or is lower than a set energy threshold to determine whether the arc has disappeared. has disappeared (when the residual energy in the cavity returns to zero or is lower than the set energy threshold, it can be determined that the arc has disappeared, otherwise it has not disappeared); or by cutting off the power output and waiting for a set time, it can be determined that the arc in the cavity has disappeared. disappear; or it can be judged by manual visual observation whether the arc in the cavity has disappeared (observation finds that there is no arc in the cavity, it is determined that the arc has disappeared, otherwise it has not disappeared).
  • step S12 may specifically include the following processing steps:
  • the average reflection coefficient is calculated using all the instantaneous reflection coefficients obtained by the current sampling; among them, each sampling, mean calculation and threshold comparison are all single-time interval synchronous multi-thread processing.
  • the detection and sampling of instantaneous reflection coefficients adopts a timed and fixed-point sampling method. All sampled values are usable values and are used to calculate the gamma mean.
  • the PID controller uses single-time interval synchronous multi-thread processing, which can achieve the same purpose at multiple work sites simultaneously, as shown in Figure 2 display to further improve the reliability of intra-cavity reflection detection and arc judgment.
  • the process of determining whether an arc is generated in the plasma chamber based on the comparison results in the above step S16 may include the following determination:
  • whether there is an arc generated in the cavity can be directly determined by judging whether
  • this embodiment in order to further improve the accuracy of judging arc generation Degree, by judging whether
  • setting analysis and judgment conditions may include the following:
  • N is a positive integer not less than 2.
  • setting analysis and judgment conditions may also include the following:
  • the specific length can be determined based on actual application monitoring experience or the statistics of historical monitoring data), the limited number of times M or less (including 1 time ) and discontinuous, it can be determined that no arc is generated in the current plasma cavity.
  • setting analysis and judgment conditions may also include the following:
  • setting analysis and judgment conditions may also include the following:
  • N is a positive integer not less than 2.
  • the detection time period of arc detection sampling includes multiple detection time periods from small to large.
  • Set the reflection coefficient threshold to a manually set coefficient threshold or a system adaptively set coefficient threshold.
  • the above plasma cavity arc suppression method may also include the following steps:
  • the detection time will be extended to the next larger detection time period
  • the detection time remains unchanged, and the coefficient threshold set adaptively by the system is increased by multiples or fixed. Adaptive growth in the form of value growth.
  • the reflection coefficient threshold ⁇ th can be set manually (such as based on work experience or historical monitoring data, etc.), or can be set adaptively by the system. Among them, when the system adaptively sets it, an initial value ⁇ th can be set first to introduce the initial comparison process of
  • the initial value ⁇ th can be artificially set, or it can be It is calculated using dynamic data or historical data of ⁇ cur and ⁇ aver .
  • the frequency of arc generation is evaluated by
  • the coefficient threshold set by the system adaptively can remain unchanged.
  • the value of ⁇ th will be increased, such as using a multiple increase or a fixed value increase, or first obtaining
  • the dynamic maximum value is then used as a multiple or fixed value increase as the adjusted ⁇ th .
  • system adaptive coefficient threshold adjustment can be achieved, thereby further improving the accuracy of judging arc generation.
  • the above plasma cavity arc suppression method further includes the steps:
  • the general control status includes:
  • the PID controller obtains the instantaneous value of gamma to calculate its mean value, and compares it with
  • the specific process may include the following processing:
  • the state machine instructs the freezing of the last average reflection coefficient in the normal working state, instructs the control module to freeze the operating parameters, and instructs the output terminal to freeze the operating variable parameters of each unit device.
  • the PID controller switches to the shutdown control state, and its state machine will also switch to the operating state, instructing each module to freeze the working parameters of the final corresponding restoration node, such as instructing the module responsible for gamma mean calculation to freeze the gamma mean.
  • instruct the control module of the PID controller to freeze its operating parameters, and instruct the output end of the docking plasma chamber to freeze the operating variable parameters of its unit device; at the same time, the state machine instructs the PID controller to suspend monitoring the gamma value for a period of time X (including Potential fall time + zero potential + potential rise).
  • FIG. 3 it is a schematic diagram of ARC suppression at each stage.
  • the entire ARC occurrence process can be divided into seven stages A-G.
  • the meaning and processing method of each stage can be shown in Table 1.
  • FIG. 4 it is a schematic diagram of one of the ARC processing flows.
  • the entire process can be divided into two parts: the Gamma mean calculation and comparison part and the PID save suspension part.
  • a plasma cavity arc suppression device 100 including a detection sampling module 11 , a coefficient comparison module 13 , an arc elimination module 15 and an output recovery module 17 .
  • the detection sampling module 11 is used to obtain the reflection coefficient in the plasma cavity through arc detection sampling; the reflection coefficient includes an instantaneous reflection coefficient and an average reflection coefficient.
  • the coefficient comparison module 13 is used to compare the absolute value of the difference between the instantaneous reflection coefficient and the average reflection coefficient with the set reflection coefficient threshold.
  • the arc elimination module 15 is used to instruct the freezing of the working parameters of the last corresponding restoration node of the RF power supply system through the state machine, suspend the arc detection sampling, and cut off the docking through the control module of the PID controller when it is determined that an arc is generated in the plasma cavity based on the comparison results. Electrical output at the output of the plasma chamber.
  • the output recovery module 17 is used to instruct the control module of the PID controller to restore the power output of the output end and resume arc detection sampling according to the operating parameters after the arc in the plasma cavity disappears.
  • the above-mentioned plasma cavity arc suppression device 100 obtains the instantaneous and average reflection coefficient in the plasma cavity through arc detection sampling, and then compares it with the set reflection coefficient threshold to accurately determine whether there is an arc in the plasma cavity. If it is determined that there is an arc in the plasma cavity, generated, then the state machine will be used to instruct the RF power supply system to freeze the working parameters of the last corresponding restoration node, suspend arc detection sampling, and cut off the power output of the output end of the docking plasma cavity through the control module of the PID controller, that is, suspend the RF power supply to the plasma After the arc in the plasma chamber disappears, the control module of the PID controller is instructed according to the working parameters to restore the power output at the output end and resume arc detection sampling, that is, restore the power output of the RF power supply to the plasma chamber. This achieves high-precision suppression of arcs in the plasma cavity.
  • the above scheme greatly improves the accuracy of judging whether an arc is generated through the comparison mechanism between the average reflection coefficient (also called gamma average) and the critical value.
  • the state machine is used to instruct the freezing system to work parameters corresponding to the last restoration node, suspend arc detection and suspend power output, so that after the arc disappears in the cavity, it can be accurately and quickly restored according to the frozen working parameters.
  • the power output realizes high-precision intra-cavity arc suppression processing, and the arc suppression cost is lower, the efficiency is higher, and the adaptability is stronger.
  • the process of determining whether there is arc generation in the plasma cavity based on the comparison results includes:
  • setting analysis and judgment conditions includes:
  • N is a positive integer not less than 2.
  • setting analysis and judgment conditions includes:
  • setting analysis and judgment conditions includes:
  • setting analysis and judgment conditions includes:
  • N is a positive integer not less than 2.
  • the detection time period of arc detection sampling includes multiple detection time periods from small to large, and the reflection coefficient threshold is set to a manually set coefficient threshold or a coefficient threshold set adaptively by the system;
  • the above method also includes the steps:
  • the detection time will be extended to the next larger detection time period
  • the detection time remains unchanged, and the coefficient threshold set by the system is adaptively increased by a multiple increase or a fixed value increase.
  • the above method further includes the steps:
  • the PID controller is maintained in the general control state
  • the general control status includes:
  • the process of freezing the operating parameters of the corresponding restoration node of the radio frequency power supply system through a state machine instruction includes:
  • the state machine instructs the freezing of the last average reflection coefficient in the normal working state, instructs the control module to freeze the operating parameters, and instructs the output terminal to freeze the operating variable parameters of each unit device.
  • the step of obtaining the reflection coefficient in the plasma cavity through arc detection sampling includes:
  • the average reflection coefficient is calculated using all the instantaneous reflection coefficients obtained by the current sampling; among them, each sampling, mean calculation and threshold comparison are all single-time interval synchronous multi-thread processing.
  • Each module in the above-mentioned plasma cavity arc suppression device 100 can be implemented in whole or in part by software, hardware, and combinations thereof.
  • Each of the above modules can be embedded in or independent of the PID controller or processor in the radio frequency power supply system in the form of hardware, or can be stored in the memory in the radio frequency power supply system in the form of software to facilitate the call and execution of the PID controller or processor. The operations corresponding to each of the above modules.
  • a radio frequency power supply system 200 including a radio frequency power supply 22 , a PID controller 24 and a plasma chamber 26 .
  • RF power supply 22 is electrically connected to plasma chamber 26 through PID controller 24.
  • the PID controller 24 is used to implement the following arc suppression processing steps:
  • the reflection coefficient in the plasma cavity through arc detection sampling; the reflection coefficient includes instantaneous reflection coefficient and average reflection coefficient;
  • the power output at the output end is restored according to the working parameters and the Complex arc detection sampling.
  • Figure 7 shows the structure of the ARC processing module divided according to the implementation function.
  • the PID controller 24 can be divided into a control module that controls the output end of the docking plasma chamber 26 and an ARC processing module as shown in Figure 7.
  • the ARC processing module which includes an average calculation unit, a comparison unit, an ARC detection unit and a state machine.
  • the average calculation unit can be used to calculate the instantaneous reflection coefficient from the measurement information of the real-time detection sample and calculate the corresponding average reflection coefficient.
  • the comparison unit can be used to compare
  • the ARC detection unit can be used to determine whether there is arc generation in the cavity based on the comparison results.
  • the state machine can be used to implement the corresponding indication control function shown in the above embodiment.
  • Figures 6 and 7 are only block diagrams of some product entities and functional structures related to the solution of this application, and do not constitute a detailed limitation of the radio frequency power supply system to which the solution of this application is applied.
  • the specific radio frequency power system It may include more or fewer components than shown in the above figure, or combine certain components, or have a different component arrangement, as determined by the actual type of RF power supply system.
  • the above-mentioned radio frequency power supply system 200 obtains the instantaneous and average reflection coefficient in the plasma cavity through arc detection sampling, and then compares it with the set reflection coefficient threshold to accurately determine whether an arc is generated in the plasma cavity. If it is determined that an arc is generated in the plasma cavity, Then, the working parameters of the last corresponding restoration node of the radio frequency power supply system will be frozen through the state machine instruction, arc detection sampling will be suspended, and the power output of the output end of the docking plasma cavity will be cut off through the control module of the PID controller 24, that is, the radio frequency power supply to the plasma cavity will be suspended.
  • the control module of the PID controller 24 is instructed according to the operating parameters to restore the power output at the output end and resume arc detection sampling, that is, restore the power of the RF power supply to the plasma chamber 26 output, thereby achieving high-precision suppression of arcs in the plasma cavity.
  • the above scheme greatly improves the accuracy of judging whether an arc is generated through the comparison mechanism between the average reflection coefficient (also called gamma average) and the critical value.
  • the state machine is used to indicate the operating parameters of the freezing system's last corresponding restoration node, pause arc detection, and pause. Power output, so that after the arc in the cavity disappears, the power output can be accurately and quickly restored according to the frozen working parameters, achieving high-precision arc suppression processing in the cavity, and the arc suppression cost is lower, the efficiency is higher, and the adaptability is stronger .
  • a computer-readable storage medium is also provided, with a computer program stored thereon.
  • the computer program is executed by the processor, the following processing steps are implemented: obtaining the reflection coefficient in the plasma cavity through arc detection sampling; the reflection coefficient includes Instantaneous reflection coefficient and average reflection coefficient; compare the absolute value of the difference between the instantaneous reflection coefficient and the average reflection coefficient with the set reflection coefficient threshold; if it is determined that an arc is generated in the plasma cavity according to the comparison result, the RF power supply system will be frozen through the state machine instruction
  • the arc detection sampling is suspended and the power output of the output end of the docking plasma cavity is cut off through the control module of the PID controller; after the arc in the plasma cavity disappears, the control module of the PID controller is instructed according to the working parameters.
  • the group restores power output at the output terminal and resumes arc detection sampling.
  • the added steps or sub-steps in the above embodiments of the plasma cavity arc suppression method can also be implemented.
  • Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory.
  • Volatile memory may include random access memory (RAM) or external cache memory.
  • RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous chain Synchlink DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), etc.
  • SRAM static RAM
  • DRAM dynamic RAM
  • SDRAM synchronous DRAM
  • DDRSDRAM double data rate SDRAM
  • ESDRAM enhanced SDRAM
  • SLDRAM synchronous chain Synchlink DRAM
  • Rambus direct RAM
  • DRAM direct memory bus dynamic RAM
  • RDRAM memory bus dynamic RAM

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Abstract

The present application relates to a plasma chamber arc suppression method and apparatus, and a radio frequency power supply system. The method comprises: acquiring reflection coefficients in a plasma chamber by means of arc detection sampling, the reflection coefficients comprising an instantaneous reflection coefficient and an average reflection coefficient; comparing the absolute value of the difference between the instantaneous reflection coefficient and the average reflection coefficient with a set reflection coefficient threshold; if it is determined that an arc is produced in the plasma chamber according to a comparison result, instructing, by means of a state machine, to freeze the last working parameters corresponding to a recovery node of the radio frequency power supply system, to pause arc detection sampling, and to cut off power output of an output end connected to the plasma chamber by means of a control module of a PID controller; and after the electric arc in the plasma chamber disappears, instructing the control module of the PID controller to restore power output of the output end according to working parameters, and restoring electric arc detection sampling. High precision intrachamber arc suppression is implemented.

Description

等离子体腔电弧抑制方法、装置和射频电源系统Plasma cavity arc suppression method, device and radio frequency power supply system 技术领域Technical field
本申请涉及射频系统测控技术领域,特别是涉及一种等离子体腔电弧抑制方法、装置和射频电源系统。This application relates to the technical field of radio frequency system measurement and control, and in particular to a plasma cavity arc suppression method, device and radio frequency power supply system.
背景技术Background technique
随着射频电源技术的发展,该技术的应用领域也得到了发展,从以前的真空领域扩展到其他领域,如半导体进而美容等领域。常说的射频电源系统一般包括射频电源和等离子体腔室,射频电源是等离子体腔室的配套电源,多应用于射频溅射、PECVD化学气相沉积、反应离子刻蚀等设备中。在实际应用中,等离子体腔室内电弧的产生会导致产品良品率下降,也会进一步导致电磁干扰(EMI)问题。目前,对于等离子体腔室内电弧的产生,传统的抑制技术主要是以检测电压电流瞬时变化率的判断方式,而灭弧技术则是通过硬件设备进行灭弧,通过设计电弧抑制器对电弧进行抑制。然而,在实现过程中,发明人发现传统技术中至少存在着电弧抑制精确度不高的技术问题。With the development of radio frequency power supply technology, the application fields of this technology have also developed, expanding from the previous vacuum field to other fields, such as semiconductors and then beauty. The often mentioned RF power supply system generally includes a RF power supply and a plasma chamber. The RF power supply is a supporting power supply for the plasma chamber and is mostly used in equipment such as RF sputtering, PECVD chemical vapor deposition, and reactive ion etching. In practical applications, the generation of arcs in the plasma chamber will lead to a decrease in product yield and further lead to electromagnetic interference (EMI) problems. At present, for the generation of arc in the plasma chamber, the traditional suppression technology is mainly based on the detection of the instantaneous change rate of voltage and current, while the arc extinguishing technology extinguishes the arc through hardware equipment and suppresses the arc by designing an arc suppressor. However, during the implementation process, the inventor discovered that there is at least a technical problem of low arc suppression accuracy in the traditional technology.
发明内容Contents of the invention
基于此,有必要针对上述技术问题,提供一种能够大幅提高腔内电弧抑制精确度的等离子体腔电弧抑制方法、等离子体腔电弧抑制装置、一种射频电源系统以及一种计算机可读存储介质。Based on this, it is necessary to address the above technical problems and provide a plasma cavity arc suppression method, a plasma cavity arc suppression device, a radio frequency power supply system and a computer-readable storage medium that can greatly improve the accuracy of intra-cavity arc suppression.
为了实现上述目的,本申请提供了以下技术方案:In order to achieve the above objectives, this application provides the following technical solutions:
一方面,提供一种等离子体腔电弧抑制方法,所述方法包括:On the one hand, a plasma cavity arc suppression method is provided, which method includes:
通过电弧检测采样获取等离子体腔内的反射系数;反射系数包括瞬时反射系数和平均反射系数;Obtain the reflection coefficient in the plasma cavity through arc detection sampling; the reflection coefficient includes instantaneous reflection coefficient and average reflection coefficient;
将瞬时反射系数和平均反射系数的差值绝对值与设定反射系数阈值比较;Compare the absolute value of the difference between the instantaneous reflection coefficient and the average reflection coefficient with the set reflection coefficient threshold;
若根据比较结果确定等离子体腔内有电弧产生,则通过状态机指示冻结射频电源系统最后对应还原节点的工作参数、暂停电弧检测采样并通过PID控制器的控制模组切断对接等离子体腔的输出端的电力输出;If it is determined that an arc is generated in the plasma cavity based on the comparison results, the state machine is used to instruct the RF power supply system to freeze the working parameters of the last corresponding restoration node, pause arc detection sampling, and cut off the power to the output end of the docking plasma cavity through the control module of the PID controller. output;
在等离子体腔内的电弧消失后,按照工作参数指示PID控制器的控制模组 恢复输出端的电力输出并恢复电弧检测采样。After the arc in the plasma cavity disappears, the control module of the PID controller is instructed according to the working parameters. Restore power output at the output and resume arc detection sampling.
在其中一个实施例中,根据比较结果确定等离子体腔内是否有电弧产生的过程,包括:In one embodiment, the process of determining whether there is arc generation in the plasma cavity based on the comparison results includes:
根据差值绝对值小于设定反射系数阈值满足设定分析判断条件的情况,确定等离子体腔内有电弧产生或无电弧产生。According to the situation that the absolute value of the difference is less than the set reflection coefficient threshold and meets the set analysis and judgment conditions, it is determined whether there is arc generation or no arc generation in the plasma cavity.
在其中一个实施例中,设定分析判断条件包括:In one embodiment, setting analysis and judgment conditions includes:
若差值绝对值连续N次小于设定反射系数阈值,则确定等离子体腔内无电弧产生;N为不小于2的正整数。If the absolute value of the difference is less than the set reflection coefficient threshold for N consecutive times, it is determined that no arc is generated in the plasma cavity; N is a positive integer not less than 2.
在其中一个实施例中,设定分析判断条件包括:In one embodiment, setting analysis and judgment conditions includes:
若在设定时段内差值绝对值大于设定反射系数阈值出现M次且不连续,则确定等离子体腔内无电弧产生;M为不小于1的正整数。If the absolute value of the difference is greater than the set reflection coefficient threshold M times and is discontinuous within the set period, it is determined that no arc is generated in the plasma cavity; M is a positive integer not less than 1.
在其中一个实施例中,设定分析判断条件包括:In one embodiment, setting analysis and judgment conditions includes:
若差值绝对值大于设定反射系数阈值达1次,则确定等离子体腔内有电弧产生。If the absolute value of the difference is greater than the set reflection coefficient threshold for 1 time, it is determined that an arc is generated in the plasma cavity.
在其中一个实施例中,设定分析判断条件包括:In one embodiment, setting analysis and judgment conditions includes:
若差值绝对值连续N次大于设定反射系数阈值,则确定等离子体腔内有电弧产生;N为不小于2的正整数。If the absolute value of the difference is greater than the set reflection coefficient threshold for N consecutive times, it is determined that an arc is generated in the plasma cavity; N is a positive integer not less than 2.
在其中一个实施例中,电弧检测采样的检测时间段包括由小到大的多个检测时间段,设定反射系数阈值为人工设定的系数阈值或系统自适应设置的系数阈值;In one embodiment, the detection time period of arc detection sampling includes multiple detection time periods from small to large, and the reflection coefficient threshold is set to a manually set coefficient threshold or a coefficient threshold set adaptively by the system;
上述方法还包括步骤:The above method also includes the steps:
从最小的检测时间段起,若等离子体腔内有电弧产生的频率小于设定频率阈值,则将检测时间加长至下一个更大的检测时间段;Starting from the minimum detection time period, if the frequency of arc generation in the plasma cavity is less than the set frequency threshold, the detection time will be extended to the next larger detection time period;
否则保持检测时间不变,对系统自适应设置的系数阈值采用倍数增长或定值增长的方式进行自适应增长。Otherwise, the detection time remains unchanged, and the coefficient threshold set by the system is adaptively increased by a multiple increase or a fixed value increase.
在其中一个实施例中,上述方法还包括步骤:In one embodiment, the above method further includes the steps:
若根据比较结果确定等离子体腔内无电弧产生,则维持PID控制器工作在一般控制状态;If it is determined based on the comparison results that no arc is generated in the plasma cavity, the PID controller is maintained in the general control state;
其中,一般控制状态包括:Among them, the general control status includes:
维持控制模组的现行工作状态; Maintain the current working status of the control module;
持续进行电弧检测采样,获取等离子体腔内的反射系数;Continuously conduct arc detection sampling to obtain the reflection coefficient in the plasma cavity;
记录当前正常工作状态下的平均反射系数;Record the average reflection coefficient under current normal working conditions;
记录对控制模组的运作参数;Record the operating parameters of the control module;
记录输出端的单元器件的运作变量参数,将当前正常工作的时间节点设定为还原节点并持续更新。Record the operating variable parameters of the unit device at the output end, set the current normal working time node as the restoration node, and continuously update it.
在其中一个实施例中,通过状态机指示冻结射频电源系统最后对应还原节点的工作参数的过程,包括:In one embodiment, the process of freezing the radio frequency power supply system and finally corresponding to restoring the operating parameters of the node is instructed through a state machine, including:
通过状态机指示冻结正常工作状态下的最后一个平均反射系数、指示控制模组冻结运作参数以及指示输出端冻结各单元器件的运作变量参数。The state machine instructs the freezing of the last average reflection coefficient in the normal working state, instructs the control module to freeze the operating parameters, and instructs the output terminal to freeze the operating variable parameters of each unit device.
在其中一个实施例中,通过电弧检测采样获取等离子体腔内的反射系数的步骤,包括:In one embodiment, the step of obtaining the reflection coefficient in the plasma cavity through arc detection sampling includes:
采用定时定点采样的方式获取瞬时反射系数;Use timed and fixed-point sampling to obtain the instantaneous reflection coefficient;
利用当前采样得到的所有瞬时反射系数计算得到平均反射系数;其中,每次的采样、均值计算以及阈值比较均为单时间间隔同步多线程处理。The average reflection coefficient is calculated using all the instantaneous reflection coefficients obtained by the current sampling; among them, each sampling, mean calculation and threshold comparison are all single-time interval synchronous multi-thread processing.
另一方面,提供一种等离子体腔电弧抑制装置,装置包括:On the other hand, a plasma cavity arc suppression device is provided, which includes:
检测采样模块,用于通过电弧检测采样获取等离子体腔内的反射系数;反射系数包括瞬时反射系数和平均反射系数;The detection sampling module is used to obtain the reflection coefficient in the plasma cavity through arc detection sampling; the reflection coefficient includes the instantaneous reflection coefficient and the average reflection coefficient;
系数比较模块,用于将瞬时反射系数和平均反射系数的差值绝对值与设定反射系数阈值比较;The coefficient comparison module is used to compare the absolute value of the difference between the instantaneous reflection coefficient and the average reflection coefficient with the set reflection coefficient threshold;
电弧消除模块,用于在根据比较结果确定等离子体腔内有电弧产生时,通过状态机指示冻结射频电源系统最后对应还原节点的工作参数、暂停电弧检测采样并通过PID控制器的控制模组切断对接等离子体腔的输出端的电力输出;The arc elimination module is used to instruct the freezing of the radio frequency power supply system through the state machine and finally the working parameters of the corresponding restoration node, suspend arc detection sampling, and cut off the docking through the control module of the PID controller when it is determined that an arc is generated in the plasma cavity based on the comparison results. power output at the output of the plasma chamber;
输出恢复模块,用于在等离子体腔内的电弧消失后,按照工作参数指示PID控制器的控制模组恢复输出端的电力输出并恢复电弧检测采样。The output recovery module is used to instruct the control module of the PID controller to restore the power output at the output end and resume arc detection sampling according to the working parameters after the arc in the plasma cavity disappears.
又一方面,提供一种射频电源系统,包括射频电源、PID控制器和等离子体腔室,射频电源通过PID控制器电气连接等离子体腔室;In another aspect, a radio frequency power supply system is provided, including a radio frequency power supply, a PID controller and a plasma chamber, and the radio frequency power supply is electrically connected to the plasma chamber through the PID controller;
PID控制器用于实现如下电弧抑制处理步骤:The PID controller is used to implement the following arc suppression processing steps:
通过电弧检测采样获取等离子体腔内的反射系数;反射系数包括瞬时反射系数和平均反射系数;Obtain the reflection coefficient in the plasma cavity through arc detection sampling; the reflection coefficient includes instantaneous reflection coefficient and average reflection coefficient;
将瞬时反射系数和平均反射系数的差值绝对值与设定反射系数阈值比较; Compare the absolute value of the difference between the instantaneous reflection coefficient and the average reflection coefficient with the set reflection coefficient threshold;
若根据比较结果确定等离子体腔内有电弧产生,则冻结射频电源系统最后对应还原节点的工作参数、暂停电弧检测采样并切断对接等离子体腔的输出端的电力输出;If it is determined that an arc is generated in the plasma cavity based on the comparison results, the operating parameters of the last corresponding reduction node of the RF power supply system will be frozen, arc detection sampling will be suspended, and the power output of the output end connected to the plasma cavity will be cut off;
在等离子体腔内的电弧消失后,按照工作参数恢复输出端的电力输出并恢复电弧检测采样。After the arc in the plasma cavity disappears, the power output at the output end is restored according to the working parameters and arc detection sampling is resumed.
再一方面,提供一种计算机可读存储介质,其上存储有计算机程序,计算机程序被处理器执行时实现上述任一项的等离子体腔电弧抑制方法的步骤。In yet another aspect, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps of any of the above plasma cavity arc suppression methods are implemented.
上述技术方案中的一个技术方案具有如下优点和有益效果:One of the above technical solutions has the following advantages and beneficial effects:
上述等离子体腔电弧抑制方法、装置和射频电源系统,通过电弧检测采样获取等离子体腔内的瞬时和平均反射系数,然后与设定反射系数阈值比较,以精准判断等离子体腔内是否有电弧产生,如果确定等离子体腔内有电弧产生,那么会通过状态机指示冻结射频电源系统最后对应还原节点的工作参数、暂停电弧检测采样并通过PID控制器的控制模组切断对接等离子体腔的输出端的电力输出,也即暂停射频电源对等离子体腔室的功率输出,待等离子体腔内的电弧消失后,按照工作参数指示PID控制器的控制模组恢复输出端的电力输出并恢复电弧检测采样,也即恢复射频电源对等离子体腔室的功率输出,从而实现对等离子体腔内的电弧的高精确度抑制。The above-mentioned plasma cavity arc suppression method, device and radio frequency power supply system obtain the instantaneous and average reflection coefficient in the plasma cavity through arc detection sampling, and then compare it with the set reflection coefficient threshold to accurately determine whether there is an arc in the plasma cavity. If determined If an arc occurs in the plasma cavity, the state machine will instruct the RF power supply system to freeze the working parameters of the final corresponding restoration node, suspend arc detection sampling, and cut off the power output of the output end of the docking plasma cavity through the control module of the PID controller, that is, The power output of the RF power supply to the plasma chamber is suspended. After the arc in the plasma chamber disappears, the control module of the PID controller is instructed according to the working parameters to resume the power output at the output end and resume arc detection sampling, that is, the RF power supply is restored to the plasma chamber. The power output of the chamber achieves high-precision suppression of arcs in the plasma chamber.
相比于传统方法,上述方案通过反射系数均值(也可称gamma均值)与临界值的对比机制,大幅提高了电弧是否产生的判断精确度。在确定电弧产生时通过状态机指示冻结系统最后对应还原节点的工作参数、暂停电弧检测并暂停功率输出,从而在腔内电弧消失后可以按照冻结的工作参数准确且迅速地恢复功率输出,实现高精确度的腔内电弧抑制处理,而且电弧抑制成本更低,效率更高,适应性更强。Compared with the traditional method, the above scheme greatly improves the accuracy of judging whether an arc is generated through the comparison mechanism between the average reflection coefficient (also called gamma average) and the critical value. When the arc generation is determined, the state machine is used to instruct the freezing system to work parameters corresponding to the final restoration node, suspend arc detection and suspend power output. Therefore, after the arc disappears in the cavity, power output can be accurately and quickly restored according to the frozen working parameters, achieving high Precise intra-cavity arc suppression processing, with lower arc suppression cost, higher efficiency and stronger adaptability.
附图说明Description of the drawings
为了更清楚地说明本申请实施例或传统技术中的技术方案,下面将对实施例或传统技术描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本申请的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to more clearly explain the technical solutions in the embodiments of the present application or the traditional technology, the drawings needed to be used in the description of the embodiments or the traditional technology will be briefly introduced below. Obviously, the drawings in the following description are only for the purpose of explaining the embodiments or the technical solutions of the traditional technology. For some embodiments of the application, those of ordinary skill in the art can also obtain other drawings based on these drawings without exerting creative efforts.
图1为一个实施例中的等离子体腔电弧抑制方法的流程示意环境图; Figure 1 is a schematic process environment diagram of a plasma cavity arc suppression method in one embodiment;
图2为一个实施例中的瞬时值采样示意图;Figure 2 is a schematic diagram of instantaneous value sampling in an embodiment;
图3为一个实施例中的ARC抑制阶段示意图;Figure 3 is a schematic diagram of the ARC inhibition stage in one embodiment;
图4为一个实施例中的ARC监测与抑制处理的流程示意图;Figure 4 is a schematic flow chart of ARC monitoring and suppression processing in one embodiment;
图5为一个实施例中的等离子体腔电弧抑制装置的模块结构框图;Figure 5 is a module structural block diagram of a plasma cavity arc suppression device in one embodiment;
图6为一个实施例中的射频电源系统的结构框架示意图;Figure 6 is a schematic structural framework diagram of a radio frequency power supply system in an embodiment;
图7为一个实施例中的ARC处理模块的结构示意图。Figure 7 is a schematic structural diagram of an ARC processing module in an embodiment.
具体实施方式Detailed ways
为了使本申请的目的、技术方案及优点更加清楚明白,以下结合附图及实施例,对本申请进行进一步详细说明。应当理解,此处描述的具体实施例仅仅用以解释本申请,并不用于限定本申请。In order to make the purpose, technical solutions and advantages of the present application more clear, the present application will be further described in detail below with reference to the drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application and are not used to limit the present application.
除非另有定义,本文所使用的所有的技术和科学术语与属于本申请的技术领域的技术人员通常理解的含义相同。本文中在本申请的说明书中所使用的术语只是为了描述具体的实施例的目的,不是旨在于限制本申请。Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field to which this application belongs. The terminology used herein in the description of the application is for the purpose of describing specific embodiments only and is not intended to limit the application.
需要说明的是,在本文中提及“实施例”意味着,结合实施例描述的特定特征、结构或特性可以包含在本发明的至少一个实施例中。在说明书中的各个位置展示该短语并不一定均是指相同的实施例,也不是与其它实施例互斥的独立的或备选的实施例。It should be noted that reference to "embodiments" herein means that specific features, structures or characteristics described in connection with the embodiments may be included in at least one embodiment of the present invention. The appearances of this phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments.
本领域技术人员可以理解,本文所描述的实施例可以与其它实施例相结合。在本发明说明书和所附权利要求书中使用的术语“和/或”是指相关联列出的项中的一个或多个的任何组合以及所有可能组合,并且包括这些组合。Those skilled in the art will appreciate that the embodiments described herein may be combined with other embodiments. As used in this specification and the appended claims, the term "and/or" means and includes any and all possible combinations of one or more of the associated listed items.
在实践研究中,发明人发现只通过对电流电压变化率进行检测判断是否产生电弧现象可能会导致误判,从而影响系统的正常运行。而采用专门的灭弧装置虽然能有效抑制电弧现象,但提高了系统复杂性及制造成本,在只有小电弧产生的使用场景下,灭弧装置的必要性并不高。此外,灭弧装置需要针对于特定的场景进行设计,而等离子体腔内的电弧种类繁多,单一的灭弧装置难以起到效果。因此,本申请针对传统技术中至少存在着电弧抑制精确度不高的技术问题,提出了一种新的等离子体腔电弧抑制方法,可以实现高精确度的腔内电弧抑制。In practical research, the inventor found that only detecting the current and voltage change rate to determine whether an arc phenomenon occurs may lead to misjudgment, thereby affecting the normal operation of the system. Although the use of a special arc extinguishing device can effectively suppress arc phenomena, it increases system complexity and manufacturing costs. In usage scenarios where only small arcs are generated, the arc extinguishing device is not necessary. In addition, arc extinguishing devices need to be designed for specific scenarios, and there are many types of arcs in the plasma cavity, making it difficult for a single arc extinguishing device to be effective. Therefore, this application proposes a new plasma cavity arc suppression method that can achieve high-precision intra-cavity arc suppression in order to address the technical problem of low arc suppression accuracy at least in traditional technology.
下面将结合本发明实施例图中的附图,对本发明实施方式进行详细说明。 The embodiments of the present invention will be described in detail below with reference to the accompanying drawings of the embodiments of the present invention.
在一个实施例中,如图1所示,提供了一种等离子体腔电弧抑制方法,可以应用于各类型的射频电源系统,该方法可以包括以下步骤S12至S18:In one embodiment, as shown in Figure 1, a plasma cavity arc suppression method is provided, which can be applied to various types of radio frequency power supply systems. The method can include the following steps S12 to S18:
S12,通过电弧检测采样获取等离子体腔内的反射系数;反射系数包括瞬时反射系数和平均反射系数。S12, obtain the reflection coefficient in the plasma cavity through arc detection sampling; the reflection coefficient includes the instantaneous reflection coefficient and the average reflection coefficient.
可以理解,电弧检测采样是指通过利用系统现有的传感器系统或者外接的传感器装置等,对等离子体腔室进行量测信息采样,以便据此计算出等离子体腔内的反射系数(本文中也可称为gamma值)的检测手段。采样的量测信息可以是电压值、电流值、功率值、腔体阻抗值和电源阻抗值中的至少一种或几种的组合,只要能够准确测出等离子体腔内的反射系数即可。瞬时反射系数是指当前时刻采样得到的等离子体腔内的实时反射系数,平均反射系数则可以是指利用截至当前时刻的所有采样得到的反射系数计算得到的平均系数值。It can be understood that arc detection sampling refers to sampling the measurement information of the plasma chamber by using the existing sensor system of the system or an external sensor device, so as to calculate the reflection coefficient in the plasma chamber (which may also be called in this article). is the gamma value) detection method. The sampled measurement information may be at least one or a combination of several voltage values, current values, power values, cavity impedance values and power supply impedance values, as long as the reflection coefficient in the plasma cavity can be accurately measured. The instantaneous reflection coefficient refers to the real-time reflection coefficient in the plasma cavity sampled at the current moment, and the average reflection coefficient may refer to the average coefficient value calculated using the reflection coefficients sampled up to the current moment.
具体地,在射频电源系统的工作过程中,对系统(主要是其中的等离子体腔室的相关电参量)进行电弧检测采样,以得到等离子体腔内的瞬时反射系数并计算得到相应的平均反射系数。Specifically, during the operation of the radio frequency power supply system, arc detection and sampling are performed on the system (mainly the relevant electrical parameters of the plasma chamber) to obtain the instantaneous reflection coefficient in the plasma chamber and calculate the corresponding average reflection coefficient.
S14,将瞬时反射系数和平均反射系数的差值绝对值与设定反射系数阈值比较。S14: Compare the absolute value of the difference between the instantaneous reflection coefficient and the average reflection coefficient with the set reflection coefficient threshold.
可以理解,为便于叙述,可以将瞬时反射系数记为Γcur,将平均反射系数记为Γaver,上述比较过程则可以描述为判断:|Γcur–Γaver|<Γth是否成立,成立则代表系统当前正常工作,腔内没有电弧产生,不成立则代表系统当前工作异常,腔内有电弧产生。It can be understood that for the convenience of description, the instantaneous reflection coefficient can be recorded as Γ cur and the average reflection coefficient as Γ aver . The above comparison process can be described as a judgment: Is |Γ cur – Γ aver |<Γ th true? If true, then It means that the system is currently working normally and there is no arc generated in the cavity. If it is not true, it means that the system is currently working abnormally and there is arc generated in the cavity.
上述通过电弧检测采样、gamma均值计算与比对处理的部分,用于精准判断腔内是否有电弧产生的过程,也可以称之为ARC(电弧)监测。The above-mentioned part of arc detection sampling, gamma average calculation and comparison processing is used to accurately determine whether there is an arc in the cavity, which can also be called ARC (arc) monitoring.
S16,若根据比较结果确定等离子体腔内有电弧产生,则通过状态机指示冻结射频电源系统最后对应还原节点的工作参数、暂停电弧检测采样并通过PID控制器的控制模组切断对接等离子体腔的输出端的电力输出。S16, if it is determined that an arc is generated in the plasma cavity based on the comparison results, the state machine is used to instruct the freezing of the working parameters of the last corresponding restoration node of the RF power supply system, the arc detection sampling is suspended, and the output of the docking plasma cavity is cut off through the control module of the PID controller. terminal power output.
可以理解,在系统中,状态机是指示系统各模块进行工作参数冻结和/或解冻的状态控制单元。在系统工作过程中,PID控制器可以包括一般控制状态和关断控制状态。PID控制器采样获取gamma瞬时值以计算其均值,并与|Γcur–Γaver|<Γth进行对比,获取gamma瞬时值与对比结果且判断为无电弧产生时即为一般控制状态,该状态下PID控制器维持其控制模块的现行工作并且持续检测 gamma值,同时记录当前时间节点下系统正常工作的各项工作参数,该时间节点可认定为还原节点,此还原节点的各数据在一般控制状态下会不断被更新。It can be understood that in the system, the state machine is a state control unit that instructs each module of the system to freeze and/or unfreeze working parameters. During the system operation, the PID controller can include general control state and shutdown control state. The PID controller samples and obtains the instantaneous value of gamma to calculate its average value, and compares it with |Γ cur –Γ aver |<Γ th . When the instantaneous value of gamma and the comparison result are obtained and it is judged that no arc is generated, it is a general control state. This state The lower PID controller maintains the current operation of its control module and continues to detect The gamma value also records various working parameters of the system's normal operation at the current time node. This time node can be identified as a restoration node, and the data of this restoration node will be continuously updated under general control conditions.
在确定等离子体腔内有电弧产生时,PID控制器切换至关断控制状态,该状态下,一方面,状态机也将切换运作状态,指示各模块冻结最后对应还原节点的工作参数,暂停电弧检测采样(ARC监测)一段时间X(该时间X长短可依据等离子体腔的电位下降时间+零电位时间+电位上升时间设定);另一方面,PID控制器的控制模组仍处于运作状态,断开对接等离子体腔的输出端的电力输出,以切断射频电源对等离子体腔室的射频功率输出,断开电力输出起,等离子体腔室将经历电位下降,静止一段时间(零电位时间),以及后续恢复电力后的电位重新拉升时间(电位上升时间)。When it is determined that an arc is generated in the plasma cavity, the PID controller switches to the shutdown control state. In this state, on the one hand, the state machine will also switch to the operating state, instructing each module to freeze the working parameters of the last corresponding reduction node and suspend arc detection. Sampling (ARC monitoring) for a period of time X (the length of this time Open the power output of the output end of the docking plasma cavity to cut off the RF power output of the RF power supply to the plasma chamber. After disconnecting the power output, the plasma chamber will experience a potential drop, a period of inactivity (zero potential time), and subsequent restoration of power. The subsequent potential re-raising time (potential rise time).
S18,在等离子体腔内的电弧消失后,按照工作参数指示PID控制器的控制模组恢复输出端的电力输出并恢复电弧检测采样。S18, after the arc in the plasma cavity disappears, instruct the control module of the PID controller to restore the power output at the output end and resume arc detection sampling according to the working parameters.
可以理解,在PID控制器的控制模组切断对接等离子体腔的输出端的电力输出后,等离子体腔室的电位下降并在零电位保持设定时间,以消除腔内产生的电弧。在静止设定时间后(该时间长短可以已经实际应用中电弧消除的最短时间/灭弧时间统计规律设定),电弧被消除,此时可以由状态机切换运作状态以指示各模块按照灭弧前最后冻结的还原节点的工作参数恢复正常工作状态,PID控制器的控制模组重新接通对接等离子体腔室的电力输出,而且PID控制器重新启用ARC监测,如此即进入下一轮的电弧监测与抑制工作过程。本领域技术人员可以理解,若恢复工作后,仍监测到腔内电弧产生,则可以重复上述动作进行电弧抑制,可选的,可以延长零电位时间,以达到更好的灭弧效果。It can be understood that after the control module of the PID controller cuts off the power output of the output end connected to the plasma chamber, the potential of the plasma chamber drops and remains at zero potential for a set time to eliminate the arc generated in the chamber. After the static setting time (the length of this time can be set according to the statistical rules of the minimum arc elimination time/arc extinguishing time in actual applications), the arc is eliminated. At this time, the operating state can be switched by the state machine to instruct each module to follow the arc extinguishing time. The working parameters of the last frozen reduction node return to normal working status, the control module of the PID controller reconnects the power output of the docking plasma chamber, and the PID controller re-enables ARC monitoring, thus entering the next round of arc monitoring and inhibit the work process. Those skilled in the art can understand that if arc generation in the cavity is still detected after resumption of work, the above actions can be repeated to suppress the arc, and optionally, the zero potential time can be extended to achieve better arc extinguishing effect.
上述等离子体腔电弧抑制方法中,通过电弧检测采样获取等离子体腔内的瞬时和平均反射系数,然后与设定反射系数阈值比较,以精准判断等离子体腔内是否有电弧产生,如果确定等离子体腔内有电弧产生,那么会通过状态机指示冻结射频电源系统最后对应还原节点的工作参数、暂停电弧检测采样并通过PID控制器的控制模组切断对接等离子体腔的输出端的电力输出,也即暂停射频电源对等离子体腔室的功率输出,待等离子体腔内的电弧消失后,按照工作参数指示PID控制器的控制模组恢复输出端的电力输出并恢复电弧检测采样,也即恢复射频电源对等离子体腔室的功率输出,从而实现对等离子体腔内的电弧的高精确度抑制。 In the above plasma cavity arc suppression method, the instantaneous and average reflection coefficients in the plasma cavity are obtained through arc detection sampling, and then compared with the set reflection coefficient threshold to accurately determine whether there is an arc in the plasma cavity. If it is determined that there is an arc in the plasma cavity, generated, then the state machine will be used to instruct the RF power supply system to freeze the working parameters of the last corresponding restoration node, suspend arc detection sampling, and cut off the power output of the output end of the docking plasma cavity through the control module of the PID controller, that is, suspend the RF power supply to the plasma After the arc in the plasma chamber disappears, the control module of the PID controller is instructed according to the working parameters to restore the power output at the output end and resume arc detection sampling, that is, restore the power output of the RF power supply to the plasma chamber. This achieves high-precision suppression of arcs in the plasma cavity.
相比于传统方法,上述方案通过反射系数均值(也可称gamma均值)与临界值的对比机制,大幅提高了电弧是否产生的判断精确度。在确定电弧产生时通过状态机指示冻结系统最后对应还原节点的工作参数、暂停电弧检测并暂停功率输出,从而在腔内电弧消失后可以按照冻结的工作参数准确且迅速地恢复功率输出,实现高精确度的腔内电弧抑制处理,而且电弧抑制成本更低,效率更高,适应性更强。Compared with the traditional method, the above scheme greatly improves the accuracy of judging whether an arc is generated through the comparison mechanism between the average reflection coefficient (also called gamma average) and the critical value. When the arc generation is determined, the state machine is used to instruct the freezing system to work parameters corresponding to the final restoration node, suspend arc detection and suspend power output. Therefore, after the arc disappears in the cavity, power output can be accurately and quickly restored according to the frozen working parameters, achieving high Precise intra-cavity arc suppression processing, with lower arc suppression cost, higher efficiency and stronger adaptability.
在一实施方式中,等离子体腔内的电弧是否已消失的判断方式可以但不限于:通过对腔内进行能量检测,判断腔内残余能量是否归零或低于设定的能量阈值来确定电弧是否已消失(腔内残余能量归零或低于设定的能量阈值,则可判定电弧已消失,反之则未消失);或者通过切断功率输出后等待设定时间后即可确定腔内的电弧已消失;又或者通过人工进行视觉观察来判断腔内电弧是否已消失(观察发现腔内已无电弧则确定电弧已消失,反之则未消失)。其他判断方式,只要能够准确判断腔内电弧是否已消失均可。通过上述方式对腔内电弧状态的判断,可以及时准确地指示状态机切换工作状态,指示各模块恢复冻结前的工作状态,减少功率切断时间,从而提升整体的电弧抑制处理效率。In one embodiment, the method of determining whether the arc in the plasma cavity has disappeared can be, but is not limited to: performing energy detection in the cavity and determining whether the residual energy in the cavity has returned to zero or is lower than a set energy threshold to determine whether the arc has disappeared. has disappeared (when the residual energy in the cavity returns to zero or is lower than the set energy threshold, it can be determined that the arc has disappeared, otherwise it has not disappeared); or by cutting off the power output and waiting for a set time, it can be determined that the arc in the cavity has disappeared. disappear; or it can be judged by manual visual observation whether the arc in the cavity has disappeared (observation finds that there is no arc in the cavity, it is determined that the arc has disappeared, otherwise it has not disappeared). Other judgment methods are acceptable as long as it can accurately judge whether the arc in the cavity has disappeared. By judging the arc status in the cavity in the above way, the state machine can be timely and accurately instructed to switch to the working state, and each module can be instructed to restore the working state before freezing, thereby reducing the power cut-off time, thereby improving the overall arc suppression processing efficiency.
在一个实施例中,关于上述步骤S12,具体可以包括如下处理步骤:In one embodiment, the above step S12 may specifically include the following processing steps:
采用定时定点采样的方式获取瞬时反射系数;Use timed and fixed-point sampling to obtain the instantaneous reflection coefficient;
利用当前采样得到的所有瞬时反射系数计算得到平均反射系数;其中,每次的采样、均值计算以及阈值比较均为单时间间隔同步多线程处理。The average reflection coefficient is calculated using all the instantaneous reflection coefficients obtained by the current sampling; among them, each sampling, mean calculation and threshold comparison are all single-time interval synchronous multi-thread processing.
具体的,对于瞬时反射系数的检测采样采用的是定时定点采样的方式,所有的采样值均为可用值,均用于计算gamma均值。此外,对于每一次的采样,系数与均值计算,以及阈值对比的过程,在本实施例中,PID控制器采用了单时间间隔同步多线程处理,可以同步多工地实现相同目的,如图2所示,以进一步提高腔内反射检测与电弧判断的可靠性。Specifically, the detection and sampling of instantaneous reflection coefficients adopts a timed and fixed-point sampling method. All sampled values are usable values and are used to calculate the gamma mean. In addition, for each sampling, coefficient and mean calculation, and threshold comparison process, in this embodiment, the PID controller uses single-time interval synchronous multi-thread processing, which can achieve the same purpose at multiple work sites simultaneously, as shown in Figure 2 display to further improve the reliability of intra-cavity reflection detection and arc judgment.
在一个实施例中,关于上述步骤S16中,根据比较结果确定等离子体腔内是否有电弧产生的过程,可以包括如下判断:In one embodiment, the process of determining whether an arc is generated in the plasma chamber based on the comparison results in the above step S16 may include the following determination:
根据差值绝对值小于设定反射系数阈值满足设定分析判断条件的情况,确定等离子体腔内有电弧产生或无电弧产生。According to the situation that the absolute value of the difference is less than the set reflection coefficient threshold and meets the set analysis and judgment conditions, it is determined whether there is arc generation or no arc generation in the plasma cavity.
可以理解,在上述实施例中可以通过判断|Γcur–Γaver|<Γth是否成立,而直接确定腔内是否有电弧产生。在本实施例中,为了进一步提高电弧产生的判断精确 度,采用判断|Γcur–Γaver|<Γth是否成立且是否满足设定分析判断条件的情况,来更精确地判断腔内是否有电弧产生。It can be understood that in the above embodiment, whether there is an arc generated in the cavity can be directly determined by judging whether |Γ cur – Γ aver |<Γ th is true. In this embodiment, in order to further improve the accuracy of judging arc generation Degree, by judging whether |Γ cur – Γ aver |<Γ th is true and whether it meets the set analysis and judgment conditions, we can more accurately judge whether there is an arc in the cavity.
在一个实施例中,可选的,设定分析判断条件可以包括如下:In one embodiment, optionally, setting analysis and judgment conditions may include the following:
若差值绝对值连续N次小于设定反射系数阈值,则确定等离子体腔内无电弧产生;N为不小于2的正整数。If the absolute value of the difference is less than the set reflection coefficient threshold for N consecutive times, it is determined that no arc is generated in the plasma cavity; N is a positive integer not less than 2.
具体的,如果判断到连续|Γcur–Γaver|<Γth达到N次,就可以确定当前等离子体腔内无电弧产生。Specifically, if it is determined that |Γ cur –Γ aver |<Γ th reaches N times continuously, it can be determined that no arc is generated in the current plasma cavity.
在一个实施例中,可选的,设定分析判断条件还可以包括如下:In one embodiment, optionally, setting analysis and judgment conditions may also include the following:
若在设定时段内差值绝对值大于设定反射系数阈值出现M次且不连续,则确定等离子体腔内无电弧产生;M为不小于1的正整数。If the absolute value of the difference is greater than the set reflection coefficient threshold M times and is discontinuous within the set period, it is determined that no arc is generated in the plasma cavity; M is a positive integer not less than 1.
具体的,如果|Γcur–Γaver|>Γth一段时间(即设定时段,具体长短可以根据实际应用的监测经验或者历史监测数据的统计情况确定)内、限定次数M以下(含1次)且不连续,就可以确定当前等离子体腔内无电弧产生。Specifically, if |Γ cur –Γ aver |>Γ th within a period of time (that is, a set period, the specific length can be determined based on actual application monitoring experience or the statistics of historical monitoring data), the limited number of times M or less (including 1 time ) and discontinuous, it can be determined that no arc is generated in the current plasma cavity.
在一个实施例中,可选的,设定分析判断条件还可以包括如下:In one embodiment, optionally, setting analysis and judgment conditions may also include the following:
若差值绝对值大于设定反射系数阈值达1次,则确定等离子体腔内有电弧产生。If the absolute value of the difference is greater than the set reflection coefficient threshold for 1 time, it is determined that an arc is generated in the plasma cavity.
具体的,如果|Γcur–Γaver|>Γth为1次,那么可以确定等离子体腔内有电弧产生。Specifically, if |Γ cur –Γ aver |>Γ th is 1, then it can be determined that an arc is generated in the plasma cavity.
在一个实施例中,可选的,设定分析判断条件还可以包括如下:In one embodiment, optionally, setting analysis and judgment conditions may also include the following:
若差值绝对值连续N次大于设定反射系数阈值,则确定等离子体腔内有电弧产生;N为不小于2的正整数。If the absolute value of the difference is greater than the set reflection coefficient threshold for N consecutive times, it is determined that an arc is generated in the plasma cavity; N is a positive integer not less than 2.
具体的,如果|Γcur–Γaver|>Γth为连续多次(含2次),那么可以确定等离子体腔内有电弧产生。Specifically, if |Γ cur –Γ aver |>Γ th is multiple times in succession (including 2 times), then it can be determined that an arc is generated in the plasma cavity.
需要说明的是,上述几种设定分析判断条件还可形成组合使用,只要彼此之间互斥的条件不形成组合即可。It should be noted that the above-mentioned set analysis and judgment conditions can also be used in combination, as long as mutually exclusive conditions do not form a combination.
在一个实施例中,电弧检测采样的检测时间段包括由小到大的多个检测时间段。设定反射系数阈值为人工设定的系数阈值或系统自适应设置的系数阈值。上述等离子体腔电弧抑制方法还可以包括步骤:In one embodiment, the detection time period of arc detection sampling includes multiple detection time periods from small to large. Set the reflection coefficient threshold to a manually set coefficient threshold or a system adaptively set coefficient threshold. The above plasma cavity arc suppression method may also include the following steps:
从最小的检测时间段起,若等离子体腔内有电弧产生的频率小于设定频率阈值,则将检测时间加长至下一个更大的检测时间段;Starting from the minimum detection time period, if the frequency of arc generation in the plasma cavity is less than the set frequency threshold, the detection time will be extended to the next larger detection time period;
否则保持检测时间不变,对系统自适应设置的系数阈值采用倍数增长或定 值增长的方式进行自适应增长。Otherwise, the detection time remains unchanged, and the coefficient threshold set adaptively by the system is increased by multiples or fixed. Adaptive growth in the form of value growth.
具体的,设定反射系数阈值Γth,可以是人工设定(如根据工作经验或历史监控数据等)的,也可以由系统自适应设置。其中,由系统自适应设置时,可以先设置一个初值Γth,以引入|Γcur–Γaver|<Γth的初始比较处理,该初值Γth可以是人为设定的,也可以是通过采用Γcur和Γaver的动态数据或历史数据计算产生。Specifically, the reflection coefficient threshold Γ th can be set manually (such as based on work experience or historical monitoring data, etc.), or can be set adaptively by the system. Among them, when the system adaptively sets it, an initial value Γ th can be set first to introduce the initial comparison process of |Γ cur – Γ aver |<Γ th . The initial value Γ th can be artificially set, or it can be It is calculated using dynamic data or historical data of Γ cur and Γ aver .
在实际监测中,可以按既定由小到大的数个检测时间段,例如但不限于8us,16us,32us…以此类推,先设定最小检测时间段,如8us,在该最小检测时间段内,通过|Γcur–Γaver|<Γth评估电弧产生的频率,若电弧产生的频率小于预设频率阈值,则加长检测时间段至下一个更大的检测时间段,例如16us或32us,系统自适应设置的系数阈值可以保持不变。而在该最小检测时间段内,若电弧产生的频率高于预设频率阈值,则增加Γth数值,如采用倍数增长或采用定值增长,又或者是先获取|Γcur–Γaver|的动态最大值,再采用倍数或定值增长,来作为调整后的ΓthIn actual monitoring, you can set several detection time periods from small to large, such as but not limited to 8us, 16us, 32us... and so on. First set the minimum detection time period, such as 8us, and then set the minimum detection time period in this minimum detection time period. Within , the frequency of arc generation is evaluated by |Γ cur – Γ aver |<Γ th . If the frequency of arc generation is less than the preset frequency threshold, the detection time period is lengthened to the next larger detection time period, such as 16us or 32us. The coefficient threshold set by the system adaptively can remain unchanged. Within the minimum detection time period, if the frequency of arc generation is higher than the preset frequency threshold, the value of Γ th will be increased, such as using a multiple increase or a fixed value increase, or first obtaining |Γ cur – Γ aver | The dynamic maximum value is then used as a multiple or fixed value increase as the adjusted Γ th .
通过上述步骤,可以实现系统自适应的系数阈值调整,从而进一步提高电弧产生的判断精确度。Through the above steps, system adaptive coefficient threshold adjustment can be achieved, thereby further improving the accuracy of judging arc generation.
在一个实施例中,上述等离子体腔电弧抑制方法还包括步骤:In one embodiment, the above plasma cavity arc suppression method further includes the steps:
若根据比较结果确定等离子体腔内无电弧产生,则维持PID控制器工作在一般控制状态。其中,一般控制状态包括:If it is determined according to the comparison result that no arc is generated in the plasma cavity, the PID controller is maintained in the general control state. Among them, the general control status includes:
维持控制模组的现行工作状态;Maintain the current working status of the control module;
持续进行电弧检测采样,获取等离子体腔内的反射系数;Continuously conduct arc detection sampling to obtain the reflection coefficient in the plasma cavity;
记录当前正常工作状态下的平均反射系数;Record the average reflection coefficient under current normal working conditions;
记录对控制模组的运作参数;Record the operating parameters of the control module;
记录输出端的单元器件的运作变量参数,将当前正常工作的时间节点设定为还原节点并持续更新。Record the operating variable parameters of the unit device at the output end, set the current normal working time node as the restoration node, and continuously update it.
具体的,在PID控制器的一般控制状态下,PID控制器获取gamma瞬时值以计算其均值,并与|Γcur–Γaver|<Γth进行对比,判断为无电弧产生时维持一般控制状态,此时,PID控制器维持现行控制模块的工作并持续监控gamma值,同时记录当前时间节点的以下工作参数:(a)正常工作的gamma均值;(b)PID控制器对输出端的控制模块的运作参数;(c)输出端运行电力输出的单元器件的运作变量参数,并将该时间节点认定为还原节点,此还原节点的数据在一般控制状态 会不断被更新。Specifically, in the general control state of the PID controller, the PID controller obtains the instantaneous value of gamma to calculate its mean value, and compares it with |Γ cur – Γ aver |<Γ th , and determines that the general control state is maintained when no arc is generated. , at this time, the PID controller maintains the work of the current control module and continuously monitors the gamma value, while recording the following working parameters of the current time node: (a) the average gamma value of normal operation; (b) the PID controller's response to the control module at the output end. Operation parameters; (c) The operation variable parameters of the unit device that runs the power output at the output end, and the time node is identified as the restoration node. The data of this restoration node is in the general control state. Will be constantly updated.
在一个实施例中,关于上述步骤S16中,通过状态机指示冻结射频电源系统最后对应还原节点的工作参数的过程,具体可以包括如下处理过程:In one embodiment, regarding the process of instructing the freezing of the operating parameters of the radio frequency power supply system and finally the corresponding restoration node through the state machine in step S16 above, the specific process may include the following processing:
通过状态机指示冻结正常工作状态下的最后一个平均反射系数、指示控制模组冻结运作参数以及指示输出端冻结各单元器件的运作变量参数。The state machine instructs the freezing of the last average reflection coefficient in the normal working state, instructs the control module to freeze the operating parameters, and instructs the output terminal to freeze the operating variable parameters of each unit device.
具体的,判断产生电弧时,PID控制器切换至关断控制状态,其状态机也将切换运作状态,指示各模块冻结最后对应还原节点的工作参数,如指示负责gamma均值计算的模块冻结gamma均值、指示PID控制器的控制模块冻结其运作参数、指示对接等离子体腔的输出端冻结其单元器件的运作变量参数;与此同时,状态机指示PID控制器暂停监控gamma值于一时间段X(包括电位下降时间+零电位+电位上升)。Specifically, when it is determined that an arc has occurred, the PID controller switches to the shutdown control state, and its state machine will also switch to the operating state, instructing each module to freeze the working parameters of the final corresponding restoration node, such as instructing the module responsible for gamma mean calculation to freeze the gamma mean. , instruct the control module of the PID controller to freeze its operating parameters, and instruct the output end of the docking plasma chamber to freeze the operating variable parameters of its unit device; at the same time, the state machine instructs the PID controller to suspend monitoring the gamma value for a period of time X (including Potential fall time + zero potential + potential rise).
如图3所示,即为各个阶段ARC抑制示意图,可将整个ARC发生的过程分为A-G七个阶段,其中各个阶段的意义及处理方式可以如表1所示。通过上述步骤,由状态机提供的参数冻结控制机制,可以保证系统在电弧消除后能以最快速度恢复至正常工作状态。As shown in Figure 3, it is a schematic diagram of ARC suppression at each stage. The entire ARC occurrence process can be divided into seven stages A-G. The meaning and processing method of each stage can be shown in Table 1. Through the above steps, the parameter freezing control mechanism provided by the state machine can ensure that the system can return to normal working status as quickly as possible after the arc is eliminated.
表1
Table 1
如图4所示,即为其中一种ARC处理流程示意图,整个过程可以划分为两大部分:Gamma均值计算与对比部分以及PID保存挂起部分。通过上述处理方法,实现了ARC的高精确度检测与抑制,同时能够以最快的速度在灭弧后恢复系统工作且灭弧成本较低。As shown in Figure 4, it is a schematic diagram of one of the ARC processing flows. The entire process can be divided into two parts: the Gamma mean calculation and comparison part and the PID save suspension part. Through the above processing method, high-precision detection and suppression of ARC is achieved, and at the same time, the system can be restored to work as quickly as possible after arc extinguishing with low arc extinguishing cost.
应该理解的是,虽然图1和图4的流程图中的各个步骤按照箭头的指示依 次显示,但是这些步骤并不是必然按照箭头指示的顺序依次执行。除非本文中有明确的说明,这些步骤的执行并没有严格的顺序限制,这些步骤可以以其它的顺序执行。而且,图1和图4中的至少一部分步骤可以包括多个子步骤或者多个阶段,这些子步骤或者阶段并不必然是在同一时刻执行完成,而是可以在不同的时刻执行,这些子步骤或者阶段的执行顺序也不必然是依次进行,而是可以与其它步骤或者其它步骤的子步骤或者阶段的至少一部分轮流或者交替地执行。It should be understood that although the various steps in the flowcharts of Figures 1 and 4 follow the directions of arrows, are displayed, but these steps are not necessarily performed in the order indicated by the arrows. Unless explicitly stated in this article, there is no strict order restriction on the execution of these steps, and these steps can be executed in other orders. Moreover, at least some of the steps in Figures 1 and 4 may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily executed at the same time, but may be executed at different times. These sub-steps or The execution order of the stages is not necessarily sequential, but may be performed in turn or alternately with other steps or sub-steps of other steps or at least part of the stages.
在一个实施例中,如图5所示,提供了一种等离子体腔电弧抑制装置100,包括检测采样模块11、系数比较模块13、电弧消除模块15和输出恢复模块17。其中:检测采样模块11用于通过电弧检测采样获取等离子体腔内的反射系数;反射系数包括瞬时反射系数和平均反射系数。系数比较模块13用于将瞬时反射系数和平均反射系数的差值绝对值与设定反射系数阈值比较。电弧消除模块15用于在根据比较结果确定等离子体腔内有电弧产生时,通过状态机指示冻结射频电源系统最后对应还原节点的工作参数、暂停电弧检测采样并通过PID控制器的控制模组切断对接等离子体腔的输出端的电力输出。输出恢复模块17用于在等离子体腔内的电弧消失后,按照工作参数指示PID控制器的控制模组恢复输出端的电力输出并恢复电弧检测采样。In one embodiment, as shown in FIG. 5 , a plasma cavity arc suppression device 100 is provided, including a detection sampling module 11 , a coefficient comparison module 13 , an arc elimination module 15 and an output recovery module 17 . Among them: the detection sampling module 11 is used to obtain the reflection coefficient in the plasma cavity through arc detection sampling; the reflection coefficient includes an instantaneous reflection coefficient and an average reflection coefficient. The coefficient comparison module 13 is used to compare the absolute value of the difference between the instantaneous reflection coefficient and the average reflection coefficient with the set reflection coefficient threshold. The arc elimination module 15 is used to instruct the freezing of the working parameters of the last corresponding restoration node of the RF power supply system through the state machine, suspend the arc detection sampling, and cut off the docking through the control module of the PID controller when it is determined that an arc is generated in the plasma cavity based on the comparison results. Electrical output at the output of the plasma chamber. The output recovery module 17 is used to instruct the control module of the PID controller to restore the power output of the output end and resume arc detection sampling according to the operating parameters after the arc in the plasma cavity disappears.
上述等离子体腔电弧抑制装置100,通过电弧检测采样获取等离子体腔内的瞬时和平均反射系数,然后与设定反射系数阈值比较,以精准判断等离子体腔内是否有电弧产生,如果确定等离子体腔内有电弧产生,那么会通过状态机指示冻结射频电源系统最后对应还原节点的工作参数、暂停电弧检测采样并通过PID控制器的控制模组切断对接等离子体腔的输出端的电力输出,也即暂停射频电源对等离子体腔室的功率输出,待等离子体腔内的电弧消失后,按照工作参数指示PID控制器的控制模组恢复输出端的电力输出并恢复电弧检测采样,也即恢复射频电源对等离子体腔室的功率输出,从而实现对等离子体腔内的电弧的高精确度抑制。The above-mentioned plasma cavity arc suppression device 100 obtains the instantaneous and average reflection coefficient in the plasma cavity through arc detection sampling, and then compares it with the set reflection coefficient threshold to accurately determine whether there is an arc in the plasma cavity. If it is determined that there is an arc in the plasma cavity, generated, then the state machine will be used to instruct the RF power supply system to freeze the working parameters of the last corresponding restoration node, suspend arc detection sampling, and cut off the power output of the output end of the docking plasma cavity through the control module of the PID controller, that is, suspend the RF power supply to the plasma After the arc in the plasma chamber disappears, the control module of the PID controller is instructed according to the working parameters to restore the power output at the output end and resume arc detection sampling, that is, restore the power output of the RF power supply to the plasma chamber. This achieves high-precision suppression of arcs in the plasma cavity.
相比于传统方法,上述方案通过反射系数均值(也可称gamma均值)与临界值的对比机制,大幅提高了电弧是否产生的判断精确度。在确定电弧产生时通过状态机指示冻结系统最后对应还原节点的工作参数、暂停电弧检测并暂停功率输出,从而在腔内电弧消失后可以按照冻结的工作参数准确且迅速地恢复 功率输出,实现高精确度的腔内电弧抑制处理,而且电弧抑制成本更低,效率更高,适应性更强。Compared with the traditional method, the above scheme greatly improves the accuracy of judging whether an arc is generated through the comparison mechanism between the average reflection coefficient (also called gamma average) and the critical value. When determining arc generation, the state machine is used to instruct the freezing system to work parameters corresponding to the last restoration node, suspend arc detection and suspend power output, so that after the arc disappears in the cavity, it can be accurately and quickly restored according to the frozen working parameters. The power output realizes high-precision intra-cavity arc suppression processing, and the arc suppression cost is lower, the efficiency is higher, and the adaptability is stronger.
在一个实施例中,根据比较结果确定等离子体腔内是否有电弧产生的过程,包括:In one embodiment, the process of determining whether there is arc generation in the plasma cavity based on the comparison results includes:
根据差值绝对值小于设定反射系数阈值满足设定分析判断条件的情况,确定等离子体腔内有电弧产生或无电弧产生。According to the situation that the absolute value of the difference is less than the set reflection coefficient threshold and meets the set analysis and judgment conditions, it is determined whether there is arc generation or no arc generation in the plasma cavity.
在一个实施例中,设定分析判断条件包括:In one embodiment, setting analysis and judgment conditions includes:
若差值绝对值连续N次小于设定反射系数阈值,则确定等离子体腔内无电弧产生;N为不小于2的正整数。If the absolute value of the difference is less than the set reflection coefficient threshold for N consecutive times, it is determined that no arc is generated in the plasma cavity; N is a positive integer not less than 2.
在一个实施例中,设定分析判断条件包括:In one embodiment, setting analysis and judgment conditions includes:
若在设定时段内差值绝对值大于设定反射系数阈值出现M次且不连续,则确定等离子体腔内无电弧产生;M为不小于1的正整数。If the absolute value of the difference is greater than the set reflection coefficient threshold M times and is discontinuous within the set period, it is determined that no arc is generated in the plasma cavity; M is a positive integer not less than 1.
在一个实施例中,设定分析判断条件包括:In one embodiment, setting analysis and judgment conditions includes:
若差值绝对值大于设定反射系数阈值达1次,则确定等离子体腔内有电弧产生。If the absolute value of the difference is greater than the set reflection coefficient threshold for 1 time, it is determined that an arc is generated in the plasma cavity.
在一个实施例中,设定分析判断条件包括:In one embodiment, setting analysis and judgment conditions includes:
若差值绝对值连续N次大于设定反射系数阈值,则确定等离子体腔内有电弧产生;N为不小于2的正整数。If the absolute value of the difference is greater than the set reflection coefficient threshold for N consecutive times, it is determined that an arc is generated in the plasma cavity; N is a positive integer not less than 2.
在一个实施例中,电弧检测采样的检测时间段包括由小到大的多个检测时间段,设定反射系数阈值为人工设定的系数阈值或系统自适应设置的系数阈值;In one embodiment, the detection time period of arc detection sampling includes multiple detection time periods from small to large, and the reflection coefficient threshold is set to a manually set coefficient threshold or a coefficient threshold set adaptively by the system;
上述方法还包括步骤:The above method also includes the steps:
从最小的检测时间段起,若等离子体腔内有电弧产生的频率小于设定频率阈值,则将检测时间加长至下一个更大的检测时间段;Starting from the minimum detection time period, if the frequency of arc generation in the plasma cavity is less than the set frequency threshold, the detection time will be extended to the next larger detection time period;
否则保持检测时间不变,对系统自适应设置的系数阈值采用倍数增长或定值增长的方式进行自适应增长。Otherwise, the detection time remains unchanged, and the coefficient threshold set by the system is adaptively increased by a multiple increase or a fixed value increase.
在一个实施例中,上述方法还包括步骤:In one embodiment, the above method further includes the steps:
若根据比较结果确定等离子体腔内无电弧产生,则维持PID控制器工作在一般控制状态;If it is determined based on the comparison results that no arc is generated in the plasma cavity, the PID controller is maintained in the general control state;
其中,一般控制状态包括:Among them, the general control status includes:
维持控制模组的现行工作状态; Maintain the current working status of the control module;
持续进行电弧检测采样,获取等离子体腔内的反射系数;Continuously conduct arc detection sampling to obtain the reflection coefficient in the plasma cavity;
记录当前正常工作状态下的平均反射系数;Record the average reflection coefficient under current normal working conditions;
记录对控制模组的运作参数;Record the operating parameters of the control module;
记录输出端的单元器件的运作变量参数,将当前正常工作的时间节点设定为还原节点并持续更新。Record the operating variable parameters of the unit device at the output end, set the current normal working time node as the restoration node, and continuously update it.
在一个实施例中,通过状态机指示冻结射频电源系统最后对应还原节点的工作参数的过程,包括:In one embodiment, the process of freezing the operating parameters of the corresponding restoration node of the radio frequency power supply system through a state machine instruction includes:
通过状态机指示冻结正常工作状态下的最后一个平均反射系数、指示控制模组冻结运作参数以及指示输出端冻结各单元器件的运作变量参数。The state machine instructs the freezing of the last average reflection coefficient in the normal working state, instructs the control module to freeze the operating parameters, and instructs the output terminal to freeze the operating variable parameters of each unit device.
在一个实施例中,通过电弧检测采样获取等离子体腔内的反射系数的步骤,包括:In one embodiment, the step of obtaining the reflection coefficient in the plasma cavity through arc detection sampling includes:
采用定时定点采样的方式获取瞬时反射系数;Use timed and fixed-point sampling to obtain the instantaneous reflection coefficient;
利用当前采样得到的所有瞬时反射系数计算得到平均反射系数;其中,每次的采样、均值计算以及阈值比较均为单时间间隔同步多线程处理。The average reflection coefficient is calculated using all the instantaneous reflection coefficients obtained by the current sampling; among them, each sampling, mean calculation and threshold comparison are all single-time interval synchronous multi-thread processing.
关于等离子体腔电弧抑制装置100的具体限定可以参见上文中对于等离子体腔电弧抑制方法的限定,在此不再赘述。上述等离子体腔电弧抑制装置100中的各个模块可全部或部分通过软件、硬件及其组合来实现。上述各模块可以硬件形式内嵌于或独立于射频电源系统中的PID控制器或处理器中,也可以以软件形式存储于射频电源系统中的存储器中,以便于PID控制器或处理器调用执行以上各个模块对应的操作。For specific limitations on the plasma cavity arc suppression device 100, please refer to the above limitations on the plasma cavity arc suppression method, which will not be described again here. Each module in the above-mentioned plasma cavity arc suppression device 100 can be implemented in whole or in part by software, hardware, and combinations thereof. Each of the above modules can be embedded in or independent of the PID controller or processor in the radio frequency power supply system in the form of hardware, or can be stored in the memory in the radio frequency power supply system in the form of software to facilitate the call and execution of the PID controller or processor. The operations corresponding to each of the above modules.
在一个实施例中,如图6所示,提供了一种射频电源系统200,包括射频电源22、PID控制器24和等离子体腔室26。射频电源22通过PID控制器24电气连接等离子体腔室26。PID控制器24用于实现如下电弧抑制处理步骤:In one embodiment, as shown in FIG. 6 , a radio frequency power supply system 200 is provided, including a radio frequency power supply 22 , a PID controller 24 and a plasma chamber 26 . RF power supply 22 is electrically connected to plasma chamber 26 through PID controller 24. The PID controller 24 is used to implement the following arc suppression processing steps:
通过电弧检测采样获取等离子体腔内的反射系数;反射系数包括瞬时反射系数和平均反射系数;Obtain the reflection coefficient in the plasma cavity through arc detection sampling; the reflection coefficient includes instantaneous reflection coefficient and average reflection coefficient;
将瞬时反射系数和平均反射系数的差值绝对值与设定反射系数阈值比较;Compare the absolute value of the difference between the instantaneous reflection coefficient and the average reflection coefficient with the set reflection coefficient threshold;
若根据比较结果确定等离子体腔内有电弧产生,则冻结射频电源22系统最后对应还原节点的工作参数、暂停电弧检测采样并切断对接等离子体腔的输出端的电力输出;If it is determined that an arc is generated in the plasma cavity according to the comparison result, freeze the operating parameters of the last corresponding restoration node of the radio frequency power supply 22 system, suspend arc detection sampling, and cut off the power output of the output end connected to the plasma cavity;
在等离子体腔内的电弧消失后,按照工作参数恢复输出端的电力输出并恢 复电弧检测采样。After the arc in the plasma cavity disappears, the power output at the output end is restored according to the working parameters and the Complex arc detection sampling.
可以理解,关于上述PID控制器24所实现功能的具体限定说明,可以参见上文中对于等离子体腔电弧抑制方法的相应限定说明,在此不再赘述。上述射频电源系统200中的各个部件之间的具体电气连接关系及其机械结构等均可以参照本领域已有射频电源22系统的电气与机械结构等同理理解,本说明书中不再展开赘述。It can be understood that for the specific limited description of the functions implemented by the above-mentioned PID controller 24, please refer to the corresponding limited description of the plasma cavity arc suppression method above, and will not be described again here. The specific electrical connection relationships and mechanical structures of the various components in the above-mentioned RF power supply system 200 can be understood by referring to the electrical and mechanical structures of the RF power supply 22 system existing in the art, and will not be described in detail in this specification.
图7中示出的是按实现功能划分的ARC处理模块的结构,PID控制器24可以划分为控制对接等离子体腔室26的输出端的控制模块以及如图7所示的ARC处理模块,ARC处理模块,其包括均值计算单元、对比单元、ARC检测单元与状态机。均值计算单元可以用于从实时检测采样的量测信息中计算出瞬时反射系数并计算相应的平均反射系数。对比单元可以用于进行|Γcur–Γaver|与Γth的与对比。ARC检测单元可以用于根据比较的结果判断腔内是否有电弧产生。而状态机则可以用于实现上述实施例中所示的相应指示控制功能。Figure 7 shows the structure of the ARC processing module divided according to the implementation function. The PID controller 24 can be divided into a control module that controls the output end of the docking plasma chamber 26 and an ARC processing module as shown in Figure 7. The ARC processing module , which includes an average calculation unit, a comparison unit, an ARC detection unit and a state machine. The average calculation unit can be used to calculate the instantaneous reflection coefficient from the measurement information of the real-time detection sample and calculate the corresponding average reflection coefficient. The comparison unit can be used to compare |Γ cur –Γ aver | with Γ th . The ARC detection unit can be used to determine whether there is arc generation in the cavity based on the comparison results. The state machine can be used to implement the corresponding indication control function shown in the above embodiment.
本领域技术人员可以理解,图6和图7仅仅是与本申请方案相关的部分产品实体和功能结构的框图,并不构成对本申请方案所应用的射频电源系统的详尽限定,具体的射频电源系统可以包括比上图中所示更多或更少的部件,或者组合某些部件,或者具有不同的部件布置,具体可以根据实际类型的射频电源系统所确定。Those skilled in the art can understand that Figures 6 and 7 are only block diagrams of some product entities and functional structures related to the solution of this application, and do not constitute a detailed limitation of the radio frequency power supply system to which the solution of this application is applied. The specific radio frequency power system It may include more or fewer components than shown in the above figure, or combine certain components, or have a different component arrangement, as determined by the actual type of RF power supply system.
上述射频电源系统200,通过电弧检测采样获取等离子体腔内的瞬时和平均反射系数,然后与设定反射系数阈值比较,以精准判断等离子体腔内是否有电弧产生,如果确定等离子体腔内有电弧产生,那么会通过状态机指示冻结射频电源系统最后对应还原节点的工作参数、暂停电弧检测采样并通过PID控制器24的控制模组切断对接等离子体腔的输出端的电力输出,也即暂停射频电源对等离子体腔室26的功率输出,待等离子体腔内的电弧消失后,按照工作参数指示PID控制器24的控制模组恢复输出端的电力输出并恢复电弧检测采样,也即恢复射频电源对等离子体腔室26的功率输出,从而实现对等离子体腔内的电弧的高精确度抑制。The above-mentioned radio frequency power supply system 200 obtains the instantaneous and average reflection coefficient in the plasma cavity through arc detection sampling, and then compares it with the set reflection coefficient threshold to accurately determine whether an arc is generated in the plasma cavity. If it is determined that an arc is generated in the plasma cavity, Then, the working parameters of the last corresponding restoration node of the radio frequency power supply system will be frozen through the state machine instruction, arc detection sampling will be suspended, and the power output of the output end of the docking plasma cavity will be cut off through the control module of the PID controller 24, that is, the radio frequency power supply to the plasma cavity will be suspended. After the arc in the plasma chamber disappears, the control module of the PID controller 24 is instructed according to the operating parameters to restore the power output at the output end and resume arc detection sampling, that is, restore the power of the RF power supply to the plasma chamber 26 output, thereby achieving high-precision suppression of arcs in the plasma cavity.
相比于传统方法,上述方案通过反射系数均值(也可称gamma均值)与临界值的对比机制,大幅提高了电弧是否产生的判断精确度。在确定电弧产生时通过状态机指示冻结系统最后对应还原节点的工作参数、暂停电弧检测并暂停 功率输出,从而在腔内电弧消失后可以按照冻结的工作参数准确且迅速地恢复功率输出,实现高精确度的腔内电弧抑制处理,而且电弧抑制成本更低,效率更高,适应性更强。Compared with the traditional method, the above scheme greatly improves the accuracy of judging whether an arc is generated through the comparison mechanism between the average reflection coefficient (also called gamma average) and the critical value. When determining arc generation, the state machine is used to indicate the operating parameters of the freezing system's last corresponding restoration node, pause arc detection, and pause. Power output, so that after the arc in the cavity disappears, the power output can be accurately and quickly restored according to the frozen working parameters, achieving high-precision arc suppression processing in the cavity, and the arc suppression cost is lower, the efficiency is higher, and the adaptability is stronger .
在一个实施例中,还提供一种计算机可读存储介质,其上存储有计算机程序,计算机程序被处理器执行时实现如下处理步骤:通过电弧检测采样获取等离子体腔内的反射系数;反射系数包括瞬时反射系数和平均反射系数;将瞬时反射系数和平均反射系数的差值绝对值与设定反射系数阈值比较;若根据比较结果确定等离子体腔内有电弧产生,则通过状态机指示冻结射频电源系统最后对应还原节点的工作参数、暂停电弧检测采样并通过PID控制器的控制模组切断对接等离子体腔的输出端的电力输出;在等离子体腔内的电弧消失后,按照工作参数指示PID控制器的控制模组恢复输出端的电力输出并恢复电弧检测采样。In one embodiment, a computer-readable storage medium is also provided, with a computer program stored thereon. When the computer program is executed by the processor, the following processing steps are implemented: obtaining the reflection coefficient in the plasma cavity through arc detection sampling; the reflection coefficient includes Instantaneous reflection coefficient and average reflection coefficient; compare the absolute value of the difference between the instantaneous reflection coefficient and the average reflection coefficient with the set reflection coefficient threshold; if it is determined that an arc is generated in the plasma cavity according to the comparison result, the RF power supply system will be frozen through the state machine instruction Finally, corresponding to the working parameters of the restoration node, the arc detection sampling is suspended and the power output of the output end of the docking plasma cavity is cut off through the control module of the PID controller; after the arc in the plasma cavity disappears, the control module of the PID controller is instructed according to the working parameters. The group restores power output at the output terminal and resumes arc detection sampling.
在一个实施例中,计算机程序被处理器执行时,还可以实现上述等离子体腔电弧抑制方法各实施例中增加的步骤或者子步骤。In one embodiment, when the computer program is executed by the processor, the added steps or sub-steps in the above embodiments of the plasma cavity arc suppression method can also be implemented.
本领域普通技术人员可以理解实现上述实施例方法中的全部或部分流程,是可以通过计算机程序来指令相关的硬件来完成,的计算机程序可存储于一非易失性计算机可读取存储介质中,该计算机程序在执行时,可包括如上述各方法的实施例的流程。其中,本申请所提供的各实施例中所使用的对存储器、存储、数据库或其它介质的任何引用,均可包括非易失性和/或易失性存储器。非易失性存储器可包括只读存储器(ROM)、可编程ROM(PROM)、电可编程ROM(EPROM)、电可擦除可编程ROM(EEPROM)或闪存。易失性存储器可包括随机存取存储器(RAM)或者外部高速缓冲存储器。作为说明而非局限,RAM以多种形式可得,诸如静态RAM(SRAM)、动态RAM(DRAM)、同步DRAM(SDRAM)、双数据率SDRAM(DDRSDRAM)、增强型SDRAM(ESDRAM)、同步链路(Synchlink)DRAM(SLDRAM)、存储器总线(Rambus)直接RAM(RDRAM)、直接存储器总线动态RAM(DRDRAM)、以及存储器总线动态RAM(RDRAM)等。Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage medium. , when executed, the computer program may include the processes of the above method embodiments. Any reference to memory, storage, database or other media used in the embodiments provided in this application may include non-volatile and/or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous chain Synchlink DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), etc.
以上实施例的各技术特征可以进行任意的组合,为使描述简洁,未对上述实施例中的各个技术特征所有可能的组合都进行描述,然而,只要这些技术特征的组合不存在矛盾,都应当认为是本说明书记载的范围。 The technical features of the above embodiments can be combined in any way. To simplify the description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, all possible combinations should be used. It is considered to be within the scope of this manual.
以上实施例仅表达了本申请的几种实施方式,其描述较为具体和详细,但并不能因此而理解为对申请专利范围的限制。应当指出的是,对于本领域的普通技术人员来说,在不脱离本申请构思的前提下,还可以做出若干变形和改进,这些都属于本申请的保护范围。因此,本申请专利的保护范围应以所附权利要求为准。 The above embodiments only express several implementation modes of the present application, and their descriptions are relatively specific and detailed, but they should not be construed as limiting the scope of the patent application. It should be noted that, for those of ordinary skill in the art, several modifications and improvements can be made without departing from the concept of the present application, and these all fall within the protection scope of the present application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims (13)

  1. 一种等离子体腔电弧抑制方法,其特征在于,包括以下步骤:A plasma cavity arc suppression method, characterized by including the following steps:
    通过电弧检测采样获取等离子体腔内的反射系数;所述反射系数包括瞬时反射系数和平均反射系数;Obtain the reflection coefficient in the plasma cavity through arc detection sampling; the reflection coefficient includes the instantaneous reflection coefficient and the average reflection coefficient;
    将所述瞬时反射系数和所述平均反射系数的差值绝对值与设定反射系数阈值比较;Compare the absolute value of the difference between the instantaneous reflection coefficient and the average reflection coefficient with a set reflection coefficient threshold;
    若根据比较结果确定所述等离子体腔内有电弧产生,则通过状态机指示冻结射频电源系统最后对应还原节点的工作参数、暂停所述电弧检测采样并通过PID控制器的控制模组切断对接所述等离子体腔的输出端的电力输出;If it is determined that an arc is generated in the plasma cavity according to the comparison result, the state machine is used to instruct the RF power supply system to freeze the working parameters of the last corresponding restoration node, suspend the arc detection sampling, and cut off the docking through the control module of the PID controller. power output at the output of the plasma chamber;
    在所述等离子体腔内的电弧消失后,按照所述工作参数指示所述PID控制器的控制模组恢复所述输出端的电力输出并恢复所述电弧检测采样。After the arc in the plasma cavity disappears, the control module of the PID controller is instructed according to the operating parameters to restore the power output of the output end and resume the arc detection sampling.
  2. 根据权利要求1所述的等离子体腔电弧抑制方法,其特征在于,所述根据比较结果确定所述等离子体腔内是否有电弧产生的过程,包括:The plasma cavity arc suppression method according to claim 1, wherein the process of determining whether there is arc generation in the plasma cavity according to the comparison results includes:
    根据所述差值绝对值小于所述设定反射系数阈值满足设定分析判断条件的情况,确定所述等离子体腔内有电弧产生或无电弧产生。According to the fact that the absolute value of the difference is less than the set reflection coefficient threshold and satisfies the set analysis and judgment conditions, it is determined whether there is arc generation or no arc generation in the plasma cavity.
  3. 根据权利要求2所述的等离子体腔电弧抑制方法,其特征在于,所述设定分析判断条件包括:The plasma cavity arc suppression method according to claim 2, wherein the set analysis and judgment conditions include:
    若所述差值绝对值连续N次小于所述设定反射系数阈值,则确定所述等离子体腔内无电弧产生;N为不小于2的正整数。If the absolute value of the difference is smaller than the set reflection coefficient threshold for N consecutive times, it is determined that no arc is generated in the plasma cavity; N is a positive integer not less than 2.
  4. 根据权利要求2或3所述的等离子体腔电弧抑制方法,其特征在于,所述设定分析判断条件包括:The plasma cavity arc suppression method according to claim 2 or 3, characterized in that the set analysis and judgment conditions include:
    若在设定时段内所述差值绝对值大于所述设定反射系数阈值出现M次且不连续,则确定所述等离子体腔内无电弧产生;M为不小于1的正整数。If the absolute value of the difference is greater than the set reflection coefficient threshold M times and is discontinuous within a set period, it is determined that no arc is generated in the plasma cavity; M is a positive integer not less than 1.
  5. 根据权利要求2所述的等离子体腔电弧抑制方法,其特征在于,所述设定分析判断条件包括:The plasma cavity arc suppression method according to claim 2, wherein the set analysis and judgment conditions include:
    若所述差值绝对值大于所述设定反射系数阈值达1次,则确定所述等离子体腔内有电弧产生。If the absolute value of the difference is greater than the set reflection coefficient threshold for one time, it is determined that an arc is generated in the plasma cavity.
  6. 根据权利要求2、3或5所述的等离子体腔电弧抑制方法,其特征在于,所述设定分析判断条件包括:The plasma cavity arc suppression method according to claim 2, 3 or 5, characterized in that the set analysis and judgment conditions include:
    若所述差值绝对值连续N次大于所述设定反射系数阈值,则确定所述等离子体腔内有电弧产生;N为不小于2的正整数。 If the absolute value of the difference is greater than the set reflection coefficient threshold for N consecutive times, it is determined that an arc is generated in the plasma cavity; N is a positive integer not less than 2.
  7. 根据权利要求1所述的等离子体腔电弧抑制方法,其特征在于,所述电弧检测采样的检测时间段包括由小到大的多个检测时间段,所述设定反射系数阈值为人工设定的系数阈值或系统自适应设置的系数阈值;The plasma cavity arc suppression method according to claim 1, wherein the detection time period of the arc detection sampling includes multiple detection time periods from small to large, and the set reflection coefficient threshold is manually set. Coefficient threshold or coefficient threshold set adaptively by the system;
    所述方法还包括步骤:The method also includes the steps of:
    从最小的所述检测时间段起,若所述等离子体腔内有电弧产生的频率小于设定频率阈值,则将所述检测时间加长至下一个更大的检测时间段;Starting from the minimum detection time period, if the frequency of arc generation in the plasma cavity is less than the set frequency threshold, the detection time is lengthened to the next larger detection time period;
    否则保持所述检测时间不变,对所述系统自适应设置的系数阈值采用倍数增长或定值增长的方式进行自适应增长。Otherwise, the detection time is kept unchanged, and the coefficient threshold set adaptively by the system is adaptively increased by a multiple increase or a fixed value increase.
  8. 根据权利要求1所述的等离子体腔电弧抑制方法,其特征在于,所述方法还包括步骤:The plasma cavity arc suppression method according to claim 1, characterized in that the method further includes the steps:
    若根据比较结果确定所述等离子体腔内无电弧产生,则维持所述PID控制器工作在一般控制状态;If it is determined according to the comparison result that no arc is generated in the plasma cavity, the PID controller is maintained to work in the general control state;
    其中,所述一般控制状态包括:Wherein, the general control status includes:
    维持所述控制模组的现行工作状态;Maintain the current working status of the control module;
    持续进行电弧检测采样,获取等离子体腔内的反射系数;Continuously conduct arc detection sampling to obtain the reflection coefficient in the plasma cavity;
    记录当前正常工作状态下的平均反射系数;Record the average reflection coefficient under current normal working conditions;
    记录对所述控制模组的运作参数;Record the operating parameters of the control module;
    记录所述输出端的单元器件的运作变量参数,将当前正常工作的时间节点设定为还原节点并持续更新。Record the operating variable parameters of the unit device at the output end, set the current normal working time node as the restoration node, and continuously update it.
  9. 根据权利要求8所述的等离子体腔电弧抑制方法,其特征在于,通过状态机指示冻结射频电源系统最后对应还原节点的工作参数的过程,包括:The plasma cavity arc suppression method according to claim 8, characterized in that the process of freezing the working parameters of the final corresponding restoration node of the radio frequency power supply system through a state machine includes:
    通过状态机指示冻结正常工作状态下的最后一个平均反射系数、指示所述控制模组冻结运作参数以及指示所述输出端冻结各单元器件的运作变量参数。The state machine instructs the freezing of the last average reflection coefficient in the normal working state, instructs the control module to freeze operating parameters, and instructs the output end to freeze the operating variable parameters of each unit device.
  10. 根据权利要求1所述的等离子体腔电弧抑制方法,其特征在于,通过电弧检测采样获取等离子体腔内的反射系数的步骤,包括:The plasma cavity arc suppression method according to claim 1, wherein the step of obtaining the reflection coefficient in the plasma cavity through arc detection sampling includes:
    采用定时定点采样的方式获取所述瞬时反射系数;Obtain the instantaneous reflection coefficient by using timed and fixed-point sampling;
    利用当前采样得到的所有瞬时反射系数计算得到所述平均反射系数;其中,每次的采样、均值计算以及阈值比较均为单时间间隔同步多线程处理。The average reflection coefficient is calculated using all instantaneous reflection coefficients obtained by current sampling; wherein, each sampling, mean calculation and threshold comparison are all single time interval synchronous multi-thread processing.
  11. 一种等离子体腔电弧抑制装置,其特征在于,所述装置包括:A plasma cavity arc suppression device, characterized in that the device includes:
    检测采样模块,用于通过电弧检测采样获取等离子体腔内的反射系数;所 述反射系数包括瞬时反射系数和平均反射系数;The detection sampling module is used to obtain the reflection coefficient in the plasma cavity through arc detection sampling; The reflection coefficient includes instantaneous reflection coefficient and average reflection coefficient;
    系数比较模块,用于将所述瞬时反射系数和所述平均反射系数的差值绝对值与设定反射系数阈值比较;A coefficient comparison module, used to compare the absolute value of the difference between the instantaneous reflection coefficient and the average reflection coefficient with the set reflection coefficient threshold;
    电弧消除模块,用于在根据比较结果确定所述等离子体腔内有电弧产生时,通过状态机指示冻结射频电源系统最后对应还原节点的工作参数、暂停所述电弧检测采样并通过PID控制器的控制模组切断对接所述等离子体腔的输出端的电力输出;The arc elimination module is used to instruct through the state machine to freeze the operating parameters of the last corresponding restoration node of the radio frequency power supply system, suspend the arc detection sampling, and control it through the PID controller when it is determined that an arc is generated in the plasma cavity based on the comparison result. The module cuts off the power output of the output end connected to the plasma cavity;
    输出恢复模块,用于在所述等离子体腔内的电弧消失后,按照所述工作参数指示所述PID控制器的控制模组恢复所述输出端的电力输出并恢复所述电弧检测采样。An output recovery module is configured to instruct the control module of the PID controller to restore the power output of the output end and restore the arc detection sampling according to the operating parameters after the arc in the plasma cavity disappears.
  12. 一种射频电源系统,其特征在于,包括射频电源、PID控制器和等离子体腔室,所述射频电源通过所述PID控制器电气连接所述等离子体腔室;A radio frequency power supply system, characterized in that it includes a radio frequency power supply, a PID controller and a plasma chamber, and the radio frequency power supply is electrically connected to the plasma chamber through the PID controller;
    所述PID控制器用于实现如下电弧抑制处理步骤:The PID controller is used to implement the following arc suppression processing steps:
    通过电弧检测采样获取等离子体腔内的反射系数;所述反射系数包括瞬时反射系数和平均反射系数;Obtain the reflection coefficient in the plasma cavity through arc detection sampling; the reflection coefficient includes the instantaneous reflection coefficient and the average reflection coefficient;
    将所述瞬时反射系数和所述平均反射系数的差值绝对值与设定反射系数阈值比较;Compare the absolute value of the difference between the instantaneous reflection coefficient and the average reflection coefficient with a set reflection coefficient threshold;
    若根据比较结果确定所述等离子体腔内有电弧产生,则冻结射频电源系统最后对应还原节点的工作参数、暂停所述电弧检测采样并切断对接所述等离子体腔的输出端的电力输出;If it is determined that an arc is generated in the plasma cavity according to the comparison result, freeze the operating parameters of the last corresponding reduction node of the radio frequency power supply system, suspend the arc detection sampling, and cut off the power output of the output end connected to the plasma cavity;
    在所述等离子体腔内的电弧消失后,按照所述工作参数恢复所述输出端的电力输出并恢复所述电弧检测采样。After the arc in the plasma cavity disappears, the power output of the output end is restored according to the operating parameters and the arc detection sampling is restored.
  13. 一种计算机可读存储介质,其上存储有计算机程序,其特征在于,所述计算机程序被处理器执行时实现权利要求1至10中任一项所述的等离子体腔电弧抑制方法的步骤。 A computer-readable storage medium with a computer program stored thereon, characterized in that when the computer program is executed by a processor, the steps of the plasma cavity arc suppression method described in any one of claims 1 to 10 are implemented.
PCT/CN2023/094827 2022-05-18 2023-05-17 Plasma chamber arc suppression method and apparatus, and radio frequency power supply system WO2023222046A1 (en)

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CN115020178A (en) * 2022-05-18 2022-09-06 深圳市恒运昌真空技术有限公司 Plasma chamber arc suppression method and device and radio frequency power supply system
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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007177267A (en) * 2005-12-27 2007-07-12 Nippon Reliance Kk Alternating current power-supply unit and process for inhibiting arc in the unit
CN107275179A (en) * 2016-03-30 2017-10-20 东京毅力科创株式会社 Plasma processing apparatus and method of plasma processing
CN112635285A (en) * 2020-12-03 2021-04-09 长江存储科技有限责任公司 Monitoring method and system for plasma process chamber arc discharge
CN114446752A (en) * 2020-11-04 2022-05-06 中微半导体设备(上海)股份有限公司 Detection method and detection device for electric arc of plasma processing chamber
CN115020178A (en) * 2022-05-18 2022-09-06 深圳市恒运昌真空技术有限公司 Plasma chamber arc suppression method and device and radio frequency power supply system

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007177267A (en) * 2005-12-27 2007-07-12 Nippon Reliance Kk Alternating current power-supply unit and process for inhibiting arc in the unit
CN107275179A (en) * 2016-03-30 2017-10-20 东京毅力科创株式会社 Plasma processing apparatus and method of plasma processing
CN114446752A (en) * 2020-11-04 2022-05-06 中微半导体设备(上海)股份有限公司 Detection method and detection device for electric arc of plasma processing chamber
CN112635285A (en) * 2020-12-03 2021-04-09 长江存储科技有限责任公司 Monitoring method and system for plasma process chamber arc discharge
CN115020178A (en) * 2022-05-18 2022-09-06 深圳市恒运昌真空技术有限公司 Plasma chamber arc suppression method and device and radio frequency power supply system

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