WO2023213287A1

WO2023213287A1 - Bandgap reference circuit, integrated circuit, and electronic device

Info

Publication number: WO2023213287A1
Application number: PCT/CN2023/092190
Authority: WO
Inventors: 杜宇恒
Original assignee: 芯海科技（深圳）股份有限公司
Priority date: 2022-05-05
Filing date: 2023-05-05
Publication date: 2023-11-09
Also published as: CN114740941B; CN114740941A

Abstract

A bandgap reference circuit, an integrated circuit, and an electronic device. The bandgap reference circuit comprises: a bandgap reference module (1), the band gap reference module (1) being configured to output a bandgap reference voltage, and the temperature drift coefficient of the bandgap reference voltage being less than or equal to a temperature drift threshold; and a calibration module (2), the calibration module (2) being configured to adjust the voltage value of the bandgap reference voltage. The voltage value of the bandgap reference voltage is calibrated outside a bandgap reference source, and the bandgap reference source only needs to adjust the temperature drift coefficient of an output voltage, so that the temperature drift coefficient of the output voltage is small. The voltage value is calibrated by an external calibration circuit, and compared with a common method in which it is difficult to consider both the accuracy of voltage value calibration and the temperature drift coefficient by calibrating the voltage value of the bandgap reference voltage inside the bandgap reference source, the voltage obtained by means of calibration is accurate and the temperature drift coefficient is smaller.

Description

Bandgap reference circuits, integrated circuits and electronic devices

Cross-references to related applications

This application claims priority from Chinese application No. 202210481095.8, filed on May 5, 2022, the entire content of which is hereby incorporated by reference for all purposes.

Technical field

This application relates to the field of electronic circuit technology, and in particular to bandgap reference circuits, integrated circuits and electronic equipment.

Background technique

The bandgap reference voltage source is one of the basic circuit components in integrated circuits. The bandgap reference voltage source can provide other circuits with an accurate reference voltage that is insensitive to operating temperature, power supply voltage and circuit load. Compared with the external chip power supply, the bandgap reference voltage source has better accuracy and stability, and can effectively reduce the circuit area. Therefore, it has been used in integrated circuit systems such as data converters, power management circuits, and memories. Wide range of applications.

In the initial state of actual applications, the reference voltage output by the bandgap reference voltage source will have a certain deviation, so the bandgap reference voltage source needs to be calibrated. Calibration requires adjustment of the resistor network inside the bandgap reference voltage source. Adjusting the resistor network will affect the temperature drift coefficient of the bandgap reference voltage source. If the temperature drift coefficient changes significantly, it will affect the output of the reference voltage source at different temperatures. The accuracy of the reference voltage has a greater impact. How to reduce the impact of calibration on the temperature drift coefficient of the reference voltage source is one of the technical problems to be solved in this field.

Contents of the invention

In view of this, exemplary embodiments of the present application provide bandgap reference circuits, integrated circuits and electronic devices, which can effectively reduce the impact of the temperature drift coefficient of the calibration pair.

According to one aspect of the present application, a bandgap reference circuit is provided. The bandgap reference circuit includes a bandgap reference module and a calibration module. The bandgap reference module is configured to output a bandgap reference voltage. The temperature drift coefficient of the bandgap reference voltage is less than Or equal to the temperature drift threshold; the calibration module is configured to generate a reference current according to the band gap reference voltage and adjust the voltage value of the band gap reference voltage according to the reference current; wherein the current value of the reference current is adjustable.

In some embodiments, the calibration module includes a reference current unit and a voltage boost unit. The reference current unit is configured to generate a reference current according to the band gap reference voltage, and the current value of the reference current is adjustable. The voltage boost unit is configured to adjust the band gap according to the reference current. The voltage value of the reference voltage.

In some embodiments, the reference current unit includes a first resistor network, the resistance value of the first resistor network is adjustable, One end of the first resistor network is connected to the first port of the bandgap reference module, and the other end of the first resistor network is connected to the second port of the bandgap reference module, where the first port is the output end of the bandgap reference module; the voltage rises The unit includes a first resistor, a first end of the first resistor is connected to the second port, and a second end of the first resistor is connected to ground.

In some embodiments, the bandgap reference module includes a positive temperature coefficient generation unit, a negative temperature coefficient generation unit and a calibration unit, the positive temperature coefficient generation unit is configured to generate a positive temperature coefficient voltage; the negative temperature coefficient generation unit and the positive temperature coefficient generation unit is connected and set to generate a negative temperature coefficient voltage; the calibration unit is connected to a positive temperature coefficient generating unit and set to adjust the voltage value of the positive temperature coefficient voltage.

In some embodiments, the calibration unit includes a second resistor network, the resistance of the second resistor network is adjustable, a first end of the second resistor network is connected to a first port of the bandgap reference module, and a second end of the second resistor network Connected to the positive temperature coefficient generation unit.

In some embodiments, the positive temperature coefficient generating unit includes a first triode circuit, a second resistor, a third resistor and a comparison circuit; the first terminal of the first triode circuit is connected to the first terminal of the first resistor, The second end of the first triode circuit is connected to the first end of the second resistor, the second end of the second resistor is connected to the first end of the second resistor network, the second end of the second resistor network is connected to the third The first end of the resistor and the second end of the third resistor are connected to the first input end of the comparison circuit, and the second end of the second resistor is also connected to the second input end of the comparison circuit.

In some embodiments, the negative temperature coefficient generating unit includes a second triode circuit, a first terminal of the second triode circuit is connected to the first terminal of the first resistor, and a second terminal of the second triode circuit is connected to at the first input terminal of the comparison circuit.

In some embodiments, the minimum voltage adjustment amount by which the first resistor network adjusts the bandgap reference voltage is less than the minimum voltage adjustment amount by which the second resistor network adjusts the bandgap reference voltage.

According to another aspect of the present application, an integrated circuit is provided, including any of the above bandgap reference circuits.

According to another aspect of the present application, an electronic device is provided, including a device body and an integrated circuit as described above provided in the device body.

One or more technical solutions provided in exemplary embodiments of the present application include a bandgap reference module and a calibration module. The calibration module generates a reference current based on the bandgap reference voltage output by the bandgap reference module, and adjusts the bandgap based on the reference current. The voltage value of the reference voltage and the current value of the reference current are adjustable. The bandgap reference circuit of the present application adjusts the temperature drift coefficient of the bandgap reference voltage through the bandgap reference module, so that the temperature drift coefficient of the bandgap reference voltage is smaller, and passes an adjustable reference current outside the bandgap reference module through the calibration module. Calibrate the voltage value of the bandgap reference voltage, thereby effectively reducing the impact of calibration on the temperature drift coefficient of the bandgap reference voltage. Compared with the common method of calibrating the voltage value of the bandgap reference voltage inside the bandgap reference module, which is difficult to take into account the accuracy of the voltage value calibration and the temperature drift coefficient, the voltage obtained by the calibration is both accurate and the temperature drift coefficient is more accurate. Small.

Description of the drawings

Further details, features and advantages of the present application are disclosed in the following description of exemplary embodiments in conjunction with the accompanying drawing, in which:

Figure 1 shows a block diagram of a bandgap reference circuit according to an exemplary embodiment of the present application;

Figure 2 shows a schematic diagram of the principle of a bandgap reference module according to an exemplary embodiment of the present application;

Figure 3 shows a circuit schematic diagram of another bandgap reference circuit according to an exemplary embodiment of the present application;

FIG. 4 shows a schematic principle diagram of a first resistor network or a second resistor network according to an exemplary embodiment of the present application.

Detailed ways

Embodiments of the present application will be described in more detail below with reference to the accompanying drawings. Although certain embodiments of the present application are shown in the drawings, it should be understood that the present application may be embodied in various forms and should not be construed as limited to the embodiments set forth herein, but rather these embodiments are provided for Understand this application more thoroughly and completely. It should be understood that the drawings and embodiments of the present application are for illustrative purposes only and are not intended to limit the scope of protection of the present application.

It should be understood that the various steps described in the method embodiments of the present application can be executed in different orders and/or in parallel. Furthermore, method embodiments may include additional steps and/or omit performance of illustrated steps. The scope of the present application is not limited in this regard.

As used herein, the term "include" and its variations are open-ended, ie, "including but not limited to." The term "based on" means "based at least in part on." The term "one embodiment" means "at least one embodiment"; the term "another embodiment"

means "at least one additional embodiment"; the term "some embodiments" means "at least some embodiments". Relevant definitions of other terms will be given in the description below. It should be noted that concepts such as “first” and “second” mentioned in this application are only used to distinguish different devices, modules or units, and are not used to limit the order of functions performed by these devices, modules or units. Or interdependence.

It should be noted that the modifications of "one" and "multiple" mentioned in this application are illustrative and not restrictive. Those skilled in the art will understand that unless the context clearly indicates otherwise, it should be understood as "one or Multiple”.

The names of messages or information exchanged between multiple devices in the embodiments of the present application are only for illustrative purposes and are not used to limit the scope of these messages or information.

The solution of the present application is described below with reference to the accompanying drawings. Figure 1 shows a block diagram of a bandgap reference circuit according to an exemplary embodiment of the present application. The bandgap reference circuit includes a bandgap reference module 1 and a calibration module 2. Bandgap The reference module 1 is configured to output a bandgap reference voltage, and the temperature drift coefficient of the bandgap reference voltage is less than or equal to the temperature drift threshold; the calibration module 2 is configured to generate a reference current based on the bandgap reference voltage and adjust the bandgap reference voltage according to the reference current. voltage value; among them, the current value of the reference current is adjustable.

In some embodiments, the bandgap reference module 1 may be a traditional bandgap reference source, and the calibration module 2 may be a bandgap reference source. Circuitry external to the reference bandgap reference source.

As an embodiment, the calibration module 2 may include a load resistor with variable resistance. By adjusting the resistance of the load resistor, an adjustable reference current can be obtained. The calibration module 2 may also include a sampling resistor for sampling the reference current. The voltage across the sampling resistor and the bandgap reference voltage across the load resistor form the adjusted bandgap reference voltage. By adjusting the resistance of the load resistor, the reference current passing through the load resistor can be adjusted, thereby adjusting the voltage at both ends of the sampling resistor, and finally obtaining the adjusted bandgap reference voltage.

Since the bandgap reference circuit in the embodiment of the present invention adjusts the temperature drift coefficient of the bandgap reference voltage through the bandgap reference module 1, the temperature drift coefficient of the bandgap reference voltage output by the bandgap reference module 1 is smaller, and then through the bandgap The calibration module 2 outside the reference module 1 calibrates the voltage value of the bandgap reference voltage, thereby effectively reducing the impact of calibration on the temperature drift coefficient of the bandgap reference voltage. Compared with the common method of calibrating the voltage value of the bandgap reference voltage inside the bandgap reference module 1, which is difficult to take into account the accuracy of the voltage value calibration and the temperature drift coefficient, the voltage obtained by calibrating the bandgap reference circuit of the present application is both accurate and accurate. And the temperature drift coefficient is smaller.

In some embodiments, the calibration module 2 includes a reference current unit and a voltage boost unit. The reference current unit is configured to generate a reference current according to the bandgap reference voltage. The current value of the reference current is adjustable; and the voltage boost unit is configured to adjust according to the reference current. The voltage value of the bandgap reference voltage.

Specifically, as shown in Figure 1, RT1 in the figure is the reference current unit, R1 is the voltage boost unit, and the bandgap reference voltage is loaded on RT1. By changing the resistance of RT1, the reference current flowing through RT1 can be changed. The reference current passes through R1, changing the voltage across R1. The voltage across R1 and the bandgap reference voltage across RT1 form the adjusted bandgap reference voltage.

In some embodiments, the reference current unit includes a first resistor network, the resistance value of the first resistor network is adjustable, one end of the first resistor network is connected to the first port of the bandgap reference module 1, and the other end of the first resistor network It is connected to the second port of the bandgap reference module 1, where the first port is the output end of the bandgap reference module 1; the voltage boosting unit includes a first resistor, the first end of the first resistor is connected to the second port, and the first resistor The second terminal is grounded.

Specifically, the adjusted bandgap reference voltage U2 can be obtained by the following relationship:
U ₂ ＝U ₁ +(I ₁ +I ₂ )*r ₁ ＝U ₁ +(U ₁ /R ₁ +I ₂ )*r ₁ ＝U ₁ +U ₁ *(r ₁ /R ₁ )+r ₁ *I ₂ .

Among them, U ₁ is the band gap reference voltage, U ₂ is the adjusted band gap reference voltage, I ₁ is the current passing through when the band gap reference voltage is loaded on the first resistor network, and I ₂ is the second resistor of the band gap reference module 1. The current flowing from the port to the ground through the first resistor, R1 is the resistance of the first resistor, and r ₁ is the resistance of the first resistor network.

According to the formula, adjusting the resistance value of r ₁ will affect the temperature drift coefficient of U ₁ *(r ₁ /R ₁ ) part. Ideally, the temperature drift coefficient of the bandgap reference voltage U ₁ output by the bandgap reference module 1 is 0 or very small, so the temperature drift coefficient of the U ₁ *(r ₁ /R ₁ ) part brought by the adjusted resistance r ₁ The change is very small, so the adjusted resistance r ₁ has an effect on the adjusted band gap reference voltage U ₂ output by the entire calibration circuit. The impact is minimal.

In some embodiments, the bandgap reference module 1 includes: a positive temperature coefficient generation unit configured to generate a positive temperature coefficient voltage; a negative temperature coefficient generation unit connected to the positive temperature coefficient generation unit , and is configured to generate a negative temperature coefficient voltage; and a calibration unit, which is connected to the positive temperature coefficient generation unit and is configured to adjust the voltage value of the positive temperature coefficient voltage.

In some embodiments, the calibration unit includes a second resistor network, the resistance of the second resistor network is adjustable, the first end of the second resistor network is connected to the first port of the bandgap reference module 1 , and the second resistor network has an adjustable resistance. The terminal is connected to the positive temperature coefficient generating unit.

FIG. 2 shows a schematic diagram of the principle of a bandgap reference module according to an exemplary embodiment of the present application. As shown in Figure 2, the number of triodes in Q1 (i.e. the first triode circuit) in the positive temperature coefficient generating unit is M. The emitter of each triode in Q1 is connected to the base. The voltage drop is the voltage drop across a PN junction. Similarly, the number of triodes of Q2 (i.e. the second triode circuit) in the negative temperature coefficient generating unit is usually one. The emitter of the triode of Q2 is also connected to the base. The voltage drop of the triode of Q2 is the voltage of a PN junction. drop. Q1 and Q2 can be transistors with the same technical parameters. The function of R2, Q1 and Q2 is to generate PTAT (Proportional To Absolute Temperature, proportional to absolute temperature) current. Q1 and Q2 cooperate with the adjustable resistor (calibration unit) of RT2 and R3 to generate the bandgap reference voltage based on the PTAT current.

The temperature coefficient of Q2 in the negative temperature coefficient generating unit is a negative temperature coefficient, and the second resistor network RT2 in the calibration unit has a positive temperature coefficient. Therefore, it is more complicated to use the second resistor network RT2 to calibrate the bandgap reference voltage in the prior art. The temperature drift coefficient that greatly affects the bandgap reference voltage output by the bandgap reference module 1.

As an embodiment, FIG. 3 shows a circuit schematic diagram of another bandgap reference circuit according to an exemplary embodiment of the present application. RT2 is a second resistor network with an adjustable resistance. Both the first resistor network RT1 and the second resistor network RT2 can be used for calibration. RT2 can be used to adjust the temperature drift coefficient of the output bandgap reference voltage so that the temperature drift coefficient of the bandgap reference voltage is less than the temperature drift threshold.

In some embodiments, the minimum voltage adjustment amount of the first resistor network to calibrate the bandgap reference voltage is less than the first resistive network. The minimum voltage adjustment required by a two-resistor network to calibrate the bandgap reference voltage.

Specifically, the resistance of the second resistor network is adjustable, and the minimum change amount of the resistance in the two resistor networks corresponds to the minimum voltage adjustment amount for calibrating the bandgap reference voltage.

In Figure 3, the approximate calculation formula of the bandgap reference voltage is The approximate formula for calculating the bandgap reference voltage is This formula is a refinement of the above formula, where V1 corresponds to U ₁ (bandgap reference voltage) above, V2 corresponds to U ₂ (adjusted bandgap reference voltage), and RT1 corresponds to r ₁ (first resistor network) , R ₁ corresponds to R ₁ . In addition, _VT is the thermal voltage of the triode (each triode in the first triode circuit and the second triode circuit), M is the number of triodes connected in series in the first triode circuit, and Vbe is the The voltage difference between the emitter and base.

and then,

In practical applications, R2 (second resistance) can be made much larger than R1 (first resistance), then

When calibrating using RT1, calibrate Partially, is a fixed value. The minimum voltage change to calibrate the bandgap reference voltage is equal to Relevant; when calibrating with RT2, calibrate part, is a fixed value, the minimum voltage change value for calibrating the bandgap reference voltage is the same as Related. The minimum change in resistance in the two resistor networks thus corresponds to the minimum voltage adjustment required to calibrate the bandgap reference voltage. By configuring the resistance value of the resistor, the minimum voltage adjustment amount for calibrating the bandgap reference voltage is smaller than the minimum voltage adjustment amount for calibrating the bandgap reference voltage by the second resistor network.

The minimum voltage adjustment corresponds to the calibration speed and calibration accuracy. The larger the minimum voltage adjustment, the faster the calibration speed and the lower the calibration accuracy. Calibration using the second resistor network has lower accuracy and faster speed (coarse calibration), while calibration using the second resistor network has higher accuracy (fine calibration). When calibrating using the bandgap reference circuit of the embodiment of the present application, the second resistor network can be used for rough calibration first, and then the first resistor network can be used for fine calibration. When using this kind of calibration circuit for automatic calibration, when a larger calibration range and higher calibration accuracy are required, the second resistor network with a larger calibration range and faster calibration speed can be used for rough adjustment, so that the calibration The error is quickly reduced to a smaller range (corresponding to the coarse-tuned temperature drift threshold range), and then the first resistor network is used for fine-tuning to obtain a smaller calibration error (corresponding to the fine-tuned temperature drift threshold range). Calibrating larger voltage errors takes into account both calibration speed and calibration accuracy.

For example, the calibration accuracy corresponding to the first resistor network (ie, the minimum voltage adjustment amount required to calibrate the corresponding band gap reference voltage) is 1 mV, and the calibration accuracy of the second resistor network is 10 mV. In this way, the bandgap reference voltage is roughly calibrated first by calibrating the second resistor network, so that the output bandgap reference voltage can be compared with the predetermined voltage (in practical applications, it can be compared with the higher-precision The signal output by the bandgap reference module 1 is compared with an error within ±10mV, and then the bandgap reference voltage is accurately calibrated by adjusting the second resistor network so that the error is within ±1mV.

Additionally, using a two-stage resistor network for calibration has the advantage of reducing the number of resistors required for higher calibration accuracy and a larger calibration range. When the number of resistor networks used for calibration is 1, the voltage range that needs to be covered by the calibration is plus or minus 500mV, the calibration accuracy is 1mV, and the calibration accuracy is 1/1000 of the calibration range. It is usually required to use at least an exponent of 1024(2 times) unit resistors form a resistor network. If two resistor networks corresponding to different calibration accuracy are used, the second resistor network RT2 is responsible for the calibration range of plus or minus 500mV, and the calibration accuracy is 10mV, then the first resistor network RT1 only needs to use 128 unit resistors to meet the requirements; Assume The second resistor network RT2 is responsible for the calibration range of plus and minus 20mV, and the calibration accuracy is 1mV. Then the first resistor network RT1 only needs 64 unit resistors to meet the requirements. Using two resistor networks to achieve the same calibration accuracy only requires the use of 192 unit resistors, greatly reducing the total number of unit resistors required in the resistor network.

In some embodiments, the first resistor network includes one or more first circuit segments connected in series and a plurality of first switches. Each segment of the first circuit includes one or more third resistors connected in parallel. Each first switch Set to switch the resistance of the first resistor network; the second resistor network includes one or more second circuits connected in series, and a plurality of second switches, each second circuit including one or more fourth resistors connected in parallel, Each second switch is configured to switch the resistance of the first resistor network.

As an embodiment, Figure 4 shows a schematic diagram of a first resistor network or a second resistor network according to an exemplary embodiment of the present application. The resistor labels in the resistor network in Figure 4 are all R0, which represents the The various parameters of all resistors included in the resistor network are basically the same, such as the resistance value and the temperature drift coefficient. The resistor network in Figure 4 is divided into multiple sections. The first section includes one R0 resistor, the second section includes two R0 resistors..., each circuit section (the first circuit or the second circuit) can be equipped with a circuit corresponding to this section. A switch connected in parallel (the third switch or the fourth switch), which can switch the resistance of the resistor network (for example, when the switch is closed, all resistors included in this circuit are short-circuited), thereby adjusting the first or second resistor The resistance of the network.

In some embodiments, the bandgap reference module 1 is a voltage mode bandgap reference circuit or a current mode bandgap reference circuit.

In practical applications, an external controller can be used to calibrate the bandgap reference module 1, such as a microcontroller, CPU, etc. Calibration by an external controller compares the bandgap reference voltage to a preset voltage. The preset voltage is provided by the bandgap reference module 1 with high accuracy. The built-in comparator of the external controller compares the input bandgap reference voltage with the preset voltage. If the bandgap reference voltage is greater or less than the preset voltage, the bandgap reference voltage is The first resistor network or the second resistor network in the gap reference circuit is adjusted until the deviation between the band gap reference voltage and the preset voltage is within the temperature drift threshold range.

The sequence of calibration may be to use the second resistor network to calibrate the bandgap reference before calibrating using the first resistor network. The temperature drift coefficient of the voltage is calibrated so that the temperature drift coefficient of the bandgap reference voltage is closer to 0 (the temperature drift coefficient is within the third threshold range). In this way, the band gap reference voltage is calibrated, which has less impact on the temperature drift coefficient. Or first use the first resistor network for rough adjustment, and then use the second resistor network for fine adjustment.

As mentioned above, the bandgap reference voltage is adjusted by adjusting the resistance of the resistor network. The first resistor network and the second resistor network may be divided into multiple circuit segments. Each circuit segment may include one or more resistors. Each segment of the resistor network may include a switch connected in parallel with this segment of circuit. By controlling whether each switch When closed, the resistance value can be controlled and the bandgap reference voltage can be calibrated.

The bandgap reference circuit provided by the embodiment of the present application includes a bandgap reference module 1 and a calibration module 2. The calibration module 2 generates a reference current according to the bandgap reference voltage output by the bandgap reference module 1, and adjusts the bandgap reference voltage according to the reference current. The voltage value and the current value of the reference current are adjustable. The bandgap reference circuit of the present application adjusts the temperature drift coefficient of the bandgap reference voltage through the bandgap reference module 1, so that the temperature drift coefficient of the bandgap reference voltage is smaller, and adjusts the temperature drift coefficient outside the bandgap reference module 1 through the calibration module 2. The reference current calibrates the voltage value of the bandgap reference voltage, thereby effectively reducing the impact of calibration on the temperature drift coefficient of the bandgap reference voltage. Compared with the common method of calibrating the voltage value of the bandgap reference voltage inside the bandgap reference module 1, which is difficult to take into account the accuracy of the voltage value calibration and the temperature drift coefficient, the voltage obtained by the calibration is both accurate and has a temperature drift coefficient. smaller.

The above is a detailed introduction to the bandgap reference circuit, integrated circuit and electronic equipment provided by this application. Specific examples are used in this article to illustrate the principles and implementation methods of this application. The description of the above embodiments is only used to help understand this application. The method and its core idea; at the same time, for those of ordinary skill in the field, there will be changes in the specific implementation and application scope based on the ideas of this application. In summary, the contents of this specification should not be understood as Limitations on this Application.

Claims

A bandgap reference circuit, wherein the bandgap reference circuit includes:

a bandgap reference module, the bandgap reference module is configured to output a bandgap reference voltage, the temperature drift coefficient of the bandgap reference voltage is less than or equal to the temperature drift threshold; and

Calibration module, the calibration module is configured to generate a reference current according to the bandgap reference voltage, and adjust the voltage value of the bandgap reference voltage according to the reference current; wherein the current value of the reference current is adjustable.
The bandgap reference circuit according to claim 1, wherein the calibration module includes:

a reference current unit configured to generate a reference current based on the bandgap reference voltage; and

and a voltage boosting unit configured to adjust the voltage value of the bandgap reference voltage according to the reference current.
The bandgap reference circuit according to claim 2, wherein the reference current unit includes a first resistor network, the resistance value of the first resistor network is adjustable, and one end of the first resistor network is connected to the bandgap The first port of the reference module is connected, and the other end of the first resistor network is connected to the second port of the bandgap reference module, where the first port is the output end of the bandgap reference module;

The voltage boosting unit includes a first resistor, a first end of the first resistor is connected to the second port, and a second end of the first resistor is connected to ground.
The bandgap reference circuit according to any one of claims 1-3, wherein the bandgap reference module includes:

a positive temperature coefficient generating unit, the positive temperature coefficient generating unit is configured to generate a positive temperature coefficient voltage;

a negative temperature coefficient generating unit, the negative temperature coefficient generating unit is connected to the positive temperature coefficient generating unit and is configured to generate a negative temperature coefficient voltage; and

A calibration unit, the calibration unit is connected to the positive temperature coefficient generating unit and is configured to adjust the voltage value of the positive temperature coefficient voltage.
The bandgap reference circuit according to claim 4, wherein the calibration unit includes a second resistor network, the resistance of the second resistor network is adjustable, and the first end of the second resistor network is connected to the bandgap The first port of the reference module is connected, and the second end of the second resistance network is connected to the positive temperature coefficient generating unit.
The bandgap reference circuit according to any one of claims 4 or 5, wherein the positive temperature coefficient generating unit includes a first transistor circuit, a second resistor, a third resistor and a comparison circuit;

The first end of the first triode circuit is connected to the first end of the first resistor, the second end of the first triode circuit is connected to the first end of the second resistor, and the second The second end of the resistor is connected to the first end of the second resistor network, the second end of the second resistor network is connected to the first end of the third resistor, and the second end of the third resistor is connected to The first input terminal of the comparison circuit and the second terminal of the second resistor are also connected to the second input terminal of the comparison circuit.
The bandgap reference circuit according to any one of claims 4 to 6, wherein the negative temperature coefficient generating unit includes a second triode circuit, the first end of the second triode circuit is connected to the first The first end of the resistor and the second end of the second transistor circuit are connected to the first input end of the comparison circuit.
The bandgap reference circuit of claim 5 , wherein the first resistor network adjusts the bandgap reference voltage by a minimum voltage adjustment amount less than the second resistor network adjusts the bandgap reference voltage. the minimum voltage adjustment amount.
An integrated circuit, comprising the bandgap reference circuit according to any one of claims 1-8.
An electronic device, which includes a device main body and an integrated circuit as claimed in claim 9 provided in the device main body.